JPS62167176U - - Google Patents

Info

Publication number
JPS62167176U
JPS62167176U JP5569186U JP5569186U JPS62167176U JP S62167176 U JPS62167176 U JP S62167176U JP 5569186 U JP5569186 U JP 5569186U JP 5569186 U JP5569186 U JP 5569186U JP S62167176 U JPS62167176 U JP S62167176U
Authority
JP
Japan
Prior art keywords
tab
electrode
printed circuit
circuit board
smaller
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5569186U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0518708Y2 (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1986055691U priority Critical patent/JPH0518708Y2/ja
Publication of JPS62167176U publication Critical patent/JPS62167176U/ja
Application granted granted Critical
Publication of JPH0518708Y2 publication Critical patent/JPH0518708Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1986055691U 1986-04-14 1986-04-14 Expired - Lifetime JPH0518708Y2 (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1986055691U JPH0518708Y2 (enrdf_load_stackoverflow) 1986-04-14 1986-04-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986055691U JPH0518708Y2 (enrdf_load_stackoverflow) 1986-04-14 1986-04-14

Publications (2)

Publication Number Publication Date
JPS62167176U true JPS62167176U (enrdf_load_stackoverflow) 1987-10-23
JPH0518708Y2 JPH0518708Y2 (enrdf_load_stackoverflow) 1993-05-18

Family

ID=30883824

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986055691U Expired - Lifetime JPH0518708Y2 (enrdf_load_stackoverflow) 1986-04-14 1986-04-14

Country Status (1)

Country Link
JP (1) JPH0518708Y2 (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01161170A (ja) * 1987-12-18 1989-06-23 Japan Synthetic Rubber Co Ltd 集積回路部品の試験装置
JPH02156168A (ja) * 1988-12-07 1990-06-15 Nec Corp 選別装置
JPH02148483U (enrdf_load_stackoverflow) * 1989-05-19 1990-12-17
JPH07113840A (ja) * 1993-09-21 1995-05-02 Micron Technol Inc 半導体ダイの試験に使用される交換可能な基板を備えたキャリア

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS601574A (ja) * 1983-06-20 1985-01-07 Ibiden Co Ltd プリント配線板検査用治具回路板

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS601574A (ja) * 1983-06-20 1985-01-07 Ibiden Co Ltd プリント配線板検査用治具回路板

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01161170A (ja) * 1987-12-18 1989-06-23 Japan Synthetic Rubber Co Ltd 集積回路部品の試験装置
JPH02156168A (ja) * 1988-12-07 1990-06-15 Nec Corp 選別装置
JPH02148483U (enrdf_load_stackoverflow) * 1989-05-19 1990-12-17
JPH07113840A (ja) * 1993-09-21 1995-05-02 Micron Technol Inc 半導体ダイの試験に使用される交換可能な基板を備えたキャリア

Also Published As

Publication number Publication date
JPH0518708Y2 (enrdf_load_stackoverflow) 1993-05-18

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