JPH0447423B2 - - Google Patents

Info

Publication number
JPH0447423B2
JPH0447423B2 JP63243574A JP24357488A JPH0447423B2 JP H0447423 B2 JPH0447423 B2 JP H0447423B2 JP 63243574 A JP63243574 A JP 63243574A JP 24357488 A JP24357488 A JP 24357488A JP H0447423 B2 JPH0447423 B2 JP H0447423B2
Authority
JP
Japan
Prior art keywords
sample
primary
ions
particles
ion beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP63243574A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0290049A (ja
Inventor
Shigeki Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP63243574A priority Critical patent/JPH0290049A/ja
Publication of JPH0290049A publication Critical patent/JPH0290049A/ja
Publication of JPH0447423B2 publication Critical patent/JPH0447423B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP63243574A 1988-09-28 1988-09-28 イオン散乱分光装置 Granted JPH0290049A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63243574A JPH0290049A (ja) 1988-09-28 1988-09-28 イオン散乱分光装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63243574A JPH0290049A (ja) 1988-09-28 1988-09-28 イオン散乱分光装置

Publications (2)

Publication Number Publication Date
JPH0290049A JPH0290049A (ja) 1990-03-29
JPH0447423B2 true JPH0447423B2 (enrdf_load_stackoverflow) 1992-08-03

Family

ID=17105856

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63243574A Granted JPH0290049A (ja) 1988-09-28 1988-09-28 イオン散乱分光装置

Country Status (1)

Country Link
JP (1) JPH0290049A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3271304B2 (ja) * 1992-06-30 2002-04-02 株式会社島津製作所 飛行時間形イオン散乱分光装置
JP5156468B2 (ja) * 2008-04-24 2013-03-06 大学共同利用機関法人自然科学研究機構 原子/分子ビームの3次元速度分布測定方法及び装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63102150A (ja) * 1986-10-17 1988-05-07 Rikagaku Kenkyusho イオン散乱分光顕微鏡

Also Published As

Publication number Publication date
JPH0290049A (ja) 1990-03-29

Similar Documents

Publication Publication Date Title
Carson et al. On-line chemical analysis of aerosols by rapid single-particle mass spectrometry
US5166521A (en) Ion-scattering spectrometer
EP1060380B1 (en) Atmospheric-particle analyser
US5026988A (en) Method and apparatus for time of flight medium energy particle scattering
JPH0447423B2 (enrdf_load_stackoverflow)
US5784424A (en) System for studying a sample of material using a heavy ion induced mass spectrometer source
US5182453A (en) Ion scattering spectrometer
JP2678059B2 (ja) 電子ビーム装置
JP5553308B2 (ja) 軽元素分析装置及び分析方法
JP4130904B2 (ja) 平行磁場型ラザフォード後方散乱分析装置
CN111727489B (zh) 动量分辨光电子能谱仪及用于动量分辨光电子能谱的方法
JPH05174783A (ja) 質量分析装置
JP3239427B2 (ja) イオン散乱分光装置
RU172272U1 (ru) Прибор для изучения параметров микрометеоритов и частиц космического мусора
JPH0637564Y2 (ja) 中性粒子散乱分析装置
JP2895860B2 (ja) 質量分析方法
JPH02165038A (ja) 飛行時間型粒子分析装置
JPH039259A (ja) 高繰り返しレーザ励起質量分折装置
JPH02145947A (ja) イオン散乱分光装置
JP2926666B2 (ja) 直衝突イオン散乱分光装置
Schilling et al. The Dubna double-arm time-of-flight spectrometer for heavy-ion reaction products
JPH0574410A (ja) イオン散乱分析装置
JPH0336029Y2 (enrdf_load_stackoverflow)
JP2003068245A (ja) 定量的なエネルギー補正機能を持つ飛行時間型質量分析器
JPH03285244A (ja) イオン散乱分析装置