JPH0516504Y2 - - Google Patents
Info
- Publication number
- JPH0516504Y2 JPH0516504Y2 JP9303287U JP9303287U JPH0516504Y2 JP H0516504 Y2 JPH0516504 Y2 JP H0516504Y2 JP 9303287 U JP9303287 U JP 9303287U JP 9303287 U JP9303287 U JP 9303287U JP H0516504 Y2 JPH0516504 Y2 JP H0516504Y2
- Authority
- JP
- Japan
- Prior art keywords
- detector
- measured
- radiation source
- basis weight
- radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000005855 radiation Effects 0.000 claims description 40
- 239000004065 semiconductor Substances 0.000 claims description 14
- 238000001514 detection method Methods 0.000 claims description 5
- 239000007789 gas Substances 0.000 description 10
- 230000005250 beta ray Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 8
- 238000010521 absorption reaction Methods 0.000 description 5
- 238000005339 levitation Methods 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 2
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 description 1
- 229910004613 CdTe Inorganic materials 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9303287U JPH0516504Y2 (zh) | 1987-06-17 | 1987-06-17 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9303287U JPH0516504Y2 (zh) | 1987-06-17 | 1987-06-17 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63200731U JPS63200731U (zh) | 1988-12-23 |
| JPH0516504Y2 true JPH0516504Y2 (zh) | 1993-04-30 |
Family
ID=30955264
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9303287U Expired - Lifetime JPH0516504Y2 (zh) | 1987-06-17 | 1987-06-17 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0516504Y2 (zh) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4919115B2 (ja) | 2009-09-24 | 2012-04-18 | 横河電機株式会社 | 放射線検査装置 |
| US8660682B2 (en) * | 2010-11-22 | 2014-02-25 | Honeywell Asca Inc. | Air wipe and sheet guide temperature control on paper and continuous web scanners |
| JP5996447B2 (ja) * | 2013-01-30 | 2016-09-21 | アンリツインフィビス株式会社 | Ｘ線検査装置 |
-
1987
- 1987-06-17 JP JP9303287U patent/JPH0516504Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63200731U (zh) | 1988-12-23 |
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