JPH0533974Y2 - - Google Patents
Info
- Publication number
- JPH0533974Y2 JPH0533974Y2 JP19269187U JP19269187U JPH0533974Y2 JP H0533974 Y2 JPH0533974 Y2 JP H0533974Y2 JP 19269187 U JP19269187 U JP 19269187U JP 19269187 U JP19269187 U JP 19269187U JP H0533974 Y2 JPH0533974 Y2 JP H0533974Y2
- Authority
- JP
- Japan
- Prior art keywords
- package
- measurement probe
- probe assembly
- comb
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000523 sample Substances 0.000 claims description 110
- 238000005259 measurement Methods 0.000 claims description 107
- 239000011295 pitch Substances 0.000 claims description 26
- 239000004020 conductor Substances 0.000 claims description 24
- 238000012360 testing method Methods 0.000 claims description 7
- 238000011990 functional testing Methods 0.000 claims description 6
- 239000011810 insulating material Substances 0.000 claims description 5
- 238000001514 detection method Methods 0.000 description 16
- 210000000078 claw Anatomy 0.000 description 11
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 6
- 239000000853 adhesive Substances 0.000 description 3
- 230000001070 adhesive effect Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 229920001971 elastomer Polymers 0.000 description 2
- 239000003822 epoxy resin Substances 0.000 description 2
- 239000000696 magnetic material Substances 0.000 description 2
- 230000014759 maintenance of location Effects 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 239000005060 rubber Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 239000011889 copper foil Substances 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 239000013013 elastic material Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000012811 non-conductive material Substances 0.000 description 1
- 230000000284 resting effect Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 229920003051 synthetic elastomer Polymers 0.000 description 1
- 239000005061 synthetic rubber Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19269187U JPH0533974Y2 (ru) | 1987-12-21 | 1987-12-21 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19269187U JPH0533974Y2 (ru) | 1987-12-21 | 1987-12-21 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0197263U JPH0197263U (ru) | 1989-06-28 |
JPH0533974Y2 true JPH0533974Y2 (ru) | 1993-08-27 |
Family
ID=31483531
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19269187U Expired - Lifetime JPH0533974Y2 (ru) | 1987-12-21 | 1987-12-21 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0533974Y2 (ru) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006261144A (ja) * | 2005-03-15 | 2006-09-28 | Minowa Koa Inc | 抵抗器の製造法及び抵抗器の検測装置 |
-
1987
- 1987-12-21 JP JP19269187U patent/JPH0533974Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0197263U (ru) | 1989-06-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP2709570B2 (ja) | 電気試験プローブ用位置決め装置 | |
US5646542A (en) | Probing adapter for testing IC packages | |
US4308498A (en) | Kelvin test fixture for electrically contacting miniature, two terminal, leadless, electrical components | |
US5184065A (en) | Twist lock probe tip | |
JPH0533974Y2 (ru) | ||
JPH07508351A (ja) | 電流を流す導体を結合するための端子 | |
JPH0533973Y2 (ru) | ||
JP3790041B2 (ja) | プローブおよび検査装置 | |
JPH0342377Y2 (ru) | ||
JPH0533972Y2 (ru) | ||
JPS62222164A (ja) | 電気プロ−ブ | |
JPS5828360Y2 (ja) | Icクリツプ | |
JPH0742140Y2 (ja) | プローブのアース構造 | |
JP3132465B2 (ja) | 半導体装置及びプローブユニット | |
JPH05240877A (ja) | 半導体集積回路測定用プローバ | |
JPH065321A (ja) | Icクリップ | |
JPS5826388Y2 (ja) | 点検用アダプタ | |
JPH08179003A (ja) | 表面実装部品測定端子取付器 | |
JP2526212Y2 (ja) | Icソケット | |
JPH0541420A (ja) | プローブカード | |
JPH0210462Y2 (ru) | ||
JPS61259176A (ja) | プロ−ブ | |
JPS63279179A (ja) | 集積回路装置の測定用ソケット | |
JP3056088B2 (ja) | 電子部品特性測定用治具 | |
JPH0524061Y2 (ru) |