JPH06109423A - Apparatus for detecting edge of traveling belt - Google Patents

Apparatus for detecting edge of traveling belt

Info

Publication number
JPH06109423A
JPH06109423A JP26198092A JP26198092A JPH06109423A JP H06109423 A JPH06109423 A JP H06109423A JP 26198092 A JP26198092 A JP 26198092A JP 26198092 A JP26198092 A JP 26198092A JP H06109423 A JPH06109423 A JP H06109423A
Authority
JP
Japan
Prior art keywords
edge position
strip
light
laser beam
semiconductor laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP26198092A
Other languages
Japanese (ja)
Inventor
Yoshinori Anabuki
善範 穴吹
Hitoshi Aizawa
均 相澤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Steel Corp filed Critical Kawasaki Steel Corp
Priority to JP26198092A priority Critical patent/JPH06109423A/en
Publication of JPH06109423A publication Critical patent/JPH06109423A/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To stably detect the edge position of a plate without increasing a maintenance load by a method wherein a semiconductor laser is used as a light source for a beam of light with which an edge part at a continuously traveling strip is irradiated in a prescribed effective field of view. CONSTITUTION:For example, an edge part at a steel belt S traveling inside a hermetically sealed continuous treatment installation 5 is irradiated, via a shielding glass 6 through a cylindrical lens, with a laser beam oscillated from a semiconductor laser 7 which is oscillated continuously at a high output of about 100 to 300mW as a laser beam provided with an effective field of view corresponding to the plate width of the steel belt S. At this time, the wavelength of the laser beam is selected at a value which is deviated form the absorption band of the glass, e.g. at 800nm. The laser beam with which the edge part is irradiated is reflected partly by the steel belt S, it is passed through the glass 6 again and it is incident on a CCD camera 2. The intensity of the laser beam which is incident on the camera 2 is proportional to the edge position of the steel belt. As a result, when the output of the camera is amplified by an amplifier 3, it is possible to obtain the signal of the edge position.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、連続して走行するス
トリップのエッジ位置検出装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an edge position detecting device for continuously running strips.

【0002】[0002]

【従来の技術】ストリップの連続処理装置における通常
の板エッジ位置検出方法は、例えば図1に示すように、
一対の光源1と検出器2をそれぞれ、鋼板Sの両側(表
側及び裏側)に設置し、検出器2で受光する光量が板エ
ッジ位置に比例することを利用するものである(例えば
特公昭60-41285号公報、特開昭62-14310号公報、同62−
179601号公報)。このとき検出器としてCCDカメラを
用いた場合、光量に比例してカメラ素子の抵抗が変化す
ることから、得られるカメラ出力を増幅器3で増幅して
やれば、鋼板エッジ位置に比例した電圧が出力され、従
ってエッジ位置のリアルタイムでの検出が可能となる。
2. Description of the Related Art A conventional plate edge position detecting method in a continuous strip processing apparatus is, for example, as shown in FIG.
A pair of the light source 1 and the detector 2 are installed on both sides (front side and back side) of the steel plate S, and the fact that the amount of light received by the detector 2 is proportional to the plate edge position is utilized (for example, Japanese Patent Publication No. 60). -41285, JP 62-14310, 62-
179601 publication). At this time, when a CCD camera is used as the detector, the resistance of the camera element changes in proportion to the amount of light. Therefore, if the obtained camera output is amplified by the amplifier 3, a voltage proportional to the steel plate edge position is output, Therefore, the edge position can be detected in real time.

【0003】被処理材が、真空室や焼鈍炉等の密閉型連
続処理設備内を走行している場合のエッジ位置検出方法
も、原理は上記と場合と同様であるが、光学系の構成が
幾分異なる。すなわち、密閉型連続処理設備内には、光
源と検出器を設置することが設備設計上難しいことか
ら、通常は図2に示すように、光を反射するための反射
板4を密閉型連続処理設備5内に設け、一方光源1や検
出器2は密閉型連続処理設備外に設置し、反射板4で反
射された光を遮蔽ガラス6を介して検出器2で受光し、
さらに増幅器3で増幅することにより、鋼板エッジ位置
を検出している(例えば実公昭63-21554号公報)。
A method of detecting an edge position when a material to be processed is running in a closed continuous processing facility such as a vacuum chamber or an annealing furnace is the same in principle as the above case, but has an optical system configuration. Somewhat different. That is, since it is difficult to install a light source and a detector in the closed continuous processing facility due to the facility design, normally, as shown in FIG. 2, the reflection plate 4 for reflecting light is closed. The light source 1 and the detector 2 are installed inside the equipment 5, while the light source 1 and the detector 2 are installed outside the closed continuous processing equipment, and the light reflected by the reflection plate 4 is received by the detector 2 through the shielding glass 6,
Further, the position of the steel sheet edge is detected by being amplified by the amplifier 3 (for example, Japanese Utility Model Publication No. 63-21554).

【0004】[0004]

【発明が解決しようとする課題】しかしながら、上記の
従来法には、以下に述べるような光源の定期的交換や反
射板の定期的保全を必要とするところに問題を残してい
た。 1)光源の定期的交換 通常、光源は、蛍光灯又はハロゲンランプであり、半年
に1回程度の頻度で定期的に交換する必要があるので、
ランニングコストと共に保全負荷が大きい。
However, the above conventional method has a problem in that it requires periodical replacement of the light source and periodical maintenance of the reflector as described below. 1) Periodical replacement of light source Normally, the light source is a fluorescent lamp or a halogen lamp, and it is necessary to replace it regularly every six months.
Maintenance costs are large along with running costs.

【0005】2)反射板の定期的保全 特に密閉型連続処理設備内にエッジ位置検出のための反
射板を設置した場合は、反射板の汚れ等によりエッジ位
置検出精度が低下することから、これを防止するため
に、2週間〜1ヶ月に1回程度の頻度で定期的な反射板
の清掃又は交換が必要となって、保全負荷の増大を招
く。また反射板を設備内に組込む必要があり、設備設計
上も問題が残る。
2) Periodic maintenance of the reflector In particular, when the reflector for detecting the edge position is installed in the closed type continuous processing facility, the edge position detection accuracy is deteriorated due to the dirt of the reflector and the like. In order to prevent this, periodical cleaning or replacement of the reflection plate is required at a frequency of about once every two weeks to one month, resulting in an increase in maintenance load. In addition, it is necessary to incorporate the reflector into the equipment, which causes problems in equipment design.

【0006】このように従来のエッジ位置検出装置で
は、安定したエッジ位置検出ができず、ひいては鋼板の
蛇行修正ができないため、安定した操業は望み得なかっ
た。この発明は、上記の問題を有利に解決するもので、
ランニングコストや保全負荷の増大を招くことなしに、
安定して板エッジ位置を検出することができる走行帯の
エッジ位置検出装置を提案することを目的とする。
As described above, the conventional edge position detecting device cannot detect the edge position in a stable manner and cannot correct the meandering of the steel sheet, so that stable operation cannot be expected. The present invention advantageously solves the above problems,
Without increasing running costs and maintenance load,
It is an object of the present invention to propose an edge position detecting device for a traveling zone capable of stably detecting a plate edge position.

【0007】[0007]

【課題を解決するための手段】さて発明者らは、上記の
問題を解決すべく鋭意検討を重ね、その際、光源として
半導体レーザを用いたところ、所期した目的の達成に関
し、望外の成果を得ることができた。この発明は、上記
の知見に立脚するものである。
[Means for Solving the Problems] The inventors of the present invention have made extensive studies to solve the above problems, and when a semiconductor laser is used as a light source at that time, an unexpected result is achieved in achieving the intended purpose. I was able to get The present invention is based on the above findings.

【0008】すなわちこの発明は、連続走行するストリ
ップに対し、そのエッジ部に所定の有効視野で光を照射
する光源としての半導体レーザと、該ストリップからの
反射光を受光する受光器とからなる走行帯のエッジ位置
検出装置(第1発明)である。
That is, according to the present invention, a continuously traveling strip is composed of a semiconductor laser as a light source for irradiating the edge portion thereof with light in a predetermined effective field of view and a light receiver for receiving reflected light from the strip. It is a band edge position detecting device (first invention).

【0009】またこの発明は、真空室や焼鈍炉等の密閉
型連続処理設備内を連続走行するストリップに対し、該
密閉型連続処理設備の外部から、該処理設備に設けた遮
蔽ガラスを介して、該ストリップのエッジ部に所定の有
効視野で光を照射する光源としての半導体レーザと、同
じく該密閉型連続処理設備の外部に設置され、該遮蔽ガ
ラスを介して、該ストリップからの反射光を受光する受
光器とからなる走行帯のエッジ位置検出装置(第2発
明)である。
Further, according to the present invention, with respect to a strip continuously traveling in a closed continuous processing equipment such as a vacuum chamber or an annealing furnace, the strip is provided from outside the closed continuous processing equipment through a shielding glass provided in the processing equipment. , A semiconductor laser as a light source that irradiates the edge portion of the strip with light in a predetermined effective field of view, and is also installed outside the hermetically sealed continuous processing facility, and reflects light from the strip through the shielding glass. It is an edge position detecting device for a traveling zone (second invention), which comprises a light receiving device for receiving light.

【0010】この発明において、半導体レーザとして
は、連続発振で 100〜200 mW程度の出力を持つ高出力の
半導体レーザが好適である。また受光器としては、CC
Dカメラがとくに有利に適合するが、その他従来公知の
種々のイメージセンサが使用できるのはいうまでもな
い。さらにこの発明における測定対象は、熱延鋼板や冷
延鋼板などの金属ストリップに限るものではなく、プラ
スチックフィルムやロール紙など長尺の帯状体であれ
ば、いずれもを対象とすることができる。
In the present invention, as the semiconductor laser, a high output semiconductor laser having an output of 100 to 200 mW in continuous oscillation is suitable. Also, as the light receiver, CC
Although the D camera is particularly advantageously suited, it goes without saying that various conventionally known image sensors can be used. Furthermore, the measurement target in the present invention is not limited to a metal strip such as a hot rolled steel plate or a cold rolled steel plate, and any long strip such as a plastic film or roll paper can be used.

【0011】[0011]

【作用】この発明では、光源として、事実上、寿命が半
永久的である半導体レーザを用いるので、光源の定期的
交換が不必要となり、また鋼板から十分な反射光が得ら
れるようになるため、従来、密閉型連続処理設備内での
エッジ位置検出の際に不可避とされた反射板も不用とな
る。
In the present invention, since a semiconductor laser having a semi-permanent life is practically used as a light source, periodic replacement of the light source is unnecessary, and sufficient reflected light can be obtained from the steel plate. Conventionally, a reflector that is inevitable when detecting an edge position in a closed continuous processing facility is also unnecessary.

【0012】[0012]

【実施例】第1発明の構成は、第2発明の構成に含まれ
るので、ここでは第2発明についてのみ説明する。図3
に、第2発明に従うエッジ位置検出装置の好適例を斜視
面で、また図4には一部断面でそれぞれ示す。構成の骨
子は、前掲図2の場合と共通するので、同一の番号を付
して示し、図中番号7が半導体レーザである。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Since the structure of the first invention is included in the structure of the second invention, only the second invention will be described here. Figure 3
A preferred example of the edge position detecting device according to the second invention is shown in a perspective view, and in FIG. The skeleton of the configuration is the same as in the case of FIG. 2 described above, and therefore is shown with the same numbers, and in the figure, the number 7 is a semiconductor laser.

【0013】さて図3,4に示したところにおいて、半
導体レーザ1から発振されたレーザ光は、図5に示すよ
うに、シリンドリカルレンズ8を通して鋼帯Sの板幅に
対応した有効視野をもつレーザ光として、遮蔽ガラス6
を介して密閉型連続処理設備5内を走行中の鋼帯Sのエ
ッジ部に照射される。ここにレーザ光の波長は、遮蔽ガ
ラス6の吸収帯から外れた値(例えば800 nm)に選定す
る。鋼帯エッジ部に照射されたレーザ光は、その一部が
鋼帯Sで反射され、再び遮蔽ガラス6を通ってCCDカ
メラ2に入光する。CCDカメラ2に入光するレーザ光
の強度は、鋼帯エッジ位置に比例するので、カメラ出力
を増幅器3で増幅してやれば、エッジ位置信号を得るこ
とができるわけである。
Now, as shown in FIGS. 3 and 4, the laser light emitted from the semiconductor laser 1 passes through a cylindrical lens 8 and has an effective field of view corresponding to the plate width of the steel strip S, as shown in FIG. Shielding glass 6 as light
The edge portion of the steel strip S running through the closed continuous processing facility 5 is irradiated via the. Here, the wavelength of the laser light is selected to be a value outside the absorption band of the shielding glass 6 (for example, 800 nm). A part of the laser beam applied to the edge portion of the steel strip is reflected by the steel strip S, passes through the shielding glass 6 again, and enters the CCD camera 2. Since the intensity of the laser light entering the CCD camera 2 is proportional to the steel strip edge position, the edge position signal can be obtained by amplifying the camera output with the amplifier 3.

【0014】なお、鋼帯エッジ部以外に照射されたレー
ザ光は、通常、密閉型連続処理設備内壁で吸収される
が、内壁材質がレーザ光を反射する場合は、レーザ光が
照射される部分の内壁に僅かな傾きを付け、内壁による
反射光がCCDカメラ2に入光しないようにする。ま
た、遮蔽ガラス6の表面・裏面からの反射光による外乱
を防ぐため、遮蔽ガラス6も反射光がCCDカメラ2に
入光しないよう僅かな傾きを設けることが好ましい。
The laser light applied to the area other than the edge of the steel strip is usually absorbed by the inner wall of the hermetically sealed continuous processing facility. However, when the material of the inner wall reflects the laser light, the part to which the laser light is applied is irradiated. The inner wall of is slightly inclined so that the light reflected by the inner wall does not enter the CCD camera 2. Further, in order to prevent the disturbance due to the reflected light from the front and back surfaces of the shielding glass 6, it is preferable that the shielding glass 6 is also provided with a slight inclination so that the reflected light does not enter the CCD camera 2.

【0015】[0015]

【発明の効果】この発明による効果は次のとおりであ
る。 1)事実上、寿命が半永久的である半導体レーザを光源
として用いるので、光源の定期的交換が不要になり、保
全性が向上すると同時にランニングコストを低減するこ
とができる。 2)高出力半導体レーザが光源であるので、被処理体か
ら十分な反射光を得ることができ、従って従来、密閉型
連続処理設備内でのエッジ位置検出の際に不可避とされ
た反射板が不用になり、密閉型連続処理設備の設計・製
作コストを抑えることができると共に、反射板の保全が
不要になる。 3)この装置は、保全負荷が少ない上に、安定した鋼板
エッジ検出が可能であるので、真空室内のエッジ位置検
出や焼鈍炉内蛇行修正装置の検出端として利用でき、特
に、雰囲気ガスの影響で反射板が汚れことから、これま
で鋼板の蛇行検出が不可能であった特殊雰囲気の連続焼
鈍炉における蛇行センサとしての利用が可能となる。
The effects of the present invention are as follows. 1) In practice, since a semiconductor laser having a semi-permanent life is used as a light source, periodical replacement of the light source is unnecessary, which improves maintenance and reduces running cost. 2) Since the high-power semiconductor laser is the light source, it is possible to obtain a sufficient amount of reflected light from the object to be processed. Therefore, the conventional reflector that is inevitable when detecting the edge position in the closed continuous processing equipment is used. It becomes unnecessary, the design and manufacturing cost of the closed continuous processing equipment can be suppressed, and the maintenance of the reflector is not necessary. 3) Since this device has a low maintenance load and can detect the steel plate edge stably, it can be used as the edge position detection in the vacuum chamber and the detection end of the meandering correction device in the annealing furnace. Since the reflector plate becomes dirty, it can be used as a meandering sensor in a continuous annealing furnace in a special atmosphere where it has been impossible to detect meandering of a steel plate.

【図面の簡単な説明】[Brief description of drawings]

【図1】従来の板エッジ位置検出装置の模式図である。FIG. 1 is a schematic diagram of a conventional plate edge position detection device.

【図2】従来方式の密閉型連続処理設備内走行中のスト
リップの板エッジ位置検出装置の模式図である。
FIG. 2 is a schematic diagram of a plate edge position detecting device for a strip that is running in a conventional closed continuous processing facility.

【図3】この発明に従う、密閉型連続処理設備内走行中
のストリップの板エッジ位置検出装置の斜視図である。
FIG. 3 is a perspective view of a plate edge position detecting device for a strip running in a closed continuous processing facility according to the present invention.

【図4】この発明に従う、密閉型連続処理設備内走行中
のストリップの板エッジ位置検出装置の一部断面図であ
る。
FIG. 4 is a partial cross-sectional view of a plate edge position detecting device for a strip running in a closed continuous processing facility according to the present invention.

【図5】半導体レーザ装置の内部拡大図である。FIG. 5 is an enlarged view of the inside of the semiconductor laser device.

【符号の説明】[Explanation of symbols]

1 光源 2 検出器 3 増幅器 4 反射板 5 密閉型連続処理設備 6 遮蔽ガラス 7 半導体レーザ 8 シリンドリカルレンズ 1 Light Source 2 Detector 3 Amplifier 4 Reflector 5 Closed Continuous Processing Equipment 6 Shielding Glass 7 Semiconductor Laser 8 Cylindrical Lens

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 連続走行するストリップに対し、そのエ
ッジ部に所定の有効視野で光を照射する光源としての半
導体レーザと、該ストリップからの反射光を受光する受
光器とからなることを特徴とする走行帯のエッジ位置検
出装置。
1. A semiconductor laser as a light source for irradiating an edge of a continuously traveling strip with a predetermined effective field of view, and a photodetector for receiving the reflected light from the strip. Edge position detection device for running zone.
【請求項2】 真空室や焼鈍炉等の密閉型連続処理設備
内を連続走行するストリップに対し、該密閉型連続処理
設備の外部から、該処理設備に設けた遮蔽ガラスを介し
て、該ストリップのエッジ部に所定の有効視野で光を照
射する光源としての半導体レーザと、同じく該密閉型連
続処理設備の外部に設置され、該遮蔽ガラスを介して、
該ストリップからの反射光を受光する受光器とからなる
ことを特徴とする走行帯のエッジ位置検出装置。
2. A strip that continuously runs in a closed continuous processing facility such as a vacuum chamber or an annealing furnace, and the strip is provided from outside the closed continuous processing facility through a shielding glass provided in the processing facility. A semiconductor laser as a light source for irradiating light with a predetermined effective visual field to the edge portion of, and similarly installed outside the closed continuous processing facility, through the shielding glass,
An edge position detection device for a traveling zone, comprising: a light receiver for receiving the reflected light from the strip.
JP26198092A 1992-09-30 1992-09-30 Apparatus for detecting edge of traveling belt Pending JPH06109423A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26198092A JPH06109423A (en) 1992-09-30 1992-09-30 Apparatus for detecting edge of traveling belt

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26198092A JPH06109423A (en) 1992-09-30 1992-09-30 Apparatus for detecting edge of traveling belt

Publications (1)

Publication Number Publication Date
JPH06109423A true JPH06109423A (en) 1994-04-19

Family

ID=17369336

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26198092A Pending JPH06109423A (en) 1992-09-30 1992-09-30 Apparatus for detecting edge of traveling belt

Country Status (1)

Country Link
JP (1) JPH06109423A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006349530A (en) * 2005-06-16 2006-12-28 Nippon Zeon Co Ltd Film thickness measuring system and method for sheet type optical laminate
JP2008114474A (en) * 2006-11-06 2008-05-22 Totani Corp Heat seal position detecting device of plastic film
JP2008234115A (en) * 2007-03-19 2008-10-02 Secom Co Ltd Portable monitoring device and article monitoring system
WO2013181598A1 (en) * 2012-05-31 2013-12-05 The Regents Of The University Of Michigan Laser-based edge detection

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006349530A (en) * 2005-06-16 2006-12-28 Nippon Zeon Co Ltd Film thickness measuring system and method for sheet type optical laminate
JP2008114474A (en) * 2006-11-06 2008-05-22 Totani Corp Heat seal position detecting device of plastic film
JP2008234115A (en) * 2007-03-19 2008-10-02 Secom Co Ltd Portable monitoring device and article monitoring system
WO2013181598A1 (en) * 2012-05-31 2013-12-05 The Regents Of The University Of Michigan Laser-based edge detection

Similar Documents

Publication Publication Date Title
JPS6234096B2 (en)
CA2047288C (en) Apparatus and method for angle measurement
US5932888A (en) Web or sheet edge position measurement process and device
JPH06109423A (en) Apparatus for detecting edge of traveling belt
US5617212A (en) Open-path gas monitoring
JPS61231403A (en) Apparatus for detecting position of edge part of steel plate strip running through furnace
JPH0423724B2 (en)
JPS5630724A (en) Inspecting device of substrate surface
JPH06207910A (en) Surface inspection apparatus
JPS6013137B2 (en) Defect detection method
JPS6254592B2 (en)
KR200295251Y1 (en) Pinhole Detection Device for Strip
JPH06294627A (en) Buckling detection method in continuous heat treatment furnace
JPS58204348A (en) Method for detecting flaw on surface of metallic object
JPS58216938A (en) Surface flaw detector for metal object
JPH06222159A (en) Human body detecting device
JPS6114512A (en) Contactless displacement detecting device
JPH0613441Y2 (en) Width measuring device for belts such as sheets using a centering sensor with A, G and C circuits
JP3406951B2 (en) Surface condition inspection device
JPH03165207A (en) Track inspecting device
JPH08128967A (en) Surface inspection device
JP3190725B2 (en) Defect detection method and apparatus
JPH04204311A (en) Width measuring device for band-like object such as cloth and sheet
JPS58204350A (en) Method for detecting flaw on surface of metallic object
JPH03225209A (en) Track inspection instrument