JPH05203418A - 寸法測定用光電装置 - Google Patents

寸法測定用光電装置

Info

Publication number
JPH05203418A
JPH05203418A JP25804292A JP25804292A JPH05203418A JP H05203418 A JPH05203418 A JP H05203418A JP 25804292 A JP25804292 A JP 25804292A JP 25804292 A JP25804292 A JP 25804292A JP H05203418 A JPH05203418 A JP H05203418A
Authority
JP
Japan
Prior art keywords
scale
axis
optical instrument
constant
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP25804292A
Other languages
English (en)
Japanese (ja)
Inventor
Martin Kerner
ケルナー マーティン
Georges Lendi
ランディ ジョルジュ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tesa SARL
Original Assignee
Tesa SARL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tesa SARL filed Critical Tesa SARL
Publication of JPH05203418A publication Critical patent/JPH05203418A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/12—Measuring arrangements characterised by the use of optical techniques for measuring diameters internal diameters

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP25804292A 1991-09-26 1992-09-28 寸法測定用光電装置 Pending JPH05203418A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH02861/91-0 1991-09-26
CH286191 1991-09-26

Publications (1)

Publication Number Publication Date
JPH05203418A true JPH05203418A (ja) 1993-08-10

Family

ID=4243234

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25804292A Pending JPH05203418A (ja) 1991-09-26 1992-09-28 寸法測定用光電装置

Country Status (2)

Country Link
EP (1) EP0534288A1 (de)
JP (1) JPH05203418A (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2746705B1 (fr) * 1996-03-27 1998-06-19 Heidelberg Harris Sa Dispositif de mesure sans contact de modifications de position d'une nappe continue de matiere
GB9828473D0 (en) 1998-12-24 1999-02-17 British Aerospace Non-contact positioning apparatus
ES2163971B1 (es) * 1999-04-19 2003-06-16 Univ La Coruna Fleximetro fotovoltaico.
DE19961955A1 (de) * 1999-12-24 2001-07-05 Hannover Laser Zentrum Verfahren zur Messung eines Abstandes zwischen einer Meßvorrichtung und einer Meßoberfläche sowie Meßvorrichtung
US7768629B2 (en) * 2006-05-12 2010-08-03 Voith Patent Gmbh Device and process for optical distance measurement
US20070263228A1 (en) * 2006-05-12 2007-11-15 Voith Paper Patent Gmbh Device and process for optical distance measurement
CN118067047B (zh) * 2024-04-19 2024-07-19 成都万唐科技有限责任公司 一种工件表面光滑度评估系统

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2066449B (en) * 1979-12-21 1984-03-21 Rolls Royce Monitoring distance variations
JPS6049841B2 (ja) * 1980-07-16 1985-11-05 室蘭工業大学長 光学式非接触型検出装置
DE3431616A1 (de) * 1984-08-28 1986-03-06 Messerschmitt-Bölkow-Blohm GmbH, 8012 Ottobrunn Messvorrichtung zur bestimmung der relativlage zweier koerper

Also Published As

Publication number Publication date
EP0534288A1 (de) 1993-03-31

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