JPH0533342B2 - - Google Patents

Info

Publication number
JPH0533342B2
JPH0533342B2 JP60020299A JP2029985A JPH0533342B2 JP H0533342 B2 JPH0533342 B2 JP H0533342B2 JP 60020299 A JP60020299 A JP 60020299A JP 2029985 A JP2029985 A JP 2029985A JP H0533342 B2 JPH0533342 B2 JP H0533342B2
Authority
JP
Japan
Prior art keywords
peak
particle
sample
hold
switching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60020299A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61178643A (ja
Inventor
Tokihiro Kosaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sysmex Corp
Original Assignee
Sysmex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sysmex Corp filed Critical Sysmex Corp
Priority to JP60020299A priority Critical patent/JPS61178643A/ja
Publication of JPS61178643A publication Critical patent/JPS61178643A/ja
Publication of JPH0533342B2 publication Critical patent/JPH0533342B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G01N15/131—Details
    • G01N15/132—Circuits

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Measurement Of Current Or Voltage (AREA)
JP60020299A 1985-02-05 1985-02-05 粒子分析装置 Granted JPS61178643A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60020299A JPS61178643A (ja) 1985-02-05 1985-02-05 粒子分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60020299A JPS61178643A (ja) 1985-02-05 1985-02-05 粒子分析装置

Publications (2)

Publication Number Publication Date
JPS61178643A JPS61178643A (ja) 1986-08-11
JPH0533342B2 true JPH0533342B2 (zh) 1993-05-19

Family

ID=12023271

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60020299A Granted JPS61178643A (ja) 1985-02-05 1985-02-05 粒子分析装置

Country Status (1)

Country Link
JP (1) JPS61178643A (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0718787B2 (ja) * 1988-08-26 1995-03-06 富士電機株式会社 微粒子測定装置
JP2002022646A (ja) 2000-07-07 2002-01-23 Horiba Ltd 粒径分布測定装置
US6864979B2 (en) 2000-12-08 2005-03-08 Horiba, Ltd Particle size distribution measuring apparatus
JP4266075B2 (ja) 2001-02-19 2009-05-20 株式会社堀場製作所 粒径分布測定装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5068173A (zh) * 1973-10-16 1975-06-07
JPS568527A (en) * 1979-07-02 1981-01-28 Toa Medical Electronics Co Ltd Particle analyzing device
JPS5841336A (ja) * 1981-09-04 1983-03-10 Toa Medical Electronics Co Ltd 粒子分析装置
JPS61126447A (ja) * 1984-11-26 1986-06-13 Hitachi Ltd 粒子分析装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5068173A (zh) * 1973-10-16 1975-06-07
JPS568527A (en) * 1979-07-02 1981-01-28 Toa Medical Electronics Co Ltd Particle analyzing device
JPS5841336A (ja) * 1981-09-04 1983-03-10 Toa Medical Electronics Co Ltd 粒子分析装置
JPS61126447A (ja) * 1984-11-26 1986-06-13 Hitachi Ltd 粒子分析装置

Also Published As

Publication number Publication date
JPS61178643A (ja) 1986-08-11

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