JPH0349177B2 - - Google Patents
Info
- Publication number
- JPH0349177B2 JPH0349177B2 JP58033168A JP3316883A JPH0349177B2 JP H0349177 B2 JPH0349177 B2 JP H0349177B2 JP 58033168 A JP58033168 A JP 58033168A JP 3316883 A JP3316883 A JP 3316883A JP H0349177 B2 JPH0349177 B2 JP H0349177B2
- Authority
- JP
- Japan
- Prior art keywords
- magnetic field
- ion
- deflection
- ions
- deflection magnetic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58033168A JPS59160949A (ja) | 1983-03-01 | 1983-03-01 | 質量分析装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58033168A JPS59160949A (ja) | 1983-03-01 | 1983-03-01 | 質量分析装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59160949A JPS59160949A (ja) | 1984-09-11 |
JPH0349177B2 true JPH0349177B2 (enrdf_load_stackoverflow) | 1991-07-26 |
Family
ID=12379002
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58033168A Granted JPS59160949A (ja) | 1983-03-01 | 1983-03-01 | 質量分析装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59160949A (enrdf_load_stackoverflow) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59209258A (ja) * | 1983-05-12 | 1984-11-27 | Jeol Ltd | 質量分析装置 |
JPS59215650A (ja) * | 1983-05-24 | 1984-12-05 | Jeol Ltd | 質量分析装置 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0239509B2 (ja) * | 1982-05-13 | 1990-09-05 | Hokko Chem Ind Co | Chiokuromann44onruinokairyoseiho |
-
1983
- 1983-03-01 JP JP58033168A patent/JPS59160949A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS59160949A (ja) | 1984-09-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US20120312982A1 (en) | Mass spectrometers and methods of ion separation and detection | |
JP7029494B2 (ja) | 分光およびイメージングシステム、並びに、試料の特性評価の方法 | |
US4556794A (en) | Secondary ion collection and transport system for ion microprobe | |
JPH0352180B2 (enrdf_load_stackoverflow) | ||
US4672204A (en) | Mass spectrometers | |
JPS6229049A (ja) | 質量分析計 | |
AU2017220662B2 (en) | Extraction system for charged secondary particles for use in a mass spectrometer or other charged particle device | |
US5621209A (en) | Attomole detector | |
JPH0354831B2 (enrdf_load_stackoverflow) | ||
JPH0766767B2 (ja) | 荷電粒子装置とその集束レンズ | |
JPH0349177B2 (enrdf_load_stackoverflow) | ||
EP1051735A2 (en) | Charged particle energy analysers | |
US3217161A (en) | Electrode means to electrostatically focus ions separated by a mass spectrometer on a detector | |
JPH0812773B2 (ja) | 同時検出型質量分析装置 | |
JP2956706B2 (ja) | 質量分析装置 | |
SU957318A1 (ru) | Квадрупольный масс-спектрометр | |
KR20180115306A (ko) | 질량 분석기 또는 다른 대전 입자 디바이스에서 사용하기 위한 대전된 2차 입자용 추출 시스템 | |
JP3096375B2 (ja) | ハイブリッドタンデム質量分析装置 | |
SU1614050A1 (ru) | Квадрупольный масс-спектрометр | |
JP2949753B2 (ja) | 四重極質量分析計 | |
JPS5852299B2 (ja) | 質量分析装置 | |
JPS61237357A (ja) | 質量分析装置 | |
JP3153386B2 (ja) | 質量分析装置 | |
JPS6062055A (ja) | 質量分析装置 | |
JPS60189150A (ja) | 質量分析計のイオン源 |