JPH0574182B2 - - Google Patents

Info

Publication number
JPH0574182B2
JPH0574182B2 JP59046172A JP4617284A JPH0574182B2 JP H0574182 B2 JPH0574182 B2 JP H0574182B2 JP 59046172 A JP59046172 A JP 59046172A JP 4617284 A JP4617284 A JP 4617284A JP H0574182 B2 JPH0574182 B2 JP H0574182B2
Authority
JP
Japan
Prior art keywords
sample
analysis
exchange pipe
preliminary
rod
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59046172A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60189853A (ja
Inventor
Teruji Hirai
Takeshi Araki
Hideto Furumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP59046172A priority Critical patent/JPS60189853A/ja
Publication of JPS60189853A publication Critical patent/JPS60189853A/ja
Publication of JPH0574182B2 publication Critical patent/JPH0574182B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/18Vacuum locks ; Means for obtaining or maintaining the desired pressure within the vessel

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Electron Tubes For Measurement (AREA)
JP59046172A 1984-03-10 1984-03-10 試料交換装置 Granted JPS60189853A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59046172A JPS60189853A (ja) 1984-03-10 1984-03-10 試料交換装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59046172A JPS60189853A (ja) 1984-03-10 1984-03-10 試料交換装置

Publications (2)

Publication Number Publication Date
JPS60189853A JPS60189853A (ja) 1985-09-27
JPH0574182B2 true JPH0574182B2 (zh) 1993-10-15

Family

ID=12739603

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59046172A Granted JPS60189853A (ja) 1984-03-10 1984-03-10 試料交換装置

Country Status (1)

Country Link
JP (1) JPS60189853A (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5032076B2 (ja) * 2006-09-12 2012-09-26 株式会社テクノフロント 質量分析装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57138758A (en) * 1981-02-20 1982-08-27 Nippon Telegr & Teleph Corp <Ntt> Sample exchange device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53161686U (zh) * 1977-05-20 1978-12-18

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57138758A (en) * 1981-02-20 1982-08-27 Nippon Telegr & Teleph Corp <Ntt> Sample exchange device

Also Published As

Publication number Publication date
JPS60189853A (ja) 1985-09-27

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