JPH0441303B2 - - Google Patents

Info

Publication number
JPH0441303B2
JPH0441303B2 JP58235881A JP23588183A JPH0441303B2 JP H0441303 B2 JPH0441303 B2 JP H0441303B2 JP 58235881 A JP58235881 A JP 58235881A JP 23588183 A JP23588183 A JP 23588183A JP H0441303 B2 JPH0441303 B2 JP H0441303B2
Authority
JP
Japan
Prior art keywords
signal
metal surface
lift
flaw
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58235881A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60125560A (ja
Inventor
Masaharu Yokoyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kubota Corp
Original Assignee
Kubota Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kubota Corp filed Critical Kubota Corp
Priority to JP58235881A priority Critical patent/JPS60125560A/ja
Publication of JPS60125560A publication Critical patent/JPS60125560A/ja
Publication of JPH0441303B2 publication Critical patent/JPH0441303B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
    • G01N27/9053—Compensating for probe to workpiece spacing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
JP58235881A 1983-12-12 1983-12-12 金属面の検査方法 Granted JPS60125560A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58235881A JPS60125560A (ja) 1983-12-12 1983-12-12 金属面の検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58235881A JPS60125560A (ja) 1983-12-12 1983-12-12 金属面の検査方法

Publications (2)

Publication Number Publication Date
JPS60125560A JPS60125560A (ja) 1985-07-04
JPH0441303B2 true JPH0441303B2 (cs) 1992-07-07

Family

ID=16992621

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58235881A Granted JPS60125560A (ja) 1983-12-12 1983-12-12 金属面の検査方法

Country Status (1)

Country Link
JP (1) JPS60125560A (cs)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007052550A1 (ja) * 2005-10-31 2007-05-10 Sumitomo Metal Industries, Ltd. 管内面の渦流探傷におけるｓ／ｎ比測定方法
JP2012032180A (ja) * 2010-07-28 2012-02-16 Toshiba Corp 渦電流探傷装置、方法、及びプログラム

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0652255B2 (ja) * 1987-05-07 1994-07-06 日本鋼管株式会社 管内磁気探傷方法
JP4736753B2 (ja) * 2005-11-30 2011-07-27 株式会社日立製作所 渦電流探傷プローブと被検査体のリフトオフ量評価方法及びその評価装置並びに渦電流探傷方法及び渦電流探傷装置
JP7042865B2 (ja) * 2020-04-07 2022-03-28 電子磁気工業株式会社 渦電流探傷検査方法及び渦電流探傷検査装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007052550A1 (ja) * 2005-10-31 2007-05-10 Sumitomo Metal Industries, Ltd. 管内面の渦流探傷におけるｓ／ｎ比測定方法
JP2012032180A (ja) * 2010-07-28 2012-02-16 Toshiba Corp 渦電流探傷装置、方法、及びプログラム

Also Published As

Publication number Publication date
JPS60125560A (ja) 1985-07-04

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