JPH0477415B2 - - Google Patents
Info
- Publication number
- JPH0477415B2 JPH0477415B2 JP61029988A JP2998886A JPH0477415B2 JP H0477415 B2 JPH0477415 B2 JP H0477415B2 JP 61029988 A JP61029988 A JP 61029988A JP 2998886 A JP2998886 A JP 2998886A JP H0477415 B2 JPH0477415 B2 JP H0477415B2
- Authority
- JP
- Japan
- Prior art keywords
- electrostatic lens
- magnetic field
- ion beam
- mass spectrometry
- spectrometry system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000010884 ion-beam technique Methods 0.000 claims description 18
- 150000002500 ions Chemical class 0.000 claims description 17
- 238000004949 mass spectrometry Methods 0.000 claims description 12
- 230000004075 alteration Effects 0.000 description 9
- 230000005684 electric field Effects 0.000 description 9
- 238000010586 diagram Methods 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 230000005686 electrostatic field Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61029988A JPS62188152A (ja) | 1986-02-14 | 1986-02-14 | 質量分析装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61029988A JPS62188152A (ja) | 1986-02-14 | 1986-02-14 | 質量分析装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62188152A JPS62188152A (ja) | 1987-08-17 |
| JPH0477415B2 true JPH0477415B2 (enrdf_load_stackoverflow) | 1992-12-08 |
Family
ID=12291334
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61029988A Granted JPS62188152A (ja) | 1986-02-14 | 1986-02-14 | 質量分析装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62188152A (enrdf_load_stackoverflow) |
-
1986
- 1986-02-14 JP JP61029988A patent/JPS62188152A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62188152A (ja) | 1987-08-17 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP3732533B2 (ja) | 結像用の電子エネルギーフィルタ | |
| JPH11509972A (ja) | 粒子光学機器のレンズ収差補正用補正装置 | |
| US4766314A (en) | Lens arrangement for the focusing of electrically charged particles, and mass spectrometer with such a lens arrangement | |
| SU1600645A3 (ru) | Масс-спектрометр | |
| EP0255981B1 (en) | Charged particle optical systems having therein means for correcting aberrations | |
| JPH0354831B2 (enrdf_load_stackoverflow) | ||
| JP5521255B2 (ja) | 2重集束を有する磁気色消し質量分析計 | |
| US3774026A (en) | Ion-optical system for mass separation | |
| US5118939A (en) | Simultaneous detection type mass spectrometer | |
| JPH0477415B2 (enrdf_load_stackoverflow) | ||
| JP2000228162A (ja) | 電子ビーム装置 | |
| JPH08212970A (ja) | 電子ビームからイオンを除去する装置 | |
| JP2956706B2 (ja) | 質量分析装置 | |
| JPH0812773B2 (ja) | 同時検出型質量分析装置 | |
| JP3040245B2 (ja) | ウィーンフィルタ | |
| JP3096375B2 (ja) | ハイブリッドタンデム質量分析装置 | |
| JP2856518B2 (ja) | E×b型エネルギーフィルタ | |
| SU1436148A2 (ru) | Энергетический анализатор с электростатическим зеркалом | |
| JP3153386B2 (ja) | 質量分析装置 | |
| SU680534A1 (ru) | Электростатический энергоанализатор | |
| JPH0349177B2 (enrdf_load_stackoverflow) | ||
| JPS58209855A (ja) | 高質量域二重収束質量分析計 | |
| JPS6161220B2 (enrdf_load_stackoverflow) | ||
| JPS6062055A (ja) | 質量分析装置 | |
| JPH05275057A (ja) | ウィーンフィルタ |