JPH0545339A - Elastic wave element and measuring apparatus of physical property of solution using the element - Google Patents

Elastic wave element and measuring apparatus of physical property of solution using the element

Info

Publication number
JPH0545339A
JPH0545339A JP3200932A JP20093291A JPH0545339A JP H0545339 A JPH0545339 A JP H0545339A JP 3200932 A JP3200932 A JP 3200932A JP 20093291 A JP20093291 A JP 20093291A JP H0545339 A JPH0545339 A JP H0545339A
Authority
JP
Japan
Prior art keywords
solution
measuring
pond
elastic wave
piezoelectric substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3200932A
Other languages
Japanese (ja)
Inventor
Toshio Sato
敏夫 佐藤
Ryohei Mogi
良平 茂木
Hiroshi Okajima
洋 岡嶋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokimec Inc
Original Assignee
Tokimec Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokimec Inc filed Critical Tokimec Inc
Priority to JP3200932A priority Critical patent/JPH0545339A/en
Publication of JPH0545339A publication Critical patent/JPH0545339A/en
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)

Abstract

PURPOSE:To obtain an apparatus for measuring physical properties of a solution with using elastic waves to which a solution can be easily injected or removed. CONSTITUTION:A hole of a predetermined shape is formed in a supporting plate 142. When a rear face of a piezoelectric substrate 144 is bonded to the hole, a measuring pond 140 is obtained at the face opposite to where a comb-like electrode 146 is provided. When a solution to-be-measured is injected to or discharged from the measuring pond, the solution is never adhered to the comb- like electrode.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、粘性等の溶液物性を、
弾性波素子を用いて測定する弾性波素子とそれを用いた
溶液物性測定装置に関するものである。
This invention relates to solution physical properties such as viscosity,
The present invention relates to an elastic wave element for measuring using an elastic wave element and a solution physical property measuring apparatus using the elastic wave element.

【0002】[0002]

【従来の技術】従来の、弾性波素子および溶液物性測定
装置について説明する。
2. Description of the Related Art A conventional acoustic wave device and a solution property measuring apparatus will be described.

【0003】図5は従来の溶液物性測定用の弾性波素子
の斜視図である。
FIG. 5 is a perspective view of a conventional acoustic wave device for measuring the physical properties of a solution.

【0004】該素子は、圧電基板1の一平面上に、信号
入力用のくし型電極2(以下、「IDT2」という)
と、信号出力用のくし型電極3(以下、「IDT3」と
いう)とが設けられている。また、このIDT2,3の
設けられている面と同一の面上には、このIDT2とI
DT3との間に測定用池4が設けられていた。この測定
用池4は、所定の形状の”枠”を、該圧電基板1上に接
着することにより形成されていた。
The element is a comb-shaped electrode 2 for signal input (hereinafter referred to as "IDT2") on one plane of the piezoelectric substrate 1.
And a comb-shaped electrode 3 for signal output (hereinafter referred to as “IDT3”). Further, on the same surface as the surface on which the IDTs 2 and 3 are provided, the IDTs 2 and I
The measurement pond 4 was provided between the DT 3 and the DT 3. The measuring pond 4 was formed by adhering a "frame" having a predetermined shape on the piezoelectric substrate 1.

【0005】この従来素子を使用した装置で測定を行う
場合、まず、最初に測定用池4に測定対象である溶液を
入れておく。
When performing measurement with an apparatus using this conventional element, first, the solution to be measured is put into the measuring pond 4.

【0006】この状態で、IDT2に測定用の所定周波
数の信号を入力すると、圧電基板1内に表面波(以下、
「SH−SAW」という。Shear Horizontal-Surface A
coustic Wave)が励振される。
In this state, when a signal having a predetermined frequency for measurement is input to the IDT 2, a surface wave (hereinafter,
It is called "SH-SAW". Shear Horizontal-Surface A
coustic Wave) is excited.

【0007】そして、このSH−SAWは、圧電基板1
の表面を伝搬し、IDT3により検出される。この時、
該SH−SAWは、上記測定用池4内の溶液の物性、例
えば、粘性の影響を受けて、その位相速度が変化する。
従って、この位相速度の変化を検出することにより、物
性を測定していた。
The SH-SAW is a piezoelectric substrate 1
Of the IDT3 and is detected by the IDT3. At this time,
The phase velocity of the SH-SAW changes under the influence of the physical properties of the solution in the measurement pond 4, for example, the viscosity.
Therefore, the physical properties are measured by detecting the change in the phase velocity.

【0008】[0008]

【発明が解決しようとする課題】しかし、上記従来技術
においては、測定用池4が非常に小さいため、測定溶液
除去時に、溶液を完全に除去することが困難であった。
また、溶液の注入、除去時に、IDT2,3等に溶液が
付着し、測定できなくなることがあった。
However, in the above-mentioned prior art, since the measuring pond 4 is very small, it was difficult to completely remove the solution when removing the measuring solution.
In addition, when the solution was injected or removed, the solution sometimes adhered to the IDTs 2 and 3 and the measurement could not be performed.

【0009】さらに、SH−SAWの伝搬に影響を与え
ないように、測定用池4を圧電基板1の表面に接着する
ことは、困難であった。
Further, it has been difficult to bond the measuring pond 4 to the surface of the piezoelectric substrate 1 so as not to affect the propagation of SH-SAW.

【0010】本発明の目的は、測定対象の溶液の注入、
除去の容易な弾性波素子とそれを用いた溶液物性測定装
置を提供することにある。
An object of the present invention is to inject a solution to be measured,
An object of the present invention is to provide an elastic wave element that can be easily removed and a solution physical property measuring apparatus using the same.

【0011】[0011]

【課題を解決するための手段】本発明は上記目的を達成
するためになされたもので、圧電基板と、該圧電基板の
一面上に設けられた入力用のくし型電極と、該面上に、
上記入力用くし型電極と対をなして設けられた出力用の
くし型電極と、該面の反対側の面上に設けられた、測定
対象となる溶液を入れるための測定用池とを有すること
を特徴とする弾性波素子が提供される。
SUMMARY OF THE INVENTION The present invention has been made to achieve the above object, and comprises a piezoelectric substrate, an input comb-shaped electrode provided on one surface of the piezoelectric substrate, and an input comb-shaped electrode on the surface. ,
It has an output comb-shaped electrode provided in pair with the input comb-shaped electrode, and a measurement pond for containing a solution to be measured, which is provided on a surface opposite to the surface. An elastic wave element characterized by the above is provided.

【0012】また、上記弾性波素子と、上記圧電基板中
に弾性波を発生させる波数の電気信号を発信可能な発信
手段とを有することを特徴とする溶液物性測定装置が提
供される。
Further, there is provided a solution physical property measuring apparatus comprising the elastic wave element and transmitting means capable of transmitting an electric signal having a wave number for generating an elastic wave in the piezoelectric substrate.

【0013】[0013]

【作用】測定用池に測定対象となる溶液を注入する。こ
の場合、該測定用池は、くし型電極とは反対側の面に設
けられているため、電極に該溶液が付着する恐れはな
い。
[Function] The solution to be measured is injected into the measuring pond. In this case, since the measuring pond is provided on the surface opposite to the comb-shaped electrode, there is no possibility that the solution will adhere to the electrode.

【0014】この状態で、発信手段を作動させて、該弾
性波素子に弾性波を発生させる。弾性波は、表面波とは
異なり、圧電基板の表面付近ではなく、バルク領域を伝
搬するため、該電極とは反対側の面に設けられている測
定用池内の溶液の物性の影響を受ける。言い替えれば、
測定用池がくし型電極の設けられている面の裏側にあっ
ても、溶液の物性を測定することができる。
In this state, the transmitting means is operated to generate an elastic wave in the elastic wave element. Unlike surface waves, elastic waves propagate not in the vicinity of the surface of the piezoelectric substrate but in the bulk region, and thus are affected by the physical properties of the solution in the measurement pond provided on the surface opposite to the electrode. In other words,
Even if the measurement pond is on the back side of the surface on which the comb-shaped electrode is provided, the physical properties of the solution can be measured.

【0015】[0015]

【実施例】本発明の一実施例を、図1を用いて説明す
る。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described with reference to FIG.

【0016】本実施例の溶液物性測定装置の概略図を図
1に示す。
FIG. 1 shows a schematic view of the solution physical property measuring apparatus of this embodiment.

【0017】該溶液物性測定装置は、液体の粘度の測定
を目的としたもので、発信器10、スイッチ12、弾性
波素子センサ14、位相差検出回路16から主に構成さ
れる。
The solution physical property measuring apparatus is intended for measuring the viscosity of a liquid, and is mainly composed of an oscillator 10, a switch 12, an elastic wave element sensor 14, and a phase difference detecting circuit 16.

【0018】発信器10は、測定に使用する弾性波を生
じさせるための電気信号を発生させるためのものであ
る。
The oscillator 10 is for generating an electric signal for generating an elastic wave used for measurement.

【0019】この弾性波には図2に示すように基板の厚
さと周波数とによってきまる様々な弾性波が存在する
が、X2方向成分が比較的大きく励振される周波数の弾
性波を使用して測定するようになっている。
There are various elastic waves depending on the thickness of the substrate and the frequency as shown in FIG. 2, but the elastic wave having a frequency at which the X2 direction component is excited relatively large is measured. It is supposed to do.

【0020】本実施例においては、発信器10の信号
は、弾性波((本明細書中、表面波以外の弾性波を「弾
性波」という。)を発生させる周波数に設定されてい
る。そして、この発信器10の発生する信号は、弾性波
素子センサ14に出力される構成と成っている。
In the present embodiment, the signal of the oscillator 10 is set to a frequency for generating an elastic wave ((in the present specification, an elastic wave other than a surface wave is referred to as an "elastic wave"). The signal generated by the oscillator 10 is output to the acoustic wave element sensor 14.

【0021】弾性波素子センサ14は、内部に二つの測
定系を有した構成と成っている。なお、この弾性波素子
センサ14の詳細については、図3、図4を用いて後ほ
ど詳細に説明する。
The acoustic wave element sensor 14 has a structure having two measuring systems inside. The details of the acoustic wave element sensor 14 will be described later with reference to FIGS. 3 and 4.

【0022】位相差検出回路16は、上述した弾性波素
子センサ14の二つの測定系から出力される信号の位相
差を検出するためのものである。この位相差は、溶液の
粘度、誘電率、両測定系間の温度差等により発生するも
のである。
The phase difference detection circuit 16 is for detecting the phase difference between the signals output from the two measurement systems of the acoustic wave element sensor 14 described above. This phase difference is caused by the viscosity of the solution, the dielectric constant, the temperature difference between both measuring systems, and the like.

【0023】弾性波素子センサ14を詳細に説明する。The acoustic wave element sensor 14 will be described in detail.

【0024】図3は、該弾性波素子センサ14の回路構
成を示したものである。
FIG. 3 shows a circuit configuration of the elastic wave element sensor 14.

【0025】弾性波素子センサ14内の回路は、測定対
象の溶液を入れる測定用池140を有する測定系Cと、
測定用池を有さない参照用の測定系Dとから成る。そし
て、各測定系は、圧電基板144上に設けられたIDT
146を有している。また図には示していないが、両測
定系とも、その圧電基板144の裏表両面に接地導体を
設けさらに、両面を短絡させることにより、溶液の誘電
率による影響を除去している。
The circuit in the elastic wave element sensor 14 includes a measuring system C having a measuring pond 140 for containing a solution to be measured,
And a reference measuring system D without a measuring pond. Then, each measurement system includes an IDT provided on the piezoelectric substrate 144.
It has 146. Although not shown in the figure, both measuring systems have ground conductors on both front and back surfaces of the piezoelectric substrate 144, and short-circuit the both surfaces to remove the influence of the dielectric constant of the solution.

【0026】測定用池を有する測定系Cの断面を図4に
示す。
A cross section of the measuring system C having a measuring pond is shown in FIG.

【0027】本実施例の測定系Cは、圧電基板144の
裏側、つまり、IDT146の設けられていない側の面
に、測定用池140を配置した点に特徴を有している。
The measurement system C of the present embodiment is characterized in that the measurement pond 140 is arranged on the back side of the piezoelectric substrate 144, that is, the surface on which the IDT 146 is not provided.

【0028】該測定用池140は、該測定用池140を
形成する穴を設けた支持板142に圧電基板144を接
着することにより構成されている。
The measuring pond 140 is constructed by adhering a piezoelectric substrate 144 to a support plate 142 having holes for forming the measuring pond 140.

【0029】この測定用池140は、IDT146の励
振する弾性波に一様に影響を与えるように配置されてい
なければならない。従って、本実施例においては、該弾
性波素子センサ14を上側あるいは下側から見た場合
に、測定用池140は入力用のIDT146と、出力用
のIDT146と、弾性波の伝搬経路とを含むような長
方形としているが、これに限定されるものではない。上
述の条件を満たすものであれば、他の形状、大きさでも
構わない。
The measuring pond 140 must be arranged so as to uniformly affect the elastic waves excited by the IDT 146. Therefore, in this embodiment, when the elastic wave element sensor 14 is viewed from above or below, the measurement pond 140 includes an input IDT 146, an output IDT 146, and an elastic wave propagation path. However, the present invention is not limited to this. Other shapes and sizes may be used as long as they satisfy the above conditions.

【0030】ただし、弾性波の発生あるいは検出に悪影
響のないように、測定用池140は、IDT146と全
く重ならないか、または、IDT146をすべて含むよ
うに重なるかのいずれかであることが好ましい。
However, it is preferable that the measurement pond 140 does not overlap the IDT 146 at all or overlaps so as to include all the IDTs 146 so that the generation or detection of elastic waves is not adversely affected.

【0031】この支持板142の大きさは、圧電基板1
44を十分に覆うことができるほど大きくなっている。
ただし、該測定用池140や支持板142の形、大きさ
等は、これに限定されるものではない。また、測定用池
140と支持板142との接合方法についても、圧電基
板144中を伝搬する弾性波に影響を与えない手法であ
れば特に限定されない。
The size of the support plate 142 is the size of the piezoelectric substrate 1.
It is large enough to cover 44 sufficiently.
However, the shape and size of the measurement pond 140 and the support plate 142 are not limited to these. Further, the method of joining the measurement pond 140 and the support plate 142 is not particularly limited as long as it is a method that does not affect the elastic waves propagating in the piezoelectric substrate 144.

【0032】粘度の測定動作について説明する。The operation of measuring the viscosity will be described.

【0033】まず、測定用池140に測定対象となる溶
液を入れる。この場合、測定用池140は、IDT14
6とは反対側に設けられているため、IDT146に該
溶液が付着するおそれは少ない。
First, the solution to be measured is placed in the measuring pond 140. In this case, the measurement pond 140 is the IDT 14
Since it is provided on the side opposite to 6, there is little possibility that the solution will adhere to the IDT 146.

【0034】この状態で発信器10の発生する信号を弾
性素子センサ14に入力することにより、圧電基板14
4中に弾性波を生じさせる。そして、位相差検出回路1
6で二つの測定系間の位相差、つまり、温度と粘性の影
響を受ける測定系Cと、温度の影響は受けるが、粘性の
影響は受けない測定系Dとの位相差を検出することによ
り、温度補償を図りつつ粘度を測定することができる。
In this state, by inputting the signal generated by the oscillator 10 to the elastic element sensor 14, the piezoelectric substrate 14
4 produces an elastic wave. Then, the phase difference detection circuit 1
By detecting the phase difference between the two measurement systems at 6, that is, the measurement system C that is affected by temperature and viscosity and the measurement system D that is affected by temperature but not viscosity, It is possible to measure the viscosity while compensating for temperature.

【0035】以上説明したように上記実施例において
は、測定用の弾性波として弾性波を使用しているため、
測定用池140をIDT146と反対側の面に設けるこ
とができた。これにより、製造時の該測定用池の形成、
つまり、支持板142と圧電基板144との接着が容易
となった。また、測定の際の、溶液の注入および排除が
容易となった。更に、該溶液がIDT146に付着する
危険も少なくなる。特に、上記実施例においては、支持
板142を圧電基板144よりも大きくしているため、
IDT146への付着はほぼ完璧に防ぐことができる。
As described above, in the above embodiment, since the elastic wave is used as the elastic wave for measurement,
The measurement pond 140 could be provided on the surface opposite to the IDT 146. By this, formation of the measuring pond during manufacturing,
That is, the support plate 142 and the piezoelectric substrate 144 are easily bonded to each other. In addition, it became easy to inject and remove the solution during the measurement. Furthermore, the risk of the solution adhering to the IDT 146 is reduced. Particularly, in the above embodiment, since the support plate 142 is made larger than the piezoelectric substrate 144,
Adhesion to the IDT 146 can be prevented almost completely.

【0036】[0036]

【発明の効果】以上説明したように本発明によれば、製
造工程において、測定対象である溶液を入れる池の形成
が容易となる。また溶液を該池に注入、除去する際に、
該溶液がIDTへ付着するおそれが少ない。また、測定
後の、溶液の除去も非常に容易となる。
As described above, according to the present invention, it becomes easy to form a pond for containing a solution to be measured in the manufacturing process. Also, when pouring and removing the solution into the pond,
The solution is less likely to adhere to the IDT. Further, the removal of the solution after the measurement becomes very easy.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例の概要を示す斜視図である。FIG. 1 is a perspective view showing an outline of an embodiment of the present invention.

【図2】弾性波の存在を示すグラフである。FIG. 2 is a graph showing the presence of elastic waves.

【図3】弾性波素子の回路構成を示す説明図である。FIG. 3 is an explanatory diagram showing a circuit configuration of an acoustic wave device.

【図4】測定用池を有する弾性波素子センサの説明図で
ある。
FIG. 4 is an explanatory diagram of an acoustic wave element sensor having a measurement pond.

【図5】従来技術を示す斜視図である。FIG. 5 is a perspective view showing a conventional technique.

【符号の説明】[Explanation of symbols]

1:圧電基板、2:くし型電極(IDT)、3:くし型
電極(IDT、)、4:測定用池、10:発信器、1
2:スイッチ、14:弾性波素子センサ、16:位相差
検出回路、140:測定用池、142:支持板、14
4:圧電基板、146:IDT、C:測定系、D:測定
系。
1: Piezoelectric substrate, 2: Comb type electrode (IDT), 3: Comb type electrode (IDT,), 4: Measuring pond, 10: Transmitter, 1
2: switch, 14: elastic wave element sensor, 16: phase difference detection circuit, 140: measurement pond, 142: support plate, 14
4: piezoelectric substrate, 146: IDT, C: measurement system, D: measurement system.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】溶液の物性の測定を目的とする弾性波素子
であって、 圧電基板と、 該圧電基板の一面上に設けられた入力用のくし型電極
と、 該面上に、上記入力用くし型電極と対をなして設けられ
た出力用のくし型電極と、 該面の反対側の面上に設けられた、測定対象となる溶液
を入れるための、測定用池と、 を有することを特徴とする弾性波素子。
1. An acoustic wave device for measuring the physical properties of a solution, comprising: a piezoelectric substrate; a comb-shaped electrode for input provided on one surface of the piezoelectric substrate; and the above-mentioned input on the surface. A comb electrode for output, which is provided in a pair with the comb electrode for use, and a measuring pond, which is provided on a surface opposite to the surface, for containing a solution to be measured. An acoustic wave device characterized by the above.
【請求項2】請求項1記載の弾性波素子と、 上記圧電基板中に弾性波を発生させる周波数の電気信号
を発信可能な発信手段と、 を有することを特徴とする溶液物性測定装置。
2. An apparatus for measuring physical properties of a solution, comprising: the elastic wave device according to claim 1; and a transmitting means capable of transmitting an electric signal having a frequency for generating an elastic wave in the piezoelectric substrate.
JP3200932A 1991-08-09 1991-08-09 Elastic wave element and measuring apparatus of physical property of solution using the element Pending JPH0545339A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3200932A JPH0545339A (en) 1991-08-09 1991-08-09 Elastic wave element and measuring apparatus of physical property of solution using the element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3200932A JPH0545339A (en) 1991-08-09 1991-08-09 Elastic wave element and measuring apparatus of physical property of solution using the element

Publications (1)

Publication Number Publication Date
JPH0545339A true JPH0545339A (en) 1993-02-23

Family

ID=16432690

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3200932A Pending JPH0545339A (en) 1991-08-09 1991-08-09 Elastic wave element and measuring apparatus of physical property of solution using the element

Country Status (1)

Country Link
JP (1) JPH0545339A (en)

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JP2004069661A (en) * 2002-08-09 2004-03-04 Mitsubishi Electric Corp Chemical sensor
JP2008089600A (en) * 2002-06-08 2008-04-17 Lg Innotek Co Ltd Saw sensor element using slit elastic wave, and its method
US7389673B2 (en) 2004-09-10 2008-06-24 Murata Manufacturing Co., Ltd. Sensor for detecting analyte in liquid and device for detecting analyte in liquid using the same
US7437907B2 (en) 2004-09-10 2008-10-21 Murata Manufacturing Co., Ltd. Sensor for detecting substance in liquid and apparatus for detecting substance in liquid using the same
US7656070B2 (en) 2005-04-06 2010-02-02 Murata Manufacturing Co., Ltd. Surface wave sensor apparatus

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008089600A (en) * 2002-06-08 2008-04-17 Lg Innotek Co Ltd Saw sensor element using slit elastic wave, and its method
JP2004069661A (en) * 2002-08-09 2004-03-04 Mitsubishi Electric Corp Chemical sensor
US7389673B2 (en) 2004-09-10 2008-06-24 Murata Manufacturing Co., Ltd. Sensor for detecting analyte in liquid and device for detecting analyte in liquid using the same
US7437907B2 (en) 2004-09-10 2008-10-21 Murata Manufacturing Co., Ltd. Sensor for detecting substance in liquid and apparatus for detecting substance in liquid using the same
US7656070B2 (en) 2005-04-06 2010-02-02 Murata Manufacturing Co., Ltd. Surface wave sensor apparatus

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