JPH04313714A - Inclination correcting device for sample table - Google Patents

Inclination correcting device for sample table

Info

Publication number
JPH04313714A
JPH04313714A JP3064643A JP6464391A JPH04313714A JP H04313714 A JPH04313714 A JP H04313714A JP 3064643 A JP3064643 A JP 3064643A JP 6464391 A JP6464391 A JP 6464391A JP H04313714 A JPH04313714 A JP H04313714A
Authority
JP
Japan
Prior art keywords
sample
sample table
inclination
image
tilt
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3064643A
Other languages
Japanese (ja)
Inventor
Masahiko Sakamoto
雅彦 阪本
Keiji Nakajima
中嶋 恵治
Nobuyuki Kosaka
小坂 宜之
Yoko Miyazaki
陽子 宮崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP3064643A priority Critical patent/JPH04313714A/en
Publication of JPH04313714A publication Critical patent/JPH04313714A/en
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

PURPOSE:To exactly set the inclination of a sample table against an optical system with simple constitution, in the inclination correcting device for the sample table used for a measuring instrument provided with a confocal optical system such as a laser microscope. CONSTITUTION:The relation of a working distance and brightness of an image is stored in an image memory 5 in advance. Based on the position of a sample point in the surface image of an obtained sample 3 and brightness information, the inclination of the present sample table 9 is calculated, and the inclination of the sample table 9 is controlled by a table driving device 8. In such a manner, the inclination of the sample table can be corrected exactly with the simple constitution which does not use an external sensor.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】この発明は、試料テ−ブルの傾斜
補正装置に関し、例えば微細なパターンや表面形状プロ
ファイルを計測する装置などにおいて用いられるものに
関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for correcting the inclination of a sample table, and relates to an apparatus used, for example, in an apparatus for measuring minute patterns or surface profile profiles.

【0002】0002

【従来の技術】レーザ顕微鏡などのように、共焦点光学
系とその光軸に対し傾斜をかけることのできる試料テー
ブルで構成される計測装置において、試料傾斜角を精度
良く設定するためには、従来、光式や静電式の外部セン
サが必要であった。
BACKGROUND OF THE INVENTION In a measuring device such as a laser microscope, which consists of a confocal optical system and a sample table that can tilt its optical axis, in order to accurately set the sample tilt angle, it is necessary to Conventionally, external optical or electrostatic sensors were required.

【0003】これに対して、顕微鏡像そのものの情報を
利用して試料テーブルの傾斜補正を行なう技術として、
特開昭61−223551号公報に開示されているもの
があった。図4は超音波顕微鏡の構成を示すブロック図
であり、図において、3は試料、21は音波レンズ、2
2は超音波が変換された高周波信号の受信器、23は試
料傾斜制御器、23a、23bは試料傾斜制御器23を
構成する画像メモリ、演算処理部であり、24は試料テ
ーブル25をXY方向に走査するための試料テーブル駆
動部、26a、26bは試料3を傾斜させるための圧電
素子である。
On the other hand, as a technique for correcting the inclination of the sample table using information from the microscope image itself,
There was one disclosed in Japanese Unexamined Patent Publication No. 61-223551. FIG. 4 is a block diagram showing the configuration of an ultrasonic microscope. In the figure, 3 is a sample, 21 is a sonic lens, and 2
2 is a receiver for a high frequency signal obtained by converting an ultrasonic wave, 23 is a sample tilt controller, 23a and 23b are an image memory and an arithmetic processing unit that constitute the sample tilt controller 23, and 24 is a receiver for moving the sample table 25 in the X and Y directions. The sample table drive units 26a and 26b for scanning the sample 3 are piezoelectric elements for tilting the sample 3.

【0004】次に動作について説明する。音波レンズ2
1から受信器22を介して得られたビデオ信号は画像メ
モリ23aに取り込まれる。ビデオ信号の変化量は試料
3の傾斜度合によって増減し、演算処理部23bは試料
3の2次元走査方向、即ちXあるいはY方向において基
準となる位置のビデオ信号変化量や最大輝度点の演算を
行なう。この演算結果に基いて、試料3の傾斜が最小と
なるように圧電素子26a、26bを操作する。
Next, the operation will be explained. sonic lens 2
A video signal obtained from the receiver 22 from the receiver 22 is taken into the image memory 23a. The amount of change in the video signal increases or decreases depending on the degree of inclination of the sample 3, and the calculation processing unit 23b calculates the amount of change in the video signal and the maximum brightness point at a reference position in the two-dimensional scanning direction of the sample 3, that is, in the X or Y direction. Let's do it. Based on this calculation result, the piezoelectric elements 26a and 26b are operated so that the inclination of the sample 3 is minimized.

【0005】[0005]

【発明が解決しようとする課題】従来の試料テ−ブルの
傾斜補正装置は以上のように構成されており、内、外部
センサを用いるものは、センサからの出力値を試料テー
ブルの実際の傾斜角に合致するように校正しなくてはな
らず、装置構成が複雑になるという問題点があった。ま
た、特開昭61−223551号公報に開示されている
ものは、外部センサは不要であるが、画像を得るために
試料テーブル25を動かさなくてはならず処理が遅く、
また、試料3の傾斜を小さくすることはできても任意の
傾斜角に設定することはできないという問題点があった
[Problems to be Solved by the Invention] Conventional sample table tilt correction devices are constructed as described above, and those that use an external sensor use the output value from the sensor to calculate the actual tilt of the sample table. There was a problem in that the device configuration had to be calibrated to match the corners, making the device configuration complicated. Furthermore, the method disclosed in Japanese Patent Application Laid-Open No. 61-223551 does not require an external sensor, but requires moving the sample table 25 to obtain an image, which slows down the process.
Further, there was a problem in that although the inclination of the sample 3 could be made small, it was not possible to set it to an arbitrary inclination angle.

【0006】この発明は、以上のような問題点を解消す
るためになされたもので、簡単な構成で試料テーブルの
傾斜補正を行なうことができる試料テ−ブルの傾斜補正
装置を得ることを目的としている。
The present invention has been made to solve the above-mentioned problems, and an object of the present invention is to provide a sample table tilt correction device that can correct the sample table tilt with a simple configuration. It is said that

【0007】[0007]

【課題を解決するための手段】この発明に係わる試料テ
−ブルの傾斜補正装置は、試料テーブル上の試料を観察
する共焦点光学系、ワークディスタンスと像の明るさの
関係を格納する記憶手段、試料の表面画像のサンプル点
の位置と明るさ情報を基に試料テーブルの傾斜角を計算
する演算手段、及び試料テーブルの傾きを制御する試料
テーブル駆動手段を備え、得られた試料の表面画像のサ
ンプル点の位置と明るさ情報を基に、現在の試料テーブ
ルの傾斜角を計算してその傾きを制御するように構成し
たことを特徴とするものである。
[Means for Solving the Problems] A sample table tilt correction device according to the present invention includes a confocal optical system for observing a sample on a sample table, and a storage means for storing the relationship between work distance and image brightness. , a calculation means for calculating the inclination angle of the sample table based on the position and brightness information of the sample point in the surface image of the sample, and a sample table driving means for controlling the inclination of the sample table, and the obtained surface image of the sample is provided. The present invention is characterized in that the present tilt angle of the sample table is calculated based on the position and brightness information of the sample point, and the tilt is controlled.

【0008】[0008]

【作用】この発明による試料テ−ブルの傾斜補正装置で
は、ワークディスタンスと像の明るさは密接な関係を有
し、サンプル点の位置と明るさ情報を基にすれば、試料
テーブルの傾斜角を正確に計算することができる。
[Operation] In the sample table inclination correction device according to the present invention, there is a close relationship between the work distance and the image brightness, and based on the position and brightness information of the sample point, the inclination angle of the sample table can be determined. can be calculated accurately.

【0009】[0009]

【実施例】【Example】

実施例1.以下、この発明の一実施例を図について説明
する。図1はこの発明の一実施例による試料テ−ブルの
傾斜補正装置を用いた計測装置の構成を示すブロック図
である。図において、1は共焦点光学系を備えたレーザ
顕微鏡、2は微小に絞られ試料上を走査し反射光により
試料像を得るためのレーザビーム、3は試料、4はレー
ザ顕微鏡1より得られた試料像であるビデオ信号をデジ
タル信号に変換するためのA/D変換器、5は画像メモ
リ、6は試料の傾斜等を算出する演算処理装置、7は試
料テーブル9を制御するテーブルコントローラ、8は試
料テーブル9を駆動するテーブル駆動装置である。
Example 1. An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a block diagram showing the configuration of a measuring device using a sample table tilt correction device according to an embodiment of the present invention. In the figure, 1 is a laser microscope equipped with a confocal optical system, 2 is a finely focused laser beam that scans over the sample and obtains a sample image using reflected light, 3 is a sample, and 4 is a laser beam obtained from laser microscope 1. 5 is an image memory; 6 is an arithmetic processing unit that calculates the inclination of the sample; 7 is a table controller that controls the sample table 9; Reference numeral 8 denotes a table driving device for driving the sample table 9.

【0010】図2はワークディスタンスdとその時の像
の明るさf(d)の関係を示すグラフであり、試料3の
材料が同じであれば一定の関係となる。dfは合焦位置
である。予め、各材料毎にこの関係を演算処理装置6に
格納しておく。試料3を傾斜させて観察する際には以下
の手順で行なう。まず、試料3上で表面形状が光学系の
焦点深度以内となるエリアをレーザ顕微鏡1の視野に位
置させる。そこで、ビデオ信号をA/D変換器4を介し
て画像メモリ5に取り込む。図3は、取り込んだ入力画
像10を示しており、演算処理装置6は11、12、1
3のサンプル点1、サンプル点2、サンプル点3を抽出
する。3点を抽出するのは、図2に示したように、像の
明るさはワークディスタンスdに対して単調に変化せず
極値をもつからである。3点の明るさf(d1)、f(
d2)、f(d3)と距離L1、L2から、間に合焦位
置dfを含まない2点を選択する。例えば、その2点が
サンプル点1、サンプル点2であるとすれば、現在の試
料の傾きθは以下の数式より求められる。
FIG. 2 is a graph showing the relationship between the work distance d and the image brightness f(d) at that time, and if the material of the sample 3 is the same, the relationship will be constant. df is the focus position. This relationship is stored in advance in the arithmetic processing unit 6 for each material. When observing the sample 3 while tilting it, the following procedure is used. First, an area on the sample 3 whose surface shape is within the depth of focus of the optical system is positioned in the field of view of the laser microscope 1. Therefore, the video signal is taken into the image memory 5 via the A/D converter 4. FIG. 3 shows the captured input image 10, in which the arithmetic processing unit 6 has 11, 12, 1
Sample point 1, sample point 2, and sample point 3 of 3 are extracted. The reason why three points are extracted is that, as shown in FIG. 2, the brightness of the image does not change monotonically with respect to the work distance d, but has an extreme value. The brightness of the three points f(d1), f(
d2), f(d3) and distances L1 and L2, two points that do not include the focal position df are selected. For example, if the two points are sample point 1 and sample point 2, then the current slope θ of the sample can be found from the following formula.

【0011】[0011]

【数1】[Math 1]

【0012】設定したい傾斜角と現在の試料の傾きθを
テーブルコントローラ7に転送すると、テーブルコント
ローラ7はテーブル駆動装置8に指令して、試料テーブ
ル9を適正な角度に補正する。L1、L2は補正精度が
良くなるように、入力画像10内で十分大きくする必要
がある。このようにワークディスタンスと像の明るさの
関係を予め格納しておき、得られた試料表面画像内のサ
ンプル点の位置と明るさ情報を基に、現在の試料テーブ
ルの傾斜角を計算してフィードバックをかけるようにし
たので、外部センサを用る必要なく、簡単な構成で試料
テーブルの傾斜補正を行なうことができるとともにコス
トも安くできる試料テ−ブルの傾斜補正装置を得ること
できる効果がある。また、信頼性を上げるために、各サ
ンプル点の値は1点だけでなく、付近の点の平均より求
めても良い。
When the desired inclination angle and the current sample inclination θ are transferred to the table controller 7, the table controller 7 instructs the table driving device 8 to correct the sample table 9 to an appropriate angle. L1 and L2 need to be sufficiently large within the input image 10 to improve the correction accuracy. In this way, the relationship between work distance and image brightness is stored in advance, and the current tilt angle of the sample table is calculated based on the position and brightness information of the sample point in the obtained sample surface image. Since feedback is applied, it is possible to correct the inclination of the sample table with a simple configuration without using an external sensor, and it is possible to obtain a device for correcting the inclination of the sample table at a low cost. . Furthermore, in order to increase reliability, the value of each sample point may be determined not only from one point but also from the average of nearby points.

【0013】実施例2. 上記実施例1では、各材料毎にワークディスタンスdと
その時の像の明るさf(d)の関係を格納しておくとし
たが、材料の反射率を基に係数をかけるようにしてもよ
い。
Example 2. In Example 1 above, the relationship between the work distance d and the image brightness f(d) at that time is stored for each material, but it may also be multiplied by a coefficient based on the reflectance of the material. .

【0014】実施例3. 上記実施例1では、観察する試料3上で表面形状が光学
系の焦点深度以内となるエリア選ぶとしたが、観察する
試料3以外に傾斜補正専用の試料を試料テーブル9上に
設置してもよい。
Example 3. In the first embodiment described above, an area on the sample 3 to be observed whose surface shape is within the depth of focus of the optical system is selected. good.

【0015】実施例4. 上記実施例1ではサンプル点を3点抽出し、そこから間
に合焦位置dfを含まない2点を選択するものとしたが
、予めフォーカス合わせを行ない、合焦位置をサンプル
点1とし、他に1点だけサンプル点2を抽出して傾きを
求めるようにしてもよい。
Example 4. In the first embodiment described above, three sample points are extracted, and two points that do not include the focus position df are selected between them. Alternatively, only one sample point 2 may be extracted to determine the slope.

【0016】[0016]

【発明の効果】以上のように、この発明によれば、試料
テーブル上の試料を観察する共焦点光学系、ワークディ
スタンスと像の明るさの関係を格納する記憶手段、試料
の表面画像のサンプル点の位置と明るさ情報を基に試料
テーブルの傾斜角を計算する演算手段、及び試料テーブ
ルの傾きを制御する試料テーブル駆動手段を備え、得ら
れた試料の表面画像のサンプル点の位置と明るさ情報を
基に、現在の試料テーブルの傾斜角を計算してその傾き
を制御するように構成したので、外部センサを用いない
簡単な構成で試料テーブルの傾斜補正を行なうことがで
きる試料テ−ブルの傾斜補正装置を得ることできる効果
がある。
As described above, according to the present invention, there is provided a confocal optical system for observing a sample on a sample table, a storage means for storing the relationship between work distance and image brightness, and a sample surface image of the sample. Equipped with a calculation means for calculating the tilt angle of the sample table based on the position and brightness information of the point, and a sample table driving means for controlling the tilt of the sample table, the position and brightness of the sample point in the obtained surface image of the sample is provided. Since the current tilt angle of the sample table is calculated based on the tilt information and the tilt is controlled, the sample table tilt can be corrected with a simple configuration without using an external sensor. This has the effect of providing a bull tilt correction device.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】この発明の一実施例による試料テーブルの傾斜
補正装置の構成を示すブロック図である。
FIG. 1 is a block diagram showing the configuration of a tilt correction device for a sample table according to an embodiment of the present invention.

【図2】この発明の一実施例に係るワークディスタンス
と像の明るさの関係を示すグラフである。
FIG. 2 is a graph showing the relationship between work distance and image brightness according to an embodiment of the present invention.

【図3】この発明の一実施例に係る取り込んだ入力画像
を示す説明図である。
FIG. 3 is an explanatory diagram showing a captured input image according to an embodiment of the present invention.

【図4】従来の試料テーブルの傾斜補正装置の構成を示
すブロック図である。
FIG. 4 is a block diagram showing the configuration of a conventional sample table tilt correction device.

【符号の説明】[Explanation of symbols]

1  レーザ顕微鏡 2  レーザビーム 3  試料 4  A/D変換器 5  画像メモリ 6  演算処理装置 7  テーブルコントローラ 8  テーブル駆動装置 9  試料テーブル 10  入力画像 11  サンプル点1 12  サンプル点2 13  サンプル点3 1 Laser microscope 2 Laser beam 3 Sample 4 A/D converter 5 Image memory 6 Arithmetic processing unit 7 Table controller 8 Table drive device 9 Sample table 10 Input image 11 Sample point 1 12 Sample point 2 13 Sample point 3

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】  試料テーブル上の試料を観察する共焦
点光学系、ワークディスタンスと像の明るさの関係を格
納する記憶手段、上記試料の表面画像のサンプル点の位
置と明るさ情報を基に上記試料テーブルの傾斜角を計算
する演算手段、及び上記試料テーブルの傾きを制御する
試料テーブル駆動手段を備え、得られた試料の表面画像
のサンプル点の位置と明るさ情報を基に、現在の試料テ
ーブルの傾斜角を計算してその傾きを制御するように構
成したことを特徴とする試料テ−ブルの傾斜補正装置。
Claims: 1. A confocal optical system for observing a sample on a sample table, a storage means for storing the relationship between the work distance and image brightness, and a storage means for storing the relationship between the work distance and image brightness, based on the position and brightness information of the sample point on the surface image of the sample. It is equipped with a calculation means for calculating the inclination angle of the sample table, and a sample table driving means for controlling the inclination of the sample table. A tilt correction device for a sample table, characterized in that the tilt angle of the sample table is calculated and the tilt is controlled.
JP3064643A 1991-03-28 1991-03-28 Inclination correcting device for sample table Pending JPH04313714A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3064643A JPH04313714A (en) 1991-03-28 1991-03-28 Inclination correcting device for sample table

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3064643A JPH04313714A (en) 1991-03-28 1991-03-28 Inclination correcting device for sample table

Publications (1)

Publication Number Publication Date
JPH04313714A true JPH04313714A (en) 1992-11-05

Family

ID=13264151

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3064643A Pending JPH04313714A (en) 1991-03-28 1991-03-28 Inclination correcting device for sample table

Country Status (1)

Country Link
JP (1) JPH04313714A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10634489B2 (en) 2017-09-14 2020-04-28 Yokogawa Electric Corporation Displacement sensor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10634489B2 (en) 2017-09-14 2020-04-28 Yokogawa Electric Corporation Displacement sensor

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