JPH05166993A - Semiconductor chip carrier - Google Patents

Semiconductor chip carrier

Info

Publication number
JPH05166993A
JPH05166993A JP35199191A JP35199191A JPH05166993A JP H05166993 A JPH05166993 A JP H05166993A JP 35199191 A JP35199191 A JP 35199191A JP 35199191 A JP35199191 A JP 35199191A JP H05166993 A JPH05166993 A JP H05166993A
Authority
JP
Japan
Prior art keywords
lead
semiconductor chip
solder
chip carrier
slit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP35199191A
Other languages
Japanese (ja)
Inventor
Susumu Sakamoto
進 阪本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP35199191A priority Critical patent/JPH05166993A/en
Publication of JPH05166993A publication Critical patent/JPH05166993A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3421Leaded components

Abstract

PURPOSE:To enable the part of a lead soldered to wirings laid on a board to be visually inspected to lessen a soldering operation time by a method wherein a slit or a through-hole is bored in a part of the lead to provide an opening. CONSTITUTION:An electrode located on the surface of a semiconductor chip is connected to a metallized part 2 with a wire, and a lead 3 is electrically connected to the electrode of the semiconductor chip through the intermediary of the metallized part 2. In this case, a slit 3a is provided on a part of the lead 3. Solder 6 is fed to the outer periphery of the lead 3 to connect the lead 3 with a conductor pattern 5a of an outer board 4, where a flow of solder 6 can be visually confirmed with ease through the slit 3a provided to the lead 3. By this setup, a soldering operation can be lessened in time.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は半導体チップキャリア
に関し、特に半導体チップを搭載し、他の基板の配線と
接続するための半導体チップキャリアのリード構造の改
良に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor chip carrier, and more particularly to improvement of a lead structure of a semiconductor chip carrier for mounting a semiconductor chip and connecting to a wiring of another substrate.

【0002】[0002]

【従来の技術】図4は従来の半導体チップキャリアの斜
視図を示し、図5は半導体チップキャリアの実装時の平
面図であり、図6は図5中A−A′線での断面図を示
す。各図において、1は板状の絶縁体、2はこの絶縁体
1の表面及び裏面の一部分に設けられたメタライズ部、
3はメタライズ部2に取り付けられた板状のリードであ
り、これらの部材にて半導体チップキャリアが構成され
ている。また、4は半導体チップキャリアが接続される
外部基板、5は外部基板4の表面に設けられた導体パタ
ーン、6は上記リード3と上記導体パターン5を接続す
るための半田、7は半導体チップキャリアと上記外部基
板4とが取り付けられるフィン、8はフィン7と半導体
チップキャリア及び上記外部基板4とを接続するための
半田である。
2. Description of the Related Art FIG. 4 is a perspective view of a conventional semiconductor chip carrier, FIG. 5 is a plan view of the semiconductor chip carrier when it is mounted, and FIG. 6 is a sectional view taken along the line AA 'in FIG. Show. In each figure, 1 is a plate-shaped insulator, 2 is a metallized portion provided on a part of the front surface and the back surface of the insulator 1,
Reference numeral 3 denotes a plate-shaped lead attached to the metallized portion 2, and these members constitute a semiconductor chip carrier. Further, 4 is an external substrate to which the semiconductor chip carrier is connected, 5 is a conductor pattern provided on the surface of the external substrate 4, 6 is solder for connecting the lead 3 and the conductor pattern 5, and 7 is a semiconductor chip carrier. Fins to which the external board 4 and the external board 4 are attached, and 8 are solders for connecting the fin 7 to the semiconductor chip carrier and the external board 4.

【0003】次に実装方法について説明する。メタライ
ズ部2に取り付けられた半導体チップ(図示せず)は該
チップの表面上の電極(図示せず)と、メタライズ部2
とを金やアルミニウム等のワイヤにより接続し、リード
3を表面のメタライズ部2を介して半導体チップの電極
へ電気的に接続する。そして図6に示すように半導体チ
ップキャリア及び外部基板4は半田8によりフィン7上
に取り付けられ、次いで図5に示すように半導体チップ
キャリアのリード3の外周縁部に半田6を供給して外部
基板4上の導体パターン5と接続する。これにより半導
体チップは外部基板4上の導体パターン5に接続され、
電源及び信号が供給されることにより所定の動作を行う
ようになる。
Next, a mounting method will be described. The semiconductor chip (not shown) attached to the metallized portion 2 has electrodes (not shown) on the surface of the chip and the metallized portion 2
Are connected by a wire such as gold or aluminum, and the lead 3 is electrically connected to the electrode of the semiconductor chip through the metallized portion 2 on the surface. Then, as shown in FIG. 6, the semiconductor chip carrier and the external substrate 4 are mounted on the fins 7 by the solder 8, and then the solder 6 is supplied to the outer peripheral edge portion of the leads 3 of the semiconductor chip carrier as shown in FIG. It is connected to the conductor pattern 5 on the substrate 4. As a result, the semiconductor chip is connected to the conductor pattern 5 on the external substrate 4,
A predetermined operation is performed by supplying power and a signal.

【0004】[0004]

【発明が解決しようとする課題】従来の半導体チップキ
ャリアは以上のように構成されているので、半田付けに
よりキャリアのリードを外部基板上の導体パターンに接
続する場合、外部基板とリードとの接触面に充分に半田
が流れ込み、確実に接続が行われたか否かを目視で確認
することができなかった。このため充分に半田を流し込
むため長時間ヒートアップを行うとともに、多くの量の
半田を必要とした。また、半田が広がる領域が大きくな
り、そのため外部基板の導体パターンを広く取る必要が
あり、従って組立作業時間が長く、また装置を小型化す
ることができないという問題点があった。
Since the conventional semiconductor chip carrier is constructed as described above, when the leads of the carrier are connected to the conductor pattern on the external board by soldering, the contact between the external board and the lead is made. It was not possible to visually confirm whether or not the solder was sufficiently poured into the surface and the connection was surely made. For this reason, a large amount of solder was required as well as heat-up for a long time to sufficiently pour the solder. Further, the area in which the solder spreads becomes large, which necessitates a wide conductor pattern on the external substrate, which results in a long assembling work time and the device cannot be downsized.

【0005】この発明は上記のような問題点を解消する
ためになされたもので、リードと外部基板との接触面へ
の半田の流れ込みを目視により確認でき、このため短時
間に外部基板への半田付けを行うことができ、しかも装
置を小型化することのできる半導体チップキャリアを得
ることを目的とする。
The present invention has been made to solve the above-mentioned problems, and it is possible to visually confirm the flow of solder into the contact surface between the lead and the external board, and therefore the external board can be quickly fed. An object of the present invention is to obtain a semiconductor chip carrier that can be soldered and can be downsized.

【0006】[0006]

【課題を解決するための手段】この発明に係る半導体チ
ップキャリアは、リード部の一部を切り欠くか、あるい
は貫通孔を形成することにより開口を設け、上記リード
部と他の基板上の配線との半田付け状態を確認するよう
にしたものである。
In a semiconductor chip carrier according to the present invention, an opening is provided by notching a part of a lead part or forming a through hole, and the lead part and wiring on another substrate. It is intended to confirm the soldering state with.

【0007】[0007]

【作用】この発明においては、リード部の一部が切り欠
かれ、あるいは貫通孔が形成されて開口されているた
め、この開口を通して半田の流れ込み状態を目視で確認
することができる。
In the present invention, since the lead portion is partially notched or formed with a through hole, the state of the solder flowing in can be visually confirmed through this opening.

【0008】[0008]

【実施例】以下、この発明の一実施例による半導体チッ
プキャリアを図について説明する。図1において、図4
と同一符号は同一または相当部分を示し、3aはリード
3に設けられたスリットである。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A semiconductor chip carrier according to an embodiment of the present invention will be described below with reference to the drawings. In FIG. 1, FIG.
The same reference numerals denote the same or corresponding portions, and 3a is a slit provided in the lead 3.

【0009】次に実装方法について説明する。まず従来
と同様にして半導体チップキャリアのメタライズ部2に
取り付けられた半導体チップ(図示せず)の表面上の電
極とメタライズ部2を金やアルミ等のワイヤにより接続
し、リード3をメタライズ部2を介して半導体チップの
電極に電気的に接続する。さらにリード3、及び半導体
チップキャリアの裏面のメタライズ部(図示せず)を半
田を用いてフィンと接続する。
Next, a mounting method will be described. First, the electrodes on the surface of the semiconductor chip (not shown) attached to the metallized portion 2 of the semiconductor chip carrier and the metallized portion 2 are connected by a wire such as gold or aluminum in the same manner as in the conventional case, and the leads 3 are connected to the metallized portion 2. Electrically connected to the electrode of the semiconductor chip via. Further, the leads 3 and the metallized portions (not shown) on the back surface of the semiconductor chip carrier are connected to the fins using solder.

【0010】次いで図2に示すように、リード3外周縁
部に半田6を供給して、リード3と外部基板4の導体パ
ターン5aとを接続する場合、リード3にスリット3a
が設けられているため、この時の半田6の流れ込みの様
子をスリット3aを通して容易に目視により確認でき、
半田付けの作業時間を短くできるとともに、半田付け時
に半田6がスリット3aを通して露呈している外部基板
4部に速やかに流れ込み、リード3と導体パターン5a
の接触面に半田が速やかに供給される。また、目視によ
り半田の流れ込み状態が確認できるため、半田付けに用
いる半田の量はリード3と導体パターン5aとを接続す
るのに必要最小限なものでよく、さらに半田付け部以外
に付着する半田の量が少なくなることから、導体パター
ン5aの幅を小さくすることができる。また使用される
半田6の量がやや多くとも余分な半田はリード3周辺に
広がることなくスリット3aにて溜まり吸収される。
Next, as shown in FIG. 2, when the solder 6 is supplied to the outer peripheral edge of the lead 3 to connect the lead 3 and the conductor pattern 5a of the external substrate 4, the lead 3 has a slit 3a.
Is provided, it is possible to easily visually confirm how the solder 6 flows at this time through the slit 3a.
The working time of soldering can be shortened, and at the time of soldering, the solder 6 quickly flows into the exposed external substrate 4 through the slits 3a, so that the leads 3 and the conductor patterns 5a are formed.
The solder is promptly supplied to the contact surface of. Further, since the flow-in state of the solder can be visually confirmed, the amount of solder used for soldering may be the minimum amount necessary for connecting the lead 3 and the conductor pattern 5a, and the solder attached to other parts than the soldering portion. Since the amount of the conductive pattern 5a is reduced, the width of the conductor pattern 5a can be reduced. Further, even if the amount of the solder 6 used is a little large, excess solder does not spread around the lead 3 and is collected and absorbed in the slit 3a.

【0011】このように本実施例によれば、リード3に
スリット3aを形成したから、リード3と外部基板4の
導体パターン5aとを半田付けする際に、その時の半田
の流れ込み状態をスリット3aから目視にて確認するこ
とができ、作業時間を短縮することができ、また用いる
半田量を少なくすることができる。また半田6がスリッ
ト3aを通して速やかにリード3と導体パターン5aと
の接触面に浸潤するため半田付け作業そのものの速度を
上げることができ、さらに半田付け部周辺に広がる半田
が少なくなることから導体パターン5aの幅を小さくで
き、装置の小型化を図ることができる。
As described above, according to this embodiment, since the slit 3a is formed in the lead 3, when the lead 3 and the conductor pattern 5a of the external substrate 4 are soldered, the state of the solder flowing at that time is determined by the slit 3a. It can be visually confirmed from the above, the working time can be shortened, and the amount of solder used can be reduced. Further, since the solder 6 quickly infiltrates into the contact surface between the lead 3 and the conductor pattern 5a through the slit 3a, the speed of the soldering operation itself can be increased, and the amount of solder spreading around the soldering portion is reduced, so that the conductor pattern is reduced. The width of 5a can be reduced, and the device can be downsized.

【0012】図3は本発明の他の実施例を示し、この例
ではリード3にスリットに代えて複数の貫通孔3bを形
成したものであり、半田付け時に半田を貫通孔3bを通
して供給することで、上記実施例と同様の効果を奏す
る。
FIG. 3 shows another embodiment of the present invention. In this example, the lead 3 is formed with a plurality of through holes 3b instead of slits, and the solder is supplied through the through holes 3b during soldering. Then, the same effect as that of the above-described embodiment is obtained.

【0013】なお、上記実施例では同一幅のスリットを
複数設けたものを示したが、スリットの幅や形状はこれ
に限られるものではなく種々の変形が可能である。また
貫通孔の形状も円形に限られるものでなく、種々の変形
が可能であることは言うまでもない。
In the above embodiment, a plurality of slits having the same width are provided, but the width and shape of the slits are not limited to this, and various modifications are possible. Needless to say, the shape of the through hole is not limited to the circular shape, and various modifications are possible.

【0014】[0014]

【発明の効果】以上のように、この発明に係る半導体チ
ップキャリアによれば、リード部の一部を切り欠くか、
あるいは貫通孔を形成して開口を設けたので、リード部
と他の基板上の配線との半田付け状態を目視にて確認す
ることができ、半田付け作業時間を短縮することがで
き、また半田の量を最小限とすることができ、従ってリ
ードと接続する他の基板の導体パターンを小さくでき、
装置の小型化を図ることができるという効果がある。
As described above, according to the semiconductor chip carrier of the present invention, a part of the lead portion is notched,
Alternatively, since the through hole is formed and the opening is provided, it is possible to visually confirm the soldering state of the lead portion and the wiring on another board, and it is possible to shorten the soldering work time, and Can be minimized, and therefore the conductor pattern of the other substrate connected to the lead can be made small,
There is an effect that the device can be downsized.

【0015】また、半田付けの際に開口により浸潤速度
が向上し、半田付け速度そのものを高めることができる
という効果がある。
Further, there is an effect that the opening speed at the time of soldering improves the infiltration speed, and the soldering speed itself can be increased.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例による半導体チップキャリア
の斜視図。
FIG. 1 is a perspective view of a semiconductor chip carrier according to an embodiment of the present invention.

【図2】上記半導体チップキャリアの実装時の平面図。FIG. 2 is a plan view of the semiconductor chip carrier when mounted.

【図3】上記半導体チップキャリアの他の実施例を示す
斜視図。
FIG. 3 is a perspective view showing another embodiment of the semiconductor chip carrier.

【図4】従来の半導体チップキャリアの斜視図。FIG. 4 is a perspective view of a conventional semiconductor chip carrier.

【図5】従来例の半導体チップキャリアの実装時の平面
図。
FIG. 5 is a plan view of a conventional semiconductor chip carrier when mounted.

【図6】従来例の半導体チップキャリアの断面図。FIG. 6 is a sectional view of a conventional semiconductor chip carrier.

【符号の説明】[Explanation of symbols]

1 絶縁体 2 メタライズ部 3 リード 3a スリット 3b 穴 4 外部基板 5 導体パターン 5a 導体パターン 6 半田 7 フィン 8 半田 1 Insulator 2 Metallized part 3 Lead 3a Slit 3b Hole 4 External board 5 Conductor pattern 5a Conductor pattern 6 Solder 7 Fin 8 Solder

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 半導体チップを搭載する絶縁基板と、該
基板上に搭載されたチップを他の基板上に形成された配
線と半田付けにより電気的に接続するためのリード部と
を備えた半導体チップキャリアにおいて、 上記リード部に、該リード部の一部を切り欠くか、ある
いは貫通孔を形成することにより開口を設け、 上記半田付けを行う際の半田付け状態を目視により確認
できることを特徴とする半導体チップキャリア。
1. A semiconductor comprising: an insulating substrate on which a semiconductor chip is mounted; and a lead portion for electrically connecting the chip mounted on the substrate to a wiring formed on another substrate by soldering. In the chip carrier, the lead portion is provided with an opening by notching a part of the lead portion or forming a through hole, and the soldering state at the time of performing the soldering can be visually confirmed. Semiconductor chip carrier.
JP35199191A 1991-12-13 1991-12-13 Semiconductor chip carrier Pending JPH05166993A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP35199191A JPH05166993A (en) 1991-12-13 1991-12-13 Semiconductor chip carrier

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP35199191A JPH05166993A (en) 1991-12-13 1991-12-13 Semiconductor chip carrier

Publications (1)

Publication Number Publication Date
JPH05166993A true JPH05166993A (en) 1993-07-02

Family

ID=18421029

Family Applications (1)

Application Number Title Priority Date Filing Date
JP35199191A Pending JPH05166993A (en) 1991-12-13 1991-12-13 Semiconductor chip carrier

Country Status (1)

Country Link
JP (1) JPH05166993A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007184525A (en) * 2005-12-07 2007-07-19 Mitsubishi Electric Corp Electronic apparatus
JP2011023748A (en) * 2005-12-07 2011-02-03 Mitsubishi Electric Corp Electronic apparatus
CN106469698A (en) * 2015-08-20 2017-03-01 三菱电机株式会社 High frequency height output apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007184525A (en) * 2005-12-07 2007-07-19 Mitsubishi Electric Corp Electronic apparatus
JP2011023748A (en) * 2005-12-07 2011-02-03 Mitsubishi Electric Corp Electronic apparatus
CN106469698A (en) * 2015-08-20 2017-03-01 三菱电机株式会社 High frequency height output apparatus

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