JPH04359443A - Tape carrier for tab - Google Patents

Tape carrier for tab

Info

Publication number
JPH04359443A
JPH04359443A JP3161090A JP16109091A JPH04359443A JP H04359443 A JPH04359443 A JP H04359443A JP 3161090 A JP3161090 A JP 3161090A JP 16109091 A JP16109091 A JP 16109091A JP H04359443 A JPH04359443 A JP H04359443A
Authority
JP
Japan
Prior art keywords
tape carrier
tab
tape
film
lead wire
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3161090A
Other languages
Japanese (ja)
Other versions
JP2570519B2 (en
Inventor
Mamoru Onda
護 御田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Cable Ltd
Original Assignee
Hitachi Cable Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Cable Ltd filed Critical Hitachi Cable Ltd
Priority to JP3161090A priority Critical patent/JP2570519B2/en
Publication of JPH04359443A publication Critical patent/JPH04359443A/en
Application granted granted Critical
Publication of JP2570519B2 publication Critical patent/JP2570519B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/50Tape automated bonding [TAB] connectors, i.e. film carriers; Manufacturing methods related thereto

Landscapes

  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Wire Bonding (AREA)

Abstract

PURPOSE:To provide a tape carrier for TAB, which can prevent a disconnection caused by a short circuit or corrosion generated at an opening part in a film tape. CONSTITUTION:In a tape carrier 30 for TAB, both upper and rear faces of a lead 16 provided on the output side of a flexible window 22 in a film tape 13 are coated with a protective material 40, such as an epoxy resin or silicone liquid rubber resistant to an adhesive foreign particle. In addition to this way, a protective sheet 40, such as a polyethylene sheet which is resistant to an adhesive foreign particle, may be stuck thereon.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、TAB用テープキャリ
アに関し、特にフィルムテープの一部に曲げウィンドウ
等の開口部を有するTAB用テープキャリアに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a TAB tape carrier, and more particularly to a TAB tape carrier having an opening such as a bent window in a portion of the film tape.

【0002】0002

【従来の技術】近年、半導体素子の実装技術の自動化及
び高速化を図るため、長尺状のテープキャリアにワイヤ
レスボンディングによりICやLSI等の半導体素子を
組み込んでゆくTAB(Tape Automated
 Bonding )方式が採用されるようになった。 このようなTAB方式は、IC,LSI等の半導体素子
を搭載するテープキャリアの可撓性により、折り曲げ立
体的な実装ができるという特徴を有する。図4には、従
来のTAB用テープキャリア10の断面構成が示されて
いる。TAB用テープキャリア10は、ポリイミド等か
らなるフィルムテープ12と、その上に形成された入,
出力リード線14,16とから構成される。フィルムテ
ープ12には、LSI(図示せず)収納用のデバイスホ
ール18と、プリント基板(図示せず)と出力リード線
16とを半田付けするためのOLBホール( Oute
r−lead Bonding Hole )20と、
フィルムテープ12を曲げ易くするための曲げウィンド
ウ22がそれぞれ形成されている。
[Prior Art] In recent years, in order to automate and speed up the mounting technology of semiconductor devices, TAB (Tape Automated
Bonding) method has been adopted. Such a TAB method is characterized by the flexibility of the tape carrier on which semiconductor elements such as ICs and LSIs are mounted, allowing for three-dimensional mounting by folding. FIG. 4 shows a cross-sectional configuration of a conventional TAB tape carrier 10. As shown in FIG. The TAB tape carrier 10 consists of a film tape 12 made of polyimide or the like, and a film tape 12 formed on it.
It is composed of output lead wires 14 and 16. The film tape 12 has a device hole 18 for storing an LSI (not shown) and an OLB hole (Output) for soldering a printed circuit board (not shown) and an output lead wire 16.
r-lead Bonding Hole) 20,
A bending window 22 is formed in each case to make the film tape 12 easier to bend.

【0003】このようなTAB用テープキャリア10に
おいては、スクリーン印刷法によってテープキャリアの
表面に20〜30μmの厚さのソルダーレジスト(図示
せず)を形成し、これによってOLBホール20におけ
る半田付け作業時のフラックスによる汚染防止及び外部
の汚染物質による配線パターンの保護を図っている。こ
の際、デバイスホール18のリード線14,16部分と
曲げウィンドウ22部分にはソルダーレジストは塗布さ
れない。曲げウィンドウ22にレジストを塗布しないの
は、リード線16の隙間から曲げウィンドウ22内にソ
ルダーレジストインクが侵入し、プリント配線基板に付
着してしまうためである。
[0003] In such a TAB tape carrier 10, a solder resist (not shown) having a thickness of 20 to 30 μm is formed on the surface of the tape carrier by a screen printing method. This is intended to prevent contamination caused by flux and to protect the wiring pattern from external contaminants. At this time, no solder resist is applied to the lead wires 14 and 16 portions of the device hole 18 and the bending window 22 portion. The reason why resist is not applied to the bending window 22 is that the solder resist ink enters into the bending window 22 through the gap between the lead wires 16 and adheres to the printed wiring board.

【0004】0004

【発明が解決しようとする課題】上記のような従来のT
AB用テープキャリア10においては、曲げウィンドウ
22部分の導体(リード線16)が保護されないため、
この部分に金属微粒子異物等が付着してしまう。これに
より、隣接するリード線同士が接触し、短絡を起こす恐
れがある。特に、多ピン式のテープキャリアにおいては
、異物が30μm程度であっても短絡する危険性が高い
。また、出力リード線16は一般に幅30〜50μm,
間隔30〜100μm程度と非常に微細であるため、湿
分,イオン性汚染物質等の付着により、腐食し、延いて
は断線につながる恐れがあり、同時にマイグレーション
短絡の危険性もある。他方、曲げウィンドウ22部分の
リード線16に錫,半田メッキを施すことも考えられる
が、この場合室温保管によるメッキ完了後7日〜30日
程度でウイスカが発生して短絡することがあった。
[Problem to be solved by the invention] The conventional T as described above
In the AB tape carrier 10, the conductor (lead wire 16) in the bending window 22 portion is not protected.
Foreign matter such as fine metal particles will adhere to this part. This may cause adjacent lead wires to come into contact with each other and cause a short circuit. In particular, in multi-pin type tape carriers, there is a high risk of short-circuiting even if the foreign matter is about 30 μm. In addition, the output lead wire 16 generally has a width of 30 to 50 μm,
Since the spacing is very fine, about 30 to 100 μm, there is a risk of corrosion due to adhesion of moisture, ionic contaminants, etc., which may eventually lead to disconnection, and at the same time, there is a risk of migration short circuit. On the other hand, it is conceivable to plate the lead wires 16 in the bending window 22 portion with tin or solder, but in this case, whiskers may occur and short circuits may occur within about 7 to 30 days after plating is completed by storage at room temperature.

【0005】[0005]

【発明の目的】本発明はかかる点に鑑みてなされたもの
であり、フィルムテープの一部に形成された開口部上の
導体パターンの短絡及び腐食による断線を確実に防止で
きるTAB用テープキャリアを提供することを目的とす
る。
[Object of the Invention] The present invention has been made in view of the above points, and provides a tape carrier for TAB that can reliably prevent short circuits and disconnections due to corrosion of the conductor pattern on the opening formed in a part of the film tape. The purpose is to provide.

【0006】[0006]

【課題を解決するための手段】本発明は上記目的を達成
するために、フィルムテープの開口部上の導体パターン
の表面に、例えばエポキシ樹脂やシリコン液状ゴム等の
耐異物付着性に優れた保護材を塗布し、あるいはポリエ
チレン等の耐異物付着性に優れた保護膜を貼付している
[Means for Solving the Problems] In order to achieve the above object, the present invention provides a protective film with excellent foreign substance adhesion resistance, such as epoxy resin or silicone liquid rubber, on the surface of the conductor pattern on the opening of the film tape. A protective film such as polyethylene that is highly resistant to foreign matter adhesion is attached.

【0007】[0007]

【作用】上記のように本発明に係るTAB用テープキャ
リアにおいては、塗布又は貼付によって、開口部上の露
出した導体パターンの表面に、耐異物付着性に優れた保
護膜が形成され、他に悪影響を及ぼすことなく、露出し
た導体パターンを異物から良好に保護できる。すなわち
、スクリーン印刷法によって導体パターン表面にソルダ
ーレジストを形成する場合のように、開口部内にソルダ
ーレジストインクが侵入し、プリント配線基板に付着す
るようなことがない。
[Function] As described above, in the TAB tape carrier according to the present invention, a protective film with excellent foreign matter adhesion resistance is formed on the surface of the exposed conductor pattern on the opening by coating or pasting. Exposed conductor patterns can be well protected from foreign objects without any negative effects. That is, unlike the case where a solder resist is formed on the surface of a conductor pattern by screen printing, the solder resist ink does not enter into the opening and adhere to the printed wiring board.

【0008】[0008]

【実施例】以下、本発明の一実施例を添付図面を参照し
つつ詳細に説明する。図1には実施例に係る液晶テレビ
に用いられるTAB用テープキャリア30の表面状態、
図2には図1のY−Y方向の断面の構造がそれぞれ示さ
れている。TAB用テープキャリア30は、ポリイミド
等からなるフィルムテープ12と、入力側のリード線1
4と、液晶基板32(図3)のTFT基板,STN基板
の微細配線と接続される出力側リード線16と、入,出
力側リード線14,16の先端部でLSI34(図3)
と接続されるインナーリード部36とから構成されてい
る。なお、フィルムテープ12の厚さは75μm,銅箔
(リード線14,16)の厚さは35μm,フィルムテ
ープ12とリード線14,16のエポキシ系接着材(図
示せず)の厚さは20μm,実際のインナーリード36
の数は100,TAB用テープキャリア30の幅は35
mmである。
DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described in detail below with reference to the accompanying drawings. FIG. 1 shows the surface state of a TAB tape carrier 30 used in a liquid crystal television according to an embodiment,
FIG. 2 shows the cross-sectional structure of FIG. 1 in the Y-Y direction. The TAB tape carrier 30 includes a film tape 12 made of polyimide or the like and a lead wire 1 on the input side.
4, the output side lead wire 16 connected to the fine wiring of the TFT substrate and STN substrate of the liquid crystal substrate 32 (FIG. 3), and the LSI 34 (FIG. 3) at the tips of the input and output side lead wires 14 and 16.
and an inner lead portion 36 connected to the inner lead portion 36. The thickness of the film tape 12 is 75 μm, the thickness of the copper foil (lead wires 14, 16) is 35 μm, and the thickness of the epoxy adhesive (not shown) between the film tape 12 and the lead wires 14, 16 is 20 μm. , Actual inner lead 36
The number is 100, and the width of the TAB tape carrier 30 is 35.
It is mm.

【0009】フィルムテープ12には、LSI34収納
用のデバイスホール18と、液晶基板32に出力リード
線16を半田付けするためのOLBホール( Oute
r−lead Bonding Hole )20と、
フィルムテープ12を曲げ易くするための曲げウィンド
ウ22(開口幅1.5mm,長さ20mm)がそれぞれ
形成されている。また、上記のような構成のTAB用テ
ープキャリア30においては、従来と同様にOLBホー
ル20における半田付け作業時のフラックスによる汚染
防止及び外部の汚染物質による配線パターンの保護のた
めに、デバイスホール18のリード線14,16部分と
曲げウィンドウ22部分を除いて、20〜30μmの厚
さのソルダーレジスト38がスクリーン印刷法によって
形成されている。
The film tape 12 has a device hole 18 for storing the LSI 34 and an OLB hole (Output) for soldering the output lead wire 16 to the liquid crystal board 32.
r-lead Bonding Hole) 20,
A bending window 22 (opening width 1.5 mm, length 20 mm) for making the film tape 12 easier to bend is formed in each case. In addition, in the TAB tape carrier 30 configured as described above, in order to prevent contamination by flux during soldering work in the OLB hole 20 and to protect the wiring pattern from external contaminants, the device hole 18 is A solder resist 38 having a thickness of 20 to 30 μm is formed by screen printing except for the lead wires 14 and 16 and the bending window 22.

【0010】曲げウィンドウ22の上部の出力側リード
線16の表裏両面には、保護膜40が形成されている。 保護膜40としては、(1) 未硬化エポキシ系塗料,
(2)室温硬化型シリコン液状ゴム(RTV),(3)
熱融着性ポリエチレン等が用いられる。未硬化エポキシ
塗料を用いる場合には、溶剤によって希釈された未硬化
エポキシ系塗料を、細いノズルを用いてリード線16の
両面に霧状に吹き付けて、約5μm厚の保護膜40を形
成する。なお、この場合の保護膜40の厚さは、5μm
に限定されないが、折り曲げ時のクラックの発生を防止
するために、1〜5μm程度が好ましい。一方、室温硬
化型シリコン液状ゴムの場合は、クラックが発生し難い
ため、膜厚を5〜20μm程度とする。また、熱融着性
ポリエチレンを用いる場合には、厚さ10μm程度のフ
ィルム状の熱融着性ポリエチレンを150℃でリード線
16の表面に貼付する。
A protective film 40 is formed on both the front and back surfaces of the output side lead wire 16 above the bending window 22. The protective film 40 includes (1) uncured epoxy paint;
(2) Room temperature curing silicone liquid rubber (RTV), (3)
Heat-fusible polyethylene or the like is used. When using an uncured epoxy paint, the uncured epoxy paint diluted with a solvent is sprayed onto both sides of the lead wire 16 using a fine nozzle to form a protective film 40 with a thickness of approximately 5 μm. Note that the thickness of the protective film 40 in this case is 5 μm.
Although not limited to, the thickness is preferably about 1 to 5 μm in order to prevent cracks from occurring during bending. On the other hand, in the case of room-temperature curing silicone liquid rubber, the film thickness is set to about 5 to 20 μm because cracks are less likely to occur. Further, when heat-fusible polyethylene is used, a film-like heat-fusible polyethylene having a thickness of about 10 μm is attached to the surface of the lead wire 16 at 150°C.

【0011】図3には、上記のように構成されたTAB
用テープキャリア30を液晶テレビ50に実装した様子
が示されている。TAB用テープキャリア30は、デバ
イスホール18にLSI34がセットされた状態で端部
を折り曲げられ、液晶基板32表面に実装される。この
ように、TAB用テープキャリア30を屈曲状態で実装
することにより、液晶テレビ50の小型化が図られる。 液晶基板32には透明導電膜による配線が施され、TA
B用テープキャリア30の出力側リード線16と異方性
導電膜等によって接続されている。なお、図中、符号5
2はバックライト光源である。
FIG. 3 shows a TAB configured as described above.
The tape carrier 30 is shown mounted on a liquid crystal television 50. The TAB tape carrier 30 is bent at the end with the LSI 34 set in the device hole 18 and mounted on the surface of the liquid crystal substrate 32. In this way, by mounting the TAB tape carrier 30 in a bent state, the liquid crystal television 50 can be made smaller. The liquid crystal substrate 32 is provided with wiring using a transparent conductive film, and the TA
It is connected to the output side lead wire 16 of the B tape carrier 30 by an anisotropic conductive film or the like. In addition, in the figure, the code 5
2 is a backlight light source.

【0012】次に、以上のように構成されたTAB用テ
ープキャリア30の性能試験について、表1を参照して
説明する。この試験は、曲げウィンドウ22の上部の出
力側リード線16における、錫メッキ後30日目のウィ
スカの発生による短絡と、高温高湿(65℃,湿度95
%)状態での1000時間後の腐食断線と、高温高湿(
65℃,湿度95%)状態でリード線16に28Vの直
流バイアス電圧を500時間印加した後のマイグレーシ
ョン短絡の発生率を調べたものである。試料となるTA
B用テープキャリアは、リード線16に保護膜を形成し
た本実施例による3タイプと、従来品としてリード線1
6に保護膜を形成しないタイプを各々50個づつ用い、
50個のTAB用テープキャリアのうちの幾つが上記短
絡,断線を生じるかを試験した。実施例の3タイプの試
料は、(1) 未硬化エポキシ系塗料,(2)室温硬化
型シリコン液状ゴム(RTV),(3)熱融着性ポリエ
チレンを保護膜としてそれぞれ用いたものである。表か
ら明らかなように、本実施例に係るTAB用テープキャ
リアが、従来品に比べて短絡,断線の発生率が低いこと
が判る。
Next, a performance test of the TAB tape carrier 30 constructed as above will be explained with reference to Table 1. This test was conducted to detect a short circuit due to whisker formation on the output side lead wire 16 at the top of the bending window 22 on the 30th day after tin plating, and a high temperature and high humidity (65°C, humidity 95°C).
Corrosion breakage after 1000 hours under conditions of
The rate of occurrence of migration short circuits was investigated after applying a DC bias voltage of 28 V to the lead wire 16 for 500 hours at a temperature of 65° C. and a humidity of 95%. TA to be sampled
There are three types of tape carriers for B, including three types according to this embodiment in which a protective film is formed on the lead wire 16, and a conventional product in which a protective film is formed on the lead wire 1.
Using 50 pieces of each type that does not form a protective film in 6,
A test was conducted to determine how many of the 50 TAB tape carriers would cause the above-mentioned short circuit or disconnection. The three types of samples used in Examples are those in which (1) uncured epoxy paint, (2) room temperature curing silicone liquid rubber (RTV), and (3) heat-fusible polyethylene were used as protective films. As is clear from the table, the TAB tape carrier according to this example has a lower incidence of short circuits and disconnections than conventional products.

【0013】[0013]

【表1】[Table 1]

【0014】[0014]

【発明の効果】以上説明したように、本発明に係るTA
B用テープキャリアおいては、フィルムテープに形成さ
れた開口部上の導体パターンの表面に、耐異物付着性に
優れた保護材を塗布、あるいは貼付しているため、プリ
ント配線基板を汚す等の他への悪影響を生じることなく
、開口部上の導体パターンの短絡及び腐食による断線を
確実に防止できるという効果がある。
[Effects of the Invention] As explained above, the TA according to the present invention
In the B tape carrier, a protective material with excellent foreign matter adhesion resistance is coated or pasted on the surface of the conductor pattern on the opening formed in the film tape, so there is no possibility of contaminating the printed wiring board. This has the effect of reliably preventing short-circuiting and disconnection of the conductor pattern over the opening due to corrosion, without adversely affecting others.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】図1は、本発明の実施例の構成を示す平面図で
ある。
FIG. 1 is a plan view showing the configuration of an embodiment of the present invention.

【図2】図2は、図1のY−Y方向の断面図である。FIG. 2 is a sectional view taken along the Y-Y direction in FIG. 1;

【図3】図3は、本発明の使用状態を示す断面図である
FIG. 3 is a sectional view showing the state of use of the present invention.

【図4】図4は、従来技術の構成を示す断面図である。FIG. 4 is a cross-sectional view showing the configuration of the prior art.

【符号の説明】[Explanation of symbols]

12      フィルムテープ          
          32      液晶基板 14      入力側リード線          
          34      LSI 16      出力側リード線          
          36      インナーリード 18      デバイスホール          
          38      ソルダーレジス
ト 20      OLBホール           
           40      保護膜 22      曲げウィンドウ          
          50      液晶テレビ 30      TAB用テープキャリア      
      52      バックライト光源
12 Film tape
32 Liquid crystal board 14 Input side lead wire
34 LSI 16 Output side lead wire
36 Inner lead 18 Device hole
38 Solder resist 20 OLB hole
40 Protective film 22 Bending window
50 LCD TV 30 TAB tape carrier
52 Backlight light source

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】  導体パターンが形成されたフィルムテ
ープの一部に、所定の開口部を有するTAB用テープキ
ャリアにおいて、前記開口部上の前記導体パターンの表
面に耐異物付着性に優れた保護膜を塗布あるいは貼付し
て形成したことを特徴とするTAB用テープキャリア。
1. A TAB tape carrier having a predetermined opening in a part of the film tape on which a conductive pattern is formed, a protective film having excellent foreign matter adhesion resistance on the surface of the conductive pattern above the opening. A tape carrier for TAB, characterized in that it is formed by coating or pasting.
JP3161090A 1991-06-05 1991-06-05 TAB tape carrier Expired - Fee Related JP2570519B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3161090A JP2570519B2 (en) 1991-06-05 1991-06-05 TAB tape carrier

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3161090A JP2570519B2 (en) 1991-06-05 1991-06-05 TAB tape carrier

Publications (2)

Publication Number Publication Date
JPH04359443A true JPH04359443A (en) 1992-12-11
JP2570519B2 JP2570519B2 (en) 1997-01-08

Family

ID=15728422

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3161090A Expired - Fee Related JP2570519B2 (en) 1991-06-05 1991-06-05 TAB tape carrier

Country Status (1)

Country Link
JP (1) JP2570519B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05267397A (en) * 1992-01-22 1993-10-15 Sumitomo Metal Mining Co Ltd Tape carrier with protective coating and manufacture thereof

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5816555A (en) * 1981-07-22 1983-01-31 Nec Corp Lead frame
JPS60216573A (en) * 1984-04-12 1985-10-30 Seiko Epson Corp Manufacture of flexible printed circuit board
JPS616832A (en) * 1984-06-20 1986-01-13 Matsushita Electric Ind Co Ltd Material to be loaded
JPH01251079A (en) * 1988-03-31 1989-10-06 Toshiba Corp Semiconductor device
JPH02132418A (en) * 1988-07-11 1990-05-21 Toshiba Corp Production of flexible wiring board having bent part

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5816555A (en) * 1981-07-22 1983-01-31 Nec Corp Lead frame
JPS60216573A (en) * 1984-04-12 1985-10-30 Seiko Epson Corp Manufacture of flexible printed circuit board
JPS616832A (en) * 1984-06-20 1986-01-13 Matsushita Electric Ind Co Ltd Material to be loaded
JPH01251079A (en) * 1988-03-31 1989-10-06 Toshiba Corp Semiconductor device
JPH02132418A (en) * 1988-07-11 1990-05-21 Toshiba Corp Production of flexible wiring board having bent part

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JPH05267397A (en) * 1992-01-22 1993-10-15 Sumitomo Metal Mining Co Ltd Tape carrier with protective coating and manufacture thereof

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