JPH0463653U - - Google Patents

Info

Publication number
JPH0463653U
JPH0463653U JP10733390U JP10733390U JPH0463653U JP H0463653 U JPH0463653 U JP H0463653U JP 10733390 U JP10733390 U JP 10733390U JP 10733390 U JP10733390 U JP 10733390U JP H0463653 U JPH0463653 U JP H0463653U
Authority
JP
Japan
Prior art keywords
wiring
semiconductor device
spiral
showing
sectional
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10733390U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10733390U priority Critical patent/JPH0463653U/ja
Publication of JPH0463653U publication Critical patent/JPH0463653U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Semiconductor Integrated Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例の半導体装置を示す
上面図、第2図は第1図の−′線に沿つて切
断して見た断面図、第3図は第2の半導体装置に
電流を印加した状態を示す断面図、第4図は本考
案の他の実施例の上面図、第5図は第4図の−
′線の断面図、第6図は第5図の電流印加状態
を示す断面図、第7図は従来の半導体装置を示す
上面図、第8図は第7図の′線の断面
図、第9図は第8図の電流印加状態を示す断面図
である。 1……第一の配線、2……第二の配線、3……
強磁性体の第三の配線、4……コンタクト、5…
…フイールド領域、6……基板、7,8……層間
絶縁膜。
FIG. 1 is a top view showing a semiconductor device according to an embodiment of the present invention, FIG. 2 is a sectional view taken along the line -' in FIG. 1, and FIG. FIG. 4 is a top view of another embodiment of the present invention, and FIG. 5 is a cross-sectional view showing a state in which a current is applied.
6 is a sectional view showing the current application state in FIG. 5, FIG. 7 is a top view showing a conventional semiconductor device, and FIG. 8 is a sectional view taken along line 2-2 ' in FIG. 7. 9 are cross-sectional views showing the current application state of FIG. 8. 1...First wiring, 2...Second wiring, 3...
Third wiring of ferromagnetic material, 4... Contact, 5...
... Field region, 6 ... Substrate, 7, 8 ... Interlayer insulating film.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体基板上に、インダクタンス素子として、
うず巻状の第一の配線と、その端部を側方に取出
す第二の配線とを設け、前記第一の配線の上また
下に、前記第一の配線と前記第二の配線とは絶縁
された強磁性体層を設けたことを特徴とする半導
体装置。
As an inductance element on a semiconductor substrate,
A spiral-shaped first wiring and a second wiring whose end portion is taken out to the side are provided, and the first wiring and the second wiring are arranged above and below the first wiring. A semiconductor device comprising an insulated ferromagnetic layer.
JP10733390U 1990-10-12 1990-10-12 Pending JPH0463653U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10733390U JPH0463653U (en) 1990-10-12 1990-10-12

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10733390U JPH0463653U (en) 1990-10-12 1990-10-12

Publications (1)

Publication Number Publication Date
JPH0463653U true JPH0463653U (en) 1992-05-29

Family

ID=31853797

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10733390U Pending JPH0463653U (en) 1990-10-12 1990-10-12

Country Status (1)

Country Link
JP (1) JPH0463653U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7414506B2 (en) 2003-12-22 2008-08-19 Nec Electronics Corporation Semiconductor integrated circuit and fabrication method thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7414506B2 (en) 2003-12-22 2008-08-19 Nec Electronics Corporation Semiconductor integrated circuit and fabrication method thereof

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