JPH0519081B2 - - Google Patents

Info

Publication number
JPH0519081B2
JPH0519081B2 JP58102842A JP10284283A JPH0519081B2 JP H0519081 B2 JPH0519081 B2 JP H0519081B2 JP 58102842 A JP58102842 A JP 58102842A JP 10284283 A JP10284283 A JP 10284283A JP H0519081 B2 JPH0519081 B2 JP H0519081B2
Authority
JP
Japan
Prior art keywords
film
light
target film
measurement
target
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58102842A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59228105A (ja
Inventor
Kazuo Imose
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teijin Ltd
Original Assignee
Teijin Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teijin Ltd filed Critical Teijin Ltd
Priority to JP58102842A priority Critical patent/JPS59228105A/ja
Publication of JPS59228105A publication Critical patent/JPS59228105A/ja
Publication of JPH0519081B2 publication Critical patent/JPH0519081B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP58102842A 1983-06-10 1983-06-10 フイルムの厚さ測定装置 Granted JPS59228105A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58102842A JPS59228105A (ja) 1983-06-10 1983-06-10 フイルムの厚さ測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58102842A JPS59228105A (ja) 1983-06-10 1983-06-10 フイルムの厚さ測定装置

Publications (2)

Publication Number Publication Date
JPS59228105A JPS59228105A (ja) 1984-12-21
JPH0519081B2 true JPH0519081B2 (enrdf_load_stackoverflow) 1993-03-15

Family

ID=14338219

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58102842A Granted JPS59228105A (ja) 1983-06-10 1983-06-10 フイルムの厚さ測定装置

Country Status (1)

Country Link
JP (1) JPS59228105A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2753002B2 (ja) * 1988-10-06 1998-05-18 大日本印刷株式会社 合成樹脂製容器の肉厚検査装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5134754A (ja) * 1974-09-18 1976-03-24 Oki Electric Ind Co Ltd Setsuchakuzainoatsusakenshutsusochi
JPS52153468A (en) * 1976-06-15 1977-12-20 Fujitsu Ltd Thickness measuring method of substrates

Also Published As

Publication number Publication date
JPS59228105A (ja) 1984-12-21

Similar Documents

Publication Publication Date Title
US5243614A (en) Wavelength stabilizer for narrow bandwidth laser
US20040195529A1 (en) Arrangement for the stabilization of the radiation emission of a plasma
US4120200A (en) Method and device for pyrometric temperature measurements
US3790289A (en) Gas turbidity measuring apparatus
JPS6344164B2 (enrdf_load_stackoverflow)
JPH08304282A (ja) ガス分析装置
KR101279066B1 (ko) 코팅 처리의 광학 모니터링을 위한 측정 시스템
JPH0237536B2 (enrdf_load_stackoverflow)
EP0082007B1 (en) Apparatus for measuring thickness of a film
JPH045344B2 (enrdf_load_stackoverflow)
JPH07509315A (ja) レンゾメータ用の分光計
KR890010554A (ko) 광전입자 검출장치
JP3258889B2 (ja) 散乱式粒度分布測定装置における光軸調整方法
US3675029A (en) Methods and means for measuring the velocities of localized portions of flowing media
JPH0519081B2 (enrdf_load_stackoverflow)
US3383902A (en) Infrared simulator
CN205642633U (zh) 基于光辐射的测温设备及系统
JP2001281097A (ja) 散乱光測定方法及び装置
Ford et al. Development of extended field Doppler velocimetry for turbomachinery applications
JPS58113839A (ja) 露点検出装置
JP2002071318A (ja) コーティングの光学的な層厚さを連続的に決定するための方法
JP6239660B2 (ja) 校正装置および校正方法
JPH04168347A (ja) 液体クロマトグラフィー用示差屈折率検出装置
US4339201A (en) Temperature control system for an element analyzer
JPH11190691A (ja) 粒度分布測定用自動焦点機構