JPH0464430B2 - - Google Patents
Info
- Publication number
- JPH0464430B2 JPH0464430B2 JP60065316A JP6531685A JPH0464430B2 JP H0464430 B2 JPH0464430 B2 JP H0464430B2 JP 60065316 A JP60065316 A JP 60065316A JP 6531685 A JP6531685 A JP 6531685A JP H0464430 B2 JPH0464430 B2 JP H0464430B2
- Authority
- JP
- Japan
- Prior art keywords
- pin
- holding member
- guide
- compression spring
- circuit board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000006835 compression Effects 0.000 claims description 20
- 238000007906 compression Methods 0.000 claims description 20
- 238000007689 inspection Methods 0.000 claims description 20
- 238000012360 testing method Methods 0.000 description 19
- 238000000605 extraction Methods 0.000 description 17
- 230000003139 buffering effect Effects 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 2
- 230000001105 regulatory effect Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 230000004913 activation Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60065316A JPS61223666A (ja) | 1985-03-29 | 1985-03-29 | 回路基板検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60065316A JPS61223666A (ja) | 1985-03-29 | 1985-03-29 | 回路基板検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61223666A JPS61223666A (ja) | 1986-10-04 |
| JPH0464430B2 true JPH0464430B2 (enEXAMPLES) | 1992-10-14 |
Family
ID=13283380
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60065316A Granted JPS61223666A (ja) | 1985-03-29 | 1985-03-29 | 回路基板検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61223666A (enEXAMPLES) |
-
1985
- 1985-03-29 JP JP60065316A patent/JPS61223666A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61223666A (ja) | 1986-10-04 |
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