JPH05102235A - Wirebonding method - Google Patents

Wirebonding method

Info

Publication number
JPH05102235A
JPH05102235A JP3290549A JP29054991A JPH05102235A JP H05102235 A JPH05102235 A JP H05102235A JP 3290549 A JP3290549 A JP 3290549A JP 29054991 A JP29054991 A JP 29054991A JP H05102235 A JPH05102235 A JP H05102235A
Authority
JP
Japan
Prior art keywords
lead
bonding
camera
detection
leads
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3290549A
Other languages
Japanese (ja)
Other versions
JP3124336B2 (en
Inventor
Susumu Matsuda
進 松田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Mechatronics Co Ltd
Original Assignee
Toshiba Seiki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Seiki Co Ltd filed Critical Toshiba Seiki Co Ltd
Priority to JP03290549A priority Critical patent/JP3124336B2/en
Publication of JPH05102235A publication Critical patent/JPH05102235A/en
Application granted granted Critical
Publication of JP3124336B2 publication Critical patent/JP3124336B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • H01L2224/7825Means for applying energy, e.g. heating means
    • H01L2224/783Means for applying energy, e.g. heating means by means of pressure
    • H01L2224/78301Capillary
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01004Beryllium [Be]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01033Arsenic [As]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01039Yttrium [Y]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01082Lead [Pb]

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Wire Bonding (AREA)

Abstract

PURPOSE:To cut down the lead detecting time for enhancing the productivity of wirebonding work. CONSTITUTION:Before starting the wire bonding work, the numbers of detection ranges processible in an image plane are determined per detection point of a camera while teaching the coordinates of the detection ranges e1. e2... of individual leads and the ideal bonding points P1. P2... as well as considering the detection ranges e1, e2 of respective leads to the effective detection range E (DELTAX, DELTAY). At this time, within the actual bonding step, the leads the number of which has determined of an image to be taken-in from the camera are processed and image processed so as to process the positional difference from the regular position. Finally, the actual bonding point coordinates are processed conforming to the positional difference and the position of the ideal bonding point so as to perform the bonding step conforming to the processed bonding point coordinate.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、ワイヤボンディング方
法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wire bonding method.

【0002】[0002]

【従来の技術】半導体ペレットの電極とリードフレーム
のリードとの間をワイヤボンディングする場合、通常、
ボンディング位置に位置付けられた半導体ペレットやリ
ードにおけるボンディング点の理想位置からのずれ量を
検出するようにしている。
2. Description of the Related Art Usually, when wire-bonding between an electrode of a semiconductor pellet and a lead of a lead frame,
The amount of deviation of the bonding point of the semiconductor pellet or the lead positioned at the bonding position from the ideal position is detected.

【0003】従来、この検出はカメラを用いて次のよう
にして行なわれていた。
Conventionally, this detection has been performed using a camera as follows.

【0004】まずボンディング作業の前に、カメラによ
り基準となる半導体ペレットとその周辺に位置する複数
本のリードの画像を順次個々に取り込み、取り込んだ画
像を画像処理装置にて2値化或いは多値化し、半導体ペ
レット上の2領域の特徴パターンと各領域内の理想のボ
ンデイング点座標、並びに各リードにおける特徴パター
ンと各特徴パターン内の理想のボンデイング点座標をそ
の記憶部に記憶させておく(ティーチングという)。
First, before the bonding work, images of a semiconductor pellet serving as a reference and a plurality of leads located in the periphery thereof are sequentially captured by a camera, and the captured images are binarized or multivalued by an image processing device. The characteristic patterns of the two areas on the semiconductor pellet and the ideal bonding point coordinates in each area, and the characteristic patterns in each lead and the ideal bonding point coordinates in each characteristic pattern are stored in the storage unit (teaching). That).

【0005】そこで実際のボンディング動作において
は、まず検出位置であるボンディング位置或いはその前
位置に半導体ペレットが位置付けられると、カメラにて
半導体ペレット上の2つの領域並びにその半導体ペレッ
トの周辺に位置する複数本のリードの画像を順次個々に
取り込み、取り込んだ画像を画像処理装置にて2値化或
いは多値化する。次に個々の画像を、予めティーチング
作業で画像処理装置の記憶部に記憶させた対応する1つ
の特徴パターンと比較し、相互の位置ずれ量を検出す
る。そしてこのずれ量並びに理想のボンディン点座標と
から実際のボンディング点座標を算出する。ワイヤボン
ディングは、この算出されたボンディング点座標に対し
て行なわれる。
Therefore, in an actual bonding operation, first, when the semiconductor pellet is positioned at the bonding position which is the detection position or the position before it, a plurality of semiconductor pellets located in the two regions on the semiconductor pellet and in the periphery of the semiconductor pellet are detected by the camera. The images of the leads of the book are sequentially captured individually, and the captured images are binarized or multivalued by the image processing device. Next, each image is compared with one corresponding feature pattern stored in the storage unit of the image processing apparatus in advance by the teaching operation, and the mutual positional deviation amount is detected. Then, the actual bonding point coordinates are calculated from this deviation amount and the ideal bondin point coordinates. Wire bonding is performed on the calculated bonding point coordinates.

【0006】[0006]

【発明が解決しようとする課題】ところが上記の技術に
よると、実際のボンディング動作にあたり、半導体ペレ
ットを1個単位或いは各リードを1本単位で検出してい
ることから、特にリードの本数が多い場合、その検出作
業に多くの時間を必要とし、結果としてボンディング時
間も長くなり、生産性の向上を妨げる原因となってい
た。
However, according to the above-mentioned technique, in the actual bonding operation, the semiconductor pellets are detected in units of one or each of the leads. Therefore, particularly when the number of leads is large. However, it takes a lot of time for the detection work, and as a result, the bonding time becomes long, which hinders the improvement of productivity.

【0007】本発明は、リードの検出時間を短縮すると
ともに、ワイヤボンディング作業の生産性を向上させる
ことができるワイヤボンディング方法を提供することを
目的とする。
An object of the present invention is to provide a wire bonding method which can shorten the lead detection time and improve the productivity of wire bonding work.

【0008】[0008]

【課題を解決するための手段】上記目的を達成するため
請求項1における本発明は、ワイヤボンディング作業の
前に、各リード毎に検出範囲を設定するとともに、カメ
ラから取り込まれ画像処理される1画面中における処理
可能な検出範囲の数を判定しておき、リードの位置を検
出するにあたり、前記1画面中から前記判定された数分
の前記リードを処理するようにしたことを特徴とする。
In order to achieve the above object, the present invention according to claim 1 sets a detection range for each lead before wire bonding work and takes in an image from a camera for image processing. It is characterized in that the number of detection ranges that can be processed in the screen is determined in advance, and in detecting the position of the lead, the determined number of the leads are processed from the one screen.

【0009】また請求項2における本発明は、ワイヤボ
ンディング作業の前に、半導体ペレット1個当たりの検
出範囲を設定するとともに、カメラから取り込まれ画像
処理される1画面中における処理可能な検出範囲の数を
判定しておき、半導体ペレット並びにその周辺リードの
位置を検出するにあたり、前記1画面中から前記判定さ
れた数分の前記半導体ペレット並びに前記リードを処理
するようにしたことを特徴とする。
According to the second aspect of the present invention, before the wire bonding work, the detection range for each semiconductor pellet is set, and the detection range that can be processed in one screen which is taken in from the camera and image-processed is set. It is characterized in that the number of the semiconductor pellets and the leads are processed in the one screen in order to detect the positions of the semiconductor pellets and the leads around the semiconductor pellets.

【0010】[0010]

【作用】本発明の請求項1によれば、半導体ペレットの
周辺に位置するリードが複数本単位で検出される。
According to the first aspect of the present invention, a plurality of leads located around the semiconductor pellet are detected.

【0011】また本発明の請求項2によれば、半導体ペ
レット並びにその周辺に位置するリードが半導体ペレッ
ト複数個単位で検出される。
According to the second aspect of the present invention, the semiconductor pellet and the leads located around the semiconductor pellet are detected in units of a plurality of semiconductor pellets.

【0012】[0012]

【実施例】以下本発明の実施例について、図面を用いて
説明する。
Embodiments of the present invention will be described below with reference to the drawings.

【0013】図1は、本発明の実施に用いられるワイヤ
ボンディング装置の一実施例の構成図、図2はリードフ
レームの平面図、図3はリードの検出範囲を示す図、図
4は有効検出範囲を示す図、図5乃至図8はリードの検
出方法を示す図である。
FIG. 1 is a block diagram of an embodiment of a wire bonding apparatus used for carrying out the present invention, FIG. 2 is a plan view of a lead frame, FIG. 3 is a view showing a lead detection range, and FIG. 4 is an effective detection. FIG. 5 to FIG. 8 are diagrams showing the range, and FIG. 5 to FIG. 8 are diagrams showing the lead detection method.

【0014】図において、リードフレーム1には、前工
程に設置されたペレットマウント装置により半導体ペレ
ット2がマウントされ、不図示の搬送装置によってボン
ディング位置に位置付けられる。ボンディング位置には
ボンディングヘッド10が設けられる。このボンディン
グヘッド10はX−Yテーブル11上に載置されてお
り、上下動自在に保持されたボンディングアーム12の
先端にキャピラリ13が装着される。
In the figure, the semiconductor pellets 2 are mounted on the lead frame 1 by the pellet mounting device installed in the previous step, and are positioned at the bonding position by a carrier device (not shown). A bonding head 10 is provided at the bonding position. The bonding head 10 is mounted on an XY table 11, and a capillary 13 is attached to the tip of a bonding arm 12 which is held so as to be vertically movable.

【0015】ボンディング位置に位置付けられるリード
フレーム1の上方には、リードフレーム1上の所定位置
を撮像可能なカメラ14がX−Y方向に移動自在に配置
され、画像処理装置15を介して制御装置16に接続さ
れている。このカメラ14は、ボンディングヘッド10
の本体に固定されるものであってもよい。制御装置16
は、ボンディングヘッド10、X−Yテーブル11を移
動制御するもので、記憶部17、演算部18並びに比較
部19を有している。なお図中20はモニタで、カメラ
14にて撮像された画像が写し出される。
A camera 14 capable of picking up an image of a predetermined position on the lead frame 1 is movably arranged in the XY direction above the lead frame 1 positioned at the bonding position, and a control device is provided via an image processing device 15. It is connected to 16. This camera 14 has a bonding head 10
It may be fixed to the main body. Control device 16
Controls the movement of the bonding head 10 and the XY table 11, and has a storage unit 17, a calculation unit 18, and a comparison unit 19. In the figure, reference numeral 20 is a monitor on which an image captured by the camera 14 is displayed.

【0016】次に作動について説明する。Next, the operation will be described.

【0017】ボンディング作業の前に、モニタ20を見
ながら次のようにしてティーチング作業を行なう。
Before the bonding work, while watching the monitor 20, the teaching work is performed as follows.

【0018】まずカメラ14にてリード1aの画像を順
次取り込み、各リード毎にその特徴パターン、並びに図
3に示すようにその検出範囲ei(Δxi、Δyi)を
ワイヤボンディングを施す順番に設定し、記憶部17に
記憶させる。このとき理想のボンディング点Piの座標
(xi、yi)も合わせて設定し、記憶させる。なお検
出範囲eiは、リード幅から自動的に設定されるように
してもよい。
First, the images of the leads 1a are sequentially captured by the camera 14, and the characteristic pattern of each lead and its detection range ei (Δxi, Δyi) are set in the order of wire bonding as shown in FIG. It is stored in the storage unit 17. At this time, the coordinates (xi, yi) of the ideal bonding point Pi are also set and stored. The detection range ei may be automatically set from the lead width.

【0019】次に図4に示すようにカメラ14の有効検
出範囲E(ΔX、ΔY:カメラの検出精度がレンズの歪
みなどにより悪影響を受けることがない検出範囲)を設
定し、記憶部17に記憶させる。この有効検出範囲は、
モニタ20に写し出された範囲全部またはその一部とし
て設定される。
Next, as shown in FIG. 4, an effective detection range E of the camera 14 (ΔX, ΔY: a detection range in which the detection accuracy of the camera is not adversely affected by lens distortion etc.) is set and stored in the storage unit 17. Remember. This effective detection range is
It is set as all or part of the range projected on the monitor 20.

【0020】以上の設定が終了すると、制御装置16の
演算部18においては、カメラ14から取り込まれ画像
処理装置15にて2値化或いは多値化処理される1画面
中における処理可能な検出範囲の数を判定する。
When the above setting is completed, the processing unit 18 of the control unit 16 can detect a processable detection range in one screen which is captured from the camera 14 and binarized or multivalued by the image processing unit 15. Determine the number of.

【0021】この判定方法について、図5乃至第8図を
用いて説明する。
This determination method will be described with reference to FIGS. 5 to 8.

【0022】まず1番目にボンディングされるリードL
1(以下1番リードL1という)の検出範囲e1と、カ
メラ14の有効検出範囲Eとの比較が成される。これは
検出範囲e1と有効検出範囲Eとにおける横方向長さΔ
x1とΔX、縦方向長さΔy1とΔYとをそれぞれ比較
し、双方の大小関係を判定するもので、Δx1≦ΔX、
Δy1≦ΔYが成立するため、検出範囲e1は有効検出
範囲E内に含まれると判定される(図5参照)。そこで
次に、検出範囲e1と2番リードL2の検出範囲e2を
共に含む最小の四角形S2(Δm2、Δn2)と有効検
出範囲Eとの比較が成される。これは四角形S2と有効
検出範囲Eとにおける横方向長さΔm2とΔX、縦方向
長さΔn2とΔYとをそれぞれ比較し、双方の大小関係
を判定するもので、Δm2≦ΔX、Δn2≦ΔYが成立
するため、四角形S2は有効検出範囲E内に含まれると
判定される(図6参照)。以下3番リードL3、4番リ
ードL4というように順番に、上述と同様にして判定が
行なわれる。そして本例では図7に示すように、1番リ
ードL1から4番リードL4までの各検出範囲e1、e
2、e3、e4をすべて含む最小の四角形S4(Δm
4、Δn4)と有効検出範囲Eとを比較したとき、初め
てΔm4≧ΔX、Δn4≦ΔYとなることから、四角形
S4は有効検出範囲E内に含まれないと判定される。そ
こで、1つの有効検出範囲Eにおいては1番リードL1
から3番リードL3までが処理可能と判定されると、こ
れらを第1のブロックとし、演算部18は各検出範囲e
1、e2、e3を含む最小の四角形S3の中心位置Pa
の座標を算出する。そしてこの中心位置Paを基点とし
て、各リードL1〜L3における理想のボンディング点
P1〜P3との相対関係(X方向、Y方向における相対
位置関係、つまりベクトル情報)を算出して記憶部17
に記憶する(図8参照)。以後4番リード以降に対し
て、同様な処理が成される。
First, the lead L to be bonded first
The detection range e1 of 1 (hereinafter referred to as the first lead L1) and the effective detection range E of the camera 14 are compared. This is the lateral length Δ in the detection range e1 and the effective detection range E.
x1 and ΔX, and vertical lengths Δy1 and ΔY are compared with each other to determine the magnitude relationship between them. Δx1 ≦ ΔX,
Since Δy1 ≦ ΔY is established, it is determined that the detection range e1 is included in the effective detection range E (see FIG. 5). Therefore, next, a comparison is made between the minimum detection rectangle S2 (Δm2, Δn2) including both the detection range e1 and the detection range e2 of the second lead L2 and the effective detection range E. This is to compare the horizontal lengths Δm2 and ΔX and the vertical lengths Δn2 and ΔY in the quadrangle S2 and the effective detection range E, respectively, and determine the magnitude relationship between them, where Δm2 ≦ ΔX and Δn2 ≦ ΔY are satisfied. Since it is satisfied, it is determined that the quadrangle S2 is included in the effective detection range E (see FIG. 6). In the same manner as described above, the determination is performed in order, such as the third lead L3 and the fourth lead L4. In this example, as shown in FIG. 7, the detection ranges e1 and e1 from the first lead L1 to the fourth lead L4
The smallest quadrangle S4 (Δm containing all 2, e3, e4)
4, Δn4) is compared with the effective detection range E, Δm4 ≧ ΔX and Δn4 ≦ ΔY are satisfied for the first time, and thus it is determined that the quadrangle S4 is not included in the effective detection range E. Therefore, in one effective detection range E, the first lead L1
If it is determined that the third to the third leads L3 can be processed, these are set as the first block, and the arithmetic unit 18 sets each detection range e.
Center position Pa of the smallest quadrangle S3 including 1, e2, e3
Calculate the coordinates of. Then, with the center position Pa as a base point, the relative relationship (relative positional relationship in the X direction and the Y direction, that is, vector information) with the ideal bonding points P1 to P3 in each lead L1 to L3 is calculated, and the storage unit 17 is calculated.
(See FIG. 8). After that, the same processing is performed for the fourth and subsequent reads.

【0023】次に、実際にボンディング位置に位置付け
られたリードの位置検出方法について説明する。まずカ
メラ14が、その視野中心が第1の検出点、すなわち中
心位置Paとなる位置に移動し、第1のブロックとして
の3本のリードL1〜L3に対応するリード画像を取り
込む。取り込まれた画像は、画像処理装置15にて処理
された後、記憶部17に記憶される。そして、この画像
から検出範囲e1、e2、e3の部分が切り出され、そ
れぞれ記憶部17に記憶された対応する特徴パターンと
のマッチング処理が比較部19にて行なわれる。そして
比較部19にてリードの位置ずれ量が検出され、このず
れ量、中心位置Paの座標並びに理想のボンディング点
P1〜P3のベクトル情報に基づき、最終的に演算部1
8にて実際のボンディング点座標が算出される。
Next, a method of detecting the position of the lead actually positioned at the bonding position will be described. First, the camera 14 moves to the position where the center of the field of view is the first detection point, that is, the center position Pa, and captures the lead images corresponding to the three leads L1 to L3 as the first block. The captured image is stored in the storage unit 17 after being processed by the image processing device 15. Then, the detection areas e1, e2, and e3 are cut out from this image, and the comparison unit 19 performs matching processing with the corresponding feature patterns stored in the storage unit 17, respectively. Then, the comparison unit 19 detects the positional deviation amount of the lead, and finally the arithmetic operation unit 1 based on the deviation amount, the coordinates of the center position Pa, and the vector information of the ideal bonding points P1 to P3.
At 8, the actual bonding point coordinates are calculated.

【0024】カメラ14により3本のリードL1〜L3
に対応するリードが撮像され記憶部17に記憶された時
点で、このカメラ14は次の検出点に移動し、これによ
り4番リード以降のリードに対して順次ブロック毎に同
様な処理が施される。
The camera 14 uses three leads L1 to L3.
When the lead corresponding to is read and stored in the storage unit 17, the camera 14 moves to the next detection point, and the same processing is sequentially performed on the leads after the fourth lead for each block. It

【0025】なお半導体ペレット2の位置ずれに関して
は、従来と同様に半導体ペレット上の2点の位置ずれ量
が検出され、これに基づき半導体ペレット上のすべての
ボンディング点が補正演算される。
Regarding the positional deviation of the semiconductor pellet 2, the positional deviation amounts at two points on the semiconductor pellet are detected as in the conventional case, and all the bonding points on the semiconductor pellet are corrected and calculated based on this.

【0026】このようにしてすべてのボンディング点座
標が演算により求められると、制御装置16はこのボン
ディング点座標に基づいてXYテーブル11、ボンディ
ングヘッド10を作動させ、ボンディングを行なう。
When all the bonding point coordinates are calculated in this way, the controller 16 operates the XY table 11 and the bonding head 10 based on the bonding point coordinates to perform bonding.

【0027】上記実施例によれば、各リード毎に検出範
囲eiを設定し、この検出範囲eiを考慮しながら、カ
メラ14から取り込まれ画像処理される1画面中におけ
る処理可能な検出範囲の数を判定するとともに、ワイヤ
ボンディング動作においては、判定された数分のリード
を上記1画面中にて処理するようにしたので、検出時間
が短縮でき、ボンディング作業の生産性を向上させるこ
とができる。
According to the above embodiment, the detection range ei is set for each lead, and the number of processable detection ranges in one screen which is captured from the camera 14 and image-processed while considering the detection range ei. In addition to the above determination, in the wire bonding operation, the determined number of leads are processed in one screen, so that the detection time can be shortened and the productivity of the bonding work can be improved.

【0028】なお上記実施例においては、個々のリード
における検出範囲並びに理想のボンディング点座標のテ
ィーチングが終了した後に、判定を行なうようにした
が、これに限られるものではなく、例えばティーチング
と同時に判定を行なうようにしてもよい。
In the above-described embodiment, the determination is made after the teaching of the detection range of each lead and the ideal bonding point coordinates is finished, but the invention is not limited to this. May be performed.

【0029】また上記実施例は、カメラ14が取り込ん
だ1画面中において複数本分のリードの処理を行なうも
のであったが、図9に示すように、カメラ14の有効検
出範囲E´中に複数個の半導体ペレット2の像が存在し
得る場合は、半導体ペレット毎にその周辺に位置するリ
ードも含む検出範囲eaを予め設定し、上記実施例と同
様にして判定することにより、カメラ14により取り込
まれ画像処理される1画面中において、複数個の半導体
ペレット並びに対応するリードの処理を行なうことがで
き、これによりボンディング作業の生産性を大幅に向上
させることができる。
Further, in the above-described embodiment, the read processing for a plurality of lines is carried out in one screen captured by the camera 14, but as shown in FIG. When there are a plurality of images of the semiconductor pellets 2, the detection range ea including the leads located in the periphery of each of the semiconductor pellets is set in advance, and the determination is performed in the same manner as in the above-described embodiment. It is possible to process a plurality of semiconductor pellets and the corresponding leads in one screen which is taken in and image-processed, which can significantly improve the productivity of the bonding work.

【0030】[0030]

【発明の効果】本発明によれば、リードの検出時間を短
縮でき、ボンディング作業の生産性を向上させることが
できる。
According to the present invention, the lead detection time can be shortened and the productivity of the bonding work can be improved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施に用いられるワイヤボンディング
装置の一実施例の構成図を示す。
FIG. 1 shows a configuration diagram of an embodiment of a wire bonding apparatus used for implementing the present invention.

【図2】リードフレームの平面図を示す。FIG. 2 shows a plan view of a lead frame.

【図3】リードの検出範囲を示す図である。FIG. 3 is a diagram showing a lead detection range.

【図4】有効検出範囲を示す図である。FIG. 4 is a diagram showing an effective detection range.

【図5】リードの検出方法を示す図である。FIG. 5 is a diagram showing a lead detection method.

【図6】リードの検出方法を示す図である。FIG. 6 is a diagram showing a lead detection method.

【図7】リードの検出方法を示す図である。FIG. 7 is a diagram showing a lead detection method.

【図8】リードの検出方法を示す図である。FIG. 8 is a diagram showing a lead detection method.

【図9】本発明の第2の実施例を示す模式図である。FIG. 9 is a schematic diagram showing a second embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 リードフレーム 2 半導体ペレット 10 ボンディングヘッド 14 カメラ 15 画像処理装置 16 制御装置 17 記憶部 18 演算部 19 比較部 20 モニタ ei 検出範囲 E 有効検出範囲 DESCRIPTION OF SYMBOLS 1 lead frame 2 semiconductor pellet 10 bonding head 14 camera 15 image processing device 16 control device 17 storage unit 18 arithmetic unit 19 comparison unit 20 monitor ei detection range E effective detection range

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 リードフレームにマウントされた半導体
ペレットを検出位置に位置付け、カメラにて前記半導体
ペレットの周辺に位置する複数本のリードの画像を取り
込んで画像処理することにより各リードの位置を検出し
て正規の位置からのずれ量を求め、求めたずれ量に基づ
いて予め設定されているボンディング点座標を補正する
ようにしたワイヤボンディング方法において、ワイヤボ
ンディング作業の前に、前記各リード毎に検出範囲を設
定するとともに、前記カメラから取り込まれ画像処理さ
れる1画面中における処理可能な検出範囲の数を判定し
ておき、前記リードの位置を検出するにあたり、前記1
画面中から前記判定された数分の前記リードを処理する
ようにしたことを特徴とするワイヤボンディング方法。
1. The position of each lead is detected by positioning a semiconductor pellet mounted on a lead frame at a detection position, capturing images of a plurality of leads located around the semiconductor pellet with a camera, and performing image processing. Then, the amount of deviation from the regular position is obtained, and in the wire bonding method in which the preset bonding point coordinates are corrected based on the obtained amount of deviation, before the wire bonding work, for each of the leads. In addition to setting the detection range, the number of processable detection ranges in one screen captured from the camera and subjected to image processing is determined in advance.
The wire bonding method is characterized in that the determined number of the leads are processed from the screen.
【請求項2】 リードフレームにマウントされた複数個
の半導体ペレットの個々を順次検出位置に位置付け、カ
メラにて前記半導体ペレット並びにその周辺に位置する
複数本のリードの画像を取り込んで画像処理することに
より各半導体ペレット並びに各リードの位置を検出して
正規の位置からのずれ量を求め、求めたずれ量に基づい
て予め設定されているボンディング点座標を補正するよ
うにしたワイヤボンディング方法において、ワイヤボン
ディング作業の前に、前記半導体ペレット1個当たりの
検出範囲を設定するとともに、前記カメラから取り込ま
れ画像処理される1画面中における処理可能な検出範囲
の数を判定しておき、前記半導体ペレット並びに前記リ
ードの位置を検出するにあたり、前記1画面中から前記
判定された数分の前記半導体ペレット並びに前記リード
を処理するようにしたことを特徴とするワイヤボンディ
ング方法。
2. A plurality of semiconductor pellets mounted on a lead frame are sequentially positioned at detection positions, and a camera is used to capture images of the semiconductor pellets and a plurality of leads located around the semiconductor pellets for image processing. In the wire bonding method, the position of each semiconductor pellet and each lead is detected to obtain the amount of deviation from the normal position, and the preset bonding point coordinates are corrected based on the obtained amount of deviation. Before the bonding work, the detection range per semiconductor pellet is set, and the number of processable detection ranges in one screen which is captured from the camera and image-processed is determined in advance. When detecting the position of the lead, a few minutes before the determined number from the one screen A wire bonding method, wherein the semiconductor pellet and the lead are treated.
JP03290549A 1991-10-09 1991-10-09 Wire bonding method Expired - Fee Related JP3124336B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP03290549A JP3124336B2 (en) 1991-10-09 1991-10-09 Wire bonding method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP03290549A JP3124336B2 (en) 1991-10-09 1991-10-09 Wire bonding method

Publications (2)

Publication Number Publication Date
JPH05102235A true JPH05102235A (en) 1993-04-23
JP3124336B2 JP3124336B2 (en) 2001-01-15

Family

ID=17757472

Family Applications (1)

Application Number Title Priority Date Filing Date
JP03290549A Expired - Fee Related JP3124336B2 (en) 1991-10-09 1991-10-09 Wire bonding method

Country Status (1)

Country Link
JP (1) JP3124336B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5862974A (en) * 1995-10-23 1999-01-26 Kabushiki Kaisha Shinkawa Wire bonding method and apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5862974A (en) * 1995-10-23 1999-01-26 Kabushiki Kaisha Shinkawa Wire bonding method and apparatus

Also Published As

Publication number Publication date
JP3124336B2 (en) 2001-01-15

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