JPH0470590B2 - - Google Patents

Info

Publication number
JPH0470590B2
JPH0470590B2 JP56088039A JP8803981A JPH0470590B2 JP H0470590 B2 JPH0470590 B2 JP H0470590B2 JP 56088039 A JP56088039 A JP 56088039A JP 8803981 A JP8803981 A JP 8803981A JP H0470590 B2 JPH0470590 B2 JP H0470590B2
Authority
JP
Japan
Prior art keywords
phase
voltage
current
built
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56088039A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57203967A (en
Inventor
Shizuo Nomura
Shigenori Kurimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shikoku Research Institute Inc
Original Assignee
Shikoku Research Institute Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shikoku Research Institute Inc filed Critical Shikoku Research Institute Inc
Priority to JP56088039A priority Critical patent/JPS57203967A/ja
Publication of JPS57203967A publication Critical patent/JPS57203967A/ja
Publication of JPH0470590B2 publication Critical patent/JPH0470590B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
    • G01R15/125—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will for digital multimeters

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
JP56088039A 1981-06-10 1981-06-10 Digital meter of voltage, current and phase defference Granted JPS57203967A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56088039A JPS57203967A (en) 1981-06-10 1981-06-10 Digital meter of voltage, current and phase defference

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56088039A JPS57203967A (en) 1981-06-10 1981-06-10 Digital meter of voltage, current and phase defference

Publications (2)

Publication Number Publication Date
JPS57203967A JPS57203967A (en) 1982-12-14
JPH0470590B2 true JPH0470590B2 (enExample) 1992-11-11

Family

ID=13931675

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56088039A Granted JPS57203967A (en) 1981-06-10 1981-06-10 Digital meter of voltage, current and phase defference

Country Status (1)

Country Link
JP (1) JPS57203967A (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100439647B1 (ko) * 2001-08-17 2004-07-12 한홍석 휴대용 앵글미터
JP2005287256A (ja) * 2004-03-30 2005-10-13 Tm T & D Kk ディジタル形保護制御装置とその表示データ作成方法、および表示データ作成プログラム
JP5678253B2 (ja) * 2010-03-31 2015-02-25 株式会社ダイヘン 配電線用開閉器の検査装置
JP2015225035A (ja) * 2014-05-29 2015-12-14 三菱電機エンジニアリング株式会社 可搬型メンテナンスツール
CN111830349B (zh) * 2020-07-21 2023-05-05 华立科技股份有限公司 电网事件检测方法、装置和电子设备

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55152476U (enExample) * 1979-04-19 1980-11-04
JPS5665479U (enExample) * 1979-10-24 1981-06-01

Also Published As

Publication number Publication date
JPS57203967A (en) 1982-12-14

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