JPH041847B2 - - Google Patents

Info

Publication number
JPH041847B2
JPH041847B2 JP59009044A JP904484A JPH041847B2 JP H041847 B2 JPH041847 B2 JP H041847B2 JP 59009044 A JP59009044 A JP 59009044A JP 904484 A JP904484 A JP 904484A JP H041847 B2 JPH041847 B2 JP H041847B2
Authority
JP
Japan
Prior art keywords
correlation
signal
video signal
correlator
signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59009044A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60152907A (ja
Inventor
Koichiro Myagi
Katsuhisa Pponda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP904484A priority Critical patent/JPS60152907A/ja
Publication of JPS60152907A publication Critical patent/JPS60152907A/ja
Publication of JPH041847B2 publication Critical patent/JPH041847B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Closed-Circuit Television Systems (AREA)
JP904484A 1984-01-20 1984-01-20 物体の形状もしくは配列の不整検出装置 Granted JPS60152907A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP904484A JPS60152907A (ja) 1984-01-20 1984-01-20 物体の形状もしくは配列の不整検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP904484A JPS60152907A (ja) 1984-01-20 1984-01-20 物体の形状もしくは配列の不整検出装置

Publications (2)

Publication Number Publication Date
JPS60152907A JPS60152907A (ja) 1985-08-12
JPH041847B2 true JPH041847B2 (enExample) 1992-01-14

Family

ID=11709639

Family Applications (1)

Application Number Title Priority Date Filing Date
JP904484A Granted JPS60152907A (ja) 1984-01-20 1984-01-20 物体の形状もしくは配列の不整検出装置

Country Status (1)

Country Link
JP (1) JPS60152907A (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2754892B1 (fr) * 1996-10-22 1999-01-08 Framatome Sa Procede et dispositif de controle geometrique d'un assemblage de combustible par photogrammetrie

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5418891A (en) * 1977-07-12 1979-02-13 Kansai Paint Co Ltd Preparation of corrosion resistant resin
JPS5633641A (en) * 1979-08-24 1981-04-04 Inst Erekutorohimii Akademii N Nonnsilver salt photosensitive composition
JPS56126703A (en) * 1980-03-10 1981-10-05 Nec Corp Detecting method for position and device therefor
JPS59157507A (ja) * 1983-02-28 1984-09-06 Matsushita Electric Works Ltd 形状欠陥検出装置

Also Published As

Publication number Publication date
JPS60152907A (ja) 1985-08-12

Similar Documents

Publication Publication Date Title
US10267618B2 (en) Defect detection method and defect detection apparatus
US10317190B2 (en) Vibration measurement device
JP2011064482A (ja) 高速三次元計測装置及び高速三次元計測方法
JP3105702B2 (ja) 光学式欠陥検査装置
JPH041847B2 (enExample)
JPH041848B2 (enExample)
JP2873450B2 (ja) 光による欠点検査装置
JP4035558B2 (ja) 表面検査装置
JP3340879B2 (ja) 表面欠陥検出方法および装置
JP5367292B2 (ja) 表面検査装置および表面検査方法
JP3332175B2 (ja) 周期性パターンの欠陥検査方法
JP7659189B2 (ja) 欠陥検出装置、欠陥検出方法及びプログラム
JPH04160304A (ja) 板幅方向反り検出装置
JPH0453254B2 (enExample)
JP4210236B2 (ja) 光学的形状測定方法
JPS63191010A (ja) 表面粗さ計測方法
JP2005030848A (ja) 表面検査のためのシミュレーション方法及び表面検査装置
JPH0599623A (ja) 変位計測装置
JPH023148Y2 (enExample)
JP3410280B2 (ja) パターン検査装置
JPH08220073A (ja) 渦電流探傷装置の欠陥寸法評価装置
Asundi et al. Automated visual inspection of moving objects
JPH052424B2 (enExample)
JP2723900B2 (ja) レンズ検査方法
JPH0231138A (ja) 塗面の鮮映性測定方法