JPH0525840U - Input circuit of integrated circuit - Google Patents

Input circuit of integrated circuit

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Publication number
JPH0525840U
JPH0525840U JP7345091U JP7345091U JPH0525840U JP H0525840 U JPH0525840 U JP H0525840U JP 7345091 U JP7345091 U JP 7345091U JP 7345091 U JP7345091 U JP 7345091U JP H0525840 U JPH0525840 U JP H0525840U
Authority
JP
Japan
Prior art keywords
circuit
buffer circuit
input
threshold voltage
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7345091U
Other languages
Japanese (ja)
Inventor
孝行 木村
明彦 磯目
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP7345091U priority Critical patent/JPH0525840U/en
Publication of JPH0525840U publication Critical patent/JPH0525840U/en
Pending legal-status Critical Current

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Abstract

(57)【要約】 【目的】スレシホールド電圧の不整合をバッファ回路を
外部に設けずに整合させる。 【構成】集積回路LSIは複数の同一回路を実装し、入
力回路(1)1は第1のバッファ回路11と第2のバッ
ファ回路12とを有しその出力信号を選択回路13で選
択している。即ち入力信号101は第1のバッファ回路
11と第2のバッファ回路12とに入力され、その出力
信号の何れかが選択信号103により選択回路13で選
択され出力信号102として内部回路へ入力される。第
1のバッファ回路11のスレシホールド電圧はCMOS
系のスレシホールド電圧に、第2のバッファ回路12は
TTL系のスレシホールド電圧にそれぞれ設定されてい
る。
(57) [Summary] [Purpose] Match the threshold voltage mismatch without providing a buffer circuit outside. [Structure] An integrated circuit LSI has a plurality of identical circuits mounted therein, and an input circuit (1) 1 has a first buffer circuit 11 and a second buffer circuit 12, and its output signal is selected by a selection circuit 13. There is. That is, the input signal 101 is input to the first buffer circuit 11 and the second buffer circuit 12, and one of its output signals is selected by the selection circuit 13 by the selection signal 103 and input to the internal circuit as the output signal 102. . The threshold voltage of the first buffer circuit 11 is CMOS
The system threshold voltage and the second buffer circuit 12 are set to the TTL system threshold voltage, respectively.

Description

【考案の詳細な説明】[Detailed description of the device]

【0001】[0001]

【産業上の利用分野】[Industrial applications]

本考案は集積回路の入力回路に関する。 The present invention relates to an input circuit of an integrated circuit.

【0002】[0002]

【従来の技術】[Prior Art]

従来、この種の集積回路の入力回路は、入力信号に対する動作条件として固有 の規格が定められている。例えば、スレシホールド電圧(この場合、入力信号の LOWレベルを検出できる限界の電圧をいう)についても同様であるが、CMO S系集積回路はTTL系より一般に高いスレシホールド電圧が規格となっている 。 Conventionally, the input circuit of this kind of integrated circuit has its own standard as an operating condition for an input signal. For example, the same applies to the threshold voltage (in this case, the limit voltage at which the LOW level of the input signal can be detected). However, the CMOS MOS integrated circuit generally has a threshold voltage higher than that of the TTL system. ing .

【0003】[0003]

【考案が解決しようとする課題】[Problems to be solved by the device]

以上説明したように従来例では、入力信号に対するスレシホールド電圧は固定 されているので、若し前置回路とのインタフェース上これが整合しない場合は、 バッファ回路を別に設けねばならないという問題がある。この整合しない例とし ては、CMOSレベルの入力信号に対し、TTL系のスレシホールド電圧を持つ 入力回路を使用する場合、レベル的には使用することができるが、入力信号が負 荷容量などの影響でパルスの立下がりが傾斜すると、その出力信号はHIGHレ ベルの時間が延びてしまうという問題がある。 As described above, in the conventional example, since the threshold voltage for the input signal is fixed, there is a problem that a buffer circuit must be additionally provided if this does not match due to the interface with the front-end circuit. An example of this inconsistency is that if an input circuit with a TTL threshold voltage is used for a CMOS level input signal, it can be used in terms of level, but the input signal has a load capacitance, etc. If the trailing edge of the pulse is inclined due to the influence of, the output signal has a problem that the HIGH level time is extended.

【0004】[0004]

【課題を解決するための手段】[Means for Solving the Problems]

本考案の集積回路の入力回路は、入力信号に対し第1のスレシホールド電圧を 有する第1のバッファ回路と、前記入力信号に対し第2のスレシホールド電圧を 有する第2のバッファ回路と、前記第1のバッファ回路と前記第2のバッファ回 路との何れかの出力信号を外部からの選択信号により選択し内部回路へ入力する 選択回路とを備えている。 The input circuit of the integrated circuit of the present invention comprises a first buffer circuit having a first threshold voltage for an input signal, and a second buffer circuit having a second threshold voltage for the input signal. A selection circuit for selecting one of the output signals of the first buffer circuit and the second buffer circuit by an external selection signal and inputting the selected output signal to an internal circuit.

【0005】[0005]

【実施例】 次に本考案の一実施例について図を参照して説明する。図1は本実施例の回路 構成を示すブロック図である。集積回路LSIは複数の同一回路を実装し、入力 回路(1)1は第1のバッファ回路11と第2のバッファ回路12とを有しその 出力信号を選択回路13で選択している。即ち入力信号101は第1のバッファ 回路11と第2のバッファ回路12とに入力され、その出力信号の何れかが選択 信号103により選択回路13で選択され出力信号102として内部回路へ入力 される。第1のバッファ回路11のスレシホールド電圧はCMOS系のスレシホ ールド電圧に、第2のバッファ回路12はTTL系のスレシホールド電圧にそれ ぞれ設定されている。入力回路(2)2以下についても同様の構成である。Embodiment Next, an embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a block diagram showing the circuit configuration of this embodiment. The integrated circuit LSI has a plurality of identical circuits mounted therein, and the input circuit (1) 1 has a first buffer circuit 11 and a second buffer circuit 12, and an output signal thereof is selected by a selection circuit 13. That is, the input signal 101 is input to the first buffer circuit 11 and the second buffer circuit 12, and any one of its output signals is selected by the selection circuit 13 by the selection signal 103 and input to the internal circuit as the output signal 102. .. The threshold voltage of the first buffer circuit 11 is set to the CMOS threshold voltage, and the second buffer circuit 12 is set to the TTL threshold voltage. The input circuit (2) 2 and below have the same configuration.

【0006】 図2は入力信号101のオフ時の立下がり波形を示し、負荷容量などの影響で 波形が傾斜した場合である。又、CMOS系のスレシホールド電圧とTTL系の スレシホールド電圧を図中に示したが、a、b点は入力信号101の立下がり時 点からLOWレベルを検出するまでのそれぞれの時間を示している。即ちこの場 合はCMOS系のスレシホールド電圧側を選択することによってHIGHレベル の延び時間をaからbへと小さくすることができる。FIG. 2 shows a falling waveform when the input signal 101 is off, which is a case where the waveform is inclined due to the influence of load capacitance and the like. Also, the CMOS system threshold voltage and the TTL system threshold voltage are shown in the figure, but points a and b are the respective times from the falling point of the input signal 101 to the detection of the LOW level. Shows. That is, in this case, by selecting the CMOS system threshold voltage side, the extension time of the HIGH level can be shortened from a to b.

【0007】[0007]

【考案の効果】[Effect of the device]

以上説明したように本考案は、スレシホールド電圧を選択できるので、別にバッ ファ回路を設けることなしに、前置回路との整合をとるこができる。このため入 力信号のHIGHレベルの延びなどのパルス歪を軽減する効果がある。 As described above, in the present invention, since the threshold voltage can be selected, it is possible to achieve matching with the front-end circuit without separately providing a buffer circuit. Therefore, it has an effect of reducing pulse distortion such as extension of the HIGH level of the input signal.

【図面の簡単な説明】[Brief description of drawings]

【図1】本実施例の回路構成を示すブロック図である。FIG. 1 is a block diagram showing a circuit configuration of this embodiment.

【図2】本実施例における入力信号の波形図である。FIG. 2 is a waveform diagram of an input signal in this embodiment.

【符号の説明】[Explanation of symbols]

1,2,3 入力回路 11 第1のバッファ回路 12 第2のバッファ回路 13 選択回路 1, 2 and 3 input circuit 11 first buffer circuit 12 second buffer circuit 13 selection circuit

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】 入力信号に対し第1のスレシホールド電
圧を有する第1のバッファ回路と、前記入力信号に対し
第2のスレシホールド電圧を有する第2のバッファ回路
と、前記第1のバッファ回路と前記第2のバッファ回路
との何れかの出力信号を外部からの選択信号により選択
し内部回路へ入力する選択回路とを備えることを特徴と
する集積回路の入力回路。
1. A first buffer circuit having a first threshold voltage for an input signal, a second buffer circuit having a second threshold voltage for the input signal, and the first buffer circuit. An input circuit of an integrated circuit, comprising: a selection circuit for selecting an output signal of either the buffer circuit or the second buffer circuit by a selection signal from the outside and inputting the selection signal to an internal circuit.
JP7345091U 1991-09-12 1991-09-12 Input circuit of integrated circuit Pending JPH0525840U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7345091U JPH0525840U (en) 1991-09-12 1991-09-12 Input circuit of integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7345091U JPH0525840U (en) 1991-09-12 1991-09-12 Input circuit of integrated circuit

Publications (1)

Publication Number Publication Date
JPH0525840U true JPH0525840U (en) 1993-04-02

Family

ID=13518579

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7345091U Pending JPH0525840U (en) 1991-09-12 1991-09-12 Input circuit of integrated circuit

Country Status (1)

Country Link
JP (1) JPH0525840U (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57138220A (en) * 1981-02-20 1982-08-26 Hitachi Ltd Data input equipment for logical circuit
JPH02146815A (en) * 1988-11-28 1990-06-06 Mitsubishi Electric Corp Input circuit for semiconductor integrated circuit
JPH03198370A (en) * 1989-12-26 1991-08-29 Nec Corp Semiconductor integrated circuit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57138220A (en) * 1981-02-20 1982-08-26 Hitachi Ltd Data input equipment for logical circuit
JPH02146815A (en) * 1988-11-28 1990-06-06 Mitsubishi Electric Corp Input circuit for semiconductor integrated circuit
JPH03198370A (en) * 1989-12-26 1991-08-29 Nec Corp Semiconductor integrated circuit

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