JPH0423325A - Method and apparatus for drying of semiconductor substrate - Google Patents

Method and apparatus for drying of semiconductor substrate

Info

Publication number
JPH0423325A
JPH0423325A JP12392990A JP12392990A JPH0423325A JP H0423325 A JPH0423325 A JP H0423325A JP 12392990 A JP12392990 A JP 12392990A JP 12392990 A JP12392990 A JP 12392990A JP H0423325 A JPH0423325 A JP H0423325A
Authority
JP
Japan
Prior art keywords
semiconductor substrate
cup
cleaning liquid
centrifugal force
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12392990A
Other languages
Japanese (ja)
Inventor
Tsuyoshi Tanaka
強 田中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP12392990A priority Critical patent/JPH0423325A/en
Publication of JPH0423325A publication Critical patent/JPH0423325A/en
Pending legal-status Critical Current

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  • Cleaning Or Drying Semiconductors (AREA)

Abstract

PURPOSE:To dry a semiconductor substrate efficiently by a method wherein the semiconductor substrate is turned at high speed inside a cup, a cleaning liquid is scattered from the substrate by applying a centrifugal force and the cleaning liquid floating in a mist shape inside the cup is discharged at the height of the semiconductor substrate inside the cup. CONSTITUTION:A semiconductor substrate 1, as an object to be dried, which has been supported by a spinner chuck 2 is first turned at high speed by using a motor 3; and a cleaning liquid on the substrate 1 is scattered and spin-dried by applying a centrifugal force. At this time, the cleaning liquid such as pure water or the like which has been scattered by the centrifugal force flows into a drain 7 and is removed. Since one part of the liquid floats in a mist shape inside a cup 4, it is discharged to the outside of the cup 4 by using an evacuation mechanism 10 through an evacuation duct 10a installed on a side face 9 of the cup 4. The evacuation speed of the mistlike cleaning liquid is set at 1.0m/sec or higher on the surface of the semiconductor substrate 1 as the object to be cleaned. Thereby, the mistlike cleaning liquid does not adhere to the surface of the semiconductor substrate 1 whose cleaning operation has been finished, and the surface of the semiconductor substrate 1 can be set to a state of extremely high quality.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は半導体基板乾燥方法及びその装置に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a method and apparatus for drying a semiconductor substrate.

[従来の技術] 従来、半導体素子を製造する過程においては、複数回の
洗浄工程を繰り返し行われる。当然のことながら、洗浄
工程の数たけ乾燥工程も存在する。
[Prior Art] Conventionally, in the process of manufacturing semiconductor devices, cleaning steps are repeated multiple times. Naturally, there are several drying steps as well as washing steps.

現在、半導体基板の洗浄後の乾燥方法は、有機溶剤のペ
ーパーでの化学的な方法によるものと、遠心効果を利用
する物理的な方法などが利用されている。
Currently, methods for drying semiconductor substrates after cleaning include a chemical method using organic solvent paper and a physical method using a centrifugal effect.

特に、遠心効果を利用する乾燥方法であるスピン乾燥方
法は、有機溶剤のペーパーでの化学的方法と違い、薬液
を利用しない点及び安全性等の面で幅広く採用されてい
る。
In particular, the spin drying method, which is a drying method that uses centrifugal effect, has been widely adopted because it does not use chemicals and is safe, unlike chemical methods using paper using organic solvents.

第3図に従来のスピン乾燥装置の断面図を示す。FIG. 3 shows a sectional view of a conventional spin drying device.

図に示すように、従来の装置は、スピンナーチャック2
と、モータ3と、カップ4とを備えている。スピンナー
チャック2は半導体基板1を保持してカップ4内でモー
タ3により高速回転される。
As shown in the figure, the conventional device has a spinner chuck 2
, a motor 3, and a cup 4. The spinner chuck 2 holds the semiconductor substrate 1 and is rotated at high speed by the motor 3 within the cup 4 .

カップ4はその上部開口が蓋5により開閉可能に閉塞さ
れる。また、カップ4は、床部6のドレイン7より純水
等の洗浄液が除去され、排気ダクト8より排気される。
The upper opening of the cup 4 is closed by a lid 5 so as to be openable and closable. Further, cleaning liquid such as pure water is removed from the cup 4 through a drain 7 on the floor 6, and the cup 4 is exhausted through an exhaust duct 8.

半導体基板1はスピンナーチャック2の回転に伴って遠
心力が作用し、その遠心力によって付着純水等が飛散し
て乾燥される。
A centrifugal force acts on the semiconductor substrate 1 as the spinner chuck 2 rotates, and the centrifugal force scatters adhering pure water and the like and dries the semiconductor substrate 1 .

[発明が解決しようとする課題] しかしながら、半導体基板1が高速回転で乾燥する際に
、遠心力で飛び散った洗浄液が、ミスト状になってカッ
プ4内を浮遊する。カップ4の床部6に設けである排気
ダクト8により、ミスト状の洗浄液を吸い出し除去して
いるが、被乾燥体である半導体基板lの上方を浮遊して
いるミスト状の洗浄液の除去には効果がうすく、スピン
乾燥が終了すると、ミスト状の洗浄液は、乾燥済の半導
体基板1上に局部的に再付着し、シミとして残ってしま
う。このため、半導体基板1は欠陥を発生してしまうと
いう欠点がある。
[Problems to be Solved by the Invention] However, when the semiconductor substrate 1 is dried by high-speed rotation, the cleaning liquid scattered by centrifugal force becomes mist and floats in the cup 4. The mist-like cleaning liquid is sucked out and removed by the exhaust duct 8 provided on the floor 6 of the cup 4, but the mist-like cleaning liquid floating above the semiconductor substrate l, which is the object to be dried, cannot be removed. The effect is weak, and when the spin drying is completed, the mist-like cleaning liquid locally re-adheres to the dried semiconductor substrate 1 and remains as a stain. For this reason, the semiconductor substrate 1 has the drawback of generating defects.

本発明の目的は前記課題を解決した半導体基板乾燥方法
及び装置を提供することにある。
An object of the present invention is to provide a method and apparatus for drying a semiconductor substrate that solves the above problems.

[課題を解決するための手段] 前記目的を達成するため、本発明に係る半導体基板乾燥
方法においては、遠心力作用工程と、排気工程とを有す
る半導体基板乾燥方法であって、遠心力作用工程は、半
導体基板をカップ内で高速回転して該基板に遠心力を作
用させ、該基板から洗浄液を飛散させるものであり、 排気工程は、半導体基板から飛散してカップ内にミスト
状で浮遊する洗浄液を、カップ内での半導体基板の高さ
位置で排気するものである。
[Means for Solving the Problems] In order to achieve the above object, a semiconductor substrate drying method according to the present invention includes a centrifugal force application step and an exhaust step, the semiconductor substrate drying method comprising a centrifugal force application step and an exhaust step. In this method, a semiconductor substrate is rotated at high speed in a cup to apply centrifugal force to the substrate, and the cleaning liquid is scattered from the substrate. In the exhaust process, the cleaning liquid is scattered from the semiconductor substrate and suspended in the cup in the form of a mist. The cleaning liquid is exhausted within the cup at the level of the semiconductor substrate.

また、本発明に係る半導体基板乾燥装置においては、カ
ップと、スピンナーチャックと、排気機構とを有する半
導体基板乾燥装置であって、カップは、スピンナーチャ
ックを回転可能に収容するものであり、 スピンナーチャックは、半導体基板を保持し、該基板を
高速回転して遠心力を作用させるものであり、 排気機構は、排気ダクトをカップ内での半導体基板の高
さ位置に開口し、該排気ダクトを通して、カップ内にミ
スト状で浮遊する洗浄液を排気するものである。
Further, in the semiconductor substrate drying apparatus according to the present invention, the semiconductor substrate drying apparatus includes a cup, a spinner chuck, and an exhaust mechanism, the cup rotatably housing the spinner chuck, and the spinner chuck. The device holds a semiconductor substrate and rotates the substrate at high speed to apply centrifugal force.The exhaust mechanism opens an exhaust duct at the height of the semiconductor substrate in the cup, and passes the exhaust duct through the exhaust duct. This is to exhaust the cleaning liquid floating in mist inside the cup.

[実施例] 以下、本発明の実施例を図により説明する。[Example] Embodiments of the present invention will be described below with reference to the drawings.

(実施例1) 第1図は本発明の実施例1を示す断面図である。(Example 1) FIG. 1 is a sectional view showing a first embodiment of the present invention.

図において、本発明に係る半導体基板乾燥装置は、カッ
プ4と、スピンナーチャック2と、排気機構10とを有
する。
In the figure, the semiconductor substrate drying apparatus according to the present invention includes a cup 4, a spinner chuck 2, and an exhaust mechanism 10.

カップ4は、スピンナーチャック2を回転可能に収容す
るものである。
The cup 4 rotatably accommodates the spinner chuck 2.

スピンナーチャック2は、半導体基板1を保持し、かつ
モータ3により高速回転されて該基板1に遠心力を作用
させるものである。
The spinner chuck 2 holds the semiconductor substrate 1 and is rotated at high speed by the motor 3 to apply centrifugal force to the substrate 1.

また、カップ4はその上部開口が蓋5により閉塞される
ものであり、また床部6にはドレイン7が設けられてい
る。
Further, the upper opening of the cup 4 is closed by a lid 5, and a drain 7 is provided on the floor 6.

排気機構10は、カップ4内を排気するものであり、そ
の排気ダクトloaを、カップ4内での半導体基板1の
高さ位置でカップ4の側面9に開口したものである。
The exhaust mechanism 10 is for evacuating the inside of the cup 4, and has an exhaust duct loa opened in the side surface 9 of the cup 4 at the height of the semiconductor substrate 1 within the cup 4.

本発明に係る半導体基板乾燥方法では、まずスピンナー
チャック2に保持された被乾燥体である半導体基板lを
モータ3により高速回転させて基板1に遠心力を作用さ
せ、基板1上の洗浄液を飛散させてスピン乾燥させる。
In the semiconductor substrate drying method according to the present invention, first, a semiconductor substrate l, which is an object to be dried held in a spinner chuck 2, is rotated at high speed by a motor 3 to apply centrifugal force to the substrate 1, and the cleaning liquid on the substrate 1 is scattered. and spin dry.

このとき、遠心力で飛び散った純水等の洗浄液はドレイ
ン7に流れ込み除去され、一部はミスト状になってカッ
プ4内を浮遊するが、カップ4の側面9に設けられてい
る排気ダクトlOaを通して排気機構10によりカップ
4外に排気する。そのため、乾燥終了した半導体基板1
の表面にミスト状洗浄液が付着することがなく、半導体
基板1の表面は極めて高品質な状態となる。また、ミス
ト状洗浄液の排気速度は、被乾燥体である半導体基板1
の表面で1.Om/sec以上でなければ効果がない。
At this time, the cleaning liquid such as pure water splashed by the centrifugal force flows into the drain 7 and is removed, and some of it becomes a mist and floats inside the cup 4. The air is exhausted to the outside of the cup 4 by the exhaust mechanism 10 through the air. Therefore, after drying the semiconductor substrate 1
The mist-like cleaning liquid does not adhere to the surface of the semiconductor substrate 1, and the surface of the semiconductor substrate 1 is in an extremely high quality state. In addition, the exhaust speed of the mist cleaning liquid is
On the surface of 1. There is no effect unless it is Om/sec or more.

(実施例2) 第2図は本発明の実施例2を示す断面図である第1図に
示す実施例Iにおいて、排気ダクト10aはカップ4の
側面9に開口しており、半導体基板1を高速回転させた
際に、その純水等の洗浄液を排気ダクト10aに吸い込
んでしまう量が増加するため、排気ダクト10a自身が
劣化することがある。そこで、実施例2では、排気ダク
ト10aの途中に純水等の洗浄液を分離するフィルタ1
1を設けて、純水等の洗浄液をドレイン12に分離除去
して排気ダクト10aの劣化を防いでいる。
(Embodiment 2) FIG. 2 is a sectional view showing Embodiment 2 of the present invention. In Embodiment I shown in FIG. When rotating at high speed, the amount of cleaning liquid such as pure water sucked into the exhaust duct 10a increases, which may cause the exhaust duct 10a itself to deteriorate. Therefore, in the second embodiment, a filter 1 for separating cleaning liquid such as pure water is placed in the middle of the exhaust duct 10a.
1 is provided to separate and remove cleaning liquid such as pure water to the drain 12 to prevent deterioration of the exhaust duct 10a.

[発明の効果] 以上説明したように本発明によれば、カップ内でミスト
状になり浮遊している洗浄液を効率的に除去することが
でき、浮遊するミスト状の洗浄液が乾燥済の半導体基板
の表面に付着することを阻止し、極めて高品質の半導体
基板を提供することができる。その結果、パターン寸法
精度が高い半導体を製造することができるものである。
[Effects of the Invention] As explained above, according to the present invention, it is possible to efficiently remove the cleaning liquid floating in the form of mist in the cup, and the floating mist-like cleaning liquid can be removed from the dried semiconductor substrate. This makes it possible to provide extremely high quality semiconductor substrates. As a result, a semiconductor with high pattern dimensional accuracy can be manufactured.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の実施例1を示す断面図、第2図は本発
明の実施例2を示す断面図、第3図は従来例を示す断面
図である。 l・・・半導体基板    2・・・スピンナーチャッ
ク3・・・モータ      4・・・カップ5・・・
蓋        6・・・床部7・・・ドレイン  
   loa・・・排気ダクトlO・・・排気機構  
   11・・・フィルタ12・・・ドレイン
FIG. 1 is a sectional view showing a first embodiment of the present invention, FIG. 2 is a sectional view showing a second embodiment of the present invention, and FIG. 3 is a sectional view showing a conventional example. l...Semiconductor substrate 2...Spinner chuck 3...Motor 4...Cup 5...
Lid 6... Floor part 7... Drain
loa...Exhaust duct lO...Exhaust mechanism
11...Filter 12...Drain

Claims (2)

【特許請求の範囲】[Claims] (1)遠心力作用工程と、排気工程とを有する半導体基
板乾燥方法であって、 遠心力作用工程は、半導体基板をカップ内で高速回転し
て該基板に遠心力を作用させ、該基板から洗浄液を飛散
させるものであり、 排気工程は、半導体基板から飛散してカップ内にミスト
状で浮遊する洗浄液を、カップ内での半導体基板の高さ
位置で排気するものであることを特徴とする半導体基板
乾燥方法。
(1) A semiconductor substrate drying method comprising a centrifugal force applying step and an evacuation step, in which the centrifugal force applying step rotates the semiconductor substrate at high speed in a cup to apply centrifugal force to the substrate to remove the semiconductor substrate from the substrate. The cleaning liquid is scattered, and the exhaust step is characterized in that the cleaning liquid scattered from the semiconductor substrate and floating in the cup in the form of a mist is exhausted at a position in the cup at the height of the semiconductor substrate. Semiconductor substrate drying method.
(2)カップと、スピンナーチャックと、排気機構とを
有する半導体基板乾燥装置であって、 カップは、スピンナーチャックを回転可能に収容するも
のであり、 スピンナーチャックは、半導体基板を保持し、該基板を
高速回転して遠心力を作用させるものであり、 排気機構は、排気ダクトをカップ内での半導体基板の高
さ位置に開口し、該排気ダクトを通して、カップ内にミ
スト状で浮遊する洗浄液を排気するものであることを特
徴とする半導体基板乾燥装置。
(2) A semiconductor substrate drying apparatus having a cup, a spinner chuck, and an exhaust mechanism, wherein the cup rotatably accommodates the spinner chuck, and the spinner chuck holds a semiconductor substrate and removes the substrate. The exhaust mechanism opens an exhaust duct at the height of the semiconductor substrate in the cup, and passes through the exhaust duct the cleaning liquid suspended in the form of a mist inside the cup. A semiconductor substrate drying apparatus characterized in that it is an apparatus for exhausting air.
JP12392990A 1990-05-14 1990-05-14 Method and apparatus for drying of semiconductor substrate Pending JPH0423325A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12392990A JPH0423325A (en) 1990-05-14 1990-05-14 Method and apparatus for drying of semiconductor substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12392990A JPH0423325A (en) 1990-05-14 1990-05-14 Method and apparatus for drying of semiconductor substrate

Publications (1)

Publication Number Publication Date
JPH0423325A true JPH0423325A (en) 1992-01-27

Family

ID=14872841

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12392990A Pending JPH0423325A (en) 1990-05-14 1990-05-14 Method and apparatus for drying of semiconductor substrate

Country Status (1)

Country Link
JP (1) JPH0423325A (en)

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