JPH0548112Y2 - - Google Patents

Description

[Detailed description of the invention] (Industrial application field) The present invention relates to a testing device for electrical components, for example,
The present invention relates to a device that tests whether various electrical components used in a vehicle operate normally.

(Prior Art) Generally, from the aspect of quality control, manufactured products are tested to see if they function satisfactorily in the final manufacturing process.

For example, in the case of automobile electrical components, they are similarly tested to see if they function properly before they are assembled into the vehicle, and only those that pass this test are installed into the vehicle. .

When conducting this test, for example,
As disclosed in Publication No. 139545, a test device configured with a base for each type of electrical component is used, and a test device according to the type is selected by a relay, and various electrical components are tested. The optimum voltage or current for testing the electrical components is supplied to each part of the product to determine whether the electrical components are normal or abnormal, and those determined to be normal are assembled into the vehicle.

(Problem to be solved by the invention) However, in such conventional electrical component testing equipment, it is necessary to prepare a number of electrical component test circuits corresponding to the types of electrical components; The test circuit was composed of a board, and a selection device composed of relays selected the test circuit for each type of electrical component to be tested. Not only is the equipment large, but if the types of electrical components to be tested increase or differ, it is necessary to change the specifications of the test circuit and the selected equipment. This requires a great deal of cost and time, and there is a problem in that it is not possible to quickly respond to changes in the type of electrical equipment to be tested.

The present invention was developed in view of the conventional problems described above, and it focuses on the types of test circuits, test patterns, and voltages and currents supplied to electrical components depending on the type of electrical components. The purpose of this invention is to provide a testing device for electrical components that solves the above problems by programming reference values for determining whether electrical components are normal or abnormal, and by processing this program using a microcomputer. be.

(Means for solving the problem) The present invention to achieve the above object changes the voltage, current, and test pattern to be supplied to the test object.
A reference load setting means for arbitrarily setting a variable value according to the type of the test object, an output means for outputting the voltage and current set by the reference load setting means to the test object, and from the output means. storage means for storing actual permissible values of voltage and current in the object under test when voltage and current are output to the object under test; a measuring means for detecting the voltage and current in the test object when the test object is present, and comparing the voltage and current values detected by the measuring means with the voltage and current tolerance values stored in the storage means; , a comparison judgment means for judging whether the voltage and current in the test object are within permissible values and outputting the result of this judgment, and a display means for displaying the judgment result output from the comparison judgment means. It is characterized by having the following.

(Function) With such a configuration, first, the reference load setting means 26 inputs the type information of the test object 13 from an external device connected here, and determines the type of the test object 13 and the test. The voltage and current are set according to the pattern, and the output means 27 outputs the set voltage and current to the test object 13.
Output to. Next, the measurement means 25 measures the voltage and current output from the output means 27 when the test object 13 is supplied with the voltage and current outputted from the output means 27.
The comparison/judgment means 3 looks up the tolerance values stored in the storage means 4 and determines whether the detected voltage and current are within the tolerance values stored in the storage means 4. It is determined whether or not there is a person there, and the result is outputted to the display means 5 to display the result of the determination. Such processing is repeated for all test patterns set in the reference load setting means, and the test on the test object is completed.

(Example) Hereinafter, an example of the present invention will be described based on the drawings.

FIG. 2 shows an overall configuration diagram of an electrical component testing apparatus according to the present invention.

A host computer 1 that outputs vehicle type information of electrical components as test objects to be sent to the production line outputs data from the high-level computer 1 to the electrical component testing equipment installed in the inspection process of the production line. It is connected via a data branching device 2 that branches to each computer. A main central processing unit 3 is connected to the data branching device 2 as a comparison/judgment means for comprehensively controlling the testing equipment for electrical components. A storage device 4 as a storage means storing comparison judgment data and display data, a CRT,
A display device 5 as a display means consisting of a printer, etc.; a data input/output device 6 consisting of a keyboard, a floppy disk, a hard disk, etc.; and a slave central processing unit 7 that executes a test program according to instructions from the main central processing unit 3. are connected.
Therefore, when the vehicle type information is output from the host computer 1, this information is input to the main central processing unit 3 via the branching device 2.
Based on this vehicle type information, the vehicle type data, test items, comparison judgment data, and display data corresponding to this car type are looked up from the storage device 4, and these data are output to the slave central processing unit 7. Become. Further, the slave central processing unit 7 includes a storage device 8 that stores test execution data for each vehicle type;
Operation box 9 for instructing the start and end of the test, etc.
, an operating box interface 10 of the vibration exciter 11 for vibrating the electrical components, a tester interface 14 for supplying power to the electrical components 13, an A/D converter 15, and a D/D converter 15.
The vibration exciter 11 and the electrical components 13 are connected to the A converter 16, and their operations are controlled by the slave central processing unit 7 based on commands from the operation box 9.

As a power source, a test power source 20 and a system power source 21 are provided from an uninterruptible power supply 19 connected to an external power source 18 which is a commercial power source.

In addition, electrical components 13 and test machine interface 1
A connector 17 is connected to the connection line connecting the 4 and 4, and thereby the electrical components can be quickly tested.

Here, the main central processing unit 3, the storage device 4, the secondary central processing unit 7, the D/A converter 16, and the storage device 8 constitute a reference load setting means, and the secondary central processing unit 7 and the test machine interface 14
The tester interface 14 and the A/D converter 15 constitute a measuring means.

3 to 5 show specific circuit diagrams showing the connection relationship among the tester interface 14, A/D converter 15, and D/A converter 16. The circuit shown in FIG. 3 is a circuit that applies a voltage supplied by the test power supply 20 to the electrical component 13 via the connector 17.

As shown in the figure, a test power supply 20 is connected to the connector 17 via a switching transistor 30, a resistor 31 and a variable resistor 32 connected in parallel, and the switching transistor 30 is turned on. Then, voltage will be applied to the connector 17. In addition, the A/D converter 15
includes a switching circuit 23, an amplifier 33, a resistor 34,
A variable resistor 32 is connected via 35,
The divided voltage of the variable resistor 32 amplified by the amplifier 33 is output to the A/D converter 15, where it is converted into digital data. Furthermore, the D/A converter 16 is connected to a comparator 38 via a resistor 36.
is connected to resistor 37 by this comparator 38
The voltage from the amplifier 33 input via the D/A
The voltage output from converter 16 is compared, and the signal from comparator 38 is output to flip-flop 39 via resistor 40. In the circuit, the diode 42 connected to the resistor 41 is a light emitting diode, and the inverter 4 connected to the base of the switching transistor 30
It is 3.

The circuit configured in this manner operates roughly as follows.

First, when a set signal is applied from the slave central processing unit 7 to the flip-flop 39, the output of the terminal of the flip-flop 39 becomes low, while the output of the inverter 43 becomes high, the switching transistor 30 is turned on, and the test signal is connected to the connector 17. A voltage from a power source 20 is applied. While the electrical component 13 is energized via the connector 17, the variable resistor 32 converts the current flowing into the electrical component 13 into voltage and outputs it to the amplifier 33.
The amplifier 33 amplifies this voltage by a predetermined time and converts it into an A/D
Output to converter 15 and comparator 38.
The A/D converter 15 converts the voltage output from the amplifier 33 into a digital value and outputs the digital value to the slave central processing unit 7. Then, the comparator 38 compares the voltage output from the D/A converter 16 and the voltage output from the amplifier 33, and the voltage output from the D/A converter 16 is higher than the voltage output from the amplifier 33. If it's big, flip-flop 39
is reset, and power supply to the electrical components 13 is stopped.
Note that the light emitting diode 42 remains lit while the electrical component 13 is energized, and the D/
The voltage output from the A converter 16 is set by the slave central processing unit 7 based on data from the main central processing unit 3 for each type of electrical component.

The circuit shown in FIG.
This circuit supplies current through 7.

As shown in the figure, a test power supply 20 is connected to the connector 17 via a transistor 50 and a resistor 51 and a variable resistor 52 connected in parallel. Current is supplied to the electrical component 13 via the electrical component 13. Further, a variable resistor 52 is connected to the A/D converter 15 via a switching circuit 23, an amplifier 53, and resistors 54, 55.
The partial voltage of the variable resistor 52 amplified by A/
The signal is output to the D converter 15, where it is converted into digital data. Furthermore, D/A converter 1
6 is connected to a differential amplifier 57 via a resistor 56, and the differential amplifier 57 connects the voltage from the amplifier 53 input via the resistor 58 and the voltage output from the D/A converter 16. The difference between the two is calculated, and the signal from the differential amplifier 57 is outputted to the transistor 50 via the resistor 59.

The circuit configured in this manner operates roughly as follows.

First, from the D/A converter 16, the voltage set by the secondary central processing unit 7 based on data from the main central processing unit 3 for each type of electrical component is applied to the differential amplifier 5.
7, this voltage is applied to the base of the transistor 50 via the resistor 59, and the transistor 50 supplies a current corresponding to the applied voltage to the electrical component 13 via the connector 17. do. Then, the electrical component 13 is connected via the connector 17.
While the current is being supplied to the variable resistor 52
converts the current flowing into the electrical component 13 into a voltage and outputs it to the amplifier 53, which amplifies this voltage by a predetermined factor and outputs it to the A/D converter 15 and the differential amplifier 57. A/D converter 1
5 converts the voltage output from the amplifier 53 into a digital value and outputs it to the slave central processing unit 7. Then, the differential amplifier 57 applies the difference between the voltage output from the D/A converter 16 and the voltage output from the amplifier 53 to the base of the transistor 50.

The circuit shown in FIG. 5 consists of an A/D
This is a switching circuit provided before the converter 15.

As shown in the figure, this switching circuit connects the amplifier 3
3 or 53 is led to an analog switch 61 via a resistor 60, and an amplifier 62 for amplifying the input voltage is connected to the analog switch 61. An A/D converter 15 is connected to this amplifier 62, and the A/D converter 15 converts an analog quantity into a digital quantity, which is output to the slave central processing unit 7. In addition, the analog switch 61
is switched by the decoder 63 to the slave central processing unit 7.
This is done based on the address signal output from.

The test apparatus of the present invention having each part configured as described above operates as described below based on the flowcharts shown in FIGS. 6 and 7. This operation will be explained with reference to FIGS. 2 to 5.

First, as a preparatory step, a worker takes out an electrical component (hereinafter, a car instrument panel will be specifically taken as an example) that is being transported by a conveyor installed on the production line (step 1), and 2
The removed instrument panel 13 is mounted on the hanger of the vibrator 11 as shown in the figure (step 2). Next, the operator connects the mounted instrument panel 13 to the test machine interface 14 via the connector 17 (step 3). The operator then presses the test start button provided on the operation box 9 (step 4).
When this test start button is pressed, this information is input to the secondary central processing unit 7 via the operation box interface 10, and the secondary central processing unit 7 outputs a request signal for vehicle model data to the main central processing unit 3. When the main central processing unit 3 instructs the vehicle type data (step 5), the slave central processing unit 7 raises the vibration exciter 11 via the vibration exciter interface 12 (step 6). When the vibrator 11 rises to a predetermined position, the instrument panel 13 is vibrated for a predetermined time. The reason for applying the vibration in this way is to perform the test under the actual running condition of the vehicle (step 7). When this vibration is finished, the slave central processing unit 7 causes the main central processing unit 3 to transfer all the data necessary for the test according to the type of the instrument panel 13, and the test execution data is stored. D/A based on data from storage device 8
It outputs predetermined data to the converter 16, supplies predetermined voltage and predetermined current to each device installed in the instrument panel 13 through the test machine interface 14 and connector 17, and actually connects each device. The A/D converter 15 detects the current flowing through the main central processing unit 3, and the detected value is transferred to the main central processing unit 3 by the slave central processing unit 7 (steps 8 and 9). The measurement data transferred from the secondary central processing unit 7 is input to the central processing unit 3, and the main central processing unit 3 looks up the comparison judgment data stored in the storage device 4, and calculates each voltage and voltage for each test item. It is determined whether each current is within the standard value, and if this determination is OK, it is determined whether the detected data is appropriate. If there is insufficient data, proceed to step 11 and retest. On the other hand, if the judgment of whether each voltage and each current is within the standard value for each test item is NG, the main central processing unit 3 The display device 5 displays the defect contents and the printer prints out the defect contents (steps 10, 11,
12, 13). Next, the slave central processing unit 7 determines whether all tests have been completed based on the vehicle type information transferred from the main central processing unit 3 (step
14), if the test is completed, the secondary central processing unit 7
outputs a test completion signal to the main central processing unit 3, and upon receiving this signal, the main central processing unit 3 displays the test results on the display device 5 and prints out the test results on the printer (step 1). 15, 16).

The operator then turns on the test completion button on the operation box 9 and disconnects the connector 7 connecting the instrument panel 13 (steps 17 and 18).
The contact information of the test completion button is input to the slave central processing unit 7 via the operation box interface 10, and the slave central processing unit 7 that receives this information lowers the vibrator 11 and ends the test (step 19). ).

The above describes the general flow of testing electrical components, and the operation of the electrical component testing apparatus of the present invention is as shown in the operational flowchart shown in FIG.

This operation flowchart will be explained in detail below. In the flowchart shown in the figure, what is written in the left column is an operation flowchart of the main central processing unit 3, and what is written in the right column is an operation flowchart of the slave central processing unit 7.

First, the main central processing unit 3 inputs vehicle type data from the host computer 1, retrieves vehicle type-specific data and test item data that match this vehicle type data from the storage device 4 based on this vehicle type data, and retrieves these data. The data is transferred to the slave central processing unit 7 (steps 20 and 21). Next, the main central processing unit 3
inputs the test results for each test item sent from the slave central processing unit 7, and compares and judges the test results with the data stored in the storage device 4.
Compare and judge each test item (steps 22 and 23) The main central processing unit 3 determines whether data for all test items has been input from the slave central processing unit 7, and if all items have been completed, it makes a judgment. The results are displayed and printed out on the display device 5 (steps 24 and 25).

On the other hand, the slave central processing unit 7 is connected to the main central processing unit 3.
The vehicle type data and test item data transferred from the D/A converter are input, and based on these data, predetermined digital data is output to the D/A converter 16 shown in FIGS. 3 and 4. 16
Set the voltage value output from. This voltage value differs depending on the vehicle type, that is, the type of instrument panel 13, and each component of the instrument panel 13, and is sequentially set for each component before the start of testing of each component (steps 30, 31).

When this setting is made, the set voltage and current are supplied to each component of the instrument panel 13 via the connector 17, as explained in FIGS. 3 and 4. At the same time, the variable resistor 32 shown in FIGS. 3 and 4
and 52, the voltage and current supplied to the connector 17 are converted into voltage values and input to the A/D converter 15 via the switching circuit 23 shown in FIG. The data is converted into digital data and output to the slave central processing unit 7 (step 32). The slave central processing unit 7 that has input this data transfers this data to the main central processing unit 3 and performs the above processing until all items are completed. When all items are completed, a test end signal is sent to the main central processing unit 3. and finish the test (step 33,
34).

As described above, since the electrical equipment testing equipment according to the present invention is configured with a microcomputer, it is not only much smaller than conventional equipment, but also allows for a wider range of types of electrical equipment to be tested. Even if the number of data increases or the types of data change, simply by increasing or changing the data stored in the storage device 4 or the storage device 8, such a situation can be quickly dealt with.

In addition, since the test equipment is small, it can be easily moved.For example, by applying a load current from the battery terminal of the vehicle, it is possible to check open shorts in the electric circuit of the entire vehicle and the component configuration. It also becomes possible.

(Effects of the invention) As is clear from the above explanation, according to the invention, the standard for arbitrarily setting the voltage, current, and test pattern supplied to the object under test variably according to the type of the object under test. A load setting means, an output means for outputting the voltage and current set by the reference load setting means to the test object, and an actual situation when the voltage and current are output from the output means to the test object. storage means for storing permissible values of voltage and current in the test object; and measurement for detecting voltage and current in the test object when the voltage and current are output from the output means to the test object. comparing the voltage and current values detected by the measuring means with the voltage and current tolerance values stored in the storage means, and determining that the voltage and current in the test object are within the tolerance values; The structure includes a comparative judgment means for determining whether or not the test object is true and outputting the result of this judgment, and a display means for displaying the judgment result output from the comparison judgment means, so that the current conduction test of the test object can be easily performed. This can be done automatically and easily, and even if the number of test objects to be tested increases or the types of test objects differ, simply increasing or changing the data stored in the storage means can solve this situation. This will allow you to respond quickly.

[Brief explanation of drawings]

Fig. 1 is a block diagram of the electrical component testing device according to the present invention, Fig. 2 is an overall configuration diagram of the electrical component testing device according to the present invention, and Fig. 3 is a block diagram of the electrical component testing device according to the present invention. FIG. 4 is a voltage supply circuit diagram of the device; FIG. 4 is a current supply circuit diagram of the electrical component testing device according to the present invention; FIG. 5 is a circuit diagram of the switching device of the electrical component testing device according to the present invention; FIG. 7 and 7 are operational flowcharts of the electrical component testing apparatus according to the present invention. 3... Main central processing unit (comparison/judgment means, reference load setting means), 4... Storage device (storage means, reference load setting means), 5... Display device (display means), 7
...Subcentral processing unit (reference load setting means, output means), 8...Storage device (reference load setting means), 13
...Electrical equipment (test object), 14...Testing machine interface (output means, measurement means), 15...
A/D converter (measuring means), 16...D/A
Converter (reference load setting means), 17...connector.

Claims (1)

[Scope of Claim for Utility Model Registration] Reference load setting means for arbitrarily variably setting the voltage, current, and test pattern supplied to a test object according to the type of the test object; set voltage,
output means for outputting current to the test object; storage means for storing permissible values of voltage and current in the test object when voltage and current are output from the output means to the test object; Measuring means for detecting the voltage and current in the test object when the voltage and current are output from the output means to the test object; and the storage means for storing the values of the voltage and current detected by the measuring means. Comparing the voltage and current with permissible values stored in the test object, and determining whether the voltage and current in the test object are within the permissible values;
A testing device for electrical components, comprising: a comparison/judgment means for outputting the judgment result; and a display means for displaying the judgment result output from the comparison/judgment means.