JPH0533008U - Non-contact measuring device - Google Patents

Non-contact measuring device

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Publication number
JPH0533008U
JPH0533008U JP8899991U JP8899991U JPH0533008U JP H0533008 U JPH0533008 U JP H0533008U JP 8899991 U JP8899991 U JP 8899991U JP 8899991 U JP8899991 U JP 8899991U JP H0533008 U JPH0533008 U JP H0533008U
Authority
JP
Japan
Prior art keywords
light
measured
receiving element
light receiving
reflected light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP8899991U
Other languages
Japanese (ja)
Inventor
治 奈良
裕士 柚中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitutoyo Corp
Original Assignee
Mitutoyo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitutoyo Corp filed Critical Mitutoyo Corp
Priority to JP8899991U priority Critical patent/JPH0533008U/en
Publication of JPH0533008U publication Critical patent/JPH0533008U/en
Withdrawn legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)

Abstract

(57)【要約】 【目的】 透光性材質からなる被測定物であっても、厚
みに制限を受けることなく、その厚みなどを正確に測定
できる非接触型測定装置を提供する。 【構成】 レーザ光源1、レーザ光源1のレーザ光を被
測定物Wの表面Waに投光する投光レンズ2、受光素子
4および被測定物Wからの反射光を受光素子4に入射さ
せる受光レンズ3を含み、受光素子4からの信号を基に
被測定物Wの厚みなどを測定する非接触型測定装置にお
いて、被測定物Wからの反射光の光軸上にマスク11を
設け、被測定物の測定面Waとは反対面Wb側からの裏
面反射光Lbのみをカットし、表面反射光Laのみを受
光素子4で受光させる。
(57) [Summary] [Problem] To provide a non-contact type measuring device capable of accurately measuring the thickness of a light-transmissive material without being limited by its thickness. A laser light source 1, a light projecting lens 2 for projecting the laser light of the laser light source 1 onto a surface Wa of an object to be measured W, a light receiving element 4, and a light receiving element for allowing reflected light from the object to be measured W to enter the light receiving element 4. In a non-contact type measuring device including the lens 3 and measuring the thickness of the object to be measured W based on the signal from the light receiving element 4, a mask 11 is provided on the optical axis of the reflected light from the object to be measured W, Only the back surface reflected light Lb from the surface Wb opposite to the measurement surface Wa of the object to be measured is cut, and only the front surface reflected light La is received by the light receiving element 4.

Description

【考案の詳細な説明】[Detailed description of the device]

【0001】[0001]

【産業上の利用分野】[Industrial applications]

本考案は、非接触型測定装置に関する。特に、ガラスなどの透光性材料からな る部材、例えば、レンズなどの厚みなどを正確に測定することができる非接触型 測定装置に関する。 The present invention relates to a non-contact measuring device. In particular, the present invention relates to a non-contact type measuring device capable of accurately measuring the thickness of a member made of a translucent material such as glass, such as a lens.

【0002】[0002]

【背景技術】[Background technology]

例えば、被測定物の厚みや反りなどを非接触で測定する場合、図4に示すレー ザ変位計が広く用いられている。これは、レーザ光源1、投光レンズ2、受光レ ンズ3および受光素子4を含み、レーザ発光源1から出射されたレーザ光を投光 レンズ2を介して被測定物Wの表面Waに投光し、被測定物Wからの反射光を受 光レンズ3で結像させて受光素子4で受光し、この受光素子4からの信号を基に 被測定物Wの厚みや反りなどを求めるものである。 For example, the laser displacement meter shown in FIG. 4 is widely used for non-contact measurement of the thickness and warpage of an object to be measured. This includes a laser light source 1, a light projecting lens 2, a light receiving lens 3 and a light receiving element 4, and projects the laser light emitted from the laser light emitting source 1 through the light projecting lens 2 onto the surface Wa of the object to be measured W. Light is emitted, the reflected light from the object to be measured W is imaged by the light receiving lens 3 and is received by the light receiving element 4, and the thickness or warpage of the object to be measured W is obtained based on the signal from the light receiving element 4. Is.

【0003】[0003]

【考案が解決しようとする課題】[Problems to be solved by the device]

ところが、従来のレーザ変位計によってガラスなどの透光性材質からなる被測 定物Wの厚みや反りなどを測定しようとする場合、測定範囲が広くなるに従って 、被測定物Wの裏面Wbからの裏面反射光Lbの影響を受けやすく、正確な測定 ができなくなるという問題がある。 However, when it is attempted to measure the thickness or warpage of the measured object W made of a translucent material such as glass with a conventional laser displacement meter, as the measurement range becomes wider, the measured value from the back surface Wb of the measured object W increases. There is a problem that the backside reflected light Lb is easily affected and accurate measurement cannot be performed.

【0004】 つまり、図4に示す如く、被測定物Wの表面Waにレーザ光Lを投光すると、 そのレーザ光Lは、表面反射光La(実線)と屈折光Lb(破線)とに別れる。 屈折光Lbは、被測定物Wの裏面Wbで反射された後、被測定物Wの表面Waか らの表面反射光Laと平行に進行する。ここで、レーザ変位計の測定範囲が広い と、裏面反射光Lbが受光レンズ3を介して受光素子4で受光される結果、被測 定物Wの裏面Wbからの裏面反射光Lbの影響によって正確な測定ができなくな るという問題がある。That is, as shown in FIG. 4, when laser light L is projected onto the surface Wa of the object to be measured W, the laser light L is divided into surface reflected light La (solid line) and refracted light Lb (broken line). . The refracted light Lb is reflected by the back surface Wb of the measured object W and then travels in parallel with the surface reflected light La from the front surface Wa of the measured object W. Here, when the measurement range of the laser displacement meter is wide, the back surface reflected light Lb is received by the light receiving element 4 via the light receiving lens 3, and as a result, the back surface reflected light Lb from the back surface Wb of the object W is affected. There is a problem that accurate measurement cannot be performed.

【0005】 従って、このようなことから、従来のレーザ変位計によって透光性材質からな る被測定物Wの厚みや反りなどを測定しようとする場合、被測定物Wの厚みが測 定範囲の約3倍以上のものに限られるから、これより厚みが薄い被測定物Wを測 定するには、測定範囲が狭いレーザ変位計に変更するしかない。しかし、これで は汎用性が損なわれる。Therefore, from the above, when it is attempted to measure the thickness or warpage of the object W made of a translucent material by the conventional laser displacement meter, the thickness of the object W is measured within the measurement range. Since it is limited to about 3 times or more of the above, there is no choice but to change to a laser displacement meter having a narrow measurement range in order to measure the object W having a smaller thickness. However, this impairs versatility.

【0006】 ここに、本考案の目的は、このような従来の問題を解決し、透光性材質からな る被測定物であっても、厚みに制限を受けることなく、これらの被測定物の厚み などを正確に測定することができる非接触型測定装置を提供することにある。Here, the object of the present invention is to solve such a conventional problem, and to measure an object to be measured, which is made of a translucent material, without being limited in thickness. It is intended to provide a non-contact type measuring device capable of accurately measuring the thickness of an object.

【0007】[0007]

【課題を解決するための手段】[Means for Solving the Problems]

そのため、本考案の非接触型測定装置は、光源、この光源からの光を被測定物 の測定面に投光する投光レンズ、受光素子および前記被測定物からの反射光を前 記受光素子に入射させる受光レンズを含み、前記受光素子からの信号を基に被測 定物の厚みなどを測定する非接触型測定装置において、前記被測定物からの反射 光の光軸上に被測定物の測定面とは反対面側からの反射光のみをカットする遮光 手段を設けた、ことを特徴としている。 Therefore, the non-contact measuring device of the present invention includes a light source, a light projecting lens for projecting light from the light source onto the measurement surface of the object to be measured, a light receiving element, and a light receiving element for reflecting light from the object to be measured. In a non-contact type measuring device that includes a light-receiving lens that makes light incident on the object, and measures the thickness of the object to be measured based on the signal from the light-receiving element, the object to be measured is on the optical axis of the reflected light from the object to be measured. It is characterized in that a light shielding means for cutting off only the reflected light from the side opposite to the measurement surface is provided.

【0008】[0008]

【作用】[Action]

光源からの光が透光性材質からなる被測定物の表面に投光されると、そのレー ザ光は、表面反射光と屈折光とに別れる。屈折光は、被測定物の裏面で反射され た後、被測定物の表面からの表面反射光と平行に進行するが、被測定物からの反 射光の光軸上に設けられた遮光手段によってカットされるから、受光素子には被 測定物の表面からの表面反射光のみが受光される。よって、透光性材質からなる 被測定物であっても、厚みに制限を受けることなく、これらの被測定物の厚みな どを正確に測定することができる。 When the light from the light source is projected onto the surface of the object to be measured made of a translucent material, the laser light is divided into surface reflected light and refracted light. The refracted light travels in parallel with the surface reflected light from the front surface of the DUT after being reflected on the back surface of the DUT, but is shielded by the light shielding means provided on the optical axis of the reflected light from the DUT. Since the light is cut, only the surface reflected light from the surface of the DUT is received by the light receiving element. Therefore, even for an object to be measured made of a translucent material, it is possible to accurately measure the thickness of the object to be measured without being limited in thickness.

【0009】[0009]

【実施例】【Example】

以下、本考案に係る非接触型測定装置について好適な実施例を挙げ、添付の図 面を参照しながら詳細に説明する。なお、以下の図1〜図3の説明に当たって、 前述した図4と同一構成要件については、同一符号を付し、その説明を省略もし くは簡略化する。 Hereinafter, preferred embodiments of the non-contact measuring device according to the present invention will be described in detail with reference to the accompanying drawings. In the following description of FIGS. 1 to 3, the same components as those in FIG. 4 described above will be denoted by the same reference numerals, and the description thereof will be omitted or simplified.

【0010】 図1は本実施例の非接触型測定装置の測定原理を示している。本実施例の非接 触型測定装置では、前記被測定物Wからの表面反射光Laの光軸上に被測定物W の測定面である表面Waとは反対面、つまり、裏面Wb側からの裏面反射光Lb のみをカットする遮光手段としてのマスク11が設けられている。具体的には、 前記被測定物Wからの表面反射光Laの光軸上において、前記被測定物Wと前記 受光レンズ3との間にマスク11が設けられている。FIG. 1 shows the measurement principle of the non-contact type measuring apparatus of this embodiment. In the non-contact type measuring apparatus of the present embodiment, on the optical axis of the surface reflected light La from the object to be measured W, the surface opposite to the surface Wa which is the measurement surface of the object to be measured W 1, that is, from the back surface Wb side A mask 11 is provided as a light shielding means for cutting off only the back surface reflected light Lb. Specifically, on the optical axis of the surface-reflected light La from the object to be measured W, a mask 11 is provided between the object to be measured W and the light receiving lens 3.

【0011】 マスク11は、図2に示す如く、前述した各光学素子、つまり、レーザ光源1 1、投光レンズ2、受光レンズ3および受光素子4などを内部に収納したケース 13の受光口14側に対して着脱自在に取り付けられているとともに、中心に被 測定物Wからの表面反射光Laのみを通過させる絞り12を有する。なお、絞り 12の径を調整可能に構成すれば、より汎用性を高めることが可能である。As shown in FIG. 2, the mask 11 has a light receiving port 14 of a case 13 in which the above-mentioned optical elements, that is, the laser light source 11, the light projecting lens 2, the light receiving lens 3, the light receiving element 4 and the like are housed inside. The diaphragm 12 is detachably attached to the side, and has a diaphragm 12 at the center for passing only the surface reflected light La from the object to be measured W. If the diameter of the diaphragm 12 is adjustable, the versatility can be improved.

【0012】 このような構成であるから、レーザ光源1から出射されたレーザ光Lを投光レ ンズ2を通じて被測定物Wの表面Waに投光すると、そのレーザ光Lは、その表 面Waで表面反射光Laと屈折光Lbとに別れる。屈折光Lbは、被測定物Wの 裏面Wbで反射された後、被測定物Wの表面Waからの表面反射光Laと平行に 進行するが、被測定物Wからの反射光の光軸上に設けられたマスク11によって カットされるから、受光素子4には被測定物Wの表面Waからの表面反射光La のみが受光され、その信号を基に被測定物Wの厚みなどが求められる。With such a configuration, when the laser light L emitted from the laser light source 1 is projected onto the front surface Wa of the object to be measured W through the projection lens 2, the laser light L is emitted from the front surface Wa. Is divided into surface reflected light La and refracted light Lb. The refracted light Lb is reflected by the back surface Wb of the object to be measured W and then travels in parallel with the surface reflected light La from the front surface Wa of the object to be measured W, but on the optical axis of the reflected light from the object to be measured W. Since it is cut by the mask 11 provided on the light receiving element 4, only the surface reflected light La from the surface Wa of the object to be measured W is received by the light receiving element 4, and the thickness of the object to be measured W is obtained based on the signal. .

【0013】 従って、本実施例によれば、被測定物Wからの表面反射光Laの光軸上に被測 定物Wの測定面である表面Waとは反対面、つまり、裏面Wb側からの裏面反射 光Lbのみをカットするマスク11を設けたので、被測定物Wの裏面Wbからの 裏面反射光Lbをカットすることができる。よって、被測定物Wの表面反射光L aのみを受光素子4で受光することができるから、透光性材質からなる被測定物 Wであっても、厚みに制限を受けることなく、これらの被測定物Wの厚みなどを 正確に測定することができる。Therefore, according to the present embodiment, on the optical axis of the surface reflected light La from the object to be measured W, the surface opposite to the front surface Wa which is the measurement surface of the object to be measured W, that is, from the back surface Wb side Since the mask 11 that cuts only the back surface reflected light Lb is provided, the back surface reflected light Lb from the back surface Wb of the object W can be cut. Therefore, since only the surface-reflected light La of the object to be measured W can be received by the light receiving element 4, even the object to be measured W made of a light-transmissive material is not limited in its thickness. It is possible to accurately measure the thickness of the object to be measured W and the like.

【0014】 よって、被測定物Wの厚みが薄いものでも、従来のように、測定範囲の異なる レーザ変位計に変更する必要がないから汎用性が高い上、マスク11も簡易にか つ安価に構成できるから、全体としても簡易かつ安価にできる。なお、マスク1 1の絞り12の径を調整できるように構成すれば、より汎用性を高めることがで きる。Therefore, even if the object W to be measured has a small thickness, it is not necessary to change to a laser displacement meter having a different measurement range as in the conventional case, and therefore the versatility is high and the mask 11 is simple and inexpensive. Since it can be configured, it can be made simple and inexpensive as a whole. If the diameter of the diaphragm 12 of the mask 11 can be adjusted, the versatility can be improved.

【0015】 以上、本考案について好適な実施例を挙げて説明したが、本考案はこの実施例 に限定されるものでなく、本考案の要旨を逸脱しない範囲において種々の改良並 びに設計の変更が可能なことは勿論である。Although the present invention has been described with reference to the preferred embodiment, the present invention is not limited to this embodiment, and various improvements and design changes can be made without departing from the scope of the present invention. Of course, it is possible.

【0016】 例えば、上記実施例では、被測定物Wからの表面反射光Laの光軸上において 、前記被測定物Wと前記受光レンズ3との間にマスク11を設けるようにしたが 、図3のように、被測定物Wからの表面反射光Laの光軸上において、前記受光 レンズ3と受光素子4との間にマスク11を設けるようにしてもよい。ただ、上 記実施例のようにすれば、マスク11のみをケース13に対して着脱自在に構成 できる利点がある。For example, in the above embodiment, the mask 11 is provided between the object to be measured W and the light receiving lens 3 on the optical axis of the surface reflected light La from the object to be measured W. As shown in FIG. 3, a mask 11 may be provided between the light receiving lens 3 and the light receiving element 4 on the optical axis of the surface reflected light La from the measured object W. However, the above embodiment has an advantage that only the mask 11 can be detachably attached to the case 13.

【0017】[0017]

【考案の効果】[Effect of the device]

以上の通り、本考案によれば、透光性材質からなる被測定物であっても、厚み に制限を受けることなく、これらの被測定物の厚みなどを正確に測定することが できる。 As described above, according to the present invention, it is possible to accurately measure the thickness and the like of these measured objects even if the measured objects are made of a translucent material, without being limited in thickness.

【図面の簡単な説明】[Brief description of drawings]

【図1】本考案の一実施例の測定原理を示す図である。FIG. 1 is a diagram showing a measurement principle of an embodiment of the present invention.

【図2】図1の装置を示す正面図である。2 is a front view showing the device of FIG. 1. FIG.

【図3】本考案の他の実施例の測定原理を示す図であ
る。
FIG. 3 is a diagram showing the measurement principle of another embodiment of the present invention.

【図4】従来のレーザ変位計の測定原理を示す図であ
る。
FIG. 4 is a diagram showing a measurement principle of a conventional laser displacement meter.

【符号の説明】[Explanation of symbols]

1 レーザ光源 2 投光レンズ 3 受光レンズ 4 受光素子4 11 マスク(遮光手段) W 被測定物 Wa 表面 Wb 裏面 L レーザ光 La 表面反射光 Lb 裏面反射光 DESCRIPTION OF SYMBOLS 1 laser light source 2 light projecting lens 3 light receiving lens 4 light receiving element 4 11 mask (light blocking means) W object to be measured Wa front surface Wb back surface L laser light La front surface reflected light Lb back surface reflected light

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】光源、この光源からの光を被測定物の測定
面に投光する投光レンズ、受光素子および前記被測定物
からの反射光を前記受光素子に入射させる受光レンズを
含み、前記受光素子からの信号を基に被測定物の厚みな
どを測定する非接触型測定装置において、前記被測定物
からの反射光の光軸上に被測定物の測定面とは反対面側
からの反射光のみをカットする遮光手段を設けた、こと
を特徴とする非接触型測定装置。
1. A light source, a light projecting lens for projecting light from the light source onto a measurement surface of an object to be measured, a light receiving element, and a light receiving lens for causing reflected light from the object to be measured to enter the light receiving element, In a non-contact type measuring device that measures the thickness of the object to be measured based on the signal from the light receiving element, from the side opposite to the measurement surface of the object to be measured on the optical axis of the reflected light from the object to be measured. A non-contact type measuring device, characterized in that it is provided with a light-shielding means for cutting off only the reflected light.
JP8899991U 1991-10-03 1991-10-03 Non-contact measuring device Withdrawn JPH0533008U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8899991U JPH0533008U (en) 1991-10-03 1991-10-03 Non-contact measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8899991U JPH0533008U (en) 1991-10-03 1991-10-03 Non-contact measuring device

Publications (1)

Publication Number Publication Date
JPH0533008U true JPH0533008U (en) 1993-04-30

Family

ID=13958507

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8899991U Withdrawn JPH0533008U (en) 1991-10-03 1991-10-03 Non-contact measuring device

Country Status (1)

Country Link
JP (1) JPH0533008U (en)

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Effective date: 19960208