JPH0477415B2 - - Google Patents
Info
- Publication number
- JPH0477415B2 JPH0477415B2 JP61029988A JP2998886A JPH0477415B2 JP H0477415 B2 JPH0477415 B2 JP H0477415B2 JP 61029988 A JP61029988 A JP 61029988A JP 2998886 A JP2998886 A JP 2998886A JP H0477415 B2 JPH0477415 B2 JP H0477415B2
- Authority
- JP
- Japan
- Prior art keywords
- electrostatic lens
- magnetic field
- ion beam
- mass spectrometry
- spectrometry system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000010884 ion-beam technique Methods 0.000 claims description 18
- 150000002500 ions Chemical class 0.000 claims description 17
- 238000004949 mass spectrometry Methods 0.000 claims description 12
- 230000004075 alteration Effects 0.000 description 9
- 230000005684 electric field Effects 0.000 description 9
- 238000010586 diagram Methods 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 230000005686 electrostatic field Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61029988A JPS62188152A (ja) | 1986-02-14 | 1986-02-14 | 質量分析装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61029988A JPS62188152A (ja) | 1986-02-14 | 1986-02-14 | 質量分析装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62188152A JPS62188152A (ja) | 1987-08-17 |
JPH0477415B2 true JPH0477415B2 (enrdf_load_stackoverflow) | 1992-12-08 |
Family
ID=12291334
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61029988A Granted JPS62188152A (ja) | 1986-02-14 | 1986-02-14 | 質量分析装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62188152A (enrdf_load_stackoverflow) |
-
1986
- 1986-02-14 JP JP61029988A patent/JPS62188152A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS62188152A (ja) | 1987-08-17 |
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