JPH0555442U - Vacuum processing device - Google Patents

Vacuum processing device

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Publication number
JPH0555442U
JPH0555442U JP11450591U JP11450591U JPH0555442U JP H0555442 U JPH0555442 U JP H0555442U JP 11450591 U JP11450591 U JP 11450591U JP 11450591 U JP11450591 U JP 11450591U JP H0555442 U JPH0555442 U JP H0555442U
Authority
JP
Japan
Prior art keywords
chamber
vacuum processing
holder
processing chamber
vacuum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11450591U
Other languages
Japanese (ja)
Inventor
穣太 藤田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nissin Electric Co Ltd
Original Assignee
Nissin Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nissin Electric Co Ltd filed Critical Nissin Electric Co Ltd
Priority to JP11450591U priority Critical patent/JPH0555442U/en
Publication of JPH0555442U publication Critical patent/JPH0555442U/en
Pending legal-status Critical Current

Links

Abstract

(57)【要約】 【目的】 真空処理室に予備室を設けた場合、真空処理
室内の真空本引きに要する時間ならびに真空処理後の排
気に要する時間の短縮を図ることを目的とする。 【構成】 真空処理室の背面に予備室を設ける。真空処
理室内に被処理物を搬入したとき、被処理物のホルダー
と一体のゲートによって真空処理室を閉塞する。真空処
理室から被処理物を搬出したときは、ゲートバルブを閉
じて真空処理室を予備室から分離する。
(57) [Summary] [Purpose] When a preliminary chamber is provided in the vacuum processing chamber, the purpose is to reduce the time required for main vacuuming in the vacuum processing chamber and the time required for exhausting after the vacuum processing. [Structure] A backup chamber is provided on the back of the vacuum processing chamber. When the object to be processed is carried into the vacuum processing chamber, the vacuum processing chamber is closed by a gate integrated with the holder of the processing object. When the object to be processed is carried out from the vacuum processing chamber, the gate valve is closed to separate the vacuum processing chamber from the preliminary chamber.

Description

【考案の詳細な説明】[Detailed description of the device]

【0001】[0001]

【産業上の利用分野】[Industrial application]

本考案は真空処理装置に関する。 The present invention relates to a vacuum processing device.

【0002】[0002]

【従来の技術】[Prior Art]

一般に真空処理装置では、真空処理室にゲートバルブを介して予備室を連設し ておき、被処理物を真空処理室内に搬送出するときに、この予備室を利用するこ とはよく知られている。 Generally, in a vacuum processing apparatus, it is well known that a preliminary chamber is provided in series in the vacuum processing chamber via a gate valve, and the preliminary chamber is used when an object to be processed is transferred into the vacuum processing chamber. ing.

【0003】 図4はその従来例を示すもので、この例は半導体などの基板にイオンを注入処 理するイオン注入処理装置であり、1は真空処理室であるところの、イオンを照 射する照射室、2はイオン源、3は予備室で、ゲートバルブ4を介して照射室1 に連設されてある。5は被処理物である基板、6は基板5を搬送する搬送機構、 7は搬送機構6に支持されているホルダーである。FIG. 4 shows a conventional example thereof. This example shows an ion implantation processing apparatus for implanting ions into a substrate such as a semiconductor. Reference numeral 1 denotes a vacuum processing chamber for irradiating ions. The irradiation chamber 2 is an ion source and 3 is a preliminary chamber, which is connected to the irradiation chamber 1 via a gate valve 4. Reference numeral 5 denotes a substrate which is an object to be processed, 6 a transport mechanism for transporting the substrate 5, and 7 a holder supported by the transport mechanism 6.

【0004】 基板5を照射室1内に搬入するときは、まず予備室3の蓋8を開いて予備室3 内のホルダー7に基板5を取り付け、そのあと蓋8を閉じてから予備室3内を真 空粗引きを行なう。そして真空度がたとえば0.1Torr程度になったとき、 その粗引きを止め、ゲートバルブ4を開く。これによって予備室3と照射室1と は連通されるので、予備室3は照射室1側の真空ポンプにより本引きされる。When loading the substrate 5 into the irradiation chamber 1, first, the lid 8 of the auxiliary chamber 3 is opened, the substrate 5 is attached to the holder 7 in the auxiliary chamber 3, and then the lid 8 is closed and then the auxiliary chamber 3 is closed. The inside is roughly evacuated. Then, when the degree of vacuum reaches, for example, about 0.1 Torr, the roughing is stopped and the gate valve 4 is opened. As a result, the preliminary chamber 3 and the irradiation chamber 1 are communicated with each other, so that the preliminary chamber 3 is pulled by the vacuum pump on the irradiation chamber 1 side.

【0005】 ゲートバルブ4を開いたあと、搬送機構6によってホルダー7が照射室1内の 所定の位置(図中点線で示す。)まで搬送され、停止される。そして照射室1内 が所定の真空度になったあと、イオン源ガスを流し、イオン源2からのイオンを 基板5に向けて矢印方向に照射する。After opening the gate valve 4, the holder 7 is conveyed to a predetermined position (indicated by a dotted line in the drawing) in the irradiation chamber 1 by the conveying mechanism 6 and stopped. Then, after the inside of the irradiation chamber 1 has reached a predetermined degree of vacuum, an ion source gas is caused to flow, and ions from the ion source 2 are directed toward the substrate 5 in the direction of the arrow.

【0006】 イオン照射後イオン源ガスを止め、イオン源ガスを充分排気してからホルダー 7を予備室3内に引き込む。そしてゲートバルブ4を閉じ、予備室3を大気に戻 し、基板5を予備室3から取り出す。以上によってイオン注入処理を完了する。After the ion irradiation, the ion source gas is stopped, the ion source gas is sufficiently exhausted, and then the holder 7 is drawn into the auxiliary chamber 3. Then, the gate valve 4 is closed, the preliminary chamber 3 is returned to the atmosphere, and the substrate 5 is taken out of the preliminary chamber 3. This completes the ion implantation process.

【0007】 しかしこのような構成によると、基板5を照射室1内に搬入したときは、ホル ダー7と搬送機構6とはつながっているため、ゲートバルブ4は開放されたまま となる。そのため大気にさらされていた予備室3およびゲートバルブ4内を照射 室1内と同様に高真空にする必要がある。そのため照射室1内の本引き時間に要 する時間は極めて長くなる。また有害ガスであるイオン源ガスが予備室3内に流 入するため、イオン照射後は内部を充分排気する必要があるし、またその排気に 要する時間も長くなる。However, according to such a configuration, when the substrate 5 is loaded into the irradiation chamber 1, the holder 7 and the transport mechanism 6 are connected to each other, so that the gate valve 4 remains open. Therefore, it is necessary to make the interior of the preparatory chamber 3 and the gate valve 4 exposed to the atmosphere as high as the interior of the irradiation chamber 1. Therefore, the time required for the main drawing in the irradiation chamber 1 becomes extremely long. Further, since the ion source gas, which is a harmful gas, flows into the auxiliary chamber 3, it is necessary to sufficiently exhaust the inside after the ion irradiation, and the time required for the exhaust becomes long.

【0008】[0008]

【考案が解決しようとする課題】[Problems to be solved by the device]

本考案は、真空処理室に予備室を連設した真空処理装置において、被処理物を 真空処理室内に搬入したあとの真空本引きに要する時間の短縮を図るとともに、 真空処理後の排気に要する時間の短縮を図ることを目的とする。 The present invention aims to reduce the time required for main vacuuming after the object to be processed is carried into the vacuum processing chamber in a vacuum processing apparatus in which a preliminary chamber is connected to the vacuum processing chamber, and to exhaust gas after vacuum processing. The purpose is to reduce the time.

【0009】[0009]

【課題を解決するための手段】[Means for Solving the Problems]

本考案は、真空処理室の背面に設けられた予備室と、予備室を貫通し、かつ長 さ方向に沿って可動自在の可動軸と、この可動軸の先端にあって、真空処理室の 被処理物搬送口を通って内部に搬入自在の被処理物支持用のホルダーと、可動軸 の先端側にあって、ホルダーが被処理物搬送口より真空処理室に搬入されたとき に被処理物搬送口を閉塞するゲートと、ホルダーが予備室内まで戻された状態に おいて、予備室と真空処理室との間を閉塞するゲートバルブと、によって構成し たことを特徴とする。 The present invention has a backup chamber provided on the back surface of the vacuum processing chamber, a movable shaft penetrating the backup chamber and movable along the length direction, and a movable shaft at the tip of the movable shaft. A holder for supporting the processed object that can be loaded into the vacuum processing chamber through the processed object transfer port, and a holder on the tip side of the movable shaft that is processed when the holder is transferred from the processed object transfer port to the vacuum processing chamber. It is characterized in that it is constituted by a gate that closes the material transfer port and a gate valve that closes the space between the preliminary chamber and the vacuum processing chamber when the holder is returned to the preliminary chamber.

【0010】[0010]

【作用】[Action]

最初にホルダーが予備室内にあるように可動軸を引き戻しておく。そしてホル ダーに被処理物を支持する。その間予備室と真空処理室とはゲートバルブによっ て遮断されている。被処理物を真空処理するときは、予備室内を真空粗引きをし てからゲートバルブを開き、可動軸を照射室側に向けて駆動する。ゲートバルブ を開いたとき、予備室は真空処理室側の真空ポンプによって真空に引かれる。 First, pull back the movable shaft so that the holder is in the spare room. Then, the holder supports the object to be processed. Meanwhile, the spare chamber and the vacuum processing chamber are shut off by a gate valve. When vacuum-treating an object to be processed, the preliminary chamber is roughly vacuumed and then the gate valve is opened to drive the movable shaft toward the irradiation chamber. When the gate valve is opened, the auxiliary chamber is evacuated by the vacuum pump on the vacuum processing chamber side.

【0011】 可動軸の駆動によって、ホルダーが真空処理室の内部に被処理物搬送口を通っ て到達したとき、被処理物搬送口は可動軸に取り付けられているゲートによって 閉塞される。このあと真空処理室は引き続き真空ポンプによって真空本引きされ る。この場合の真空引きは真空処理室の内部だけであるから、短時間のうちに真 空引きが可能となる。このあと照射室内に真空処理用のガスが供給され、被処理 物は真空処理室内で所要の真空処理が実行される。When the holder reaches the inside of the vacuum processing chamber through the workpiece transfer port by driving the movable shaft, the workpiece transfer port is closed by the gate attached to the movable shaft. After this, the vacuum processing chamber is continuously vacuumed by a vacuum pump. In this case, since vacuuming is performed only inside the vacuum processing chamber, vacuuming can be performed in a short time. After that, a gas for vacuum processing is supplied into the irradiation chamber, and the object to be processed is subjected to required vacuum processing in the vacuum processing chamber.

【0012】 この真空処理が終了すると真空処理室内のガスが排気される。この場合ガスは 予備室内には入っていないので、そのガス排気は真空処理室内だけの排気でよい ため、その排気に要する時間は短くてすむ。そのあと可動軸は戻され、これによ ってホルダーが予備室内に戻ったとき、ゲートバルブが閉じられて、真空処理室 と予備室との間を遮断する。そのあとホルダーから被処理物を取外し、新たな被 処理物を取り付けて、次の真空処理作業に移る。When the vacuum processing is completed, the gas in the vacuum processing chamber is exhausted. In this case, since the gas is not contained in the spare chamber, the gas can be exhausted only from the vacuum processing chamber, so the time required for the exhaust can be short. After that, the movable shaft is returned, so that when the holder is returned to the preparatory chamber, the gate valve is closed to shut off between the vacuum processing chamber and the preparatory chamber. After that, remove the object to be processed from the holder, attach a new object to be processed, and move to the next vacuum processing operation.

【0013】[0013]

【実施例】【Example】

本考案の実施例を図によって説明する。なお図4と同じ符号を付した部分は同 一または対応する部分を示す。本考案にしたがい、予備室3は真空処理室すなわ ち照射室1の背面(イオンの照射方向に沿う背面)側に設置される。11は照射 室1の背面に設けられてあるホルダー搬入口である。 An embodiment of the present invention will be described with reference to the drawings. In addition, the same reference numerals as those in FIG. 4 indicate the same or corresponding portions. According to the present invention, the auxiliary chamber 3 is installed on the back side (the back side along the ion irradiation direction) of the vacuum processing chamber, that is, the irradiation chamber 1. Reference numeral 11 denotes a holder carry-in port provided on the back surface of the irradiation chamber 1.

【0014】 予備室3と照射室1との間に、両者を遮断するのに使用するゲートバルブ4が 設けてある。14はゲートバルブ4のゲート弁、15はその駆動軸、16はシー ル材である。このシール材16ならびに以下の説明におけるシール材は、たとえ ばOリングからなり、真空気密が可能となるものである。Between the preliminary chamber 3 and the irradiation chamber 1, there is provided a gate valve 4 used to shut off the two. Reference numeral 14 is a gate valve of the gate valve 4, 15 is a drive shaft thereof, and 16 is a seal material. The sealing material 16 and the sealing material in the following description are, for example, O-rings, and are vacuum-tight.

【0015】 予備室3はゲートバルブ4に対して蝶番17によって、図3に示すように開放 自在とされている。18は予備室3をゲートバルブ4に対して閉塞したとき、そ の閉塞面の気密を維持するシール材である。The spare chamber 3 is openable with respect to the gate valve 4 by a hinge 17 as shown in FIG. Reference numeral 18 denotes a seal material that maintains the airtightness of the closed surface when the auxiliary chamber 3 is closed with respect to the gate valve 4.

【0016】 ホルダー7は可動軸19の先端に支持されている。またこの可動軸19の先端 側にはホルダー搬入口11を閉塞するゲート20が設けられている。21はゲー ト20がホルダー搬入口11を閉塞したとき、その閉塞面の気密を維持するシー ル材である。The holder 7 is supported at the tip of a movable shaft 19. Further, a gate 20 for closing the holder carry-in port 11 is provided on the tip side of the movable shaft 19. Reference numeral 21 is a seal member that maintains the airtightness of the closed surface when the gate 20 closes the holder inlet 11.

【0017】 可動軸19は予備室3を貫通し、外部に導出されている。その外端はシリンダ (たとえばエアーシリンダ)22のピストンロッド23に連結部材24を介して 連結されている。したがってピストンロッド23の伸縮によって可動軸19はそ の長手方向に沿って進退自在とされる。シリンダ22は予備室3に支持されてい る。可動軸19は予備室3を気密を維持してスライドされる。25はその気密を 維持するシール材である。The movable shaft 19 penetrates through the auxiliary chamber 3 and is led to the outside. The outer end thereof is connected to a piston rod 23 of a cylinder (for example, an air cylinder) 22 via a connecting member 24. Therefore, the movable shaft 19 can be moved back and forth along its longitudinal direction by the expansion and contraction of the piston rod 23. The cylinder 22 is supported in the auxiliary chamber 3. The movable shaft 19 is slid while keeping the auxiliary chamber 3 airtight. Reference numeral 25 is a sealing material that maintains its airtightness.

【0018】 真空処理すなわちイオン注入処理は次のようにして行なう。最初にゲートバル ブ4をゲート弁14によって閉じておいて、図3に示すように予備室3を開き、 ホルダー7に被処理物である基板5を設置する。次に図2に示すように予備室3 を閉じてから、予備室3内を所要の真空ポンプによって真空粗引きを行なう。The vacuum process, that is, the ion implantation process is performed as follows. First, the gate valve 4 is closed by the gate valve 14, the preparatory chamber 3 is opened as shown in FIG. 3, and the substrate 5, which is an object to be processed, is placed in the holder 7. Next, as shown in FIG. 2, the preliminary chamber 3 is closed, and then the preliminary chamber 3 is vacuum-evacuated by a required vacuum pump.

【0019】 この真空粗引きを完了したあと、その粗引きを停止し、続いてゲートバルブ4 を開き、可動軸19を予備室3から照射室1に向けて送り出す。そしてホルダー 7をホルダー搬入口11より照射室1内に挿入する。このときゲート20によっ てホルダー搬入口11は閉塞され、照射室1と予備室3とは仕切られる。After this rough vacuuming is completed, the roughing is stopped, the gate valve 4 is subsequently opened, and the movable shaft 19 is sent from the preliminary chamber 3 toward the irradiation chamber 1. Then, the holder 7 is inserted into the irradiation chamber 1 through the holder carry-in port 11. At this time, the holder carry-in port 11 is closed by the gate 20, and the irradiation chamber 1 and the auxiliary chamber 3 are partitioned.

【0020】 なおゲートバルブ4を開いたとき、照射室1と予備室3が連通するので、この ときは照射室1側の真空ポンプによって予備室3は真空引きされる。またゲート 20によるホルダー搬入口11の閉塞は、シリンダー22による加圧力によって 維持される。When the gate valve 4 is opened, the irradiation chamber 1 and the auxiliary chamber 3 communicate with each other. At this time, the auxiliary chamber 3 is evacuated by the vacuum pump on the irradiation chamber 1 side. Further, the blockage of the holder inlet 11 by the gate 20 is maintained by the pressure applied by the cylinder 22.

【0021】 この場合、照射室1と予備室3とが連通するのは、ゲートバルブ4を開いてか らゲート20がホルダー搬送口11を閉塞するまでであり、その間の時間は極め て短い(たとえば数秒程度)。In this case, the irradiation chamber 1 and the preparatory chamber 3 communicate with each other from the time when the gate valve 4 is opened until the gate 20 closes the holder transfer port 11, and the time between them is extremely short ( For example, about a few seconds).

【0022】 これによりゲート20がホルダー搬入口11を閉塞した状態においては、それ まで大気に曝されていた部分のうち、照射室1内に面する個所は、基板5と、ホ ルダー7のホルダー搬入口11に向い合う面だけとなる。したがって以後の照射 室1内の真空本引きは、従来のように大気に曝された予備室などの真空引きを必 要としないことになり、短時間ですむようになる。As a result, in the state where the gate 20 closes the holder carry-in port 11, of the portion exposed to the atmosphere until then, the portion facing the irradiation chamber 1 is the substrate 5 and the holder of the holder 7. Only the surface facing the carry-in port 11 is provided. Therefore, the subsequent main vacuuming in the irradiation chamber 1 does not need to be vacuumed in the preliminary chamber exposed to the air as in the conventional case, and thus can be completed in a short time.

【0023】 照射室1内の真空本引きが終了したあと、照射室1内にイオン源ガスを供給し て、およびイオン源2からのイオンを基板5に照射する。この場合イオン源ガス は従来のように予備室3内には入らない。そのためイオン注入を終えたあと、こ のイオン源ガスを照射室1から排気するのに、照射室1内の排気だけですむこと により、その排気に要する時間も短くてすむ。After the main vacuum drawing in the irradiation chamber 1 is completed, an ion source gas is supplied into the irradiation chamber 1 and the substrate 5 is irradiated with ions from the ion source 2. In this case, the ion source gas does not enter the spare chamber 3 as in the conventional case. For this reason, after the ion implantation is completed, this ion source gas can be exhausted from the irradiation chamber 1 only by exhausting the gas inside the irradiation chamber 1, so that the time required for the exhaust can be shortened.

【0024】 所要のイオン照射を終了したあとは、可動軸19を予備室3内に戻し、ゲート バルブ4を閉じて照射室1を閉塞する。そして予備室3を開放してホルダー20 より基板5を取外す。以後これを必要により繰り返す。After the required ion irradiation is completed, the movable shaft 19 is returned to the inside of the preliminary chamber 3, and the gate valve 4 is closed to close the irradiation chamber 1. Then, the preliminary chamber 3 is opened and the substrate 5 is removed from the holder 20. Thereafter, this is repeated if necessary.

【0025】 なおイオン照射を照射室1内で実行しているときに予備室3内を真空ポンプに よつて高真空にしておくと、その照射を終えたあとゲート20がホルダー搬入口 11を開いたとき、照射室1内を高真空に保持できるようになって都合が良い。If ionization is performed in the irradiation chamber 1 and the interior of the auxiliary chamber 3 is set to a high vacuum by a vacuum pump, the gate 20 opens the holder carry-in port 11 after the irradiation is completed. In this case, the inside of the irradiation chamber 1 can be maintained in a high vacuum, which is convenient.

【0026】[0026]

【考案の効果】[Effect of the device]

以上説明したように本考案によれば、真空処理室に被処理物の搬入出に利用す る予備室を設けた場合、被処理物を真空処理室内に搬入したあとの真空本引きに 要する時間ならびに真空処理後の排気に要する時間の短縮を図ることができる効 果を奏する。 As described above, according to the present invention, when the vacuum processing chamber is provided with the preliminary chamber used for loading and unloading of the workpiece, the time required for the main vacuuming after the workpiece is loaded into the vacuum processing chamber. In addition, the time required for evacuation after vacuum processing can be shortened.

【図面の簡単な説明】[Brief description of drawings]

【図1】本考案の実施例を示すもので、真空処理状態に
おける断面図である。
FIG. 1 shows an embodiment of the present invention and is a sectional view in a vacuum processing state.

【図2】被処理物を真空処理室内に搬入出する前後の状
態を示す断面図である。
FIG. 2 is a cross-sectional view showing a state before and after carrying in and out an object to be processed in a vacuum processing chamber.

【図3】被処理物をホルダーに取り付け、取り出しする
状態を示す断面図である。
FIG. 3 is a cross-sectional view showing a state in which an object to be processed is attached to a holder and taken out.

【図4】従来の真空処理装置の断面図である。FIG. 4 is a sectional view of a conventional vacuum processing apparatus.

【符号の説明】[Explanation of symbols]

1 真空処理室 3 予備室 4 ゲートバルブ 5 被処理物 7 ホルダー 11 被処理物搬送口 19 可動軸 20 ゲート DESCRIPTION OF SYMBOLS 1 Vacuum processing chamber 3 Preliminary chamber 4 Gate valve 5 Processing object 7 Holder 11 Processing object transfer port 19 Movable shaft 20 Gate

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】 真空処理室の背面に設けられた予備室
と、前記予備室を貫通し、かつ長さ方向に沿って可動自
在の可動軸と、前記可動軸の先端にあって、前記真空処
理室の被処理物搬送口を通って内部に搬入自在の被処理
物支持用のホルダーと、前記可動軸の先端側にあって、
前記ホルダーが前記被処理物搬送口より前記真空処理室
に搬入されたときに、前記被処理物搬送口を閉塞するゲ
ートと、前記ホルダーが前記予備室内まで戻された状態
において、前記予備室と前記真空処理室との間を閉塞す
るゲートバルブとからなる真空処理装置。
1. A preliminary chamber provided on a back surface of a vacuum processing chamber, a movable shaft penetrating the preliminary chamber and movable along a length direction, and a vacuum provided at a tip of the movable shaft. A holder for supporting an object to be processed that can be carried into the inside through the object transfer port of the processing chamber, and on the tip side of the movable shaft,
A gate that closes the workpiece transfer port when the holder is carried into the vacuum processing chamber from the workpiece transfer port, and the preliminary chamber in a state where the holder is returned to the preliminary chamber. A vacuum processing apparatus comprising a gate valve that closes the vacuum processing chamber.
JP11450591U 1991-12-30 1991-12-30 Vacuum processing device Pending JPH0555442U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11450591U JPH0555442U (en) 1991-12-30 1991-12-30 Vacuum processing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11450591U JPH0555442U (en) 1991-12-30 1991-12-30 Vacuum processing device

Publications (1)

Publication Number Publication Date
JPH0555442U true JPH0555442U (en) 1993-07-23

Family

ID=14639438

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11450591U Pending JPH0555442U (en) 1991-12-30 1991-12-30 Vacuum processing device

Country Status (1)

Country Link
JP (1) JPH0555442U (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6258853B2 (en) * 1982-05-11 1987-12-08 Ntn Toyo Bearing Co Ltd
JPS63200446A (en) * 1987-02-13 1988-08-18 Jeol Ltd Sample exchange device in scanning type electron microscope or the like

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6258853B2 (en) * 1982-05-11 1987-12-08 Ntn Toyo Bearing Co Ltd
JPS63200446A (en) * 1987-02-13 1988-08-18 Jeol Ltd Sample exchange device in scanning type electron microscope or the like

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