JPH0578762B2 - - Google Patents
Info
- Publication number
- JPH0578762B2 JPH0578762B2 JP1317485A JP1317485A JPH0578762B2 JP H0578762 B2 JPH0578762 B2 JP H0578762B2 JP 1317485 A JP1317485 A JP 1317485A JP 1317485 A JP1317485 A JP 1317485A JP H0578762 B2 JPH0578762 B2 JP H0578762B2
- Authority
- JP
- Japan
- Prior art keywords
- paint film
- metal particles
- thickness
- infrared
- film thickness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000003973 paint Substances 0.000 claims description 39
- 239000002923 metal particle Substances 0.000 claims description 23
- 238000012545 processing Methods 0.000 claims description 20
- 238000012937 correction Methods 0.000 claims description 9
- 239000010408 film Substances 0.000 description 42
- 238000000034 method Methods 0.000 description 12
- 239000011248 coating agent Substances 0.000 description 10
- 238000000576 coating method Methods 0.000 description 10
- 239000002184 metal Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000011835 investigation Methods 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Description
【発明の詳細な説明】
（産業上の利用分野）
本発明は金属粒子を含有する有機塗装膜厚みを
赤外線で測定する測定装置の改良発明に関する。DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to an improved invention for a measuring device for measuring the thickness of an organic coating film containing metal particles using infrared rays.
（従来の技術）
従来、塗装膜厚み測定方法として赤外線を塗装
板に照射し塗装膜を透過させ、原板表面で反射し
て帰つてくる反射光量を検出器によつて測定する
ことにより、塗装膜厚みを求める赤外線式測定方
法（ホーム社、薄膜工学ハンドブツク昭和39年５
月25日発行）や、JIS Ｈ 0401に規程されている
付着量試験（以下重量法）により重量を求め、こ
の重量より膜厚みを計算することが知られてい
る。これは、単位面積の塗装膜試料を採取して、
その試料の重量を測定し、その後塗装膜を剥離
し、原板の重量を測定してその重量差から塗装膜
厚みを計算によりもとめるものである。(Prior art) Conventionally, as a method for measuring the thickness of a paint film, infrared rays are irradiated onto a paint board, transmitted through the paint film, and the amount of reflected light reflected from the surface of the original board is measured using a detector. Infrared measurement method for determining thickness (Homesha, Thin Film Engineering Handbook, May 1960)
It is known that the weight is determined by the adhesion weight test (hereinafter referred to as the gravimetric method) prescribed in JIS H 0401 (issued on the 25th of May) and the thickness of the film is calculated from this weight. This is done by collecting a paint film sample of a unit area,
The weight of the sample is measured, the paint film is then peeled off, the weight of the original plate is measured, and the thickness of the paint film is calculated from the weight difference.
しかし金属粒子を含有する有機塗装膜厚みは、
重量法で測定した結果を真とした場合に赤外線式
で測定した結果と比較すると重量法に対して赤外
線式の測定結果はばらつきが大きく信頼性に欠
け、重量法に変わる金属粒子を含有する有機塗装
膜厚みの測定手段としては適していなかつた。 However, the thickness of the organic paint film containing metal particles is
When comparing the results measured by the gravimetric method with the results measured by the infrared method, the measurement results of the infrared method vary widely and lack reliability compared to the gravimetric method. It was not suitable as a means of measuring paint film thickness.
（発明の目的、構成）
本発明者等は金属粒子を含む有機塗装膜厚み測
定装置における赤外線式塗装膜厚み測定結果のば
らつきについて種々調査・研究した結果、ばらつ
きは塗料に含まれる金属粒子の成分に起因してい
ることがわかり、その成分値を赤外線式塗装膜厚
み測定装置から得られた塗装膜厚み信号に対し重
回帰式に基く成分補正演算を行うことにより重量
法による金属粒子を含む有機塗装膜厚みの測定結
果とに相関が得られることを見出したものでその
特徴は、金属粒子を含む有機塗装膜厚みを測定す
る赤外線式塗装膜測定装置において塗装膜中の金
属粒子の種類・量ごとの成分値を保持する成分値
保持器と該保持器からの各金属粒子の成分値に基
いて、補正係数、成分比率を演算する演算処理装
置と赤外線反射光量より求めた塗装膜厚みを前記
演算処理装置の出力信号で補正演算処理する信号
処理装置とにより、金属粒子を含む有機塗装膜厚
みを補正することを特徴とする赤外線式塗装膜厚
み測定装置である。(Objective and Structure of the Invention) As a result of various investigations and studies by the present inventors regarding the variations in the results of infrared coating film thickness measurement using an organic coating film thickness measuring device containing metal particles, the inventors have found that the variations are due to the components of the metal particles contained in the paint. The component values were calculated based on a multiple regression equation on the paint film thickness signal obtained from the infrared paint film thickness measuring device, and the organic It was discovered that a correlation can be obtained between the measurement results of paint film thickness, and the feature is that an infrared paint film measuring device that measures the thickness of organic paint films containing metal particles can detect the type and amount of metal particles in the paint film. Based on the component value holder that holds the component value of each metal particle, and the component value of each metal particle from the holder, a calculation processing device that calculates the correction coefficient and component ratio, and the coating film thickness determined from the amount of infrared reflected light are The present invention is an infrared paint film thickness measuring device characterized in that the thickness of an organic paint film containing metal particles is corrected by a signal processing device that performs correction calculation processing using an output signal of the arithmetic processing device.
（実施例及び作用）
以下、本発明装置を図面に示す実施例装置によ
り詳細に説明する。(Embodiments and Effects) The apparatus of the present invention will be explained in detail below using embodiment apparatuses shown in the drawings.
第１図は赤外線式による測定方法の一例で１は
金属板、１′は被測定物体である金属粒子含有の
有機塗装膜、２は赤外線を発生させる光源、３は
照射光、４は塗装膜を構成する金属粒子、５は反
射光、６は反射光量検出器、７は信号処理装置、
８は成分値保持器、９は演算処理装置、１０は出
力表示装置である。 Figure 1 shows an example of an infrared measurement method. 1 is a metal plate, 1' is an organic coating film containing metal particles as the object to be measured, 2 is a light source that generates infrared rays, 3 is irradiation light, and 4 is the coating film. 5 is reflected light, 6 is a reflected light amount detector, 7 is a signal processing device,
8 is a component value holder, 9 is an arithmetic processing unit, and 10 is an output display device.
従来の測定装置では、被測定物体１′に光源２
より照射光（赤外線）３を照射する。照射光３は
被測定物体１′の表面で反射され、１部は被測定
物体１′に入射され、透過光は１′に含まれる金属
粒子４により反射・吸収・散乱を受け金属板１の
表面で反射し、その反射光はまた金属粒子４によ
り反射吸収・散乱を受けて被測定物体１′の外へ
出る。外へ出た反射光５は反射光量検出器６で検
出され、ここで電気信号に変換し、出力信号は信
号処理装置７に入力される。信号処理装置７によ
り反射光量は塗装膜厚みに換算され、出力表示装
置１０に表示させるものである。 In a conventional measuring device, a light source 2 is attached to the object 1' to be measured.
The irradiation light (infrared rays) 3 is irradiated. The irradiated light 3 is reflected by the surface of the object to be measured 1', a part of which is incident on the object to be measured 1', and the transmitted light is reflected, absorbed, and scattered by the metal particles 4 included in the object 1'. It is reflected by the surface, and the reflected light is also reflected, absorbed, and scattered by the metal particles 4 and exits the object to be measured 1'. The reflected light 5 going outside is detected by a reflected light amount detector 6, where it is converted into an electrical signal, and the output signal is input to a signal processing device 7. The amount of reflected light is converted into the thickness of the coating film by the signal processing device 7, and is displayed on the output display device 10.
しかし、その表示された塗装膜厚みと重量法で
同じ塗装膜を測定した金属膜厚みを比較してみる
と第２図に示すように両者の間には相関が見られ
ず、赤外線式による測定結果は信頼性に欠けるも
のであつた。そのばらつきについて発明者等は、
種々調査、研究した結果、塗料に含まれる金属粒
子の成分に起因していることがわかり、第１図の
点線わく内に示す補正係数を演算する手段を測定
装置に付加したものである。 However, when comparing the displayed paint film thickness with the metal film thickness measured using the gravimetric method of the same paint film, as shown in Figure 2, there was no correlation between the two. The results were unreliable. Regarding the variation, the inventors
As a result of various investigations and studies, it was found that the problem was caused by the components of metal particles contained in the paint, and a means for calculating the correction coefficient shown within the dotted line box in FIG. 1 was added to the measuring device.
被測定対象である塗装膜１′に含まれる金属粒
子４により反射・吸収・散乱した反射光５は反射
光量検出器６で検出され、ここで電気信号に変換
された出力信号は、信号処理装置７に入力され
る。信号処理装置７により反射光量の電気信号は
塗装膜厚み（PV）に換算されるが、このときに
塗膜中の金属粒子の種類及び量からそれぞれの種
類ごとの成分値をあらかじめ設定してある成分値
保持器８より演算処理装置９に出力し、この出力
信号に基いて演算処理装置９で補正係数、成分比
率をあらかじめ求め、この補正係数、成分比率で
上記、赤外線方式の膜厚計で得られる塗装膜厚み
信号を重回帰式に基いて成分補正演算処理を行う
ことにより金属粒子を含む有機塗装膜厚みを精度
良く算出するものである。その結果を第３図に示
す。第３図からもわかるように補正した膜厚みは
重量法による膜厚みに対してばらつきが少なく同
等の精度が得られることがわかる。 The reflected light 5 reflected, absorbed, and scattered by the metal particles 4 included in the coating film 1' that is the object to be measured is detected by a reflected light amount detector 6, and the output signal converted into an electrical signal is sent to a signal processing device. 7 is input. The electric signal representing the amount of reflected light is converted into paint film thickness (PV) by the signal processing device 7. At this time, component values for each type are preset based on the type and amount of metal particles in the paint film. The component value holder 8 outputs the signal to the arithmetic processing unit 9, and based on this output signal, the arithmetic processing unit 9 determines the correction coefficient and component ratio in advance. The thickness of an organic paint film containing metal particles can be calculated with high accuracy by performing component correction calculation processing on the obtained paint film thickness signal based on a multiple regression equation. The results are shown in FIG. As can be seen from FIG. 3, the corrected film thickness has less variation than the film thickness determined by the gravimetric method, and the same accuracy can be obtained.
信号処理装置７で行う成分補正演算重回帰式の
一例を下記に示す。 An example of a multiple regression equation for component correction calculation performed by the signal processing device 7 is shown below.
μ＝PV−a0／ρ｛（a1−ao）y1＋（a2−ao）y2＋……
＋（ao-1−ao）yo-1＋ao｝
しかし
μ：塗装膜厚み
PV：塗装膜厚み信号
yo：金属粒子の成分比率
ao：金属粒子の各成分値に基く補正係数
ρ：有機塗料の比重
a0：定数
（発明の効果）
以上説明したように本発明は、従来の赤外線式
塗装膜厚み計を改良し、塗装膜厚み測定をオンラ
インで連続的に精度良く行うことができ、又、重
量法のようにサンプルを採取してオフラインで塗
装膜厚み測定をするという工程をとらず金属板に
塗料を塗布しながら、信頼性のある塗装膜厚み管
理が行えるものであり効果大なるものがある。 μ＝PV−a 0 /ρ{(a 1 −a o )y 1 +(a 2 −a o )y 2 +……
+(a o-1 −a o )y o-1 +a o } However, μ: Paint film thickness PV: Paint film thickness signal y o : Component ratio of metal particles a o : Correction coefficient based on the value of each component of metal particles ρ: specific gravity of the organic paint a 0 : constant (effect of the invention) As explained above, the present invention improves the conventional infrared paint film thickness meter to continuously and accurately measure paint film thickness online. Moreover, it is possible to reliably control the coating film thickness while applying the paint to the metal plate without the process of taking a sample and measuring the coating film thickness off-line as in the gravimetric method. There are some things that are very effective.
第１図は本発明の実施例赤外線式塗装膜厚み測
定装置を示す図、第２図は塗装膜厚みの重量法と
従来法との関係を示す図、第３図は改良法との関
係を示す図である。
１……金属板、１′……塗装膜、２……赤外線
光源、３……照射光、４……金属粒子、５……反
射光、６……反射光量検査器、７……信号処理装
置、８……成分値保持器、９……演算処理装置、
１０……出力表示装置。
Figure 1 is a diagram showing an infrared paint film thickness measuring device according to an embodiment of the present invention, Figure 2 is a diagram showing the relationship between the gravimetric method and the conventional method for measuring paint film thickness, and Figure 3 is a diagram showing the relationship with the improved method. FIG. 1... Metal plate, 1'... Paint film, 2... Infrared light source, 3... Irradiation light, 4... Metal particles, 5... Reflected light, 6... Reflected light amount tester, 7... Signal processing Device, 8... component value holder, 9... arithmetic processing unit,
10...Output display device.
Claims (1)
線式塗装膜測定装置において塗装膜中の金属粒子
の種類、量ごとの成分値を保持する成分値保持器
と該保持器からの各金属粒子の成分値に基いて、
補正係数、成分比率を演算する演算処理装置と赤
外線反射光量より求めた塗装膜厚みを前記演算処
理装置の出力信号で補正演算処理する信号処理装
置とにより金属粒子を含む有機塗装膜厚みを補正
することを特徴とする赤外線式塗装膜厚み測定装
置。1 In an infrared paint film measuring device that measures the thickness of organic paint containing metal particles, a component value holder that holds component values for each type and amount of metal particles in the paint film, and a component of each metal particle from the holder. Based on the value
The thickness of the organic paint film containing metal particles is corrected by a calculation processing device that calculates correction coefficients and component ratios, and a signal processing device that performs correction calculation processing on the paint film thickness determined from the amount of infrared reflected light using the output signal of the calculation processing device. An infrared paint film thickness measuring device characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1317485A JPS61172002A (en) | 1985-01-25 | 1985-01-25 | Infrared ray type coating film thickness measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1317485A JPS61172002A (en) | 1985-01-25 | 1985-01-25 | Infrared ray type coating film thickness measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61172002A JPS61172002A (en) | 1986-08-02 |
| JPH0578762B2 true JPH0578762B2 (en) | 1993-10-29 |
Family
ID=11825816
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1317485A Granted JPS61172002A (en) | 1985-01-25 | 1985-01-25 | Infrared ray type coating film thickness measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61172002A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104703804A (en) * | 2012-09-26 | 2015-06-10 | Rr当纳利欧洲有限公司 | Method of measurement of aromatic varnish application |
| US9127333B2 (en) | 2007-04-25 | 2015-09-08 | Lance Jacobsen | Liquid injection of VCL4 into superheated TiCL4 for the production of Ti-V alloy powder |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5203832B2 (en) * | 2008-07-24 | 2013-06-05 | 東海旅客鉄道株式会社 | Film thickness measurement method |
| JP6456615B2 (en) * | 2014-07-10 | 2019-01-23 | 中国塗料株式会社 | Coating composition and coating film forming method |
| CN110926351B (en) * | 2019-12-30 | 2021-05-18 | 中国建材检验认证集团浙江有限公司 | Method for measuring thickness of coating or plating layer of light steel keel for building |
-
1985
- 1985-01-25 JP JP1317485A patent/JPS61172002A/en active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9127333B2 (en) | 2007-04-25 | 2015-09-08 | Lance Jacobsen | Liquid injection of VCL4 into superheated TiCL4 for the production of Ti-V alloy powder |
| CN104703804A (en) * | 2012-09-26 | 2015-06-10 | Rr当纳利欧洲有限公司 | Method of measurement of aromatic varnish application |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61172002A (en) | 1986-08-02 |
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