JPH0457220B2 - - Google Patents

Info

Publication number
JPH0457220B2
JPH0457220B2 JP7900686A JP7900686A JPH0457220B2 JP H0457220 B2 JPH0457220 B2 JP H0457220B2 JP 7900686 A JP7900686 A JP 7900686A JP 7900686 A JP7900686 A JP 7900686A JP H0457220 B2 JPH0457220 B2 JP H0457220B2
Authority
JP
Japan
Prior art keywords
defect
defects
strip
displaying
label
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP7900686A
Other languages
English (en)
Japanese (ja)
Other versions
JPS62235551A (ja
Inventor
Shigeru Kamimura
Kazuhisa Taguchi
Masayoshi Ootsuka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Paper Mills Ltd
Original Assignee
Mitsubishi Paper Mills Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Paper Mills Ltd filed Critical Mitsubishi Paper Mills Ltd
Priority to JP7900686A priority Critical patent/JPS62235551A/ja
Publication of JPS62235551A publication Critical patent/JPS62235551A/ja
Publication of JPH0457220B2 publication Critical patent/JPH0457220B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/8921—Streaks

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Controlling Sheets Or Webs (AREA)
JP7900686A 1986-04-04 1986-04-04 帯状物の欠陥位置表示方法 Granted JPS62235551A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7900686A JPS62235551A (ja) 1986-04-04 1986-04-04 帯状物の欠陥位置表示方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7900686A JPS62235551A (ja) 1986-04-04 1986-04-04 帯状物の欠陥位置表示方法

Publications (2)

Publication Number Publication Date
JPS62235551A JPS62235551A (ja) 1987-10-15
JPH0457220B2 true JPH0457220B2 (en)van) 1992-09-10

Family

ID=13677863

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7900686A Granted JPS62235551A (ja) 1986-04-04 1986-04-04 帯状物の欠陥位置表示方法

Country Status (1)

Country Link
JP (1) JPS62235551A (en)van)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0266544U (en)van) * 1988-11-07 1990-05-18
JPH0682385A (ja) * 1992-09-01 1994-03-22 Mitsubishi Rayon Co Ltd 欠陥検査装置
JP2822830B2 (ja) * 1993-01-08 1998-11-11 ダックエンジニアリング株式会社 シート状印刷物の欠陥検出方法
JP4702953B2 (ja) * 2006-06-01 2011-06-15 大日本スクリーン製造株式会社 ムラ検査方法、ムラ検査装置およびプログラム
JP4702952B2 (ja) * 2006-06-01 2011-06-15 大日本スクリーン製造株式会社 ムラ検査方法、ムラ検査装置およびプログラム
JP5569791B2 (ja) * 2010-04-14 2014-08-13 住友化学株式会社 光学フィルム作製用原反フィルム、および光学フィルムの製造方法
CN105480772B (zh) * 2015-11-26 2017-08-25 凌云光技术集团有限责任公司 卷装标签检剔分离系统及离线剔除设备的停机方法
CN105599440B (zh) * 2015-12-16 2017-11-14 凌云光技术集团有限责任公司 凹印机检剔分离工艺中的剔废方法及装置

Also Published As

Publication number Publication date
JPS62235551A (ja) 1987-10-15

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