JPH04334579A - Cleaning apparatus - Google Patents

Cleaning apparatus

Info

Publication number
JPH04334579A
JPH04334579A JP13167391A JP13167391A JPH04334579A JP H04334579 A JPH04334579 A JP H04334579A JP 13167391 A JP13167391 A JP 13167391A JP 13167391 A JP13167391 A JP 13167391A JP H04334579 A JPH04334579 A JP H04334579A
Authority
JP
Japan
Prior art keywords
cleaning
opening
case
closing means
liquid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP13167391A
Other languages
Japanese (ja)
Inventor
Shinya Murakami
村上 信也
Yuji Kamikawa
裕二 上川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Tokyo Electron Kyushu Ltd
Original Assignee
Tokyo Electron Ltd
Tokyo Electron Kyushu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd, Tokyo Electron Kyushu Ltd filed Critical Tokyo Electron Ltd
Priority to JP13167391A priority Critical patent/JPH04334579A/en
Priority to US07/880,068 priority patent/US5488964A/en
Priority to KR1019920007937A priority patent/KR0175072B1/en
Publication of JPH04334579A publication Critical patent/JPH04334579A/en
Priority to US08/560,708 priority patent/US5671764A/en
Priority to US08/743,836 priority patent/US5887604A/en
Priority to US08/789,537 priority patent/US5782990A/en
Withdrawn legal-status Critical Current

Links

Landscapes

  • Cleaning By Liquid Or Steam (AREA)
  • Cleaning And De-Greasing Of Metallic Materials By Chemical Methods (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

PURPOSE:To prevent an opening and closing means from corroding and at the same time to prevent the disorder of the environment in a cleaning chamber by cleaning the opening and closing means to open and close an open part which is for carrying a treatment object in and out and formed in the cleaning chamber to clean the treatment object with a treatment liquid. CONSTITUTION:An opening and closing means 6 is so set in a case 7 having an open part as to open and close the open part. The opening and closing means 6 and a driving means 8 located in the outside of a case 7 are joined by a seal system 10. A gas discharging and liquid discharging outlet 14 is formed in the bottom of the case 7 and at the same time a supplying means 17 to supply an opening and closing means cleaning liquid is installed at a part of the case 7. The opening and closing means 6 is cleaned by the supplying means 17 and the waste liquid of the cleaning liquid used for cleaning is discharged to the outside through the gas discharging and liquid discharging outlet 14, so that the opening and closing means 6 becomes clean and disorder of the environment in a cleaning chamber 3 is prevented.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】この発明は洗浄装置に関するもの
で、更に詳細には、例えば半導体ウエハ等の被処理体を
洗浄処理室に搬送し、処理室内において処理液に浸漬し
て洗浄処理する洗浄装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a cleaning apparatus, and more particularly, to a cleaning apparatus in which an object to be processed, such as a semiconductor wafer, is transported to a cleaning processing chamber and immersed in a processing liquid in the processing chamber for cleaning. It is related to the device.

【0002】0002

【従来の技術】一般に、半導体製造工程において、半導
体ウエハの表面に付着した薬液や不純物等を除去するた
めに洗浄装置が使用されている。この洗浄装置は、半導
体ウエハに対して、例えばアンモニア処理、水洗処理、
フッ酸処理等の各処理を順次施して半導体ウエハの表面
を清浄化するものである。
2. Description of the Related Art Generally, in semiconductor manufacturing processes, cleaning equipment is used to remove chemicals, impurities, etc. adhering to the surface of semiconductor wafers. This cleaning equipment performs, for example, ammonia treatment, water washing treatment, etc. on semiconductor wafers.
The surface of the semiconductor wafer is cleaned by sequentially performing various treatments such as hydrofluoric acid treatment.

【0003】そこで、従来の洗浄装置は、アンモニア処
理槽、水洗処理槽、フッ酸処理槽等の各処理槽を配置す
る複数の洗浄処理室を配列し、被処理体である半導体ウ
エハを搬送手段にて載置保持して各処理室内外に搬入・
搬出していた。この場合、各処理室は、雰囲気が外部に
漏れるのを防止するために各処理槽の周囲を容器にて包
囲し、また、容器に半導体ウエハの搬入・搬出用の開口
部を設け、この開口部をシャッターによって遮断し、各
洗浄処理室内の雰囲気を外部に漏れないようにしていた
Therefore, conventional cleaning equipment has a plurality of cleaning processing chambers in which processing tanks such as an ammonia processing tank, a water washing processing tank, a hydrofluoric acid processing tank, etc. are arranged, and a semiconductor wafer as an object to be processed is transferred to a transport means. Place and hold the container at the
It was being carried out. In this case, each processing chamber is surrounded by a container to prevent the atmosphere from leaking outside, and the container is provided with an opening for loading and unloading semiconductor wafers. The chamber was closed off with a shutter to prevent the atmosphere inside each cleaning chamber from leaking to the outside.

【0004】0004

【発明が解決しようとする課題】しかしながら、従来の
この種の洗浄装置においては、搬送手段が雰囲気の異な
る処理室に対して半導体ウエハを搬入・搬出するため、
搬送中に搬送手段に付着した前処理で扱った薬液がシャ
ッターに滴下することがあった。また、開口部の開放に
よって連通する両処理室内の雰囲気の相違によって化学
反応が生じ、例えばアンモニア処理室とフッ酸処理室と
が連通する場合にはアルカリと酸とが接触して化学反応
により塩が生成され、この塩がシャッターに付着するこ
とがあった。そのため、これら薬品、不純物等によって
シャッターが腐食するばかりか、処理室内の雰囲気の清
浄度が劣化して被処理体の製品歩留りが低下するという
問題があった。
[Problems to be Solved by the Invention] However, in the conventional cleaning apparatus of this type, since the transport means carries the semiconductor wafers into and out of processing chambers with different atmospheres,
During transportation, the chemical solution treated in the pretreatment that adhered to the transportation means sometimes dripped onto the shutter. In addition, a chemical reaction occurs due to the difference in atmosphere between the two treatment chambers that are communicated by opening the opening. For example, when an ammonia treatment chamber and a hydrofluoric acid treatment chamber are communicated, alkali and acid come into contact and a chemical reaction causes salt formation. was generated and this salt sometimes adhered to the shutter. Therefore, there is a problem that not only the shutter is corroded by these chemicals, impurities, etc., but also the cleanliness of the atmosphere inside the processing chamber is deteriorated, and the product yield of the objects to be processed is reduced.

【0005】この発明は上記事情に鑑みなされたもので
、シャッターを清浄にして各洗浄処理室の雰囲気の乱れ
を防止すると共に、被処理体の製品歩留りの向上を図れ
るようにした洗浄装置を提供することを目的とするもの
である。
The present invention has been made in view of the above-mentioned circumstances, and provides a cleaning device that cleans the shutter to prevent disturbance of the atmosphere in each cleaning processing chamber, and improves the product yield of objects to be processed. The purpose is to

【0006】[0006]

【課題を解決するための手段】上記目的を達成するため
に、この発明の洗浄装置は、処理液によって被処理体を
洗浄する洗浄処理室と、この洗浄処理室に設けられた被
処理体の搬入・搬出用の開口部を開閉する開閉手段とを
具備する洗浄装置を前提とし、上記開口部を有するケー
ス内に、上記開閉手段を開閉可能に配設すると共に、こ
の開閉手段とケース外に位置する駆動手段とをシール機
構を介して連結し、上記ケースの底部に排気・排液口を
設けると共に、ケースの一部に開閉手段洗浄用液の供給
手段を設けてなるものである。
[Means for Solving the Problems] In order to achieve the above object, the cleaning apparatus of the present invention includes a cleaning chamber for cleaning the object to be treated with a treatment liquid, and a cleaning chamber for cleaning the object to be treated by the cleaning chamber. Assuming that the cleaning device is equipped with an opening/closing means for opening and closing an opening for loading and unloading, the opening/closing means is disposed in a case having the opening so as to be openable and closable, and the opening/closing means and the outside of the case are provided. The case is connected to the driving means located therein via a seal mechanism, and an exhaust/drain port is provided at the bottom of the case, and a supply means for cleaning the opening/closing means is provided in a part of the case.

【0007】この発明において、上記開閉手段は開口部
を開閉するものであれば任意のものでよく、例えば上記
ケース内に開閉可能に配設されるシャッターを使用する
ことができる。
In the present invention, the opening/closing means may be of any type as long as it opens and closes the opening; for example, a shutter disposed in the case so as to be openable and closable may be used.

【0008】上記ケースは底部に排気・排液口を有する
ものであれば、その形態は任意のものでよいが、好まし
くは耐蝕性及び耐水性部材にて形成する方がよい。この
場合、耐蝕性及び耐水性部材として、例えば塩化ビニル
製部材を使用することができる。
The case may have any form as long as it has an exhaust/drain port at the bottom, but it is preferably made of a corrosion-resistant and water-resistant material. In this case, a member made of vinyl chloride, for example, can be used as the corrosion-resistant and water-resistant member.

【0009】上記シール機構はケース内に配設される開
閉手段とケース外に位置する駆動手段とを気水密に連結
するものであれば、シール部材のみで形成してもよいが
、好ましくは2つのシール部材間に形成した密封空間内
を加圧状態にする方がよい。
[0009] The above-mentioned sealing mechanism may be formed of only a sealing member as long as it connects the opening/closing means disposed inside the case and the driving means located outside the case in an air-watertight manner, but preferably two parts are used. It is better to pressurize the inside of the sealed space formed between the two seal members.

【0010】また、上記開閉手段洗浄用液の供給手段は
ケースのいずれかに設けられていればよく、例えばケー
スの上部に設けられてシャッターをシャワー洗浄するも
のであってもよい。また、洗浄形態はシャワーによって
洗浄するものでよく、あるいは、ケース内に洗浄液を溜
めてシャッターを洗浄するものであってもよい。
Further, the means for supplying the liquid for cleaning the opening/closing means may be provided in any part of the case, for example, it may be provided in the upper part of the case to shower wash the shutter. Further, the cleaning method may be one in which the shutter is washed by a shower, or the shutter may be cleaned by storing a cleaning liquid in the case.

【0011】[0011]

【作用】上記のように構成されるこの発明の洗浄装置に
よれば、ケース内に配設される開閉手段を洗浄用液供給
手段から供給される洗浄液で洗浄すると共に、洗浄に供
された排液を排気・排液口から外部に排出することがで
きるので、開閉手段は常に清浄化された状態に維持され
、洗浄処理室内の雰囲気を乱すことがない。また、シー
ル機構によって洗浄液や薬品によって汚染された空気の
駆動手段側への侵入を阻止することにより、開閉手段の
腐食を防止することができると共に、寿命の増大が図れ
る。
[Operation] According to the cleaning device of the present invention constructed as described above, the opening/closing means disposed inside the case is cleaned with the cleaning liquid supplied from the cleaning liquid supply means, and the waste water used for cleaning is cleaned with the cleaning liquid supplied from the cleaning liquid supply means. Since the liquid can be discharged to the outside from the exhaust/drain port, the opening/closing means is always maintained in a clean state and the atmosphere within the cleaning processing chamber is not disturbed. Further, by preventing air contaminated with cleaning liquid or chemicals from entering the driving means by the sealing mechanism, corrosion of the opening/closing means can be prevented and the life of the opening/closing means can be increased.

【0012】0012

【実施例】以下にこの発明の実施例を図面に基いて詳細
に説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Examples of the present invention will be described below in detail with reference to the drawings.

【0013】図1はこの発明の洗浄装置の断面図、図2
は図1の要部の拡大断面図が示されている。
FIG. 1 is a sectional view of the cleaning device of the present invention, and FIG.
1 is an enlarged sectional view of the main part of FIG.

【0014】この発明の洗浄装置は、処理槽1内に収容
される処理液に被処理体である半導体ウエハ2を浸漬し
て洗浄する複数の洗浄処理室3を有しており、各洗浄処
理室3と隣接する被処理体搬送室4との間に設けられた
被処理体の搬入・搬出用の開口部5にシャッター6を開
閉可能に配設してなる。
The cleaning apparatus of the present invention has a plurality of cleaning processing chambers 3 in which semiconductor wafers 2, which are objects to be processed, are immersed in a processing liquid contained in a processing tank 1 for cleaning. A shutter 6 is openably and closably disposed in an opening 5 for loading and unloading objects to be processed, which is provided between the chamber 3 and an adjacent object transfer chamber 4.

【0015】シャッター6は耐薬品生に優れた石英ガラ
スにて形成されており、そして、開口部5を有する矩形
枠状のケース7内に上下方向に移動可能に配設されて、
開口部5を開閉し得るようになっている。また、シャッ
ター6とケース7外の下方に位置する駆動手段であるエ
アシリンダ8のプランジャ9とがシール機構10を介し
て連結されている。
The shutter 6 is made of quartz glass with excellent chemical resistance, and is disposed in a rectangular frame-shaped case 7 having an opening 5 so as to be movable in the vertical direction.
The opening 5 can be opened and closed. Further, the shutter 6 and a plunger 9 of an air cylinder 8, which is a driving means located below outside the case 7, are connected via a seal mechanism 10.

【0016】ケース7は耐水及び耐蝕性に優れた塩化ビ
ニル製部材にて形成されている。このケース7の上端部
には複数の小孔を穿設した空気供給部7aが設けられ、
この空気供給部7aに接続するダクト11中にヘパ(H
EPA)フィルタ12を介して空気供給用ファン13が
配設されている。また、ケース7の底部には排気・排液
口14が設けられており、この排気・排液口14には排
出管15を介して図示しない吸引手段が接続されている
。このように形成することにより、ケース7内は上部か
ら供給される清浄化されたクリーンエアが層流状態で下
方の排気・排液口14から外部に流れるエアカーテンが
形成され、洗浄処理室3側から漏出する薬品を含む空気
等を安全に外部へ排出することができるようになってい
る。なお、排出管15の途中には気液分離部16が配設
されて、排出された洗浄液と汚染空気とを分離し得るよ
うになっている。
The case 7 is made of a vinyl chloride member with excellent water resistance and corrosion resistance. An air supply section 7a having a plurality of small holes is provided at the upper end of the case 7.
In the duct 11 connected to this air supply part 7a,
An air supply fan 13 is provided through an EPA filter 12. Further, an exhaust/drain port 14 is provided at the bottom of the case 7, and a suction means (not shown) is connected to the exhaust/drain port 14 via a discharge pipe 15. By forming the case 7 in this way, an air curtain is formed in which purified clean air supplied from the upper part flows to the outside from the lower exhaust/drain port 14 in a laminar flow state, and the cleaning processing chamber 3 Air containing chemicals leaking from the side can be safely discharged to the outside. Note that a gas-liquid separator 16 is disposed in the middle of the discharge pipe 15 to separate the discharged cleaning liquid and contaminated air.

【0017】一方、ケース7内の上部にシャッター洗浄
用液の供給手段であるシャワーノズル17が配設されて
おり、このシャワーノズル17には供給管18を介して
供給ポンプ19が接続されて、洗浄液である純水が供給
されるようになっている。このシャワーノズル17がシ
ャッター6に向って純水を噴射することによってシャッ
ター6に付着した薬品や不純物等を除去することができ
る。
On the other hand, a shower nozzle 17, which is a means for supplying shutter cleaning liquid, is disposed in the upper part of the case 7, and a supply pump 19 is connected to the shower nozzle 17 via a supply pipe 18. Pure water, which is a cleaning liquid, is supplied. This shower nozzle 17 sprays pure water toward the shutter 6, thereby making it possible to remove chemicals, impurities, etc. attached to the shutter 6.

【0018】なお、シール機構10は、図2に示すよう
に、ケース7の底部を貫通して取付けられた塩化ビニル
製の案内筒体20と、この案内筒体20内に貫通される
エアシリンダ8のプランジャ9との間に介在される2つ
の合成ゴム製のシール部材21,21にて形成されてい
る。この場合、案内筒体20の一部に穿設された通気孔
20aに接続するN2 ガス供給管22を介してシール
部材21,21間に形成された密封空間23内とN2 
タンク24とを接続し、密封空間23内にN2 ガスを
充填することにより密封空間23内を加圧状態に維持し
ている。したがって、シャッター6の洗浄に使用された
洗浄液がプランジャ9を伝わってエアシリンダ8側へ侵
入するのを抑えることができ、エアシリンダ8の腐食を
防止することができると共に、寿命の増大が図れる。
As shown in FIG. 2, the sealing mechanism 10 includes a guide tube 20 made of vinyl chloride that is installed through the bottom of the case 7, and an air cylinder that is passed through the guide tube 20. It is formed by two synthetic rubber sealing members 21, 21 interposed between the plunger 9 of 8 and the plunger 9 of 8. In this case, the inside of the sealed space 23 formed between the seal members 21 and 21 is connected to the N2 gas supply pipe 22 connected to the ventilation hole 20a formed in a part of the guide cylinder 20.
The inside of the sealed space 23 is maintained in a pressurized state by connecting it to a tank 24 and filling the sealed space 23 with N2 gas. Therefore, it is possible to prevent the cleaning liquid used for cleaning the shutter 6 from entering the air cylinder 8 side through the plunger 9, thereby preventing corrosion of the air cylinder 8 and increasing its life.

【0019】なお、被処理体搬送室4内には、複数のア
ーム体25,25…を回転自在に連結し、その上部側の
アーム体25に半導体ウエハ2を載置保持するフォーク
26を設けた回転搬送アーム27が配設されており、こ
の回転搬送アーム27によって半導体ウエハ2が洗浄処
理室3に搬入・搬出されるようになっている。また、被
処理体搬送室4の上端部に設けられた開口には多孔板2
8が配設され、開口に接続するダクト29にヘパ(HE
PA)フィルタ30及び空気供給用ファン31が配設さ
れている。更に、被処理体搬送室4の底部には排気・排
液口32が設けられると共に、この排気・排液口32の
上方に整流用の多孔板33が配設され、そして、排気・
排液口32に図示しない吸引ファンが接続されている。 したがって、被処理体搬送室4内は上部から供給される
清浄化されたクリーンエアが層流状態のダウンフローで
下方の排気・排液口32から外部に流れるため、室内の
雰囲気は常に清浄化される。なお、各洗浄処理室3も同
様にクリーンエアのダウンフローによって雰囲気が清浄
化されている。
A fork 26 is provided in the object transfer chamber 4 to rotatably connect a plurality of arm bodies 25, 25, . . . and to place and hold the semiconductor wafer 2 on the upper arm body 25. A rotating transfer arm 27 is provided, and the semiconductor wafer 2 is carried into and out of the cleaning processing chamber 3 by this rotating transfer arm 27. In addition, a perforated plate 2 is provided in the opening provided at the upper end of the object transfer chamber 4.
8 is arranged, and the duct 29 connected to the opening is
PA) A filter 30 and an air supply fan 31 are provided. Further, an exhaust/drain port 32 is provided at the bottom of the object transfer chamber 4, and a perforated plate 33 for rectification is provided above the exhaust/drain port 32.
A suction fan (not shown) is connected to the drain port 32. Therefore, the purified clean air supplied from the upper part of the processing object transfer chamber 4 flows to the outside from the lower exhaust/drain port 32 in a laminar downflow, so that the atmosphere inside the chamber is always clean. be done. Note that the atmosphere of each cleaning processing chamber 3 is similarly cleaned by the downflow of clean air.

【0020】次に、この発明の洗浄装置の作用について
説明すると、半導体ウエハ2を洗浄処理室3内に搬入す
る場合には、エアシリンダ8の駆動によってプランジャ
9及びシャッター6を下降させて開口部5を開放し、そ
して、回転搬送アーム27のフォーク26に半導体ウエ
ハ2を載置保持させて洗浄処理室3内に搬送する。この
とき、ケース7の上部からクリーンエアが噴射されてエ
アカーテンが形成され、洗浄処理室3内に外部の雰囲気
が入り込むのを防止する。洗浄処理室3内に半導体ウエ
ハ2を搬送した後、回転搬送アーム27は被処理体搬送
室4内に戻って洗浄処理が終了するまで待機する。なお
、半導体ウエハ2は図示しないウエハ保持アームに立設
保持されて処理槽1内の処理液に浸漬洗浄される。この
際、エアシリンダ8の駆動によってプランジャ9及びシ
ャッター6が上昇して開口部が閉じ、洗浄処理室3内の
雰囲気が外部に漏出するのを防止する。一方、シャワー
ノズル17から洗浄用純水がシャッター6に向って噴射
されて、シャッター6に付着した薬液や隣接する洗浄処
理室3内の異なる雰囲気による化学反応によって発生す
る微粒子状の塩等の不純物が除去される。そして、洗浄
に供された洗浄排液と除去された薬品や不純物は排気・
排液口14から外部に排出される。したがって、シャッ
ター6は常に清浄化された状態に維持され、洗浄処理室
3内の雰囲気は乱される虞れはない。
Next, the operation of the cleaning apparatus of the present invention will be explained. When carrying the semiconductor wafer 2 into the cleaning processing chamber 3, the plunger 9 and shutter 6 are lowered by driving the air cylinder 8 to close the opening. 5 is opened, and the semiconductor wafer 2 is placed and held on the fork 26 of the rotary transfer arm 27 and transferred into the cleaning processing chamber 3. At this time, clean air is injected from the upper part of the case 7 to form an air curtain to prevent external atmosphere from entering the cleaning processing chamber 3. After transporting the semiconductor wafer 2 into the cleaning processing chamber 3, the rotary transport arm 27 returns to the object transporting chamber 4 and waits until the cleaning processing is completed. The semiconductor wafer 2 is held upright by a wafer holding arm (not shown) and is immersed in a processing liquid in the processing tank 1 for cleaning. At this time, the plunger 9 and shutter 6 are raised by driving the air cylinder 8 to close the opening, thereby preventing the atmosphere inside the cleaning processing chamber 3 from leaking to the outside. On the other hand, when pure water for cleaning is sprayed from the shower nozzle 17 toward the shutter 6, impurities such as chemical liquid adhering to the shutter 6 and fine particulate salts generated by a chemical reaction due to a different atmosphere in the adjacent cleaning processing chamber 3 are removed. is removed. The cleaning waste liquid used for cleaning and the removed chemicals and impurities are then exhausted and
The liquid is discharged to the outside from the drain port 14. Therefore, the shutter 6 is always maintained in a clean state, and there is no possibility that the atmosphere inside the cleaning processing chamber 3 will be disturbed.

【0021】なお、上記実施例では半導体ウエハ2の洗
浄処理について説明したが、必ずしも半導体ウエハ2の
洗浄に限定されるものではなく、液体処理であれば例え
ばLCD基板等の洗浄処理においても適用できることは
勿論である。
Although the above embodiment describes the cleaning process for the semiconductor wafer 2, it is not necessarily limited to cleaning the semiconductor wafer 2, and any liquid process can also be applied to the cleaning process for, for example, an LCD substrate. Of course.

【0022】[0022]

【発明の効果】以上に説明したように、この発明の洗浄
装置によれば、ケース内に配設される開閉手段を洗浄用
液供給手段から供給される洗浄液で洗浄すると共に、洗
浄に供された排液を排気・排液口から外部に排出するこ
とができるので、開閉手段は常に清浄化された状態に維
持され、洗浄処理室内の雰囲気を乱すことがない。その
結果、被処理体の製品歩留りの向上を図ることができる
。また、シール機構によって洗浄液や薬品によって汚染
された空気の駆動手段側への侵入を阻止することにより
、開閉手段部の腐食を防止することができると共に、寿
命の増大が図れる。
As explained above, according to the cleaning device of the present invention, the opening/closing means disposed inside the case is cleaned with the cleaning liquid supplied from the cleaning liquid supply means, and the opening/closing means disposed inside the case is cleaned with the cleaning liquid supplied from the cleaning liquid supply means. Since the drained liquid can be discharged to the outside from the exhaust/drain port, the opening/closing means is always maintained in a clean state and the atmosphere inside the cleaning processing chamber is not disturbed. As a result, it is possible to improve the product yield of objects to be processed. Further, by preventing air contaminated with cleaning liquid or chemicals from entering the driving means by the sealing mechanism, corrosion of the opening/closing means can be prevented and the life of the opening/closing means can be increased.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】この発明の洗浄装置の概略断面図である。FIG. 1 is a schematic cross-sectional view of a cleaning device of the present invention.

【図2】この発明における開閉手段を示す要部拡大断面
図である。
FIG. 2 is an enlarged sectional view of a main part showing an opening/closing means in the present invention.

【符号の説明】[Explanation of symbols]

2  半導体ウエハ(被処理体) 3  洗浄処理室 5  開口部 6  シャッター(開閉手段) 7  ケース 8  エアシリンダ(駆動手段) 10  シール機構 14  排気・排液口 2 Semiconductor wafer (object to be processed) 3 Cleaning processing room 5 Opening 6 Shutter (opening/closing means) 7 Case 8 Air cylinder (driving means) 10 Seal mechanism 14 Exhaust/drain port

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】  処理液によって被処理体を洗浄する洗
浄処理室と、この洗浄処理室に設けられた被処理体の搬
入・搬出用の開口部を開閉する開閉手段とを具備する洗
浄装置において、上記開口部を有するケース内に、上記
開閉手段を開閉可能に配設すると共に、この開閉手段と
ケース外に位置する駆動手段とをシール機構を介して連
結し、上記ケースの底部に排気・排液口を設けると共に
、ケースの一部に開閉手段洗浄用液の供給手段を設けて
なることを特徴とする洗浄装置。
1. A cleaning apparatus comprising a cleaning chamber for cleaning an object to be treated with a processing liquid, and an opening/closing means for opening and closing an opening provided in the cleaning chamber for loading and unloading an object to be treated. The opening/closing means is disposed in a case having the opening so as to be openable and closable, and the opening/closing means and a driving means located outside the case are connected via a sealing mechanism, and an exhaust/air outlet is provided at the bottom of the case. A cleaning device characterized in that a drain port is provided, and a part of the case is provided with a means for supplying a liquid for cleaning the opening/closing means.
JP13167391A 1991-05-08 1991-05-08 Cleaning apparatus Withdrawn JPH04334579A (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP13167391A JPH04334579A (en) 1991-05-08 1991-05-08 Cleaning apparatus
US07/880,068 US5488964A (en) 1991-05-08 1992-05-07 Washing apparatus, and washing method
KR1019920007937A KR0175072B1 (en) 1991-05-08 1992-05-08 Washing apparatus and washing method
US08/560,708 US5671764A (en) 1991-05-08 1995-11-20 Washing apparatus, and washing method
US08/743,836 US5887604A (en) 1991-05-08 1996-11-05 Washing apparatus, and washing method
US08/789,537 US5782990A (en) 1991-05-08 1997-01-27 Method for washing objects

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13167391A JPH04334579A (en) 1991-05-08 1991-05-08 Cleaning apparatus

Publications (1)

Publication Number Publication Date
JPH04334579A true JPH04334579A (en) 1992-11-20

Family

ID=15063555

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13167391A Withdrawn JPH04334579A (en) 1991-05-08 1991-05-08 Cleaning apparatus

Country Status (1)

Country Link
JP (1) JPH04334579A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10223719A (en) * 1996-12-06 1998-08-21 Dainippon Screen Mfg Co Ltd Substrate carrier system, substrate processor and substrate carrier method
JP2003510837A (en) * 1999-09-30 2003-03-18 ラム リサーチ コーポレーション Atmospheric pressure transfer module for wafers with controlled small environment
JP2008186864A (en) * 2007-01-26 2008-08-14 Tokyo Electron Ltd Cleaning method of gate valve, and substrate treatment system
JP2011204346A (en) * 2010-03-03 2011-10-13 Hitachi High-Technologies Corp Washing method and washing apparatus

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10223719A (en) * 1996-12-06 1998-08-21 Dainippon Screen Mfg Co Ltd Substrate carrier system, substrate processor and substrate carrier method
JP2003510837A (en) * 1999-09-30 2003-03-18 ラム リサーチ コーポレーション Atmospheric pressure transfer module for wafers with controlled small environment
JP2008186864A (en) * 2007-01-26 2008-08-14 Tokyo Electron Ltd Cleaning method of gate valve, and substrate treatment system
JP2011204346A (en) * 2010-03-03 2011-10-13 Hitachi High-Technologies Corp Washing method and washing apparatus

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Effective date: 19980806