JPH05110289A - Feeder and test apparatus for part - Google Patents

Feeder and test apparatus for part

Info

Publication number
JPH05110289A
JPH05110289A JP3271589A JP27158991A JPH05110289A JP H05110289 A JPH05110289 A JP H05110289A JP 3271589 A JP3271589 A JP 3271589A JP 27158991 A JP27158991 A JP 27158991A JP H05110289 A JPH05110289 A JP H05110289A
Authority
JP
Japan
Prior art keywords
parts
component
opening
plate
plates
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3271589A
Other languages
Japanese (ja)
Other versions
JP2850598B2 (en
Inventor
Tamotsu Maeda
保 前田
Kazuyuki Hama
一行 浜
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP3271589A priority Critical patent/JP2850598B2/en
Publication of JPH05110289A publication Critical patent/JPH05110289A/en
Application granted granted Critical
Publication of JP2850598B2 publication Critical patent/JP2850598B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Supply And Installment Of Electrical Components (AREA)
  • De-Stacking Of Articles (AREA)
  • Feeding Of Articles To Conveyors (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To obtain a feeder simultaneously carrying a large number of parts and capable of smoothly feeding the parts without damage one by one and a test apparatus capable of automating positioning and connection to a tester. CONSTITUTION:A feeder is composed of a case 2 with a pair of side plates 3, a plurality of parting plates 6 having intervals 5, by which parts 1 are housed, between the side plates 3 and a bottom plate 7 sliding under the side plates. When the bottom plate is fixed onto a floor face 20 and the case 2 is moved, the parts 1 are dropped one by one and charged into an opening section 32. An opening-closing-able backing plate 34 receives the parts 1. A pair of width narrowing plates 36a, 36b are faced oppositely on both sides of the clearance of a pair of screens 35a, 35b, and the parts 1 are positioned in the cross direction by driving one width narrowing plate 36a. A second cylinder 38 lightly pushes the parts 1 against one 35a of the screens. A plurality of contact pins 39 are brought into contact with the pins 1a of the parts 1 by a third cylinder 40. When the backing plate 34 is opened after a test, the parts 1 are dropped to a lower section, and discharged onto a chute door 44.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、小形なプリント配線
板にIC、コンデンサ、抵抗等を実装して接続用のピン
を設けた、いわゆるマイクロモジュール(ハイブリッド
ICともいわれる)やIC等を実装した又は実装前のプ
リント配線板等の部品の生産工程における供給装置及び
試験装置に関し、なかでも寸法、形状が多品種にわたる
電気的、機械的な部品を対象にする。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention mounts a so-called micromodule (also called a hybrid IC), an IC, or the like, in which an IC, a capacitor, a resistor, etc. are mounted on a small printed wiring board to provide connection pins. Alternatively, the present invention relates to a supply device and a test device in a production process of components such as a printed wiring board before mounting, and particularly targets electrical and mechanical components having various sizes and shapes.

【0002】[0002]

【従来の技術】従来のマイクロモジュール(部品)の供
給装置としては、水平方向に開く一対の扉を上下2段に
配置したものの上に、偏平な部品を水平にして積み上
げ、前記上下の扉を交互に開閉することにより、部品を
1個ずつ落下させて供給するものがある。そして試験装
置としては、前記部品のピンに試験器のコネクタを手で
接続して試験をする。
2. Description of the Related Art As a conventional micromodule (parts) supply device, a pair of horizontally opening doors are arranged in two steps, and flat parts are stacked horizontally to stack the above and below doors. There is one in which parts are supplied one by one by dropping them one by one by opening and closing alternately. Then, as a test apparatus, a connector of a tester is manually connected to the pins of the component for testing.

【0003】[0003]

【発明が解決しようとする課題】前記の供給装置では、
部品を多く積み上げると下方の部品が損傷し、落下させ
て供給するとき部品が扉に引っ掛かったり、プリント配
線板上の部品の接続が離れたりし、前記の試験装置で
は、コネクタの接続が手作業で能率が悪く、手を傷めた
りする。
SUMMARY OF THE INVENTION In the above-mentioned feeding device,
If many parts are piled up, the parts below will be damaged, parts will be caught on the door when dropped and supplied, and parts on the printed wiring board will be disconnected. It is inefficient and can hurt your hands.

【0004】この発明の目的は、多数の部品を同時に搬
送して1個ずつ損傷なくスムーズに供給できる供給装置
と、試験器への位置決めと接続を自動化できる試験装置
を提供することにある。
An object of the present invention is to provide a supply device capable of simultaneously conveying a large number of parts and supplying them one by one smoothly without damage, and a test device capable of automating positioning and connection to a tester.

【0005】[0005]

【課題を解決するための手段】発明1の部品の供給装置
は、一対の側板を備えるケースを床面に対して運動させ
る運動手段と、前記側板の間にこれと直角に偏平な部品
を収納する間隔をあけて固定される複数の仕切板と、前
記側板の下部内側で水平に滑動する底板と、この底板を
前記床面に固定する固定手段とからなるものである。
According to another aspect of the present invention, there is provided a device for supplying parts, in which a case having a pair of side plates is moved with respect to a floor surface, and a flat part is housed between the side plates at right angles thereto. It comprises a plurality of partition plates fixed at intervals, a bottom plate that slides horizontally inside the lower part of the side plate, and a fixing means for fixing the bottom plate to the floor surface.

【0006】発明2の部品の試験装置は、水平と直角な
姿勢の偏平な部品を開口部の下方で受け止めて開閉可能
な受板と、この受板と前記開口部の間に隙間をあけて垂
直平行に配置される一対の衝立と、前記隙間の両側に設
けられて向かい合う一対の幅寄せ板と、この幅寄せ板の
一方を駆動する第1のシリンダと、前記衝立の一方側に
前記部品を押し付ける第2のシリンダと、前記部品のピ
ンに水平に接触可能な複数のコンタクトピンと、このコ
ンタクトピンを前記ピンに接触させる第3のシリンダと
からなるものである。
In the component testing apparatus of the second aspect of the invention, there is provided a receiving plate which can open and close by receiving a flat component in a posture perpendicular to the horizontal below the opening, and a gap is provided between the receiving plate and the opening. A pair of partitions arranged vertically and in parallel, a pair of width-shifting plates provided on both sides of the gap and facing each other, a first cylinder for driving one of the width-shifting plates, and the component on one side of the partition. And a plurality of contact pins capable of making horizontal contact with the pins of the component, and a third cylinder for bringing the contact pins into contact with the pins.

【0007】発明3は発明2において、前記受板の下方
に設けられるシュートと、このシュートの一部に設けら
れ下方に開閉可能なシュート扉と、このシュート扉と前
記シュートとの下方にそれぞれ設けられる箱とからなる
ものである。
A third aspect of the present invention is the second aspect of the present invention, wherein a chute provided below the receiving plate, a chute door provided at a part of the chute and capable of opening and closing downward, and a chute door provided below the chute door and the chute, respectively. It consists of a box that can be used.

【0008】発明4の部品の供給装置及び試験装置は、
発明1の供給装置と、発明2又は発明3の試験装置の組
合せ装置において、前記床面に前記開口部を形成し、前
記運動手段は前記ケースを前記底板の滑動方向に運動さ
せるものである。
The component supply device and the test device of the invention 4 are:
In the combination device of the supply device according to the first aspect of the invention and the test device according to the second or third aspect, the opening is formed in the floor surface, and the movement means moves the case in the sliding direction of the bottom plate.

【0009】[0009]

【作用】発明1において、図1又は図3及び図4を参照
する。底板7を床面に対して固定手段8で固定し、ケー
ス2を前板2a方向に仕切板6のピッチごとに移動させ
れば、間隔5ごとに底板7の規制を逃れた部品1は1個
ごとに落下し、例えば図1の床面20の開口部32のよ
うな特定位置に供給される。供給装置10の底板7を前
板2aの方向に閉じきれば、仕切板6の間隔5に部品1
を収納して搬送もできるし、保管もできる。
In the invention 1, reference is made to FIG. 1 or FIG. 3 and FIG. If the bottom plate 7 is fixed to the floor surface by the fixing means 8 and the case 2 is moved in the direction of the front plate 2a for each pitch of the partition plate 6, the component 1 that escapes the regulation of the bottom plate 7 at every interval 5 is 1. Each piece falls and is supplied to a specific position such as the opening 32 of the floor surface 20 in FIG. If the bottom plate 7 of the supply device 10 is closed in the direction of the front plate 2a, the component 1 is placed in the space 5 of the partition plate 6.
Can be stored and transported, and can also be stored.

【0010】発明2において、図1を参照する。開口部
32から水平と直角な姿勢で部品1を投入すれば、部品
1は受板34で受け止められ、隙間をあけた一対の衝立
35a、35bによって倒れない。次に、幅寄せ板の一
方36aを第1のシリンダ37で軽く駆動すれば、部品
1は幅方向に位置決めされる。この状態で、第2のシリ
ンダ38を駆動すれば、部品1は厚さ方向に衝立の一方
側35aに向けて軽く押し付けられ、部品1の3次元の
位置決めが完了する。第3のシリンダ40を駆動すれ
ば、複数のコンタクトピン39は部品1のピン1aに接
触して、試験器が動作可能の状態になる。試験完了後、
受板34を開けば、部品1は下方に落下して排出、搬送
される。
In Invention 2, reference is made to FIG. When the component 1 is inserted through the opening 32 in a posture perpendicular to the horizontal direction, the component 1 is received by the receiving plate 34 and cannot be fallen down by the pair of partitions 35a, 35b having a gap. Next, if one of the width shifting plates 36a is lightly driven by the first cylinder 37, the component 1 is positioned in the width direction. In this state, if the second cylinder 38 is driven, the component 1 is lightly pressed toward the one side 35a of the partition in the thickness direction, and the three-dimensional positioning of the component 1 is completed. When the third cylinder 40 is driven, the plurality of contact pins 39 come into contact with the pins 1a of the component 1 and the tester becomes operable. After the test is complete,
When the receiving plate 34 is opened, the component 1 drops downward and is discharged and conveyed.

【0011】発明3において、図1を参照する。試験完
了後、シリンダ33で受板34を開けば、部品1は受板
34からシュート扉44上に落下する。部品1はシュー
ト扉44を閉じておけば箱46に、開いておけば箱47
に落下して良品と不良品とに分けられる。
In Invention 3, FIG. 1 will be referred to. After the test is completed, if the receiving plate 34 is opened with the cylinder 33, the component 1 drops from the receiving plate 34 onto the chute door 44. Part 1 is in box 46 if chute door 44 is closed, and box 47 if it is open.
It falls into and is divided into good products and defective products.

【0012】発明4の作用は前記作用の組合せであっ
て、車輪4又はレール21等により供給装置10を底板
7の滑動方向に運動させれば、部品1は供給装置10か
ら試験装置30の受板34上の試験位置に、開口部32
を経由して供給されて試験ができる状態になり、受板3
4を開けば、部品1は下方に落下して搬送される。この
とき、シュート扉44により良品と不良品とに分けられ
る。
The operation of the invention 4 is a combination of the above operations. When the supply device 10 is moved in the sliding direction of the bottom plate 7 by the wheel 4 or the rail 21, the component 1 receives the test device 30 from the supply device 10. At the test position on the plate 34, the opening 32
It is supplied via the test board and ready for testing.
When opening 4, the component 1 falls and is conveyed. At this time, the chute door 44 separates the good product from the bad product.

【0013】[0013]

【実施例】図1は実施例の供給装置と試験装置の組合せ
装置の正面図、図2は図1のA−A矢視平面図、図3は
図1の供給装置の正面図、図4は図3のB−B矢視側面
図である。図において、同一符号をつけるものはおよそ
同一機能を持ち、重複説明を省くこともある。
FIG. 1 is a front view of a combination device of a supply device and a test device of the embodiment, FIG. 2 is a plan view of the AA arrow of FIG. 1, FIG. 3 is a front view of the supply device of FIG. FIG. 4 is a side view taken along the line BB of FIG. In the figure, those denoted by the same reference numerals have approximately the same function, and duplicate explanation may be omitted.

【0014】図1及び図2において、部品1の供給装置
10は、ケース2、側板3、車輪4、間隔5、複数の仕
切板6、底板7及び固定手段8とからなる。具体的な供
給装置10の構成は、一対の側板3を備えるケース2を
床面20のレール21で案内して矢印P方向に図示しな
いシリンダ等で運動させる車輪4と、側板3の間にこれ
と直角に偏平な部品1を収納する間隔5をあけて固定さ
れる複数の仕切板6と、側板3の下部内側で水平に滑動
する底板7と、この底板7を前記床面20に固定する固
定手段8とからなる。供給装置10の詳細は図3及び図
4に基づき後述する。
In FIGS. 1 and 2, a supply device 10 for a component 1 comprises a case 2, side plates 3, wheels 4, a gap 5, a plurality of partition plates 6, a bottom plate 7 and fixing means 8. The specific configuration of the supply device 10 is such that the case 2 provided with the pair of side plates 3 is guided between the rails 21 of the floor surface 20 and moved between the wheels 4 and the side plate 3 which are moved in the arrow P direction by a cylinder or the like (not shown). A plurality of partition plates 6 fixed at intervals to accommodate the flat parts 1 at right angles, a bottom plate 7 that slides horizontally inside the lower part of the side plate 3, and this bottom plate 7 is fixed to the floor surface 20. And a fixing means 8. Details of the supply device 10 will be described later with reference to FIGS. 3 and 4.

【0015】部品1の試験装置30において、架台31
の上面には、前記床面20とレール21が形成される。
床面20には、水平と直角な姿勢で投入される偏平な前
記部品1のための開口部32が設けられ、その下方で部
品1を受け止めてシリンダ33で開閉可能な受板34が
配置される。この受板34と前記開口部32の間に隙間
をあけて一対の衝立35a、35bが垂直平行に配置さ
れる。図2によく表れるように、前記隙間の両側に一対
の幅寄せ板36a、36bが向かい合って設けられ、こ
の幅寄せ板の一方36aを第1のシリンダ37が軽い力
で駆動して部品1を幅方向に位置決めする。前記衝立の
一方側35aに向けて前記部品1を軽く押し付ける第2
のシリンダ38が配置される。部品1のピン1aに水平
に接触可能な複数のコンタクトピン39は、第3のシリ
ンダ40で駆動される。図2によく表れるように、前記
コンタクトピン39は、第3のシリンダ40にコンタク
ト固定台41で結合され、図示しない試験器に電気的に
接続される。また前記幅寄せ板の一方36aの他方36
bはばね42で部品1の幅方向の力を和らげる。開口部
32からの部品の投入は、マイクロモジュールの場合、
ピン1aを下方にするとよい。それはピン1aが他のI
C等の部品よりプリント配線板と強固に結合しかつ弾性
があるからである。受板34の開閉は水平でなく回動で
もよい。
In the test apparatus 30 for the component 1, the pedestal 31
The floor surface 20 and rails 21 are formed on the upper surface of the.
The floor surface 20 is provided with an opening 32 for the flat part 1 to be inserted in a posture perpendicular to the horizontal, and a receiving plate 34 that receives the part 1 and can be opened / closed by a cylinder 33 is arranged below the opening 32. It A pair of partitions 35a and 35b are arranged vertically in parallel with each other with a gap between the receiving plate 34 and the opening 32. As shown in FIG. 2, a pair of width-shifting plates 36a and 36b are provided facing each other on both sides of the gap. Position in the width direction. Secondly lightly pressing the component 1 toward the one side 35a of the partition
Cylinders 38 are arranged. A plurality of contact pins 39 that can horizontally contact the pins 1 a of the component 1 are driven by the third cylinder 40. As shown in FIG. 2, the contact pin 39 is connected to the third cylinder 40 by a contact fixing base 41 and electrically connected to a tester (not shown). In addition, the other side 36a of the one side 36a
Reference numeral b is a spring 42 for absorbing the force in the width direction of the component 1. In the case of a micro module, the parts can be inserted through the opening 32.
It is advisable to bring the pin 1a downward. Pin 1a is another I
This is because it is more firmly connected to the printed wiring board and more elastic than parts such as C. The receiving plate 34 may be opened and closed not by horizontal movement but by rotation.

【0016】この試験装置30の動作を説明する。開口
部32から水平と直角な姿勢で部品1を投入すれば、部
品1は受板34で受け止められ、隙間をあけた一対の衝
立35a、35bによって倒れない。次に、幅寄せ板の
一方36aを第1のシリンダ37で軽く駆動すれば、部
品1は幅方向に位置決めされる。この状態で、第2のシ
リンダ38を駆動すれば、部品1は厚さ方向に衝立の一
方側35aに向けて軽く押し付けられる。このとき幅寄
せ板の他方36bのばね42が部品1の幅方向の力を和
らげ、厚さ方向の動きの抵抗を阻害しない。もっとも、
幅寄せ板の一方36aの動きを正確に位置制御して、部
品1を幅方向に僅かな隙間を設けて位置決めしてもよ
い。このようにして、部品1の3次元の位置決めが完了
する。第3のシリンダ40を駆動すれば、複数のコンタ
クトピン39は部品1のピン1aに接触して、試験器が
動作可能の状態になる。試験完了後、シリンダ33によ
り受板34を開けば、部品1は下方に落下して排出、搬
送される。
The operation of the test apparatus 30 will be described. When the component 1 is inserted through the opening 32 in a posture perpendicular to the horizontal direction, the component 1 is received by the receiving plate 34 and cannot be fallen down by the pair of partitions 35a, 35b having a gap. Next, if one of the width shifting plates 36a is lightly driven by the first cylinder 37, the component 1 is positioned in the width direction. When the second cylinder 38 is driven in this state, the component 1 is lightly pressed toward the one side 35a of the partition in the thickness direction. At this time, the spring 42 on the other side 36b of the width-shifting plate softens the force in the width direction of the component 1 and does not hinder the resistance to movement in the thickness direction. However,
The component 1 may be positioned with a slight gap provided in the width direction by accurately controlling the movement of one of the width-shifting plates 36a. In this way, the three-dimensional positioning of the component 1 is completed. When the third cylinder 40 is driven, the plurality of contact pins 39 come into contact with the pins 1a of the component 1 and the tester becomes operable. After the test is completed, if the receiving plate 34 is opened by the cylinder 33, the component 1 drops downward and is discharged and conveyed.

【0017】再び図1及び図2にもどる。開閉可能な前
記受板34の下方に設けられるシュート43の一部に
は、第3のシリンダ45で下方に開閉可能なシュート扉
44が設けられ、このシュート扉44と前記シュート4
3の先端との下方にそれぞれ箱46、47が配置され、
部品1が良品と不良品に分けられる。
Returning to FIGS. 1 and 2 again. A chute door 44 that can be opened and closed by a third cylinder 45 is provided in a part of the chute 43 that is provided below the openable and closable receiving plate 34. The chute door 44 and the chute 4 are provided.
Boxes 46 and 47 are arranged below the tip of 3 respectively,
The component 1 is divided into a good product and a defective product.

【0018】図3及び図4に基づき前述の供給装置10
の詳細を説明する。ケース2は一対の側板3とこれと直
角な複数の仕切板6と前板2aとで剛性を備え、いわゆ
るフリーベアリングのような車輪4で床面を自由方向に
運動できる。前記複数の仕切板6は間隔5をあけて偏平
な部品1を収納し、部品1の収納に便利なように先端が
テーパ状になっている。側板3の下部内側の溝3aに案
内されて水平に滑動する底板7が挿し込まれる。この底
板7を前記床面20に固定する固定手段8は、底板7の
端部に設けた穴8aと、この穴にはめあい可能なロッド
8bと、コノロッドを駆動して床面側に固定されるシリ
ンダ8cとからなる。車輪4に代わる運動装置として、
ケース2の下面の滑動面やケース2を吊るすチェンコン
ベアでもよいし、手で運搬する把手でもよい。
The above-mentioned feeding device 10 will be described with reference to FIGS. 3 and 4.
Will be described in detail. The case 2 has a pair of side plates 3, a plurality of partition plates 6 perpendicular to the side plates 3 and a front plate 2a, and has rigidity, and wheels 4 such as so-called free bearings can move freely on the floor. The plurality of partition plates 6 accommodate flat parts 1 at intervals 5 and the tip ends thereof are tapered so that the parts 1 can be conveniently accommodated. A bottom plate 7 that slides horizontally guided by the groove 3a inside the lower portion of the side plate 3 is inserted. The fixing means 8 for fixing the bottom plate 7 to the floor surface 20 is fixed to the floor surface side by driving a hole 8a provided at the end of the bottom plate 7, a rod 8b which can be fitted in this hole, and a cono rod. It is composed of a cylinder 8c. As an exercise device that replaces the wheels 4,
It may be a sliding surface on the lower surface of the case 2, a chain conveyor that suspends the case 2, or a handle that is carried by hand.

【0019】この供給装置10の動作を説明する。底板
7を床面に対して固定手段8で固定し、ケース2を前板
2a方向に仕切板6のピッチごとに移動させれば、間隔
5ごとに底板7の規制を逃れた部品1は1個ごとに落下
し、例えば図1の床面20の開口部32のような特定位
置に供給される。供給装置10の底板7を前板2aの方
向に閉じきれば、仕切板6の間隔5に部品1を収納して
搬送もできる。
The operation of the supply device 10 will be described. If the bottom plate 7 is fixed to the floor surface by the fixing means 8 and the case 2 is moved in the direction of the front plate 2a for each pitch of the partition plate 6, the component 1 that escapes the regulation of the bottom plate 7 at every interval 5 is 1. Each piece falls and is supplied to a specific position such as the opening 32 of the floor surface 20 in FIG. If the bottom plate 7 of the supply device 10 is closed in the direction of the front plate 2a, the component 1 can be housed in the space 5 of the partition plate 6 and transported.

【0020】[0020]

【発明の効果】発明1の部品の供給装置によれば、底板
を固定してケースを移動させれば、部品は1個ごとに床
面の特定位置に落下して供給されることとなり、多数の
部品を同時に搬送して1個ずつ損傷なくスムーズに供給
できるという効果がある。
According to the parts supply apparatus of the invention 1, if the bottom plate is fixed and the case is moved, the parts are dropped and supplied to a specific position on the floor one by one, and a large number of parts are supplied. There is an effect that the parts can be conveyed simultaneously and smoothly supplied one by one without damage.

【0021】発明2の部品の試験装置によれば、開口部
から供給される部品は、試験位置である受板で3次元に
位置決めされ、複数のコンタクトピンに接触して、試験
可能な状態になり、試験完了後に排出されて自動試験が
できるという効果がある。このとき発明3のように、試
験結果に基づき、マイクロモジュール等の部品を良品用
の箱と不良品用の箱とに分けることができるという効果
がある。
According to the component testing apparatus of the second aspect of the invention, the component supplied from the opening is three-dimensionally positioned by the receiving plate, which is a test position, and comes into contact with a plurality of contact pins so that the component can be tested. Therefore, there is an effect that it is discharged after the test is completed and an automatic test can be performed. At this time, as in Invention 3, there is an effect that parts such as a micromodule can be divided into a good product box and a defective product box based on the test result.

【0022】発明4の部品の供給装置及び試験装置によ
れば、ケースに収納した多数の部品を供給装置から試験
装置へ自動供給して自動試験を行い、自動排出できると
いう効果がある。
According to the component supply device and the test device of the fourth aspect of the invention, there is an effect that a large number of components housed in the case can be automatically supplied from the supply device to the test device to carry out an automatic test and automatically discharged.

【図面の簡単な説明】[Brief description of drawings]

【図1】実施例の供給装置と試験装置の組合せ装置の正
面図
FIG. 1 is a front view of a combination device of a supply device and a test device according to an embodiment.

【図2】図1のA−A矢視平面図FIG. 2 is a plan view taken along the line AA of FIG.

【図3】図1の供給装置の正面図FIG. 3 is a front view of the supply device of FIG.

【図4】図3のB−B矢視側面図FIG. 4 is a side view taken along the line BB of FIG.

【符号の説明】[Explanation of symbols]

1 部品 2 ケース 2a 前板 3 側板 4 車輪 5 間隔 6 仕切板 7 底板 8 固定手段 10 供給装置 20 床面 21 レール 30 試験装置 32 開口部 33 シリンダ 34 受板 35a 衝立 35b 衝立 36a 幅寄せ板 36b 幅寄せ板 37 第1のシリンダ 38 第2のシリンダ 39 コンタクトピン 40 第3のシリンダ 42 ばね 43 シュート 44 シュート扉 45 シリンダ 46 箱 47 箱 1 Parts 2 Case 2a Front Plate 3 Side Plate 4 Wheel 5 Spacing 6 Partition Plate 7 Bottom Plate 8 Fixing Means 10 Supply Device 20 Floor Surface 21 Rail 30 Testing Device 32 Opening 33 Cylinder 34 Catch Plate 35a Partition 35b Partition 36a Width Board 36b Width Shift plate 37 First cylinder 38 Second cylinder 39 Contact pin 40 Third cylinder 42 Spring 43 Chute 44 Chute door 45 Cylinder 46 Box 47 Box

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】一対の側板を備えるケースを床面に対して
運動させる運動手段と、前記側板の間にこれと直角に偏
平な部品を収納する間隔をあけて固定される複数の仕切
板と、前記側板の下部内側で水平に滑動する底板と、こ
の底板を前記床面に固定する固定手段とからなることを
特徴とする部品の供給装置。
1. A moving means for moving a case having a pair of side plates with respect to a floor surface, and a plurality of partition plates fixed between the side plates at intervals to accommodate flat parts at right angles thereto. An apparatus for supplying parts, comprising: a bottom plate that slides horizontally inside the lower portion of the side plate; and a fixing unit that fixes the bottom plate to the floor surface.
【請求項2】水平と直角な姿勢の偏平な部品を開口部の
下方で受け止めて開閉可能な受板と、この受板と前記開
口部の間に隙間をあけて垂直平行に配置される一対の衝
立と、前記隙間の両側に設けられて向かい合う一対の幅
寄せ板と、この幅寄せ板の一方を駆動する第1のシリン
ダと、前記衝立の一方側に前記部品を押し付ける第2の
シリンダと、前記部品のピンに水平に接触可能な複数の
コンタクトピンと、このコンタクトピンを前記ピンに接
触させる第3のシリンダとからなることを特徴とする部
品の試験装置。
2. A receiving plate capable of receiving and opening a flat part in a posture perpendicular to the horizontal under the opening, and a pair of the receiving plates arranged vertically in parallel with each other with a gap between the receiving plate and the opening. Partition, a pair of width-shifting plates provided on both sides of the gap and facing each other, a first cylinder that drives one of the width-shifting plates, and a second cylinder that presses the component on one side of the partition. A device for testing a component, comprising: a plurality of contact pins capable of making horizontal contact with a pin of the component; and a third cylinder for bringing the contact pin into contact with the pin.
【請求項3】請求項2記載の部品の試験装置において、
前記受板の下方に設けられるシュートと、このシュート
の一部に設けられ下方に開閉可能なシュート扉と、この
シュート扉と前記シュートとの下方にそれぞれ設けられ
る箱とからなることを特徴とする部品の試験装置。
3. The device for testing a component according to claim 2,
It is characterized by comprising a chute provided below the receiving plate, a chute door provided at a part of the chute and capable of opening and closing downward, and boxes provided below the chute door and the chute, respectively. Testing equipment for parts.
【請求項4】請求項1記載の部品の供給装置と、請求項
2又は3記載の部品の試験装置の組合せ装置において、
前記床面に前記開口部を形成し、前記運動手段は前記ケ
ースを前記底板の滑動方向に運動させることを特徴とす
る部品の供給装置及び試験装置。
4. A combination device of the component supply device according to claim 1 and the component testing device according to claim 2 or 3,
A component supplying device and a testing device, wherein the opening is formed on the floor surface, and the movement means moves the case in a sliding direction of the bottom plate.
JP3271589A 1991-10-21 1991-10-21 Parts supply equipment and test equipment Expired - Fee Related JP2850598B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3271589A JP2850598B2 (en) 1991-10-21 1991-10-21 Parts supply equipment and test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3271589A JP2850598B2 (en) 1991-10-21 1991-10-21 Parts supply equipment and test equipment

Publications (2)

Publication Number Publication Date
JPH05110289A true JPH05110289A (en) 1993-04-30
JP2850598B2 JP2850598B2 (en) 1999-01-27

Family

ID=17502187

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3271589A Expired - Fee Related JP2850598B2 (en) 1991-10-21 1991-10-21 Parts supply equipment and test equipment

Country Status (1)

Country Link
JP (1) JP2850598B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113879815A (en) * 2021-09-26 2022-01-04 吴成万 Aluminum product sticking film machine panel transport mechanism
CN114161136A (en) * 2021-11-04 2022-03-11 哈工大机器人南昌智能制造研究院 Sensor assembling machine
CN117842674A (en) * 2024-03-07 2024-04-09 兰州大学 Identification test equipment based on infrared imaging

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113879815A (en) * 2021-09-26 2022-01-04 吴成万 Aluminum product sticking film machine panel transport mechanism
CN114161136A (en) * 2021-11-04 2022-03-11 哈工大机器人南昌智能制造研究院 Sensor assembling machine
CN114161136B (en) * 2021-11-04 2024-05-14 哈工大机器人南昌智能制造研究院 Sensor assembly machine
CN117842674A (en) * 2024-03-07 2024-04-09 兰州大学 Identification test equipment based on infrared imaging
CN117842674B (en) * 2024-03-07 2024-05-03 兰州大学 Identification test equipment based on infrared imaging

Also Published As

Publication number Publication date
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