JPH0518708Y2 - - Google Patents
Info
- Publication number
- JPH0518708Y2 JPH0518708Y2 JP1986055691U JP5569186U JPH0518708Y2 JP H0518708 Y2 JPH0518708 Y2 JP H0518708Y2 JP 1986055691 U JP1986055691 U JP 1986055691U JP 5569186 U JP5569186 U JP 5569186U JP H0518708 Y2 JPH0518708 Y2 JP H0518708Y2
- Authority
- JP
- Japan
- Prior art keywords
- tab
- printed circuit
- circuit board
- electrode pad
- rigid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1986055691U JPH0518708Y2 (enrdf_load_stackoverflow) | 1986-04-14 | 1986-04-14 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1986055691U JPH0518708Y2 (enrdf_load_stackoverflow) | 1986-04-14 | 1986-04-14 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62167176U JPS62167176U (enrdf_load_stackoverflow) | 1987-10-23 |
JPH0518708Y2 true JPH0518708Y2 (enrdf_load_stackoverflow) | 1993-05-18 |
Family
ID=30883824
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1986055691U Expired - Lifetime JPH0518708Y2 (enrdf_load_stackoverflow) | 1986-04-14 | 1986-04-14 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0518708Y2 (enrdf_load_stackoverflow) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2522335B2 (ja) * | 1987-12-18 | 1996-08-07 | 日本合成ゴム株式会社 | 集積回路部品の試験装置 |
JP2936569B2 (ja) * | 1988-12-07 | 1999-08-23 | 日本電気株式会社 | 選別装置 |
US4986760A (en) * | 1989-05-19 | 1991-01-22 | Minnesota Mining And Manufacturing Company | Socket for tab burn-in and test |
JP2716663B2 (ja) * | 1993-09-21 | 1998-02-18 | マイクロン・テクノロジー・インコーポレイテッド | 半導体ダイの試験装置 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS601574A (ja) * | 1983-06-20 | 1985-01-07 | Ibiden Co Ltd | プリント配線板検査用治具回路板 |
-
1986
- 1986-04-14 JP JP1986055691U patent/JPH0518708Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPS62167176U (enrdf_load_stackoverflow) | 1987-10-23 |
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