JPH0554070B2 - - Google Patents

Info

Publication number
JPH0554070B2
JPH0554070B2 JP59020702A JP2070284A JPH0554070B2 JP H0554070 B2 JPH0554070 B2 JP H0554070B2 JP 59020702 A JP59020702 A JP 59020702A JP 2070284 A JP2070284 A JP 2070284A JP H0554070 B2 JPH0554070 B2 JP H0554070B2
Authority
JP
Japan
Prior art keywords
sweep
signal
level
slope
waveform
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59020702A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59148877A (ja
Inventor
Rodonii Burisutoru Roido
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of JPS59148877A publication Critical patent/JPS59148877A/ja
Publication of JPH0554070B2 publication Critical patent/JPH0554070B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/24—Time-base deflection circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K4/00—Generating pulses having essentially a finite slope or stepped portions
    • H03K4/06—Generating pulses having essentially a finite slope or stepped portions having triangular shape
    • H03K4/08—Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K4/00—Generating pulses having essentially a finite slope or stepped portions
    • H03K4/06—Generating pulses having essentially a finite slope or stepped portions having triangular shape
    • H03K4/08—Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape
    • H03K4/48—Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape using as active elements semiconductor devices
    • H03K4/50—Generating pulses having essentially a finite slope or stepped portions having triangular shape having sawtooth shape using as active elements semiconductor devices in which a sawtooth voltage is produced across a capacitor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Details Of Television Scanning (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Particle Accelerators (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
JP59020702A 1983-02-07 1984-02-07 掃引波形発生器用自動校正装置 Granted JPS59148877A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/464,286 US4581585A (en) 1983-02-07 1983-02-07 Apparatus and method for automatically calibrating a sweep waveform generator

Publications (2)

Publication Number Publication Date
JPS59148877A JPS59148877A (ja) 1984-08-25
JPH0554070B2 true JPH0554070B2 (OSRAM) 1993-08-11

Family

ID=23843290

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59020702A Granted JPS59148877A (ja) 1983-02-07 1984-02-07 掃引波形発生器用自動校正装置

Country Status (6)

Country Link
US (1) US4581585A (OSRAM)
JP (1) JPS59148877A (OSRAM)
DE (1) DE3404067A1 (OSRAM)
FR (1) FR2540635B1 (OSRAM)
GB (1) GB2134732B (OSRAM)
NL (1) NL187134C (OSRAM)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0181126B1 (en) * 1984-11-07 1988-12-14 National Nuclear Corporation Limited Signal synthesiser
US4799165A (en) * 1986-03-03 1989-01-17 Tektronix, Inc. Level detecting waveform sampling system
JPS62261069A (ja) * 1986-05-07 1987-11-13 Kenwood Corp オツシロスコ−プの掃引回路
US4808905A (en) * 1986-08-05 1989-02-28 Advanced Micro Devices, Inc. Current-limiting circuit
US4868465A (en) * 1986-08-29 1989-09-19 Tektronix, Inc. Sweep generator error characterization
JPS6384575U (OSRAM) * 1986-11-21 1988-06-02
US5012181A (en) * 1987-01-29 1991-04-30 John Fluke Mfg. Co., Inc. Apparatus for and method of internally calibrating an electrical calibrator
JPS63256862A (ja) * 1987-04-14 1988-10-24 Iwatsu Electric Co Ltd 掃引時間較正回路
US4841497A (en) * 1987-12-07 1989-06-20 Tektronix, Inc. Digital time base with corrected analog interpolation
US4933769A (en) * 1987-12-07 1990-06-12 U.S. Philips Corporation Picture display device including a staircase generator
US5184062A (en) * 1990-05-11 1993-02-02 Nicolet Instrument Corporation Dynamically calibrated trigger for oscilloscopes
EP0471119A1 (en) * 1990-08-14 1992-02-19 Hewlett-Packard Limited Waveform measurement
NL9001842A (nl) * 1990-08-20 1992-03-16 Philips Nv Meetinstrument en tijdbasisschakeling geschikt voor toepassing in een dergelijk meetinstrument.
DE4235317C2 (de) * 1991-11-01 1994-07-07 Hewlett Packard Co Steuerbare Verzögerungsschaltung
DE4244696C2 (de) * 1991-11-01 1995-05-18 Hewlett Packard Co Verfahren zum Kalibrieren einer steuerbaren Verzögerungsschaltung
US5283515A (en) * 1992-05-29 1994-02-01 Analog Devices, Inc. Automatic calibration system for a ramp voltage generator
KR960006301B1 (ko) * 1992-07-31 1996-05-13 주식회사코오롱 열수가용성 폴리에스테르의 제조방법
US5347176A (en) * 1993-02-17 1994-09-13 Hewlett-Packard Company Analog ramp generator with digital correction
GB9400078D0 (en) * 1994-01-05 1994-03-02 Smiths Industries Plc Ramp generator
US5594377A (en) * 1994-01-27 1997-01-14 Texas Instruments Incorporated Delay circuit for a write data precompensator system
US5537027A (en) * 1995-04-25 1996-07-16 Analog Devices, Inc. Calibration system for an asymmetrical ramp generator system
JP3514111B2 (ja) * 1997-07-09 2004-03-31 株式会社デンソー オフセット電圧補正回路
US7068087B2 (en) * 2004-02-24 2006-06-27 Tektronix, Inc. Method and apparatus for an improved timer circuit and pulse width detection
CN101409553B (zh) * 2008-11-20 2010-12-08 四川和芯微电子股份有限公司 一种相位延迟线器
EP3966585B1 (en) * 2019-05-10 2024-10-02 Westinghouse Electric Company Llc Calibration system and method
TWI819303B (zh) * 2021-05-04 2023-10-21 瑞昱半導體股份有限公司 斜坡訊號校正裝置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3571755A (en) * 1968-04-18 1971-03-23 Iwatsu Electric Co Ltd Sweep oscillator
US3603981A (en) * 1969-10-10 1971-09-07 Atomic Energy Commission Digitally controlled ramp generator
JPS5220146B2 (OSRAM) * 1972-12-20 1977-06-01
US3893036A (en) * 1973-07-27 1975-07-01 Tektronix Inc Precision function generator
US3914623A (en) * 1973-10-31 1975-10-21 Westinghouse Electric Corp Waveform generator including means for automatic slope calibration
US3971923A (en) * 1974-01-25 1976-07-27 The United States Of America As Represented By The Secretary Of The Navy Ramp function generator
DE2429183C3 (de) * 1974-06-18 1980-11-20 Philips Patentverwaltung Gmbh, 2000 Hamburg Schaltungsanordnung zum Erzeugen einer synchronisierten periodischen Spannung
US4105932A (en) * 1976-11-24 1978-08-08 Tektronix, Inc. "Slewed pulse" scope sweep calibrator
GB2090412B (en) * 1979-11-09 1984-07-18 Krautkraemer Gmbh Ultrasonic testing

Also Published As

Publication number Publication date
US4581585A (en) 1986-04-08
GB8401810D0 (en) 1984-02-29
JPS59148877A (ja) 1984-08-25
GB2134732A (en) 1984-08-15
GB2134732B (en) 1987-02-04
DE3404067C2 (OSRAM) 1988-01-21
FR2540635A1 (fr) 1984-08-10
NL187134C (nl) 1991-06-03
DE3404067A1 (de) 1984-08-16
FR2540635B1 (fr) 1987-04-17
NL8400325A (nl) 1984-09-03

Similar Documents

Publication Publication Date Title
JPH0554070B2 (OSRAM)
JPH0573176B2 (OSRAM)
JPH0124373B2 (OSRAM)
US4859936A (en) Method of and apparatus for determining AC calibration errors and apparatus using device with AC calibration errors
US4908623A (en) Apparatus and method for range control and supply voltage compensation in a dual slope analog to digital converter
AU638515B2 (en) Calibrated physical parameter value measurement system
US4527126A (en) AC parametric circuit having adjustable delay lock loop
US4933631A (en) Digital AC meter
US4628254A (en) Method for digitally measuring waveforms
EP0740234B1 (en) Delta-T measurement circuit
US4855968A (en) Time interval measurement system for analog oscilloscope
JPS635270A (ja) パルス測定回路
US4559521A (en) Calibration of a multi-slope A-D converter
JPH0547070B2 (OSRAM)
JPH01232821A (ja) 傾斜信号校正方法及びデジタル・タイム・ベース回路
US4868465A (en) Sweep generator error characterization
US6998834B2 (en) Real-time time drift adjustment for a TDR step stimulus
JPH077015B2 (ja) 傾斜波形発生器用自動校正装置
JPS63106568A (ja) 掃引波形発生器用自動校正装置
US5410245A (en) Method and apparatus for calibrating electronic scales for the horizontal axis
JP2850987B2 (ja) 周波数特性校正装置
JPH0664158B2 (ja) 自動時間間隔測定方法
JPS6218871B2 (OSRAM)
JPS5828543B2 (ja) オシロスコ−プ掃引回路
JPH0961503A (ja) 半導体試験装置における試験信号のタイミング校正装置