JPH04220179A - Inspecting method for clad band - Google Patents

Inspecting method for clad band

Info

Publication number
JPH04220179A
JPH04220179A JP40403190A JP40403190A JPH04220179A JP H04220179 A JPH04220179 A JP H04220179A JP 40403190 A JP40403190 A JP 40403190A JP 40403190 A JP40403190 A JP 40403190A JP H04220179 A JPH04220179 A JP H04220179A
Authority
JP
Japan
Prior art keywords
clad
band
stripe
laser beam
detected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP40403190A
Other languages
Japanese (ja)
Inventor
Hideki Mori
英樹 森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Proterial Ltd
Original Assignee
Hitachi Metals Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Metals Ltd filed Critical Hitachi Metals Ltd
Priority to JP40403190A priority Critical patent/JPH04220179A/en
Publication of JPH04220179A publication Critical patent/JPH04220179A/en
Pending legal-status Critical Current

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  • Pressure Welding/Diffusion-Bonding (AREA)

Abstract

PURPOSE:To continuously inspect a clad state of clad material while being manufactured by a variation of the reflected beam quantity of a laser beam with which an edge of stripe material is irradiated. CONSTITUTION:In the inspection of the clad band used for lead frame material, etc., of a semiconductor integrated circuit, the edge of the stripe material 2 with good electric conductivity is irradiated with the laser beam 5 while passing through the clad band 3 formed by cladding band-shaped base metal 1 and the stripe material 2. The reflected beam is then detected by a photodetector 6. The clad state of the clad band 3 is detected by the variation of a detection symbol for this reflected light quantity. An unclad part 8 of clad band steel thus can be continuously detected in a manufacturing process and the clad band with high reliability can be supplied.

Description

【発明の詳細な説明】[Detailed description of the invention]

【0001】0001

【産業上の利用分野】本発明は、ICパッケージ等の電
子部品に使用されるクラッド帯の未圧着部の検査方法に
関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for inspecting unpressed portions of cladding bands used in electronic components such as IC packages.

【0002】0002

【従来の技術】半導体もしくは半導体集積回路のリード
フレーム等の素材は、機械的強度を分担する金属と導電
性を受け持つ金属とを2種以上組合せ、帯状にクラッド
した複合材料が用いられる。例を挙げると、図2に示す
ようなものがある。図2は、強度の高い、また耐腐食性
の合金、例えばFe−Ni合金や、熱膨張係数がガラス
に近いFe−Ni−Co合金等のFe合金またはCu合
金等の帯状母材1の表面にこれらとは異種のAl等の良
電導性ストライプ材2を加圧圧着したものである。
BACKGROUND OF THE INVENTION Materials used for lead frames of semiconductors or semiconductor integrated circuits are composite materials in which two or more metals, one for mechanical strength and the other for electrical conductivity, are combined and clad in a band shape. An example is shown in FIG. FIG. 2 shows the surface of a strip-shaped base material 1 made of a high-strength and corrosion-resistant alloy, such as an Fe alloy such as an Fe-Ni alloy or a Fe-Ni-Co alloy whose coefficient of thermal expansion is close to that of glass, or a Cu alloy. A stripe material 2 having good conductivity, such as Al, which is different from these, is bonded under pressure.

【0003】このようなクラッド帯を製造する方法とし
ては、例えば図4の如く特開昭62−296978号公
報に記載されるように帯状母材1を巻き納めた母材リー
ル19から繰り出し、同様に良電導性ストライプ材2を
リール20から繰り出して帯状母材1に重ね合わせ、共
に2〜4段のロール等の圧延ロール17を通すことによ
って、冷間にて加圧圧着し、さらに圧延を行ない、所定
の厚さ寸法に仕上げ、クラッド帯3を得て巻き取るとい
う方法がある。帯状母材1は、その加圧圧着する前にそ
の表面をワイヤーブラシ16等で研磨して清浄化するの
が一般的であり、これを圧延ロール17により加圧圧着
し、さらに圧延を行ない、所望の板厚にし、クラッド帯
3が得られる。
As a method for producing such a clad band, for example, as shown in FIG. 4, as described in Japanese Patent Application Laid-open No. 62-296978, a band-shaped base material 1 is unwound from a base material reel 19, and a similar process is performed. A striped material 2 with good conductivity is fed out from a reel 20 and overlaid on the strip-shaped base material 1, and both are passed through rolling rolls 17 such as 2 to 4 stages of rolls to be cold-pressed and then further rolled. There is a method in which the clad band 3 is obtained by finishing it to a predetermined thickness and winding it. The surface of the strip-shaped base material 1 is generally cleaned by polishing it with a wire brush 16 or the like before being pressure-bonded, and then it is pressure-bonded with a rolling roll 17, and further rolled. The desired plate thickness is obtained, and the cladding band 3 is obtained.

【0004】0004

【発明が解決しようとする課題】前述の圧延ロールを用
いる方法で、クラッド帯を製造すると、時としてクラッ
ドされた良電導性ストライプ材のエッヂ部分に部分的に
圧着不良が生じる場合がある。この圧着不良は、主とし
て、材料を加圧圧着する工程でロールと材料間の潤滑性
が悪いために、良電導性ストライプ材が圧延ロールに接
着して圧着後ロールの回転方向に引っ張られ一部剥離し
たものと考えられる。
When a cladding band is manufactured by the method using the above-mentioned rolling rolls, poor crimping may sometimes occur at the edge portions of the clad striped material with good conductivity. This poor crimping is mainly caused by poor lubricity between the roll and the material during the process of pressurizing and crimping the materials, which causes the striped material with good conductivity to adhere to the rolling roll and be pulled in the rotational direction of the roll after crimping. It is thought that it has peeled off.

【0005】半導体装置や半導体集積回路のリードフレ
ーム等に使用されるクラッド帯は図3(a)に示す如く
、リードピンの形状に打ち抜かれた後、図3(b)に示
すように、リードピン14とICチップ15を電気的に
接続するアルミ線(ボンディングワイヤ11)がリード
ピン14の前記良電導性ストライプ材2が圧着された先
端の良電導性部分13にボンディングされる。その後、
セラミックベース12とセラミックキャップ10とを低
融点ガラス19により封止されICとなる。
[0005] The cladding band used for lead frames of semiconductor devices and semiconductor integrated circuits is punched into the shape of a lead pin as shown in FIG. 3(a), and then the lead pin 14 is punched out as shown in FIG. An aluminum wire (bonding wire 11) that electrically connects the IC chip 15 to the lead pin 14 is bonded to the good conductive portion 13 at the tip of the lead pin 14 to which the good conductive stripe material 2 is crimped. after that,
The ceramic base 12 and the ceramic cap 10 are sealed with a low melting point glass 19 to form an IC.

【0006】ボンディング工程で、クラッド帯に上述し
たような圧着不良による部分的な未圧着部があると、ボ
ンディング不良となりICの機能に支障をきたすことに
なる。ICの高信頼性を確保する上から、欠陥のない素
材を提供することが強く求められている。このため、前
記未圧着部は、検査時に検出し、切断除去されなければ
ならない。
[0006] In the bonding process, if there is a partially unpressed portion in the cladding band due to the above-mentioned crimping failure, the bonding will be defective and the function of the IC will be impaired. In order to ensure the high reliability of ICs, it is strongly required to provide materials that are free of defects. Therefore, the uncrimped portion must be detected and removed during inspection.

【0007】しかし、加圧圧着工程の後にさらに圧延を
行なうために、未圧着部の外観は、正常圧着部と何ら変
わりのないように見える。このために加圧圧着工程で、
未圧着部を検出する必要があるが、未圧着部の大きさは
、平均10〜30mmと非常に小さく、目視での検出は
不可能であった。
However, since rolling is further performed after the pressure crimping process, the appearance of the uncrimped part looks no different from the normal crimped part. For this purpose, in the pressure bonding process,
Although it is necessary to detect the unpressed portion, the size of the unpressed portion is very small, 10 to 30 mm on average, and it was impossible to detect it visually.

【0008】このようなことから、従来は検査時に粘着
テープをクラッド帯のストライプ材圧着面に貼り付け、
そして粘着テープを引き剥がすことにより、未圧着部を
剥離隆起させ、目視により検査を行なっていた。この方
法では、効率上の問題から全長に渡って検査を行なうこ
とが不可能であり、加圧圧着工程での連続的な検査を行
なうことが待ち望まれていた。本発明では、加圧圧着工
程での連続的な検査を行なうクラッド帯の検査方法を提
供することを目的とする。
[0008] For this reason, conventionally, during inspection, adhesive tape was pasted on the stripe material pressure bonding surface of the cladding band.
Then, by peeling off the adhesive tape, the unpressed portion was peeled off and raised, and visually inspected. With this method, it is impossible to inspect the entire length due to efficiency issues, and it has been desired to carry out continuous inspection during the pressure bonding process. An object of the present invention is to provide a method for inspecting a cladding band that performs continuous inspection in a pressure bonding process.

【0009】[0009]

【課題を解決するための手段】本発明は、帯状母材とス
トライプ材とを圧着したクラッド帯を通板しながら、前
記ストライプ材のエッヂにレーザー光を照射し、その反
射光を光学センサにより検出し、反射光量に対する検出
信号の変化量によって、クラッド帯の圧着状態を検査す
ることを特徴とするクラッド帯の検査方法である。
[Means for Solving the Problems] The present invention irradiates the edge of the stripe material with a laser beam while passing a clad strip formed by crimping a stripe material onto a stripe base material, and uses an optical sensor to detect the reflected light. This is a method for inspecting a cladding band, which is characterized in that the crimped state of the cladding band is inspected based on the amount of change in the detection signal with respect to the amount of reflected light.

【0010】0010

【作用】本発明の最大の特徴は、レーザー光を前記スト
ライプ材のエッヂに照射し、その反射光を光学センサに
より検出し、ストライプ材の未圧着部を検出することで
ある。この検出方法は、ストライプ材が母材に十分に圧
着していれば、ストライプ材のエッヂ付近の表面は平滑
で、未圧着であれば、同表面が粗く、前記表面の反射率
が異なることを利用したものであり、圧着部であれば、
センサの検出信号の変化量は少なく、未圧着部では、セ
ンサの検出信号の変化量は大きくなる。この検出信号の
変化量の違いによりクラッド帯のストライプ材の圧着状
態を検査することができる。
[Operation] The most important feature of the present invention is that the edge of the stripe material is irradiated with a laser beam, and the reflected light is detected by an optical sensor to detect the unpressed portion of the stripe material. This detection method shows that if the stripe material is sufficiently crimped to the base material, the surface near the edge of the stripe material is smooth, and if it is not crimped, the surface is rough and the reflectance of the surface is different. If it is a crimped part,
The amount of change in the detection signal of the sensor is small, and the amount of change in the detection signal of the sensor is large in the uncrimped portion. The crimped state of the stripe material of the cladding band can be inspected based on the difference in the amount of change in the detection signal.

【0011】[0011]

【実施例】次に図1に従い、本発明の一実施例を板厚 
0.2mm、幅 40mmの42%Ni−Fe帯状母材
に厚さ 10μm、幅 10mmの良電導性ストライプ
材2であるAl箔を加圧圧着した場合を例にとり説明す
る。加圧圧着後のクラッド帯3の上方50mmにセンサ
本体7を配し、投光素子4よりAl箔2のエッヂに、レ
ーザー光5を照射させ、その反射光を、受光素子6で受
光する。
[Example] Next, according to FIG. 1, an example of the present invention will be
An explanation will be given by taking as an example a case where an Al foil, which is a good conductive stripe material 2 and having a thickness of 10 μm and a width of 10 mm, is pressure-bonded to a 42% Ni--Fe strip base material having a thickness of 0.2 mm and a width of 40 mm. A sensor main body 7 is disposed 50 mm above the cladding band 3 after pressure bonding, a laser beam 5 is irradiated from the light projecting element 4 to the edge of the Al foil 2, and the reflected light is received by the light receiving element 6.

【0012】このとき、レーザー光5が、正常部(圧着
部)に照射されていれば、センサの出力18は、図5(
a)のようになり、未圧着部8に照射されれば、センサ
の出力18は、図5(b)のようになる。このように、
正常部と未圧着部では、センサの出力が異なる。この異
なる出力により、良電導性ストライプ材2の未圧着部の
検出が可能となる。
At this time, if the laser beam 5 is irradiated to the normal part (crimped part), the output 18 of the sensor will be as shown in FIG.
If the uncrimped portion 8 is irradiated as shown in a), the sensor output 18 will be as shown in FIG. 5(b). in this way,
The sensor output is different between the normal part and the uncrimped part. These different outputs make it possible to detect the unpressed portion of the striped material 2 with good conductivity.

【0013】また、帯状母材1と、良電導性ストライプ
材2との反射率の違いにより、レーザー光が、帯状母材
1に照射されている場合と、良電導性ストライプ材2に
照射されている場合では、センサの出力が異なる。この
ことを利用し、出力18を見ながら、レーザー光5を、
良電導性ストライプ材2のエッヂに照射することができ
る。また、同出力の違いを利用することにより、良電導
性ストライプ材2の位置ズレをアナログ的にとらえるこ
とが可能となり、良電導性ストライプ材2の位置制御も
可能となる。また、本実施例において、送り速度は、最
高30m/min、レーザーのスポット径は、φ50〜
φ1000μm、レーザー光5の照射角は、45°〜9
0°で、未圧着部の検出が可能であった。
Furthermore, due to the difference in reflectance between the strip-shaped base material 1 and the good conductive stripe material 2, the laser beam may be irradiated onto the strip-like base material 1 or the stripe material 2 with good conductivity. The output of the sensor will be different depending on the case. Using this fact, while watching the output 18, the laser beam 5 is
It is possible to irradiate the edges of the striped material 2 with good conductivity. Moreover, by utilizing the difference in the same output, it becomes possible to grasp the positional deviation of the good conductive stripe material 2 in an analog manner, and it also becomes possible to control the position of the good conductivity stripe material 2. In addition, in this example, the maximum feeding speed is 30 m/min, and the laser spot diameter is φ50 ~
φ1000 μm, irradiation angle of laser beam 5 is 45° to 9
At 0°, it was possible to detect the uncrimped portion.

【0014】[0014]

【発明の効果】本発明によれば、クラッド帯鋼の未圧着
部の検出を、製造工程内で、連続的に行なうことができ
、高信頼性のクラッド帯を供給することが可能となる。
According to the present invention, it is possible to continuously detect the uncrimped portion of the clad strip steel during the manufacturing process, and it is possible to supply a highly reliable clad strip.

【図面の簡単な説明】[Brief explanation of the drawing]

【図1】クラッド材の未圧着部検出の一実施例を示す斜
視図である。
FIG. 1 is a perspective view showing an example of detecting an uncrimped portion of a cladding material.

【図2】クラッド材の斜視図である。FIG. 2 is a perspective view of a cladding material.

【図3】(a),(b)はクラッド材をICのリードフ
レームとして使用した状態を示す斜視図および断面図で
ある。
FIGS. 3(a) and 3(b) are a perspective view and a sectional view showing a state in which the clad material is used as a lead frame of an IC.

【図4】クラッド材製造に用いられる装置の概略図であ
る。
FIG. 4 is a schematic diagram of an apparatus used for manufacturing cladding material.

【図5】(a),(b)は本発明でのセンサの出力信号
を一例を示すものである。
FIGS. 5(a) and 5(b) show an example of an output signal of a sensor according to the present invention.

【符号の説明】[Explanation of symbols]

1  帯状母材 2  良電導性ストライプ材 3  クラッド帯 4  投光素子 5  レーザー光 6  受光素子 7  センサ本体 8  未圧着部 9  低融点ガラス 10  セラミックキャップ 11  ボンディングワイヤ 12  セラミックベース 13  リードピン先端の良電導性部分14  リード
ピン 15  ICチップ 16  ワイヤーブラシ 17  圧延ロール 18  出力信号 19  母材リール 20  リール
1 Band-shaped base material 2 Good conductive stripe material 3 Clad band 4 Light emitting element 5 Laser beam 6 Light receiving element 7 Sensor main body 8 Unpressed area 9 Low melting point glass 10 Ceramic cap 11 Bonding wire 12 Ceramic base 13 Good conductivity at the tip of the lead pin Part 14 Lead pin 15 IC chip 16 Wire brush 17 Roll roll 18 Output signal 19 Base material reel 20 Reel

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】  帯状母材とストライプ材とを圧着した
クラッド帯を通板しながら、前記ストライプ材のエッヂ
にレーザー光を照射し、その反射光を光学センサにより
検出し、反射光量に対する検出信号の変化量によって、
クラッド帯の圧着状態を検査することを特徴とするクラ
ッド帯の検査方法。
1. While passing a clad strip formed by crimping a strip base material and a stripe material, a laser beam is irradiated onto the edge of the stripe material, the reflected light is detected by an optical sensor, and a detection signal corresponding to the amount of reflected light is generated. Depending on the amount of change in
A cladding band inspection method characterized by inspecting the crimped state of the cladding band.
JP40403190A 1990-12-03 1990-12-03 Inspecting method for clad band Pending JPH04220179A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP40403190A JPH04220179A (en) 1990-12-03 1990-12-03 Inspecting method for clad band

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP40403190A JPH04220179A (en) 1990-12-03 1990-12-03 Inspecting method for clad band

Publications (1)

Publication Number Publication Date
JPH04220179A true JPH04220179A (en) 1992-08-11

Family

ID=18513725

Family Applications (1)

Application Number Title Priority Date Filing Date
JP40403190A Pending JPH04220179A (en) 1990-12-03 1990-12-03 Inspecting method for clad band

Country Status (1)

Country Link
JP (1) JPH04220179A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110653483A (en) * 2019-10-08 2020-01-07 燕山大学 On-line detection device for temperature and reduction in stirring friction welding process

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110653483A (en) * 2019-10-08 2020-01-07 燕山大学 On-line detection device for temperature and reduction in stirring friction welding process
CN110653483B (en) * 2019-10-08 2020-07-31 燕山大学 On-line detection device for temperature and reduction in stirring friction welding process

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