JPH043370U - - Google Patents
Info
- Publication number
- JPH043370U JPH043370U JP4229690U JP4229690U JPH043370U JP H043370 U JPH043370 U JP H043370U JP 4229690 U JP4229690 U JP 4229690U JP 4229690 U JP4229690 U JP 4229690U JP H043370 U JPH043370 U JP H043370U
- Authority
- JP
- Japan
- Prior art keywords
- under test
- insulating substrate
- position corresponding
- terminal
- output terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4229690U JP2517456Y2 (ja) | 1990-04-20 | 1990-04-20 | アナログｉｃテスタの校正用治具 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4229690U JP2517456Y2 (ja) | 1990-04-20 | 1990-04-20 | アナログｉｃテスタの校正用治具 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH043370U true JPH043370U (OSRAM) | 1992-01-13 |
| JP2517456Y2 JP2517456Y2 (ja) | 1996-11-20 |
Family
ID=31553718
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4229690U Expired - Fee Related JP2517456Y2 (ja) | 1990-04-20 | 1990-04-20 | アナログｉｃテスタの校正用治具 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2517456Y2 (OSRAM) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7389190B2 (en) * | 2003-09-09 | 2008-06-17 | Advantest Corporation | Testing apparatus for testing a device under test and comparator circuit and calibration apparatus for the testing apparatus |
-
1990
- 1990-04-20 JP JP4229690U patent/JP2517456Y2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2517456Y2 (ja) | 1996-11-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |