JPH0526214B2 - - Google Patents

Info

Publication number
JPH0526214B2
JPH0526214B2 JP59127725A JP12772584A JPH0526214B2 JP H0526214 B2 JPH0526214 B2 JP H0526214B2 JP 59127725 A JP59127725 A JP 59127725A JP 12772584 A JP12772584 A JP 12772584A JP H0526214 B2 JPH0526214 B2 JP H0526214B2
Authority
JP
Japan
Prior art keywords
test
data processing
processing system
program
test program
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59127725A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6014353A (ja
Inventor
Buutoran Danieru
Hooru Berutoo Jan
Baaderu Aran
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of JPS6014353A publication Critical patent/JPS6014353A/ja
Publication of JPH0526214B2 publication Critical patent/JPH0526214B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP59127725A 1983-06-22 1984-06-22 デ−タ処理システムテスト方法及び装置 Granted JPS6014353A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8310315A FR2549256B1 (fr) 1983-06-22 1983-06-22 Procede et machine automatiques pour tester simultanement des systemes informatiques
FR8310315 1983-06-22

Publications (2)

Publication Number Publication Date
JPS6014353A JPS6014353A (ja) 1985-01-24
JPH0526214B2 true JPH0526214B2 (cs) 1993-04-15

Family

ID=9290051

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59127725A Granted JPS6014353A (ja) 1983-06-22 1984-06-22 デ−タ処理システムテスト方法及び装置

Country Status (5)

Country Link
US (1) US4639916A (cs)
EP (1) EP0129935B1 (cs)
JP (1) JPS6014353A (cs)
DE (1) DE3467941D1 (cs)
FR (1) FR2549256B1 (cs)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5109484A (en) * 1986-04-09 1992-04-28 International Business Machines Corporation Self configuring terminal which polls loop network and generates list of connected devices for use in selectively downloading control programs
US5274797A (en) * 1986-05-30 1993-12-28 Bull Hn Information Systems Inc. Multiprocessor system with centralized initialization, testing and monitoring of the system and providing centralized timing
US5021997A (en) * 1986-09-29 1991-06-04 At&T Bell Laboratories Test automation system
DE3931924A1 (de) * 1989-09-25 1991-04-04 Standard Elektrik Lorenz Ag Steuerung der zeitlichen zuordnung von datenverarbeitungsleistung einer rechenanlage
JPH0772870B2 (ja) * 1990-12-21 1995-08-02 インターナショナル・ビジネス・マシーンズ・コーポレイション 構造検査パネルの生産自動化方法
US5553245A (en) * 1994-05-11 1996-09-03 Macronix International Co., Ltd. Automatic configuration of multiple peripheral interface subsystems in a computer system
US5864660A (en) * 1996-03-12 1999-01-26 Electronic Data Systems Corporation Testing the integration of a plurality of elements in a computer system using a plurality of tests codes, each corresponding to an alternate product configuration for an associated element
DE19704416A1 (de) * 1997-02-06 1998-08-20 Heidenhain Gmbh Dr Johannes Vorrichtung zur Steuerung einer Werkzeugmaschine
US6477486B1 (en) * 1998-09-10 2002-11-05 Dell Usa, L.P. Automatic location determination of devices under test
US8120380B2 (en) * 2000-03-30 2012-02-21 Seagate Technology Llc Comprehensive application power tester
DE10030980A1 (de) * 2000-06-30 2002-01-10 Bosch Gmbh Robert Verfahren zur Steuerung des Programmablaufs in einem Mikrocontroller
KR100445636B1 (ko) * 2002-06-17 2004-08-25 삼성전자주식회사 에프피지에이와 다수개의 프로그램 가능한 메모리모듈들을 이용한 컴퓨터 시스템 테스트 장치 및 그 테스트방법
US7356436B2 (en) * 2005-02-02 2008-04-08 International Business Machines Corporation Method, system, and storage medium for estimating and improving test case generation
CN102540047B (zh) * 2010-12-14 2015-04-22 苏州工业园区谱芯科技有限公司 一种测试覆盖率的评估方法
TW201321973A (zh) * 2011-11-25 2013-06-01 Askey Technology Jiangsu Ltd 手持式電子裝置測試方法
TW201321968A (zh) * 2011-11-29 2013-06-01 Askey Technology Jiangsu Ltd 手持式電子裝置應用程式的測試方法
CN103136096A (zh) * 2011-11-29 2013-06-05 亚旭电子科技(江苏)有限公司 手持式电子装置应用程序的测试方法
KR20160056196A (ko) * 2014-11-11 2016-05-19 삼성전자주식회사 검사장치 및 그 제어방법

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4531182A (en) * 1969-11-24 1985-07-23 Hyatt Gilbert P Machine control system operating from remote commands
JPS4932020A (cs) * 1972-07-28 1974-03-23
FR2221740B1 (cs) * 1973-03-16 1976-06-11 Honeywell Bull Soc Ind
FR2259397B1 (cs) * 1974-01-25 1977-09-30 Honeywell Bull Soc Ind
US4057847A (en) * 1976-06-14 1977-11-08 Sperry Rand Corporation Remote controlled test interface unit
US4108358A (en) * 1977-03-22 1978-08-22 The Bendix Corporation Portable circuit tester
US4231087A (en) * 1978-10-18 1980-10-28 Bell Telephone Laboratories, Incorporated Microprocessor support system
US4281379A (en) * 1978-12-18 1981-07-28 Mcdonnell Douglas Corporation Computer driven control system for a numerically controlled machine tool
IT1117593B (it) * 1979-01-24 1986-02-17 Cselt Centro Studi Lab Telecom Sistema di aotodiagnosi per una apparecchiatura di controllo gestita da elaboratore
JPS55166754A (en) * 1979-06-15 1980-12-26 Nec Corp Automatic inspection system of computer system
GB2079492B (en) * 1980-06-25 1984-06-06 Yokogawa Electric Works Ltd Programmable controller
JPS5717019A (en) * 1980-07-07 1982-01-28 Fanuc Ltd Numerical controller
DE3040008C2 (de) * 1980-10-23 1984-08-02 Siemens AG, 1000 Berlin und 8000 München Einrichtung zum Erzeugen eines Adressenstops zum Prüfen des Programmablaufs einer Steuerung
FR2495350A1 (fr) * 1980-12-03 1982-06-04 Lazare Rene Testeur specifique a modules, automatise et portable
US4371952A (en) * 1981-05-06 1983-02-01 Ncr Corporation Diagnostic circuitry for isolating a faulty subsystem in a data processing system
US4489414A (en) * 1981-10-28 1984-12-18 Hal Computers Limited Computer peripheral testing equipment
US4471348A (en) * 1982-01-15 1984-09-11 The Boeing Company Method and apparatus for simultaneously displaying data indicative of activity levels at multiple digital test points in pseudo real time and historical digital format, and display produced thereby
DE3206891A1 (de) * 1982-02-26 1983-09-15 Robert Bosch Gmbh, 7000 Stuttgart Verfahren zur fehlerdiagnose fuer speicherprogrammierbare steuerungen
US4514842A (en) * 1983-11-03 1985-04-30 Gte Automatic Electric Inc. T-S-T-S-T Digital switching network

Also Published As

Publication number Publication date
JPS6014353A (ja) 1985-01-24
DE3467941D1 (en) 1988-01-14
FR2549256B1 (fr) 1985-11-29
EP0129935B1 (en) 1987-12-02
US4639916A (en) 1987-01-27
EP0129935A1 (en) 1985-01-02
FR2549256A1 (fr) 1985-01-18

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