JPH0556459B2 - - Google Patents

Info

Publication number
JPH0556459B2
JPH0556459B2 JP59118819A JP11881984A JPH0556459B2 JP H0556459 B2 JPH0556459 B2 JP H0556459B2 JP 59118819 A JP59118819 A JP 59118819A JP 11881984 A JP11881984 A JP 11881984A JP H0556459 B2 JPH0556459 B2 JP H0556459B2
Authority
JP
Japan
Prior art keywords
sample
light
grid electrode
anode
wavelength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59118819A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60262042A (ja
Inventor
Masayuki Uda
Fumiaki Kirihata
Sukenori Shirohashi
Hiroshi Ishida
Shinji Marutani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Riken Keiki KK
Hochiki Corp
RIKEN
Original Assignee
Riken Keiki KK
Hochiki Corp
RIKEN
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Riken Keiki KK, Hochiki Corp, RIKEN filed Critical Riken Keiki KK
Priority to JP59118819A priority Critical patent/JPS60262042A/ja
Publication of JPS60262042A publication Critical patent/JPS60262042A/ja
Publication of JPH0556459B2 publication Critical patent/JPH0556459B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
    • G01N23/2273—Measuring photoelectron spectrum, e.g. electron spectroscopy for chemical analysis [ESCA] or X-ray photoelectron spectroscopy [XPS]

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP59118819A 1984-06-09 1984-06-09 光電的仕事関数測定方法 Granted JPS60262042A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59118819A JPS60262042A (ja) 1984-06-09 1984-06-09 光電的仕事関数測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59118819A JPS60262042A (ja) 1984-06-09 1984-06-09 光電的仕事関数測定方法

Publications (2)

Publication Number Publication Date
JPS60262042A JPS60262042A (ja) 1985-12-25
JPH0556459B2 true JPH0556459B2 (enrdf_load_stackoverflow) 1993-08-19

Family

ID=14745921

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59118819A Granted JPS60262042A (ja) 1984-06-09 1984-06-09 光電的仕事関数測定方法

Country Status (1)

Country Link
JP (1) JPS60262042A (enrdf_load_stackoverflow)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57161643A (en) * 1981-03-31 1982-10-05 Matsushita Electric Works Ltd Measuring device for work function

Also Published As

Publication number Publication date
JPS60262042A (ja) 1985-12-25

Similar Documents

Publication Publication Date Title
Cottrell et al. Characteristics of a multichannel electrooptical detection system and its application to the analysis of large molecules by fast atom bombardment mass spectrometry
Karstensen et al. Absolute cross sections for single and double ionisation of Mg atoms by electron impact
JPH0556459B2 (enrdf_load_stackoverflow)
JPH0376841B2 (enrdf_load_stackoverflow)
JP2637871B2 (ja) Ｘ線計数管
JP2000357487A (ja) 質量分析装置
WO1998036268A1 (en) Charged particle analysis
CN212871466U (zh) 一种无损检测极紫外激光脉冲能量及光束空间位置的装置
JP3481031B2 (ja) 二重円筒形オープンカウンター
CN114487743A (zh) 一种微通道板收集效率测试系统及测试方法
JPH0437390B2 (enrdf_load_stackoverflow)
WO2009048697A1 (en) Apparatus and method for measuring vapor flux density
JPH0556460B2 (enrdf_load_stackoverflow)
Newburgh Photoelectric Emission Phenomena in LiF and KCl in the Extreme Ultraviolet
JP3140557B2 (ja) レーザイオン化中性粒子質量分析装置及びこれを用いる分析法
JPH057581Y2 (enrdf_load_stackoverflow)
JP4216375B2 (ja) 二次電子増倍素子を使用した測定方法及び二次電子増倍素子を使用した装置
Leskovar The afterpulse time spectra of high-speed photon detectors
JP2003068245A (ja) 定量的なエネルギー補正機能を持つ飛行時間型質量分析器
JPH0573189B2 (enrdf_load_stackoverflow)
JPH0573190B2 (enrdf_load_stackoverflow)
JPS63293847A (ja) 半導体検査装置
JPH07294459A (ja) スパッタ中性粒子質量分析方法
JPS63167256A (ja) 電子計数装置
SU1372254A1 (ru) Способ диагностики электрических полей в электронных приборах с магнитной изол цией

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term