JPH05303208A - リソグラフィ用現像液及びリソグラフィ工程 - Google Patents
リソグラフィ用現像液及びリソグラフィ工程Info
- Publication number
- JPH05303208A JPH05303208A JP4233082A JP23308292A JPH05303208A JP H05303208 A JPH05303208 A JP H05303208A JP 4233082 A JP4233082 A JP 4233082A JP 23308292 A JP23308292 A JP 23308292A JP H05303208 A JPH05303208 A JP H05303208A
- Authority
- JP
- Japan
- Prior art keywords
- surfactant
- resist
- developer
- lithographic
- lithography
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
- G03F7/322—Aqueous alkaline compositions
-
- H10P76/00—
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW082100661A TW259850B (cg-RX-API-DMAC10.html) | 1992-02-07 | 1993-02-02 | |
| DE69325043T DE69325043T2 (de) | 1992-02-07 | 1993-02-05 | Lithographischer Entwickler und lithographisches Verfahren |
| AT93300883T ATE180583T1 (de) | 1992-02-07 | 1993-02-05 | Lithographischer entwickler und lithographisches verfahren |
| MYPI93000187A MY121957A (en) | 1992-02-07 | 1993-02-05 | Lithographic developer and lithographic process. |
| EP93300883A EP0555098B1 (en) | 1992-02-07 | 1993-02-05 | Lithographic developer and lithographic process |
| KR1019930001611A KR960015482B1 (ko) | 1992-02-07 | 1993-02-06 | 리토그라피용 현상액 및 리토그라피 공정 |
| US08/395,182 US6007970A (en) | 1992-02-07 | 1995-02-27 | Lithographic developer containing surfactant |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4-57081 | 1992-02-07 | ||
| JP5708192 | 1992-02-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH05303208A true JPH05303208A (ja) | 1993-11-16 |
Family
ID=13045534
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4233082A Pending JPH05303208A (ja) | 1992-02-07 | 1992-08-07 | リソグラフィ用現像液及びリソグラフィ工程 |
| JP4233080A Pending JPH05303207A (ja) | 1992-02-07 | 1992-08-07 | リソグラフィ用現像液及びリソグラフィ工程 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4233080A Pending JPH05303207A (ja) | 1992-02-07 | 1992-08-07 | リソグラフィ用現像液及びリソグラフィ工程 |
Country Status (4)
| Country | Link |
|---|---|
| JP (2) | JPH05303208A (cg-RX-API-DMAC10.html) |
| KR (1) | KR960015482B1 (cg-RX-API-DMAC10.html) |
| MY (1) | MY121957A (cg-RX-API-DMAC10.html) |
| TW (1) | TW259850B (cg-RX-API-DMAC10.html) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2021095501A (ja) * | 2019-12-17 | 2021-06-24 | 三井化学株式会社 | アルキレンオキシド重合体の曇点測定用溶媒 |
| JP2021095500A (ja) * | 2019-12-17 | 2021-06-24 | 三井化学株式会社 | アルキレンオキシド重合体の製造方法 |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR0150146B1 (ko) * | 1995-12-20 | 1998-12-01 | 김광호 | 전자사진 현상방식 프린터의 전사전압 자동조절 제어방법 |
| JP4015823B2 (ja) | 2001-05-14 | 2007-11-28 | 株式会社東芝 | アルカリ現像液の製造方法,アルカリ現像液,パターン形成方法,レジスト膜の剥離方法,及び薬液塗布装置 |
| JP5619458B2 (ja) * | 2010-03-31 | 2014-11-05 | Hoya株式会社 | レジストパターンの形成方法及びモールドの製造方法 |
-
1992
- 1992-08-07 JP JP4233082A patent/JPH05303208A/ja active Pending
- 1992-08-07 JP JP4233080A patent/JPH05303207A/ja active Pending
-
1993
- 1993-02-02 TW TW082100661A patent/TW259850B/zh not_active IP Right Cessation
- 1993-02-05 MY MYPI93000187A patent/MY121957A/en unknown
- 1993-02-06 KR KR1019930001611A patent/KR960015482B1/ko not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2021095501A (ja) * | 2019-12-17 | 2021-06-24 | 三井化学株式会社 | アルキレンオキシド重合体の曇点測定用溶媒 |
| JP2021095500A (ja) * | 2019-12-17 | 2021-06-24 | 三井化学株式会社 | アルキレンオキシド重合体の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH05303207A (ja) | 1993-11-16 |
| KR960015482B1 (ko) | 1996-11-14 |
| MY121957A (en) | 2006-03-31 |
| TW259850B (cg-RX-API-DMAC10.html) | 1995-10-11 |
| KR930018651A (ko) | 1993-09-22 |
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