JPH0519952Y2 - - Google Patents

Info

Publication number
JPH0519952Y2
JPH0519952Y2 JP16970187U JP16970187U JPH0519952Y2 JP H0519952 Y2 JPH0519952 Y2 JP H0519952Y2 JP 16970187 U JP16970187 U JP 16970187U JP 16970187 U JP16970187 U JP 16970187U JP H0519952 Y2 JPH0519952 Y2 JP H0519952Y2
Authority
JP
Japan
Prior art keywords
wafer
lower plate
heat treatment
wafer support
column
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP16970187U
Other languages
Japanese (ja)
Other versions
JPH0173926U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16970187U priority Critical patent/JPH0519952Y2/ja
Publication of JPH0173926U publication Critical patent/JPH0173926U/ja
Application granted granted Critical
Publication of JPH0519952Y2 publication Critical patent/JPH0519952Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【考案の詳細な説明】 (1) 考案の目的 [産業上の利用分野] 本考案は、ウエーハの熱処理用治具に関し、特
にウエーハ支持部の下部板状体の下面中央部を凹
部としてなるウエーハの熱処理用治具に関するも
のである。
[Detailed explanation of the invention] (1) Purpose of the invention [Field of industrial application] The present invention relates to a jig for heat treatment of wafers, and in particular, the present invention relates to a jig for heat treatment of wafers. The present invention relates to a heat treatment jig.

[従来の技術] 従来この種のウエーハの熱処理用治具として
は、第4図に示すように、ウエーハ支持部20の
下部板状体22の下面22D全体が同一平面とさ
れてなるものが提案されていた。
[Prior Art] Conventionally, as shown in FIG. 4, a jig for heat treatment of wafers has been proposed in which the entire lower surface 22D of the lower plate-like body 22 of the wafer support portion 20 is made on the same plane. It had been.

[解決すべき問題点] しかしながら従来のウエーハの熱処理用治具で
は、下部板状体22の下面22Dが同一平面であ
つたので、テーブル部の支持柱体頭部による支持
領域を確保するために、その全面を研磨加工によ
つて平坦化しなければならない欠点があり、ひい
てはその研磨加工に多大の労力ならびに時間を必
要とする欠点があつた。
[Problems to be Solved] However, in the conventional wafer heat treatment jig, the lower surface 22D of the lower plate-shaped body 22 is on the same plane. However, it has the disadvantage that its entire surface must be flattened by polishing, and furthermore, the polishing process requires a great deal of labor and time.

そこで本考案は、これらの欠点を解決すべく、
ウエーハ支持部の下部板状体下面をその中央部で
凹部としてなるウエーハの熱処理用治具を提供せ
んとするものである。
Therefore, in order to solve these drawbacks, this invention
It is an object of the present invention to provide a jig for heat treatment of a wafer, in which the lower surface of a lower plate-like body of a wafer support part has a concave portion at its center.

(2) 考案の構成 [問題点の解決手段] 本考案により提供される問題点の解決手段は、
ウエーハ支持部20とテーブル部30より成り、
上記ウエーハ支持部20が、ウエーハを挿入載置
して支持するスリツト溝21aを有するウエーハ
支持柱体21と、該ウエーハ支持柱体21の両端
部に配設された上部板状体23及び下部板状体2
2と、該下部板状体22の下面中央部に形成され
た位置決穴22Bを有し、他方、上記テーブル部
30が、昇降部材34の上部に配設されているテ
ーブル基板35と、該テーブル基板35の上面中
央部に配設されていて上記下部板状体22の下面
中央部の上記位置決穴22Bに嵌合される位置決
柱体32と、該位置決柱体32の外周に沿つて配
設された複数の支持柱体33とを有し、さらに、
上記下部板状体22の下面に、上記複数の支持柱
体33と上記位置決穴22Bとの間で凹部22A
が形成されていることを特徴とする半導体ウエー
ハの熱処理用治具。
(2) Structure of the invention [Means for solving problems] The means for solving problems provided by this invention are as follows:
Consists of a wafer support part 20 and a table part 30,
The wafer support section 20 includes a wafer support column 21 having a slit groove 21a into which a wafer is inserted and supported, an upper plate-like body 23 and a lower plate disposed at both ends of the wafer support column 21. shape body 2
2 and a positioning hole 22B formed in the center of the lower surface of the lower plate-like body 22, and the table part 30 has a table substrate 35 disposed on the upper part of the elevating member 34; A positioning column 32 disposed at the center of the upper surface of the table board 35 and fitted into the positioning hole 22B at the center of the lower plate of the lower plate-like body 22; It has a plurality of support columns 33 arranged along the column, and further includes:
A recess 22A is formed on the lower surface of the lower plate-like body 22 between the plurality of support columns 33 and the positioning hole 22B.
1. A jig for heat treatment of semiconductor wafers, characterized in that: is formed.

である。It is.

[作用] 本考案にかかるウエーハの熱処理用治具は、ウ
エーハ支持部の下部板状体の下面中央部に対し凹
部を形成してなるので、下部板状体下面のうち研
磨加工を必要とする領域をその凹部周囲部のみに
制限する作用をなしており、ひいてはその研磨加
工に必要とする労力および時間を大幅に削減する
作用をなす。
[Function] The wafer heat treatment jig according to the present invention has a recess formed in the center of the lower surface of the lower plate of the wafer support, and therefore requires polishing of the lower surface of the lower plate. This has the effect of limiting the area to only the area around the recess, which in turn has the effect of greatly reducing the labor and time required for the polishing process.

[実施例] 次に本考案について、添付図面を参照しつつ具
体的に説明する。
[Example] Next, the present invention will be specifically described with reference to the accompanying drawings.

第1図は、本考案にかかるウエーハの熱処理用
治具の一実施例を示す正面図であつて、下部板状
体の下面中央部が除去されている。
FIG. 1 is a front view showing an embodiment of the wafer heat treatment jig according to the present invention, with the center portion of the lower surface of the lower plate-shaped body removed.

第2図および第3図は、ともに第1図実施例の
部分斜視図であつて、それぞれウエーハ支持部お
よびテーブル部を示している。
2 and 3 are both partial perspective views of the embodiment shown in FIG. 1, showing a wafer support section and a table section, respectively.

まず本考案にかかるウエーハの熱処理用治具の
一実施例について、その構成を詳細に説明する。
First, the structure of an embodiment of the wafer heat treatment jig according to the present invention will be described in detail.

10は本考案のウエーハの熱処理用治具で、半
導体ウエーハ(図示せず)を支持するための石英
もしくは炭化珪素などで形成されたウエーハ支持
部20と、ウエーハ支持部20を下方より支持し
縦型熱処理炉(図示せず)に対して挿入しあるい
はその縦型熱処理炉から取り出すための石英もし
くは炭化珪素などで形成されたテーブル部30と
を包有している。
Reference numeral 10 denotes a wafer heat treatment jig of the present invention, which includes a wafer support part 20 made of quartz or silicon carbide for supporting a semiconductor wafer (not shown), and a vertical support part 20 that supports the wafer support part 20 from below. The table 30 is made of quartz, silicon carbide, or the like and is inserted into or removed from a vertical heat treatment furnace (not shown).

ウエーハ支持部20は、半導体ウエーハを挿入
載置して支持するためのスリツト溝21aを有す
る複数(たとえば4本)のウエーハ支持柱体21
と、ウエーハ支持柱体21の両端部すなわち下端
部および上端部に対して配設された下部板状体2
2および上部板状体23とを含有している。下部
板状体22の下面は、中央部に対し凹部22Aが
形成されており、かつ凹部22Aの中心部に位置
決穴22Bが形成されている。
The wafer support section 20 includes a plurality of (for example, four) wafer support columns 21 each having a slit groove 21a for inserting and supporting a semiconductor wafer.
and a lower plate-like body 2 disposed at both ends of the wafer support column 21, that is, the lower end and the upper end.
2 and an upper plate-like body 23. A recess 22A is formed in the center of the lower surface of the lower plate-shaped body 22, and a positioning hole 22B is formed in the center of the recess 22A.

テーブル部30は、下部板状体22の位置決穴
22Bに対し頭部すなわち上端部が挿入される位
置決柱体32と、下部板状体22の凹部22Aの
周囲部すなわち支持領域22Cに対して頭部すな
わち上端部が当接される複数の支持柱体33と、
位置決柱体32および支持柱体33が上面に植設
され下面が昇降部材34に支持されたテーブル基
板35とを包有している。ここで昇降部材とテー
ブル基板35との間には、所望により熱遮蔽板な
どを配置してもよい。
The table part 30 has a positioning column 32 whose head, that is, an upper end thereof, is inserted into the positioning hole 22B of the lower plate-like body 22, and a support area 22C, which is the peripheral part of the recess 22A of the lower plate-like body 22. a plurality of support columns 33 whose heads or upper ends are abutted;
A positioning column 32 and a support column 33 are implanted on the upper surface, and the table substrate 35 is supported on the lower surface by an elevating member 34. Here, a heat shielding plate or the like may be arranged between the elevating member and the table substrate 35 if desired.

更に本考案にかかるウエーハの熱処理用治具の
一実施例について、その作用を詳細に説明する。
Furthermore, the operation of an embodiment of the wafer heat treatment jig according to the present invention will be explained in detail.

本考案のウエーハの熱処理用治具10は、ウエ
ーハ支持柱体21に対しスリツト溝21aを形成
したのち、下部板状体22の凹部22Aの周囲部
すなわち支持領域22Cを平坦面とするための研
磨加工を行なう。
The wafer heat treatment jig 10 of the present invention forms the slit groove 21a in the wafer support column 21, and then polishes the peripheral part of the recess 22A of the lower plate-shaped body 22, that is, the support region 22C, to make it a flat surface. Perform processing.

これにより下部板状体22の下面のうち、テー
ブル部30の支持柱体33による支持のために所
要の支持領域22Cを必要最小限の労力および時
間で平坦化することができ、ひいてはテーブル部
30の支持柱体33の頭部による支持を効率よく
確保し安定化している。
As a result, on the lower surface of the lower plate-like body 22, the support area 22C required for support by the support columns 33 of the table part 30 can be flattened with minimum effort and time, and as a result, the table part 30 can be flattened with minimal effort and time. Support by the head of the support column 33 is efficiently ensured and stabilized.

(3) 考案の効果 上述より明らかなように本考案にかかるウエー
ハの熱処理用治具は、テーブル基板上に配置され
た位置決柱体および支持柱体によつてウエーハ支
持部の下部板状体の下面を支持してなるウエーハ
の熱処理用治具であつて、特に 下部板状体の下面の中央部を凹部としてなるの
で、 (i) 下部板状体下面のうち研磨加工を必要とする
領域を凹部周囲部のみに制限できる効果 を有し、ひいては (ii) その研磨加工に必要とする労力および時間を
大幅に削減できる効果 を有する。
(3) Effects of the invention As is clear from the above, the wafer heat treatment jig according to the invention has a positioning column and a support column arranged on the table substrate, so that the lower plate-shaped body of the wafer support part can be fixed. This is a jig for heat treatment of wafers that supports the lower surface of the lower plate, and in particular, since the central part of the lower surface of the lower plate is a recessed part, (i) the area of the lower surface of the lower plate that requires polishing; This has the effect of restricting the polishing process to only the surrounding area of the recess, and has the effect of (ii) greatly reducing the labor and time required for the polishing process.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案にかかるウエーハの熱処理用治
具の一実施例を示す正面図、第2図および第3図
はともに同部分斜視図、第4図は同従来例を示す
斜視図である。 10……ウエーハの熱処理用治具、20……ウ
エーハ支持部、21……支持柱体、21a……ス
リツト溝、22……下部板状体、22A……凹
部、22B……位置決穴、23……上部板状体、
30……テーブル部、32……位置決柱体、33
……支持柱体、34……昇降部材、35……テー
ブル基板。
FIG. 1 is a front view showing an embodiment of the wafer heat treatment jig according to the present invention, FIGS. 2 and 3 are both perspective views of the same part, and FIG. 4 is a perspective view showing the conventional example. . 10 ... wafer heat treatment jig, 20... wafer support section, 21... support column, 21a... slit groove, 22... lower plate-shaped body, 22A... recess, 22B... positioning hole, 23... Upper plate-shaped body,
30...Table part, 32...Positioning column body, 33
. . . Support column body, 34 . . . Lifting member, 35 . . . Table substrate.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] ウエーハ支持部20とテーブル部30より成
り、上記ウエーハ支持部20が、ウエーハを挿入
載置して支持するスリツト溝21aを有するウエ
ーハ支持柱体21と、該ウエーハ支持柱体21の
両端部に配設された上部板状体23及び下部板状
体22と、該下部板状体22の下面中央部に形成
された位置決穴22Bを有し、他方、上記テーブ
ル部30が、昇降部材34の上部に配設されてい
るテーブル基板35と、該テーブル基板35の上
面中央部に配設されていて上記下部板状体22の
下面中央部の上記位置決穴22Bに嵌合される位
置決柱体32と、該位置決柱体32の外周に沿つ
て配設された複数の支持柱体33とを有し、さら
に、上記下部板状体22の下面に、上記複数の支
持柱体33と上記位置決穴22Bとの間で凹部2
2Aが形成されていることを特徴とする半導体ウ
エーハの熱処理用治具。
It consists of a wafer support section 20 and a table section 30, and the wafer support section 20 includes a wafer support column 21 having a slit groove 21a into which a wafer is inserted and supported, and a wafer support column 21 disposed at both ends of the wafer support column 21. The table part 30 has an upper plate-like body 23 and a lower plate-like body 22 provided therein, and a positioning hole 22B formed in the center of the lower surface of the lower plate-like body 22. a table substrate 35 disposed on the upper part; and a positioning column disposed at the center of the upper surface of the table substrate 35 and fitted into the positioning hole 22B at the center of the lower surface of the lower plate-like body 22. It has a body 32 and a plurality of support columns 33 arranged along the outer periphery of the positioning column 32, and further includes a plurality of support columns 33 and a plurality of support columns 33 arranged on the lower surface of the lower plate-like body 22. The recess 2 is located between the positioning hole 22B and the positioning hole 22B.
A jig for heat treatment of semiconductor wafers, characterized in that 2A is formed.
JP16970187U 1987-11-06 1987-11-06 Expired - Lifetime JPH0519952Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16970187U JPH0519952Y2 (en) 1987-11-06 1987-11-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16970187U JPH0519952Y2 (en) 1987-11-06 1987-11-06

Publications (2)

Publication Number Publication Date
JPH0173926U JPH0173926U (en) 1989-05-18
JPH0519952Y2 true JPH0519952Y2 (en) 1993-05-25

Family

ID=31459994

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16970187U Expired - Lifetime JPH0519952Y2 (en) 1987-11-06 1987-11-06

Country Status (1)

Country Link
JP (1) JPH0519952Y2 (en)

Also Published As

Publication number Publication date
JPH0173926U (en) 1989-05-18

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