JPH05291236A - Automatic immersion and treatment apparatus for semiconductor substrate - Google Patents

Automatic immersion and treatment apparatus for semiconductor substrate

Info

Publication number
JPH05291236A
JPH05291236A JP11542492A JP11542492A JPH05291236A JP H05291236 A JPH05291236 A JP H05291236A JP 11542492 A JP11542492 A JP 11542492A JP 11542492 A JP11542492 A JP 11542492A JP H05291236 A JPH05291236 A JP H05291236A
Authority
JP
Japan
Prior art keywords
semiconductor substrate
tank
liquid
controller
chemical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11542492A
Other languages
Japanese (ja)
Other versions
JP2803458B2 (en
Inventor
Yuji Seo
祐史 瀬尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP11542492A priority Critical patent/JP2803458B2/en
Publication of JPH05291236A publication Critical patent/JPH05291236A/en
Application granted granted Critical
Publication of JP2803458B2 publication Critical patent/JP2803458B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Cleaning Or Drying Semiconductors (AREA)
  • Weting (AREA)
  • Formation Of Insulating Films (AREA)

Abstract

PURPOSE:To prevent a semiconductor substrate from becoming defective such as from being overetched because a conveyance robot cannot be operated due to its trouble when the semiconductor substrate is treated automatically with a chemical liquid by means of the conveyance robot. CONSTITUTION:When a controller 35 receives a trouble signal from a conveyance robot and recognizes that the treatment time of a semiconductor substrate being treated with a chemical liquid has elapsed by a prescribed time, the controller 35 opens an inner-tank liquid-discharge valve 12 and an outer-tank liquid- discharge valve 14 until an inner-tank empty detection sensor 16 and an outer- tank empty detection sensor 18 detect an empty state in order to wholly replace the chemical liquid inside a chemical-liquid tank with ultrapure water; after that, the controller opens a water-supply valve 20. Thereby, when the conveyance robot cannot be operated, it is possible to prevent the semiconductor substrate from becoming defective such as from being overetched or the like without depending on an operator.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体製造装置に関
し、特に薬液浸漬処理装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor manufacturing apparatus, and more particularly to a chemical liquid immersion processing apparatus.

【0002】[0002]

【従来の技術】従来の自動半導体基板浸漬処理装置は、
図5に示すように半導体基板をセットするローダ25
と、薬液処理する薬液槽1と、水洗する水洗槽26と、
乾燥する乾燥機27と、乾燥後の半導体基板を貯えるア
ンローダ28と、半導体基板を搬送する搬送ロボット3
と、各部の動きを制御するコントローラ4と、装置の状
態を表示するディスプレイ5と、装置が異常な時に点灯
するアラームランプ7及び鳴動するアラームブザー9と
を有している。
2. Description of the Related Art A conventional automatic semiconductor substrate immersion treatment apparatus is
A loader 25 for setting a semiconductor substrate as shown in FIG.
And a chemical solution tank 1 for treating the chemical solution, and a washing tank 26 for washing with water,
Dryer 27 for drying, unloader 28 for storing the semiconductor substrate after drying, and transfer robot 3 for transferring the semiconductor substrate
It has a controller 4 for controlling the movement of each part, a display 5 for displaying the state of the device, an alarm lamp 7 that lights up when the device is abnormal, and an alarm buzzer 9 that sounds.

【0003】次に薬液槽1の構成について本発明に係る
図4を用いて説明する。従来の薬液槽1は、内槽29
と、内槽29に薬液を供給する給液バルブ30及び超純
水を供給する給水バルブ20と、内槽29からオーバー
フローした薬液を貯える外槽31と、外槽31の薬液を
濾過しながら内槽29へ送液するポンプ32及びフィル
ター33と、内槽29の液を排液する内槽排液バルブ1
2と、外槽31の液を排液する外槽排液バルブ14と、
外槽31の液があふれ出る前に排液するオーバーフロー
排液管34と、内槽29の液無しを検出する内槽空検知
センサー16と、外槽31の液無しを検知する外槽空検
知センサー18とを有している。
Next, the structure of the chemical liquid tank 1 will be described with reference to FIG. 4 according to the present invention. The conventional chemical liquid tank 1 has an inner tank 29.
A liquid supply valve 30 for supplying a chemical solution to the inner tank 29 and a water supply valve 20 for supplying ultrapure water; an outer tank 31 for storing the chemical solution overflowing from the inner tank 29; A pump 32 and a filter 33 for sending the liquid to the tank 29, and an inner tank drain valve 1 for discharging the liquid in the inner tank 29.
2, an outer tank drain valve 14 for draining the liquid in the outer tank 31,
Overflow drain pipe 34 that drains the liquid in the outer tank 31 before it overflows, inner tank empty detection sensor 16 that detects the absence of liquid in the inner tank 29, and outer tank empty detection that detects the absence of liquid in the outer tank 31. And a sensor 18.

【0004】次に動作について説明する。ローダ25に
セットされた半導体基板は、搬送ロボット3により薬液
槽1に運ばれ、所定時間処理された後、水洗槽26へ搬
送され、水洗処理後、乾燥機27へ運ばれて乾燥処理
後、アンローダ28に運ばれる。
Next, the operation will be described. The semiconductor substrate set in the loader 25 is carried to the chemical solution tank 1 by the transfer robot 3 and processed for a predetermined time, and then transferred to the water washing tank 26. After the water washing processing, it is carried to the dryer 27 and dried, It is carried to the unloader 28.

【0005】薬液槽1は、給液バルブ30を開けること
により、内槽29及び外槽31が薬液に満たされ、ポン
プ32及びフィルター33により外槽31の薬液を濾過
して内槽29に供給することにより、内槽29の薬液の
清浄度を向上させながら、半導体基板2を内槽29内で
処理するものである。
In the chemical tank 1, the inner tank 29 and the outer tank 31 are filled with the chemical solution by opening the liquid supply valve 30, and the chemical solution in the outer tank 31 is filtered by the pump 32 and the filter 33 and supplied to the inner tank 29. By doing so, the semiconductor substrate 2 is processed in the inner tank 29 while improving the cleanliness of the chemical liquid in the inner tank 29.

【0006】従来の自動半導体基板浸漬処理装置におい
て、搬送ロボット3が故障して動作できなくなったとき
のコントローラ34の制御について、図3を用いて説明
する。
In the conventional automatic semiconductor substrate dipping processing apparatus, the control of the controller 34 when the transfer robot 3 fails and cannot operate will be described with reference to FIG.

【0007】搬送ロボット3が故障して動けなくなると
(ステップ22)、コントローラ4は、ディスプレイ5
に故障状態を表示し(ステップ6)、アラームランプ7
を点灯させ(ステップ8)、アラームブザー9を鳴動さ
せて(ステップ10)、作業者を呼び、後の処置は作業
者に依存するものであった。
When the transfer robot 3 fails and cannot move (step 22), the controller 4 causes the display 5 to move.
The failure status is displayed on the screen (step 6), and the alarm lamp 7
Was turned on (step 8), the alarm buzzer 9 was sounded (step 10), the operator was called, and the subsequent treatment depended on the operator.

【0008】[0008]

【発明が解決しようとする課題】この従来の自動半導体
基板浸漬処理装置では、薬液槽で半導体基板を処理して
いるときに、搬送ロボットが故障して動けなくなると、
所定時間経過後も薬液槽から取り出せないため、オーバ
ーエッチングによる半導体基板の良否が作業者の処置に
依存されるものであった。
In this conventional automatic semiconductor substrate immersion processing apparatus, when the transfer robot fails and cannot move while processing a semiconductor substrate in the chemical bath,
Since it cannot be taken out of the chemical bath even after a predetermined time has passed, the quality of the semiconductor substrate due to overetching depends on the operator's treatment.

【0009】昨今、半導体工場のFA化が進み、作業者
の数が激減しており、益々この種の不良発生率が増加す
る傾向にあるという問題点があった。
In recent years, the FA factory has been promoted to FA, the number of workers has been drastically reduced, and there has been a problem that the defect occurrence rate of this kind tends to increase more and more.

【0010】本発明の目的は、搬送ロボットが故障して
動作しなくなったことによる半導体基板のオーバーエッ
チング等の不良を防止した自動半導体基板浸漬処理装置
を提供することにある。
An object of the present invention is to provide an automatic semiconductor substrate dipping processing apparatus which prevents a defect such as over-etching of a semiconductor substrate due to a transfer robot having failed and not operating.

【0011】[0011]

【課題を解決するための手段】前記目的を達成するた
め、本発明に係る自動半導体基板浸漬処理装置は、コン
トローラを有し、半導体基板を搬送ロボットにより連続
して薬液浸漬処理,水洗処理,乾燥処理する自動半導体
基板浸漬処理装置であって、コントローラは、半導体基
板を薬液処理する薬液槽に備えられ、処理中の半導体基
板が存在する状態で、半導体基板を搬送する搬送ロボッ
トが故障して動作しなくなった信号を受信し、前記処理
中の半導体基板の処理時間が所定時間経過したことを認
識した後に、薬液槽の薬液を超純水に置換する機能を有
するものである。
In order to achieve the above object, an automatic semiconductor substrate dipping treatment apparatus according to the present invention has a controller, and semiconductor substrates are continuously dipped in a chemical solution, washed with water, and dried with a transfer robot. An automatic semiconductor substrate dipping processing device for processing, wherein a controller is provided in a chemical bath for chemical treatment of a semiconductor substrate and operates in a state where a semiconductor substrate being processed is present and a transfer robot for transferring the semiconductor substrate fails. It has a function of replacing the chemical liquid in the chemical liquid tank with ultrapure water after receiving a signal indicating that the semiconductor substrate is being processed and recognizing that the processing time of the semiconductor substrate being processed has passed a predetermined time.

【0012】[0012]

【作用】搬送ロボットの故障発生の信号を受けて、ディ
スプレイに故障状態を表示させ、アラームランプを点灯
させ、アラームブサーを鳴動させると同時に、薬液槽で
の半導体基板処理時間が所定時間経過すると、内槽及び
外槽の液を全て超純水に置換する。
When the signal indicating the failure of the transfer robot is received, the failure status is displayed on the display, the alarm lamp is turned on, the alarm buzzer is sounded, and at the same time the semiconductor substrate processing time in the chemical solution tank elapses for a predetermined time, Replace all liquid in the inner and outer tanks with ultrapure water.

【0013】[0013]

【実施例】以下、本発明の一実施例を図により説明す
る。図4は、本発明に係る薬液槽を示す構成図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. FIG. 4 is a configuration diagram showing a chemical liquid tank according to the present invention.

【0014】図4において、本発明に係る薬液槽は、内
槽29と、内槽29に薬液を供給する給液バルブ30及
び超純水を供給する給水バルブ20と、内槽29からオ
ーバーフローした薬液を貯える外槽31と、外槽31の
薬液を濾過しながら内槽29へ送液するポンプ32及び
フィルター33と、内槽29の液を排液する内槽排液バ
ルブ12と、外槽31の液を排液する外槽排液バルブ1
4と、外槽31の液があふれ出る前に排液するオーバー
フロー排液管34と、内槽29の液無しを検出する内槽
空検知センサー16と、外槽31の液無しを検知する外
槽空検知センサー18と、コントローラ35とを有して
いる。
In FIG. 4, the chemical tank according to the present invention overflows from the inner tank 29, the liquid supply valve 30 for supplying the chemical solution to the inner tank 29, the water supply valve 20 for supplying the ultrapure water, and the inner tank 29. An outer tank 31 for storing the chemical liquid, a pump 32 and a filter 33 for feeding the chemical liquid in the outer tank 31 to the inner tank 29 while filtering the chemical liquid, an inner tank drain valve 12 for discharging the liquid in the inner tank 29, and an outer tank Outer tank drain valve 1 for draining 31 liquid
4, an overflow drain pipe 34 that drains the liquid in the outer tank 31 before it overflows, an inner tank empty detection sensor 16 that detects the liquid in the inner tank 29, and an outside that detects the liquid in the outer tank 31. It has a tank empty detection sensor 18 and a controller 35.

【0015】コントローラ35は、半導体基板を薬液処
理する薬液槽に備えられ、処理中の半導体基板が存在す
る状態で、半導体基板を搬送する搬送ロボットが故障し
て動作しなくなった信号を受信し、前記処理中の半導体
基板の処理時間が所定時間経過したことを認識した後
に、薬液槽の薬液を超純水に置換する機能を有するもの
である。
The controller 35 is provided in a chemical bath for chemical treatment of a semiconductor substrate, and receives a signal indicating that the transport robot for transporting the semiconductor substrate fails and does not operate in the state where the semiconductor substrate being processed exists. It has a function of replacing the chemical liquid in the chemical liquid tank with ultrapure water after recognizing that the processing time of the semiconductor substrate being processed has passed a predetermined time.

【0016】その他の構成は図5のものと同じである。The other structure is the same as that of FIG.

【0017】図1は、本発明の一実施例における搬送ロ
ボット故障時のフローチャートである。
FIG. 1 is a flow chart when a transfer robot fails in one embodiment of the present invention.

【0018】薬液槽1内で半導体基板2を処理している
ときに、搬送ロボット3が何らかの故障により動作でき
なくなると(ステップ22)、コントローラ4及び35
は、以下のような制御を行う。
While the semiconductor substrate 2 is being processed in the chemical bath 1, if the transfer robot 3 cannot operate due to some trouble (step 22), the controllers 4 and 35 are provided.
Performs the following control.

【0019】まず、コントローラ4は、ディスプレイ5
に故障状態を表示し(ステップ6)、アラームランプ7
を点灯させ(ステップ8)、アラームブザー9を鳴動さ
せる(ステップ10)。
First, the controller 4 includes a display 5
The failure status is displayed on the screen (step 6), and the alarm lamp 7
Is turned on (step 8) and the alarm buzzer 9 is activated (step 10).

【0020】また、コントローラ35は、処理途中の半
導体基板が存在する状態で、搬送ロボット3が故障して
動作しなくなった信号を受信した場合に、薬液槽1での
設定処理時間と実行処理時間とを比較し、一致すると
(ステップ11)、図4の内槽排液バルブ12を開け
(ステップ13)、図4の外槽排液バルブ14を開ける
(ステップ15)。
Further, the controller 35 receives the signal indicating that the transfer robot 3 is out of order due to the failure of the transfer robot 3 in the state where the semiconductor substrate being processed is present, the setting processing time and the execution processing time in the chemical liquid tank 1. When they are compared with each other (step 11), the inner tank drain valve 12 of FIG. 4 is opened (step 13), and the outer tank drain valve 14 of FIG. 4 is opened (step 15).

【0021】そこで、コントローラ35は、内槽空検知
センサー16が空検知すると(ステップ17)、その信
号に基づいて内槽排液バルブ12を閉じ(ステップ2
3)、外槽空検知センサー18が空検知すると(ステッ
プ19)、外槽排液バルブ14を閉じる(ステップ2
4)。
When the inner tank empty detection sensor 16 detects that the inner tank is empty (step 17), the controller 35 closes the inner tank drain valve 12 based on the signal (step 2).
3) When the outer tank empty detection sensor 18 detects empty (step 19), the outer tank drain valve 14 is closed (step 2).
4).

【0022】次に、コントローラ35は給水バルブ20
を開け(ステップ21)、作業者が到着してリセット動
作するまでこの状態を保持するものである。
Next, the controller 35 controls the water supply valve 20.
Is opened (step 21), and this state is maintained until the worker arrives and the reset operation is performed.

【0023】次に、図2を用いて本発明の実施例2につ
いて説明する。図2は、本発明の実施例2における搬送
ロボット故障時のフローチャートである。搬送ロボット
故障発生時のコントローラ4は、ディスプレイ5に故障
状態を表示し(ステップ6)、アラームランプ7を点灯
させ(ステップ8)、アラームブザー9を鳴動させる
(ステップ10)。
Next, a second embodiment of the present invention will be described with reference to FIG. FIG. 2 is a flowchart when a transfer robot fails in the second embodiment of the present invention. The controller 4 at the time of failure of the transport robot displays the failure state on the display 5 (step 6), turns on the alarm lamp 7 (step 8), and sounds the alarm buzzer 9 (step 10).

【0024】一方、コントローラ35は、薬液槽1での
設定処理時間と実行処理時間を比較して一致すれば(ス
テップ11)、給水バルブ20を開け(ステップ2
1)、作業者が到着してリセット動作するまで、この状
態を保持する。
On the other hand, the controller 35 compares the set processing time and the execution processing time in the chemical liquid tank 1 and if they match (step 11), the water supply valve 20 is opened (step 2).
1) Hold this state until the worker arrives and resets.

【0025】本実施例では、外槽オーバーフロー排液管
より薬液が排液され、液濃度が徐々に低下し、最後は水
に置換される。
In the present embodiment, the chemical liquid is drained from the outer tank overflow drain pipe, the liquid concentration gradually decreases, and finally the liquid is replaced with water.

【0026】したがって、半導体基板を空気に触させる
ことなく、水に置換されるため、パーティクルの付着が
防止できるという利点がある。
Therefore, since the semiconductor substrate is replaced with water without contact with air, there is an advantage that particles can be prevented from adhering.

【0027】[0027]

【発明の効果】以上説明したように本発明は、半導体基
板の薬液処理中に、搬送ロボットが故障して動作できな
くなったとき、コントローラが搬送ロボット故障発生の
信号を受けて、薬液槽の薬液を純水に置換するため、作
業者が処置しなくても薬液による半導体基板のオーバー
エッチング及び膜減りが生ぜず、搬送ロボット動作不可
による半導体基板の不良発生を防止できるという効果を
有する。
As described above, according to the present invention, when the transfer robot fails and cannot operate during the chemical processing of the semiconductor substrate, the controller receives the transfer robot failure occurrence signal and the chemical solution in the chemical tank is received. Since pure water is replaced with pure water, over-etching and film reduction of the semiconductor substrate due to the chemical solution do not occur even if the operator does not take any action, and it is possible to prevent the occurrence of defects in the semiconductor substrate due to the inability to operate the transfer robot.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例の動作を示すフローチャート
である。
FIG. 1 is a flowchart showing the operation of an embodiment of the present invention.

【図2】本発明の実施例2の動作を示すフローチャート
である。
FIG. 2 is a flowchart showing the operation of the second embodiment of the present invention.

【図3】従来の動作を示すフローチャートである。FIG. 3 is a flowchart showing a conventional operation.

【図4】本発明に係る薬液槽を示す構成図である。FIG. 4 is a configuration diagram showing a chemical liquid tank according to the present invention.

【図5】自動半導体基板浸漬処理装置を示す斜視図であ
る。
FIG. 5 is a perspective view showing an automatic semiconductor substrate immersion treatment apparatus.

【符号の説明】[Explanation of symbols]

1 薬液槽 2 半導体基板 3 搬送ロボット 4 コントローラ 5 ディスプレイ 7 アラームランプ 9 アラームブザー 12 内槽排液バルブ 14 外槽排液バルブ 16 内槽空検知センサー 18 外槽空検知センサー 20 給水バルブ 25 ローダ 26 水洗槽 27 乾燥機 28 アンローダ 29 内槽 30 給液バルブ 31 外槽 32 ポンプ 33 フィルター 34 オーバーフロー排液管 35 コントローラ 1 chemical tank 2 semiconductor substrate 3 transfer robot 4 controller 5 display 7 alarm lamp 9 alarm buzzer 12 inner tank drain valve 14 outer tank drain valve 16 inner tank empty detection sensor 18 outer tank empty detection sensor 20 water supply valve 25 loader 26 water washing Tank 27 Dryer 28 Unloader 29 Inner tank 30 Liquid supply valve 31 Outer tank 32 Pump 33 Filter 34 Overflow drainage pipe 35 Controller

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 コントローラを有し、半導体基板を搬送
ロボットにより連続して薬液浸漬処理,水洗処理,乾燥
処理する自動半導体基板浸漬処理装置であって、 コントローラは、半導体基板を薬液処理する薬液槽に備
えられ、処理中の半導体基板が存在する状態で、半導体
基板を搬送する搬送ロボットが故障して動作しなくなっ
た信号を受信し、前記処理中の半導体基板の処理時間が
所定時間経過したことを認識した後に、薬液槽の薬液を
超純水に置換する機能を有するものであることを特徴と
する自動半導体基板浸漬処理装置。
1. An automatic semiconductor substrate dipping processing device having a controller, which successively carries out a chemical liquid dipping process, a water washing process, and a drying process on semiconductor substrates by a transfer robot, wherein the controller is a chemical liquid tank for chemically treating the semiconductor substrate. In the state where the semiconductor substrate being processed is present, a signal indicating that the transfer robot that transfers the semiconductor substrate has failed and has stopped operating, and the processing time of the semiconductor substrate being processed has passed a predetermined time After recognizing the above, an automatic semiconductor substrate dipping treatment device having a function of replacing the chemical liquid in the chemical liquid tank with ultrapure water.
JP11542492A 1992-04-08 1992-04-08 Automatic semiconductor substrate immersion processing equipment Expired - Fee Related JP2803458B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11542492A JP2803458B2 (en) 1992-04-08 1992-04-08 Automatic semiconductor substrate immersion processing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11542492A JP2803458B2 (en) 1992-04-08 1992-04-08 Automatic semiconductor substrate immersion processing equipment

Publications (2)

Publication Number Publication Date
JPH05291236A true JPH05291236A (en) 1993-11-05
JP2803458B2 JP2803458B2 (en) 1998-09-24

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010109347A (en) * 2008-10-03 2010-05-13 Dainippon Screen Mfg Co Ltd Substrate processing apparatus, and failure handling method
CN111489959A (en) * 2020-05-22 2020-08-04 北京北方华创微电子装备有限公司 Semiconductor cleaning equipment

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010109347A (en) * 2008-10-03 2010-05-13 Dainippon Screen Mfg Co Ltd Substrate processing apparatus, and failure handling method
CN111489959A (en) * 2020-05-22 2020-08-04 北京北方华创微电子装备有限公司 Semiconductor cleaning equipment
CN111489959B (en) * 2020-05-22 2023-11-14 北京北方华创微电子装备有限公司 Semiconductor cleaning equipment

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