JPH0245920A - Semiconductor manufacturing device - Google Patents

Semiconductor manufacturing device

Info

Publication number
JPH0245920A
JPH0245920A JP19696788A JP19696788A JPH0245920A JP H0245920 A JPH0245920 A JP H0245920A JP 19696788 A JP19696788 A JP 19696788A JP 19696788 A JP19696788 A JP 19696788A JP H0245920 A JPH0245920 A JP H0245920A
Authority
JP
Japan
Prior art keywords
wafer
exhaust chamber
gas
semiconductor manufacturing
preliminary exhaust
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19696788A
Other languages
Japanese (ja)
Inventor
Noriaki Nishida
典明 西田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Kyushu Ltd
Original Assignee
NEC Kyushu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Kyushu Ltd filed Critical NEC Kyushu Ltd
Priority to JP19696788A priority Critical patent/JPH0245920A/en
Publication of JPH0245920A publication Critical patent/JPH0245920A/en
Pending legal-status Critical Current

Links

Landscapes

  • Cleaning In General (AREA)
  • Prevention Of Fouling (AREA)
  • Drying Of Semiconductors (AREA)

Abstract

PURPOSE:To prevent any dust from entering a pre-exhaust chamber by forming a gas curtain at a delivery port of the pre-exhaust chamber. CONSTITUTION:The interior of a pre-exhaust chamber 1 is exhausted as indicated by arrow 7 once a wafer is accommodated, and a valve 4 is opened and the wafer is carried. When the wafer again returns into the exhaust chamber 1 is under atmospheric pressure, a door 3 of a wafer delivery port is opened for carrying in and out the wafer. Upon delivery of the wafer, gas is injected from a gas tube 2 disposed in the exhaust chamber 1 toward the outside as indicated by arrow 6 to form a gas curtain at the wafer delivery port. Thus, any dust is prevented from entering the exhaust chamber 1.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体製造装置に関し、特に予備排気室を有す
る半導体製造装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to semiconductor manufacturing equipment, and particularly to a semiconductor manufacturing equipment having a preliminary exhaust chamber.

〔従来の技術〕[Conventional technology]

従来、半導体製造装置は、予備排気室ヘウェーハを出し
入れする際外気が予備排気室内へ流れ込む構造となって
いた。
Conventionally, semiconductor manufacturing equipment has a structure in which outside air flows into the preliminary exhaust chamber when a wafer is taken into or taken out from the preliminary exhaust chamber.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来の半導体製造装置は、予備排気室ヘウェー
ハを出し入れする際、外気が予備排気室へ流れ込む構造
となっているので、ウェーハの出し入れ時に、予備排気
室内へ外気中のごみが入り込むという欠点があった。
The above-mentioned conventional semiconductor manufacturing equipment has a structure in which outside air flows into the preliminary exhaust chamber when wafers are taken in and out of the preliminary exhaust chamber, so there is a drawback that dust in the outside air enters the preliminary exhaust chamber when wafers are taken in and out of the preliminary exhaust chamber. there were.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の半導体製造装置は、予備排気室のウェーハ出し
入れ口にガスのカーテンを設けている。
In the semiconductor manufacturing apparatus of the present invention, a gas curtain is provided at the wafer inlet/outlet of the preliminary exhaust chamber.

〔実施例〕〔Example〕

次に、本発明の実施例について図面を参照して説明する
Next, embodiments of the present invention will be described with reference to the drawings.

第1図(a)、(b)は本発明の第1の実施例の断面図
及び正面図である。
FIGS. 1(a) and 1(b) are a sectional view and a front view of a first embodiment of the present invention.

ウェーハを収納する予備排気室1は搬送室5とバルブ4
で仕切られている。また、予備排気室1内はウェーハが
収納されると矢印7で示すように排気され、バルブ4が
開き2、ウェーハが搬送される。再びウェーハが予備排
気室に戻り、予備排気室1内が大気になると、ウェーハ
出し入れ口の扉3が開き、ウェーハの出し入れを行う。
A preliminary exhaust chamber 1 for storing wafers has a transfer chamber 5 and a valve 4.
It is separated by Further, when the wafer is stored in the preliminary exhaust chamber 1, the interior of the preliminary exhaust chamber 1 is evacuated as shown by the arrow 7, the valve 4 is opened 2, and the wafer is transported. When the wafer returns to the pre-evacuation chamber and the interior of the pre-evacuation chamber 1 becomes atmospheric, the door 3 of the wafer loading/unloading port is opened and the wafer is loaded/unloaded.

ウェーハ出し入れの際、予備排気室1内に設置したガス
管2より外に向けてガスが矢印6で示すように吹き出し
、ウェーハ出し入れ口にガスのカーテンを作る。
When loading and unloading wafers, gas is blown outward from a gas pipe 2 installed in a preliminary exhaust chamber 1 as shown by an arrow 6, creating a gas curtain at the wafer loading and unloading port.

第2図は本発明の第2の実施例の断面図及び正面図であ
る。
FIG. 2 is a sectional view and a front view of a second embodiment of the present invention.

ウェーハの出し入れを行う際、予備排気室1の扉3を開
けている間、ウェーハ出し入れ口の上・下に設けたガス
管2より外に向けて矢印6で示すようにガスが吹き出し
ウェーハ出し入れ口にガスのカーテンを作る。
When loading and unloading wafers, while the door 3 of the pre-exhaust chamber 1 is open, gas is blown outward from the gas pipes 2 provided above and below the wafer loading/unloading port as shown by arrows 6. Create a gas curtain.

この実施例ではガス管2が上・下に設置されているので
外からのごみの侵入を遮断する効果が大きいという利点
がある。
In this embodiment, since the gas pipes 2 are installed at the top and bottom, there is an advantage that the effect of blocking the intrusion of dust from the outside is great.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明は、予備排気室のウェーハ
出し入れ口にガスのカーテンを作るようにしたので、予
備排気室内に入り込むごみを遮断できる効果がある。
As described above, in the present invention, a gas curtain is formed at the wafer inlet/outlet of the pre-evacuation chamber, so that there is an effect of blocking dust from entering the pre-evacuation chamber.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(a)、(b)及び第2図(a)、(b)はそれ
ぞれ本発明の第1及び第2の実施例の断面図及び正面図
である。 1・・・予備排気室、2・・・ガス管、3・・・扉、4
・・・バルブ、5・・・搬送室。
1(a), (b) and FIG. 2(a), (b) are a sectional view and a front view of the first and second embodiments of the present invention, respectively. 1...Preliminary exhaust chamber, 2...Gas pipe, 3...Door, 4
... Valve, 5... Transfer chamber.

Claims (1)

【特許請求の範囲】[Claims] 半導体ウェーハを真空中で搬送する機構を有する半導体
製造装置において、前記ウェーハを収納する予備排気室
のウェーハ出し入れ口にガスのカーテンを設けたことを
特徴とする半導体製造装置。
1. A semiconductor manufacturing apparatus having a mechanism for transporting semiconductor wafers in a vacuum, characterized in that a gas curtain is provided at a wafer inlet/outlet of a preliminary evacuation chamber in which the wafers are stored.
JP19696788A 1988-08-05 1988-08-05 Semiconductor manufacturing device Pending JPH0245920A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19696788A JPH0245920A (en) 1988-08-05 1988-08-05 Semiconductor manufacturing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19696788A JPH0245920A (en) 1988-08-05 1988-08-05 Semiconductor manufacturing device

Publications (1)

Publication Number Publication Date
JPH0245920A true JPH0245920A (en) 1990-02-15

Family

ID=16366628

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19696788A Pending JPH0245920A (en) 1988-08-05 1988-08-05 Semiconductor manufacturing device

Country Status (1)

Country Link
JP (1) JPH0245920A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997014179A1 (en) * 1995-10-13 1997-04-17 Advanced Semiconductor Materials America, Inc. Semiconductor processing system with gas curtain
US6672864B2 (en) 2001-08-31 2004-01-06 Applied Materials, Inc. Method and apparatus for processing substrates in a system having high and low pressure areas
US8794896B2 (en) 2005-12-14 2014-08-05 Tokyo Electron Limited Vacuum processing apparatus and zonal airflow generating unit

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1997014179A1 (en) * 1995-10-13 1997-04-17 Advanced Semiconductor Materials America, Inc. Semiconductor processing system with gas curtain
US5997588A (en) * 1995-10-13 1999-12-07 Advanced Semiconductor Materials America, Inc. Semiconductor processing system with gas curtain
US6672864B2 (en) 2001-08-31 2004-01-06 Applied Materials, Inc. Method and apparatus for processing substrates in a system having high and low pressure areas
US8794896B2 (en) 2005-12-14 2014-08-05 Tokyo Electron Limited Vacuum processing apparatus and zonal airflow generating unit

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