JPH0580825B2 - - Google Patents

Info

Publication number
JPH0580825B2
JPH0580825B2 JP59109963A JP10996384A JPH0580825B2 JP H0580825 B2 JPH0580825 B2 JP H0580825B2 JP 59109963 A JP59109963 A JP 59109963A JP 10996384 A JP10996384 A JP 10996384A JP H0580825 B2 JPH0580825 B2 JP H0580825B2
Authority
JP
Japan
Prior art keywords
cassette
chamber
semiconductor substrate
substrate
fork
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59109963A
Other languages
Japanese (ja)
Other versions
JPS60254627A (en
Inventor
Toshio Takahashi
Kazuo Sato
Sumio Yamaguchi
Muneo Mizumoto
Sumio Okuno
Toshimitsu Myata
Yoshimasa Kondo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP10996384A priority Critical patent/JPS60254627A/en
Publication of JPS60254627A publication Critical patent/JPS60254627A/en
Publication of JPH0580825B2 publication Critical patent/JPH0580825B2/ja
Granted legal-status Critical Current

Links

Description

【発明の詳細な説明】 〔発明の利用分野〕 この発明は半導体基板を搬送する機構、たとえ
ば分子線エピタキシ装置等の超高真空が必要とさ
れる槽内において半導体基板を搬送する機構に関
するものである。
[Detailed Description of the Invention] [Field of Application of the Invention] The present invention relates to a mechanism for transporting a semiconductor substrate, for example, a mechanism for transporting a semiconductor substrate in a tank that requires an ultra-high vacuum such as a molecular beam epitaxy device. be.

〔発明の背景〕[Background of the invention]

分子線エピタキシは、到達圧力が1.3×10-8Pa
以下の超高真空中で半導体基板に高品質の薄膜結
晶を形成する技術であり、薄膜構造の制御性に優
れていることから、近年特に注目されている。
Molecular beam epitaxy has an ultimate pressure of 1.3×10 -8 Pa
It is a technique for forming high-quality thin film crystals on semiconductor substrates in an ultra-high vacuum, and has received particular attention in recent years because of its excellent controllability of thin film structures.

第2図は従来の半導体基板搬送装置を有する分
子線エピタキシ装置を示す概略図、第3図は第2
図のA−A断面図、第4図は第2図、第3図に示
した半導体基板搬送機構のカセツトを示す斜視図
である。図において、2は半導体基板搬送室、1
は搬送室2に設けられた半導体基板導入口、3,
4は搬送室2に連結された半導体基板処理室、6
a,6bは搬送室2と処理室3,4との間に設け
られたゲートバルブで、搬送室2、処理室3,4
はそれぞれ独立した真空ポンプ(図示せず)によ
つて排気される。11は搬送室2内に設けられた
レール、10はレール11上を走行する搬送台車
で、台車10はチエーン等を介してモータ等によ
つて駆動される。9は台車10上に載置されたカ
セツトで、カセツト9は台車10上に2個載置さ
れている。8は一方のカセツト9に積載された複
数の半導体基板、12は基板8の周面に設けられ
た複数のバヨネツトピン、13はカセツト9に設
けられた溝で、ピン12は溝13に係合してい
る。7a,7bは一方のカセツト9に積載された
基板8を処理室3,4内に持込み、処理を終えた
基板8を処置室3,4内から取出して他方のカセ
ツト9に積載するマニピユレータ、5は搬送室2
に設けられた半導体基板搬出口である。
Fig. 2 is a schematic diagram showing a molecular beam epitaxy system having a conventional semiconductor substrate transfer device, and Fig.
4 is a perspective view showing a cassette of the semiconductor substrate transport mechanism shown in FIGS. 2 and 3. FIG. In the figure, 2 is a semiconductor substrate transfer chamber;
3 is a semiconductor substrate inlet provided in the transfer chamber 2;
4 is a semiconductor substrate processing chamber connected to the transfer chamber 2; 6;
a and 6b are gate valves provided between the transfer chamber 2 and the processing chambers 3 and 4;
are evacuated by independent vacuum pumps (not shown). Reference numeral 11 denotes a rail provided in the transfer chamber 2, and 10 indicates a transfer carriage that runs on the rail 11. The carriage 10 is driven by a motor or the like via a chain or the like. Reference numeral 9 denotes a cassette placed on a cart 10, and two cassettes 9 are placed on the cart 10. 8 is a plurality of semiconductor substrates loaded on one cassette 9; 12 is a plurality of bayonet pins provided on the peripheral surface of the substrate 8; 13 is a groove provided in the cassette 9; the pin 12 is engaged with the groove 13; ing. 7a, 7b are manipulators 5 which bring the substrates 8 loaded in one cassette 9 into the processing chambers 3, 4, take out the processed substrates 8 from the processing chambers 3, 4, and load them into the other cassette 9; is transport room 2
This is the semiconductor substrate export port provided in the.

この分子線エピタキシ装置においては、まずゲ
ートバルブ6a,6bを閉じた状態で、導入口1
を開き、一方のカセツト9に複数の基板8を積載
し、このカセツト9を導入口1から搬送室2内に
入れ、台車10上に載置する。つぎに、導入口1
を閉じたのち、搬送室2内を真空排気する。つい
で、台車10を処理室3の正面まで走行し、ゲー
トバルブ6aを開いて、マニピユレータ7aによ
り一方のカセツト9に積載された基板8を処理室
3内に持込み、ゲートバルブ6aを閉じて、処理
室3を超高真空に排気したのち、基板8を処理す
る。つぎに、ゲートバルブ6aを開き、マニピユ
レータ7aにより処理を終えた基板8を処理室3
内から取出して他方のカセツト9に積載する。そ
して、全ての基板8を処理室3で処理したのち、
ゲートバルブ6aを閉じ、台車10を処理室4の
正面まで走行し、上述の操作と同様の操作によ
り、基板8を処理室4で処理する。つぎに、全て
の基板8を処理室4で処理したのち、台車10を
搬出口5まで走行し、搬出口5を開いて、搬出口
5から基板8が積載されたカセツト9を外部に取
出す。
In this molecular beam epitaxy apparatus, first, with the gate valves 6a and 6b closed, the inlet port 1 is
is opened, a plurality of substrates 8 are loaded into one cassette 9, this cassette 9 is put into the transfer chamber 2 through the inlet 1, and placed on the trolley 10. Next, inlet 1
After closing, the inside of the transfer chamber 2 is evacuated. Next, the cart 10 is moved to the front of the processing chamber 3, the gate valve 6a is opened, and the substrate 8 loaded in one cassette 9 is brought into the processing chamber 3 by the manipulator 7a, and the gate valve 6a is closed and the processing begins. After the chamber 3 is evacuated to ultra-high vacuum, the substrate 8 is processed. Next, the gate valve 6a is opened, and the processed substrate 8 is transferred to the processing chamber 3 by the manipulator 7a.
Take it out from inside and load it into the other cassette 9. After processing all the substrates 8 in the processing chamber 3,
The gate valve 6a is closed, the cart 10 is driven to the front of the processing chamber 4, and the substrate 8 is processed in the processing chamber 4 by the same operation as described above. Next, after all the substrates 8 have been processed in the processing chamber 4, the cart 10 is driven to the exit 5, the exit 5 is opened, and the cassette 9 loaded with the substrates 8 is taken out from the exit 5.

このように、従来の半導体基板搬送機構におい
ては、台車10で基板8が積載されたカセツト9
を搬送しており、しかもカセツト9に多数の基板
8を積載したときには、カセツト9自体が大型に
なる上に重量も増すので、台車10で搬送すべき
重量が大きくなり、このため台車10の駆動装置
が大型になるとともに、台車10の操作性が低下
する。
In this way, in the conventional semiconductor substrate transport mechanism, the cart 10 transports the cassettes 9 loaded with the substrates 8.
When a large number of substrates 8 are loaded on the cassette 9, the cassette 9 itself becomes large and weighs more, so the weight to be transported by the trolley 10 increases, and therefore the drive of the trolley 10 becomes more difficult. As the device becomes larger, the operability of the trolley 10 decreases.

〔発明の目的〕[Purpose of the invention]

この発明は上述の問題点を解決するためになさ
れたもので、搬送台車で搬送すべき重量が小さい
半導体基板搬送機構を提供することを目的とす
る。
The present invention was made to solve the above-mentioned problems, and an object of the present invention is to provide a semiconductor substrate transport mechanism in which the weight to be transported by a transport vehicle is small.

〔発明の概要〕[Summary of the invention]

この目的を達成するため、この発明において
は、半導体基板を加工する処理室に接続された搬
送室内で上記半導体基板を搬送する半導体基板搬
送機構において、上記搬送室内に水平方向にレー
ルを設け、上記レール上を走行する搬送台車を設
け、垂直方向に移動可能でありかつ内部を上記搬
送台車が走行可能であるカセツトを常置し、上記
カセツトの内部に水平な複数の棚を設ける。
In order to achieve this object, in the present invention, in a semiconductor substrate transport mechanism that transports the semiconductor substrate within a transport chamber connected to a processing chamber for processing semiconductor substrates, a rail is provided in the horizontal direction within the transport chamber, and the A transport vehicle running on rails is provided, a cassette that is vertically movable and within which the transport vehicle can run is permanently placed, and a plurality of horizontal shelves are provided inside the cassette.

〔発明の実施例〕[Embodiments of the invention]

第5図はこの発明に係る半導体基板搬送機構を
有する分子線エピタキシ装置を示す概略図、第6
図は第5図のB−B断面図、第1図は第5図のC
−C断面図、第7図は第1図のD−D断面図、第
8図は第1図に示した半導体基板搬送機構の一部
を示す斜視図である。図において、14は搬送室
2に連結された真空槽、19は真空槽14に設け
られた半導体基板挿入口、17は搬送室2内に水
平方向に設けられたレール、16はレール17上
を走行する搬送台車で、台車16は駆動装置(図
示せず)により駆動される。15は真空槽14内
に垂直方向に移動可能に設けられたカセツトで、
カセツト15は駆動装置(図示せず)により垂直
方向に駆動され、またカセツト15のabfe面と
cdhg面は大きく開口しており、台車16はその
開口を通つてカセツト15の内部を走行する。2
1はカセツト15の内部に設けられた水平な複数
の棚、20はカセツト15のabcd面に設けられ
た複数の開口、18,29はレール17と直交す
る方向から真空槽14、処理室3内に進入可能な
フオークで、フオーク18は開口20を通つてカ
セツト15内に進入する。
FIG. 5 is a schematic diagram showing a molecular beam epitaxy apparatus having a semiconductor substrate transport mechanism according to the present invention, and FIG.
The figure is a cross-sectional view taken along line B-B in Figure 5, and Figure 1 is C in Figure 5.
-C sectional view, FIG. 7 is a DD sectional view of FIG. 1, and FIG. 8 is a perspective view showing a part of the semiconductor substrate transport mechanism shown in FIG. 1. In the figure, 14 is a vacuum chamber connected to the transfer chamber 2, 19 is a semiconductor substrate insertion opening provided in the vacuum chamber 14, 17 is a rail provided in the horizontal direction in the transfer chamber 2, and 16 is a section on the rail 17. The carriage 16 is a traveling carriage and is driven by a drive device (not shown). 15 is a cassette provided vertically movably within the vacuum chamber 14;
The cassette 15 is driven vertically by a drive device (not shown), and the abfe surface of the cassette 15
The cdhg surface has a large opening, and the carriage 16 travels inside the cassette 15 through the opening. 2
1 is a plurality of horizontal shelves provided inside the cassette 15; 20 is a plurality of openings provided on the ABCD surfaces of the cassette 15; The fork 18 enters the cassette 15 through the opening 20.

この半導体基板搬送機構においては、まずフオ
ーク18に半導体基板8を載置したのち、フオー
ク18を挿入口19から真空槽14内に挿入し、
さらに開口20を通してカセツト15内に進入さ
せる。つぎに、カセツト15を所定距離だけつま
り定寸上昇させることにより、棚21に基板8を
載置したのち、フオーク18を第1図に示す位置
まで後退させ、カセツト15を定寸上昇させて、
次の開口20をフオーク18が進入可能な位置に
位置決めする。このような操作を繰返して、カセ
ツト15の全ての棚21に基板8を載置したの
ち、挿入口19を閉じ、搬送室2、真空槽14内
を真空状態にする。ついで、台車16をカセツト
15内に進入させたのち、カセツト15を定寸下
降させることにより、最下部の棚21に載置され
た基板8を台車16上に積載し、台車16を処理
室3の正面まで走行し、搬送室2に設けられた基
板昇降装置(図示せず)により、台車16上の基
板8を定寸上昇させ、フオーク29を搬送室2内
に進入させ、基板昇降装置で基板8を下降するこ
とにより、基板8をフオーク29上に載置する。
つぎに、ゲートバルブ6aを開き、フオーク29
により基板8を処理室3内に持込み、フオーク2
9を元の位置に戻し、ゲートバルブ6aを閉じ、
処理室3を超高真空に排気したのち、基板8を処
理する。ついで、ゲートバルブ6aを開き、フオ
ーク29により処理を終えた基板8を処理室3内
から搬送室2内に取出し、基板昇降装置でフオー
ク29上の基板8を上昇し、フオーク29を元の
位置に戻し、基板昇降装置で基板8を下降して、
基板8を台車16上に積載し、台車16で基板8
を所定場所まで搬送する。このような操作を繰返
して、基板8を順次処理する。
In this semiconductor substrate transfer mechanism, first, the semiconductor substrate 8 is placed on the fork 18, and then the fork 18 is inserted into the vacuum chamber 14 from the insertion port 19.
Further, it is introduced into the cassette 15 through the opening 20. Next, the substrate 8 is placed on the shelf 21 by raising the cassette 15 by a predetermined distance, that is, by a fixed amount, and then the fork 18 is retreated to the position shown in FIG. 1, and the cassette 15 is raised by a fixed amount.
The next opening 20 is positioned at a position where the fork 18 can enter. After repeating these operations to place the substrates 8 on all the shelves 21 of the cassette 15, the insertion port 19 is closed and the inside of the transfer chamber 2 and the vacuum chamber 14 are brought into a vacuum state. Next, after the trolley 16 is advanced into the cassette 15, the cassette 15 is lowered by a certain distance to load the substrates 8 placed on the lowest shelf 21 onto the trolley 16, and the trolley 16 is moved into the processing chamber 3. The substrate 8 on the trolley 16 is raised by a certain distance by a substrate lifting device (not shown) provided in the transfer chamber 2, the fork 29 is entered into the transfer chamber 2, and the substrate lifting device (not shown) is installed in the transfer chamber 2. By lowering the substrate 8, the substrate 8 is placed on the fork 29.
Next, open the gate valve 6a and
The substrate 8 is brought into the processing chamber 3 by the fork 2.
9 to its original position, close the gate valve 6a,
After the processing chamber 3 is evacuated to ultra-high vacuum, the substrate 8 is processed. Next, the gate valve 6a is opened, the processed substrate 8 is taken out from the processing chamber 3 into the transfer chamber 2 by the fork 29, and the substrate 8 on the fork 29 is raised by the substrate lifting device, and the fork 29 is returned to its original position. , lower the board 8 using the board lifting device, and
The board 8 is loaded on the trolley 16, and the board 8 is loaded on the trolley 16.
transport to the designated location. Such operations are repeated to sequentially process the substrates 8.

このように、台車16によつて基板8を1枚ず
つ搬送するから、台車16で搬送すべき重量が非
常に小さい。また、基板昇降装置およびフオーク
29により、基板8を台車16上から処理室3内
に簡単な操作で供給することが可能である。さら
に、従来のようにカセツト15を大気中に取出す
必要がなく、カセツト15を真空槽14内に常置
するから、カセツト15の表面に付着したガスや
水が真空槽14内でアウトガスとして飛び出し、
処理室3の超高真空域への到達を困難にすること
がない。
In this way, since the substrates 8 are transported one by one by the trolley 16, the weight to be transported by the trolley 16 is very small. Furthermore, the substrate lifting device and the fork 29 allow the substrate 8 to be supplied from the trolley 16 into the processing chamber 3 with a simple operation. Furthermore, since the cassette 15 does not need to be taken out into the atmosphere as in the conventional case and is permanently placed in the vacuum chamber 14, gas and water adhering to the surface of the cassette 15 escape as outgas within the vacuum chamber 14.
It does not make it difficult to reach the ultra-high vacuum region of the processing chamber 3.

第9図はこの発明に係る半導体基板搬送機構を
有する他の分子線エピタキシ装置を示す一部断面
図、第10図は第9図のE−E断面図、第11図
は第9図のF−F断面図である。図において、4
a,4bはゲートバルブ6bを介して搬送室2に
連絡された半導体基板処理室、14a〜14cは
搬送室2に連結された真空槽、15a〜15cは
真空槽14a〜14c内に設けられたカセツト
で、カセツト15a〜15cの構造は第1図等に
示したカセツト15の構造と同様である。22a
〜22cは真空槽14a〜14cに連結された予
備排気室で、予備排気室22a〜22c内にはカ
セツト(図示せず)が設けられ、かつ蓋(図示せ
ず)が設けられており、蓋を開いて上記カセツト
に基板8を載置することができ、さらに予備排気
室22a〜22cはそれぞれ独立した真空ポンプ
(図示せず)によつて排気可能である。28a〜
28cは真空槽14a〜14cと予備排気室22
a〜22cとの間に設けられたゲートバルブ、1
6a,16bはカセツト15a,15bとカセツ
ト15b,15cとの間を走行する搬送台車、2
9a〜29cは処理室3,4a,4b内に進入可
能なフオークである。
FIG. 9 is a partial sectional view showing another molecular beam epitaxy apparatus having a semiconductor substrate transport mechanism according to the present invention, FIG. 10 is a sectional view taken along line E-E in FIG. 9, and FIG. -F sectional view. In the figure, 4
14a to 14c are vacuum chambers connected to the transfer chamber 2, and 15a to 15c are provided within the vacuum chambers 14a to 14c. The structure of cassettes 15a to 15c is similar to the structure of cassette 15 shown in FIG. 22a
22c is a pre-evacuation chamber connected to the vacuum chambers 14a-14c, and a cassette (not shown) is provided in the pre-evacuation chamber 22a-22c, and a lid (not shown) is provided. The substrate 8 can be placed in the cassette by opening the cassette, and the preliminary evacuation chambers 22a to 22c can be evacuated by independent vacuum pumps (not shown). 28a~
28c is the vacuum chamber 14a to 14c and the preliminary exhaust chamber 22
A gate valve provided between a to 22c, 1
Reference numerals 6a and 16b refer to conveyance carts 2 that run between the cassettes 15a and 15b and the cassettes 15b and 15c;
9a to 29c are forks that can enter into the processing chambers 3, 4a, and 4b.

この半導体基板搬送装置においては、まず予備
排気室22aの蓋を開き、予備排気室22a内の
カセツトに基板8を載置したのち、上記蓋を閉
じ、予備排気室22a内を真空排気する。つい
で、ゲートバルブ28aを開き、フオーク18a
により基板8を予備排気室22a内のカセツトか
らカセツト15aに移す。つぎに、台車16aに
より基板8を処理室3の正面まで搬送し、フオー
ク29aにより処理室3内に基板8を持込む。つ
いで、フオーク29aにより処理が終了した基板
8を台車16a上に積載し、台車16aをカセツ
ト15bまで走行させ、カセツト15bを定寸上
昇させることにより、棚21に基板8を載置す
る。このような操作を繰返すことにより、処理室
3での処理が終了した基板8をカセツト15bの
棚21に載置する。つぎに、台車16bにより基
板8を処理室4a,4bの正面まで搬送し、フオ
ーク29b,29cにより処理室4a,4b内に
持込み、処理室4a,4bでの処理が終了した基
板をカセツト15cの棚21に載置する。つい
で、予備排気室22cを真空排気したのち、ゲー
トバルブ28cを開き、フオーク18cをカセツ
ト15c内に進入させ、カセツト15cを定寸下
降させることにより、基板8をフオーク18cに
載置し、フオーク18cを元の位置まで戻し、フ
オーク18c上の基板を予備排気室22c内のカ
セツトに移す。このような操作を繰返すことによ
り、カセツト15cの棚21に載置された基板8
を全て予備排気室22c内のカセツトに移したの
ち、ゲートバルブ28cを閉じ、予備排気室22
cの蓋を開いて、予備排気室22c内の基板8を
取出す。なお、処理室3での処理が終了した基板
8をカセツト15bから予備排気室22bを介し
て取出してもよい。
In this semiconductor substrate transfer apparatus, the lid of the pre-evacuation chamber 22a is first opened, the substrate 8 is placed in a cassette within the pre-evacuation chamber 22a, the lid is closed, and the interior of the pre-evacuation chamber 22a is evacuated. Then, open the gate valve 28a and open the fork 18a.
The substrate 8 is transferred from the cassette in the preliminary evacuation chamber 22a to the cassette 15a. Next, the substrate 8 is transported to the front of the processing chamber 3 by the cart 16a, and the substrate 8 is brought into the processing chamber 3 by the fork 29a. Next, the substrates 8 that have been processed by the fork 29a are loaded onto the cart 16a, the cart 16a is driven to the cassette 15b, and the substrate 8 is placed on the shelf 21 by raising the cassette 15b by a certain amount. By repeating such operations, the substrate 8 that has been processed in the processing chamber 3 is placed on the shelf 21 of the cassette 15b. Next, the substrate 8 is transported to the front of the processing chambers 4a, 4b by the trolley 16b, brought into the processing chambers 4a, 4b by forks 29b, 29c, and the substrates that have been processed in the processing chambers 4a, 4b are placed in the cassette 15c. Place it on the shelf 21. Next, after evacuating the pre-evacuation chamber 22c, the gate valve 28c is opened, the fork 18c is advanced into the cassette 15c, and the cassette 15c is lowered by a certain distance to place the substrate 8 on the fork 18c, and the fork 18c is returned to its original position, and the substrate on the fork 18c is transferred to the cassette in the preliminary evacuation chamber 22c. By repeating such operations, the substrate 8 placed on the shelf 21 of the cassette 15c
After all of the gas is transferred to the cassette in the preliminary exhaust chamber 22c, the gate valve 28c is closed and the preliminary exhaust chamber 22
Open the lid of c and take out the substrate 8 inside the preliminary evacuation chamber 22c. Note that the substrate 8 that has been processed in the processing chamber 3 may be taken out from the cassette 15b via the preliminary exhaust chamber 22b.

このように、予備排気室22a〜22cを設け
れば、搬送室2内が大気圧になることがないの
で、処理室3,4a,4b内の超高真空領域への
到達が極めて容易である。また、搬送室2の中間
にカセツト15を設け、2台の台車16a,16
bを設ければ、台車16a,16bの走行距離を
短かくすることができるから、台車16a,16
bの駆動装置が非常に簡単になるとともに、台車
16a,16bの操作が容易となる。したがつ
て、真空下で行なう複数プロセスの一貫処理を行
なう生産ラインが可能となる。
In this way, by providing the preliminary exhaust chambers 22a to 22c, the pressure inside the transfer chamber 2 does not reach atmospheric pressure, so it is extremely easy to reach the ultra-high vacuum region within the processing chambers 3, 4a, and 4b. . In addition, a cassette 15 is provided in the middle of the transfer chamber 2, and two carts 16a, 16
b, the traveling distance of the carts 16a, 16b can be shortened.
The driving device b becomes very simple, and the carriages 16a, 16b can be easily operated. Therefore, it becomes possible to create a production line that carries out integrated processing of multiple processes under vacuum.

なお、上述実施例においては、分子線エピタキ
シ装置の半導体基板搬送機構について説明した
が、他の真空装置の半導体基板搬送機構、大気中
における半導体基板搬送機構にもこの発明を適用
可能である。
In the above-mentioned embodiments, the semiconductor substrate transport mechanism of a molecular beam epitaxy apparatus has been described, but the present invention can also be applied to a semiconductor substrate transport mechanism of other vacuum apparatuses or a semiconductor substrate transport mechanism in the atmosphere.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、この発明に係る半導体基
板搬送機構においては、カセツトの棚に半導体基
板を載置した状態で、搬送台車をカセツト内に進
入させたのち、カセツトを下降することにより、
1枚の半導体基板を搬送台車に積載することがで
きる。このため、搬送台車で搬送すべき重量が非
常に小さいから、搬送台車の駆動装置を小型にす
ることができるとともに、搬送台車の操作性を向
上することが可能である。このように、この発明
の効果は顕著である。
As explained above, in the semiconductor substrate transport mechanism according to the present invention, by moving the transport vehicle into the cassette with the semiconductor substrate placed on the shelf of the cassette, and then lowering the cassette,
One semiconductor substrate can be loaded onto the carrier. Therefore, since the weight to be transported by the transport vehicle is very small, the drive device for the transport vehicle can be downsized, and the operability of the transport vehicle can be improved. As described above, the effects of this invention are remarkable.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は第5図のC−C断面図、第2図は従来
の半導体基板搬送機構を有する分子線エピタキシ
装置を示す概略図、第3図は第2図のA−A断面
図、第4図は第2図、第3図に示した半導体基板
搬送機構のカセツトを示す斜視図、第5図はこの
発明に係る分子線エピタキシ装置を示す概略図、
第6図は第5図のB−B断面図、第7図は第1図
のD−D断面図、第8図は第1図に示した半導体
基板搬送機構の一部を示す斜視図、第9図はこの
発明に係る半導体基板搬送機構を有する他の分子
線エピタキシ装置を示す一部断面図、第10図は
第9図のE−E断面図、第11図は第9図のF−
F断面図である。 2……半導体基板搬送室、8……半導体基板、
14,14a〜14c……真空槽、15,15a
〜15c……カセツト、16,16a,16b…
…搬送台車、17……レール、18,18a〜1
8c……フオーク。
1 is a sectional view taken along the line CC in FIG. 5, FIG. 2 is a schematic diagram showing a molecular beam epitaxy apparatus having a conventional semiconductor substrate transport mechanism, and FIG. 4 is a perspective view showing a cassette of the semiconductor substrate transport mechanism shown in FIGS. 2 and 3, and FIG. 5 is a schematic diagram showing a molecular beam epitaxy apparatus according to the present invention.
6 is a sectional view taken along line BB in FIG. 5, FIG. 7 is a sectional view taken along line DD in FIG. 1, and FIG. 8 is a perspective view showing a part of the semiconductor substrate transport mechanism shown in FIG. FIG. 9 is a partial sectional view showing another molecular beam epitaxy apparatus having a semiconductor substrate transport mechanism according to the present invention, FIG. 10 is a sectional view taken along line EE in FIG. 9, and FIG. −
It is an F sectional view. 2... Semiconductor substrate transfer chamber, 8... Semiconductor substrate,
14, 14a to 14c...vacuum chamber, 15, 15a
~15c...Cassette, 16, 16a, 16b...
...Transportation truck, 17...Rail, 18, 18a~1
8c...fork.

Claims (1)

【特許請求の範囲】 1 半導体基板を加工する処理室に接続された搬
送室内で上記半導体基板を搬送する半導体基板搬
送機構において、上記搬送室内に水平方向にレー
ルを設け、上記レール上を走行する搬送台車を設
け、垂直方向に移動可能でありかつ内部を上記搬
送台車が走行可能であるカセツトを常置し、上記
カセツトの内部に水平な複数の棚を設けたことを
特徴とする半導体基板搬送機構。 2 上記レールと直交する方向から上記カセツト
内に進入可能なフオークを設け、上記カセツトに
上記進入手段が進入する開口部を設けたことを特
徴とする特許請求の範囲第1項記載の半導体基板
搬送機構。
[Scope of Claims] 1. In a semiconductor substrate transport mechanism that transports the semiconductor substrate within a transport chamber connected to a processing chamber for processing semiconductor substrates, a rail is provided in the horizontal direction within the transport chamber, and the semiconductor substrate travels on the rail. A semiconductor substrate transport mechanism characterized in that a transport vehicle is provided, a cassette that is vertically movable and within which the transport vehicle can run is permanently placed, and a plurality of horizontal shelves are provided inside the cassette. . 2. Semiconductor substrate transport according to claim 1, characterized in that a fork capable of entering into the cassette from a direction perpendicular to the rail is provided, and an opening into which the entering means enters is provided in the cassette. mechanism.
JP10996384A 1984-05-30 1984-05-30 Carrying mechanism for semiconductor substrate Granted JPS60254627A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10996384A JPS60254627A (en) 1984-05-30 1984-05-30 Carrying mechanism for semiconductor substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10996384A JPS60254627A (en) 1984-05-30 1984-05-30 Carrying mechanism for semiconductor substrate

Publications (2)

Publication Number Publication Date
JPS60254627A JPS60254627A (en) 1985-12-16
JPH0580825B2 true JPH0580825B2 (en) 1993-11-10

Family

ID=14523583

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10996384A Granted JPS60254627A (en) 1984-05-30 1984-05-30 Carrying mechanism for semiconductor substrate

Country Status (1)

Country Link
JP (1) JPS60254627A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100338951B1 (en) * 1999-12-18 2002-05-31 박종섭 Magazine in/out apparatus for semiconductor manufacturing bake oven

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57145312A (en) * 1981-01-27 1982-09-08 Instruments Sa Semiconductor producing material treating facility
JPS58168252A (en) * 1982-03-29 1983-10-04 Toshiba Corp Manufacture of semiconductor device
JPS5950538A (en) * 1982-09-17 1984-03-23 Hitachi Ltd Wafer carrier
JPS59171135A (en) * 1983-03-18 1984-09-27 Hitachi Ltd Wafer conveying device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57145312A (en) * 1981-01-27 1982-09-08 Instruments Sa Semiconductor producing material treating facility
JPS58168252A (en) * 1982-03-29 1983-10-04 Toshiba Corp Manufacture of semiconductor device
JPS5950538A (en) * 1982-09-17 1984-03-23 Hitachi Ltd Wafer carrier
JPS59171135A (en) * 1983-03-18 1984-09-27 Hitachi Ltd Wafer conveying device

Also Published As

Publication number Publication date
JPS60254627A (en) 1985-12-16

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