JPH0423335Y2 - - Google Patents

Info

Publication number
JPH0423335Y2
JPH0423335Y2 JP11618085U JP11618085U JPH0423335Y2 JP H0423335 Y2 JPH0423335 Y2 JP H0423335Y2 JP 11618085 U JP11618085 U JP 11618085U JP 11618085 U JP11618085 U JP 11618085U JP H0423335 Y2 JPH0423335 Y2 JP H0423335Y2
Authority
JP
Japan
Prior art keywords
rail
optical semiconductor
leads
receiving element
guide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP11618085U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6226055U (enExample
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11618085U priority Critical patent/JPH0423335Y2/ja
Publication of JPS6226055U publication Critical patent/JPS6226055U/ja
Application granted granted Critical
Publication of JPH0423335Y2 publication Critical patent/JPH0423335Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP11618085U 1985-07-29 1985-07-29 Expired JPH0423335Y2 (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11618085U JPH0423335Y2 (enExample) 1985-07-29 1985-07-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11618085U JPH0423335Y2 (enExample) 1985-07-29 1985-07-29

Publications (2)

Publication Number Publication Date
JPS6226055U JPS6226055U (enExample) 1987-02-17
JPH0423335Y2 true JPH0423335Y2 (enExample) 1992-05-29

Family

ID=31000528

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11618085U Expired JPH0423335Y2 (enExample) 1985-07-29 1985-07-29

Country Status (1)

Country Link
JP (1) JPH0423335Y2 (enExample)

Also Published As

Publication number Publication date
JPS6226055U (enExample) 1987-02-17

Similar Documents

Publication Publication Date Title
JPH0423335Y2 (enExample)
KR102129849B1 (ko) 프로브 카드 지지장치
JPWO2016067503A1 (ja) 生産処理装置、生産処理方法、プログラム及びワークの製造方法
JP3732635B2 (ja) プリント配線板検査装置
CN210253164U (zh) 一种电路板插针检测装置
CN221960350U (zh) 一种盖玻片机构
CN219967738U (zh) 一种传感器定位治具
JPS6240434Y2 (enExample)
JPS5923423Y2 (ja) リ−ドの曲がつたicの検出排除装置
JPH08261736A (ja) 半導体挿入抜取装置
CN220871631U (zh) 一种钢轨轨底边缘厚度检查样板
JPH08128816A (ja) リード検査方法
JP2002107306A (ja) チップコンデンサ外観・電気特性検査方法および装置
CN207135392U (zh) 一种自主防尘的电路板
JPH08306830A (ja) 特性選別装置のicパッケージ位置決め方法及びその構造
JPH06147848A (ja) 外観検査装置
KR100266782B1 (ko) 전해콘덴서 검사장치
JPS58143241A (ja) 半導体装置の検査装置
JPH06224270A (ja) 半導体検査装置及びウェハ
JP3656791B2 (ja) 平積された板状材料の分離装置
JPS6139557A (ja) 半導体デバイスのリ−ドピンの曲り検出装置
JPH06160063A (ja) 表面検査方法
KR0164582B1 (ko) 아이시 칩의 리드체킹방법 및 장치
CN120870626A (zh) 测试头
JPH05190629A (ja) 半導体装置のリード曲がり検査装置