JPH0481124B2 - - Google Patents

Info

Publication number
JPH0481124B2
JPH0481124B2 JP60004408A JP440885A JPH0481124B2 JP H0481124 B2 JPH0481124 B2 JP H0481124B2 JP 60004408 A JP60004408 A JP 60004408A JP 440885 A JP440885 A JP 440885A JP H0481124 B2 JPH0481124 B2 JP H0481124B2
Authority
JP
Japan
Prior art keywords
point
imaging
pair
dimensional
axis direction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60004408A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61162705A (ja
Inventor
Mitsuo Iso
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kanadevia Corp
Original Assignee
Hitachi Shipbuilding and Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Shipbuilding and Engineering Co Ltd filed Critical Hitachi Shipbuilding and Engineering Co Ltd
Priority to JP440885A priority Critical patent/JPS61162705A/ja
Publication of JPS61162705A publication Critical patent/JPS61162705A/ja
Publication of JPH0481124B2 publication Critical patent/JPH0481124B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2522—Projection by scanning of the object the position of the object changing and being recorded

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP440885A 1985-01-14 1985-01-14 立体計測方法 Granted JPS61162705A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP440885A JPS61162705A (ja) 1985-01-14 1985-01-14 立体計測方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP440885A JPS61162705A (ja) 1985-01-14 1985-01-14 立体計測方法

Publications (2)

Publication Number Publication Date
JPS61162705A JPS61162705A (ja) 1986-07-23
JPH0481124B2 true JPH0481124B2 (enrdf_load_stackoverflow) 1992-12-22

Family

ID=11583490

Family Applications (1)

Application Number Title Priority Date Filing Date
JP440885A Granted JPS61162705A (ja) 1985-01-14 1985-01-14 立体計測方法

Country Status (1)

Country Link
JP (1) JPS61162705A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2659439B1 (fr) * 1990-03-12 1996-03-08 Centre Nat Rech Scient Procede et systeme de releve et de mesure de contours en trois dimensions.
FR3035207B1 (fr) * 2015-04-14 2021-01-29 Mesure Systems3D Dispositif modulaire de mesure sans contact et systeme de mesure et de controle correspondant

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5537982A (en) * 1978-09-11 1980-03-17 Ishikawajima Harima Heavy Ind Co Ltd Solid-shape detector for characteristic test of deformation of curved-surface body
AT367552B (de) * 1979-05-11 1982-07-12 Chlestil Gustav Dkfm Ing Verfahren zur fotografischen herstellung von datentraegern fuer die reproduktion dreidimensionaler objekte, vorrichtung zur durch- fuehrung des verfahrens und reproduktionseinrichtung
JPS5733304A (en) * 1980-08-06 1982-02-23 Hitachi Ltd Method and device for shape inspection
JPS58206909A (ja) * 1982-05-07 1983-12-02 Yokogawa Hokushin Electric Corp 物体の任意形状測定装置

Also Published As

Publication number Publication date
JPS61162705A (ja) 1986-07-23

Similar Documents

Publication Publication Date Title
JP4551919B2 (ja) 断層撮影の検査システムおよびその方法
US5612905A (en) Three-dimensional measurement of large objects
EP2132523B1 (en) Method and device for exact measurement of objects
JPH1183438A (ja) 光学式測定装置の位置校正方法
CN108198224A (zh) 一种用于立体视觉测量的线阵相机标定装置及标定方法
JP4939304B2 (ja) 透明膜の膜厚測定方法およびその装置
US20030053045A1 (en) System for inspecting a flat sheet workpiece
CN115683059B (zh) 一种结构光三维垂线测量装置及方法
JPH0481125B2 (enrdf_load_stackoverflow)
JPH04172213A (ja) 三次元形状測定装置の校正方法
GB2064102A (en) Improvements in electro- optical dimension measurement
JPH09196624A (ja) 微少寸法測定方法、及び装置
JP2000081329A (ja) 形状測定方法及び装置
JPH0481124B2 (enrdf_load_stackoverflow)
CN101113891B (zh) 光学式测量装置
JPH07113534B2 (ja) 精密輪郭の視覚測定方法及び装置
JP2945448B2 (ja) 表面形状測定装置
JP2007085912A (ja) 位置測定方法及び位置測定装置並びに位置測定システム
JP2000249664A (ja) Ｘ線透過検査方法及び装置
JP2795790B2 (ja) ３次元計測装置のセンサ座標補正方法
JPS61159102A (ja) 二次元測定方法
JP2678127B2 (ja) 光学式測定装置
JP3095411B2 (ja) Ｃｃｄカメラの校正方法
JPH0942946A (ja) 電子部品の測定装置、測定方法及びキャリブレーションマスク
Elad et al. A novel non-contact technique for measuring complex surface shapes under dynamic conditions