JPH0525043B2 - - Google Patents
Info
- Publication number
- JPH0525043B2 JPH0525043B2 JP10148185A JP10148185A JPH0525043B2 JP H0525043 B2 JPH0525043 B2 JP H0525043B2 JP 10148185 A JP10148185 A JP 10148185A JP 10148185 A JP10148185 A JP 10148185A JP H0525043 B2 JPH0525043 B2 JP H0525043B2
- Authority
- JP
- Japan
- Prior art keywords
- light source
- signal generator
- laser scanner
- modulated
- laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2441—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10148185A JPS61260106A (ja) | 1985-05-15 | 1985-05-15 | 3次元計測方法および装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10148185A JPS61260106A (ja) | 1985-05-15 | 1985-05-15 | 3次元計測方法および装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61260106A JPS61260106A (ja) | 1986-11-18 |
| JPH0525043B2 true JPH0525043B2 (enrdf_load_stackoverflow) | 1993-04-09 |
Family
ID=14301906
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10148185A Granted JPS61260106A (ja) | 1985-05-15 | 1985-05-15 | 3次元計測方法および装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61260106A (enrdf_load_stackoverflow) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4962852B2 (ja) * | 2007-03-05 | 2012-06-27 | 株式会社ニコン | 形状測定方法および形状測定装置 |
| CN109323665B (zh) * | 2018-01-31 | 2020-03-27 | 黑龙江科技大学 | 一种线结构光驱动全息干涉的精密三维测量方法 |
-
1985
- 1985-05-15 JP JP10148185A patent/JPS61260106A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61260106A (ja) | 1986-11-18 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4212073A (en) | Method and system for surface contouring | |
| US4634879A (en) | Method and system for determining surface profile information | |
| EP1643210B1 (en) | Method and apparatus for measuring shape of an object | |
| JPH0656330B2 (ja) | 干渉計システム | |
| US4813782A (en) | Method and apparatus for measuring the floating amount of the magnetic head | |
| NO20200134A1 (en) | Motion compensation in phase-shifted structured light illumination for measuring dimensions of freely moving objects | |
| JP2714152B2 (ja) | 物体形状測定方法 | |
| JP4188515B2 (ja) | 光学式形状測定装置 | |
| JPH0525043B2 (enrdf_load_stackoverflow) | ||
| JPH0473523B2 (enrdf_load_stackoverflow) | ||
| Zhang et al. | Spatiotemporal phase unwrapping and its application in fringe projection fiber optic phase-shifting profilometry | |
| JPH0525044B2 (enrdf_load_stackoverflow) | ||
| EP0235941B1 (en) | Surface measurement | |
| JP2939944B2 (ja) | 3次元物体形状計測装置 | |
| JPH0719824A (ja) | 形状計測装置 | |
| JPH07503547A (ja) | 距離測定用干渉型プローブ | |
| JP4177188B2 (ja) | 動的形状及び動的位置の同時測定方法、装置、光学素子 | |
| JPS639877A (ja) | 3次元計測方法 | |
| US20250035433A1 (en) | Measuring unit and method for optically measuring objects | |
| JP3139862B2 (ja) | 表面欠陥検査装置 | |
| US3749492A (en) | Interferometric hypsocline generator | |
| RU2157964C1 (ru) | Способ определения пространственного положения границы объекта | |
| JP4187124B2 (ja) | フリンジスキャンを用いた干渉計装置 | |
| JPH01124785A (ja) | レーザ測距装置 | |
| JP2017166876A (ja) | ヘテロダイン干渉装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |