JPH04170431A - Fluorinated aromatic polyamide, derivative thereof, and use and production thereof - Google Patents

Fluorinated aromatic polyamide, derivative thereof, and use and production thereof

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Publication number
JPH04170431A
JPH04170431A JP29544290A JP29544290A JPH04170431A JP H04170431 A JPH04170431 A JP H04170431A JP 29544290 A JP29544290 A JP 29544290A JP 29544290 A JP29544290 A JP 29544290A JP H04170431 A JPH04170431 A JP H04170431A
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Japan
Prior art keywords
aromatic polyamide
fluorine
tables
formula
polyamide
Prior art date
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Granted
Application number
JP29544290A
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Japanese (ja)
Other versions
JP3006870B2 (en
Inventor
Kanichi Yokota
横田 完一
Akihiko Ikeda
章彦 池田
Yasuhiro Kataoka
康浩 片岡
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Asahi Chemical Industry Co Ltd
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Asahi Chemical Industry Co Ltd
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  • Polyamides (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Polymers With Sulfur, Phosphorus Or Metals In The Main Chain (AREA)
  • Paints Or Removers (AREA)
  • Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)

Abstract

PURPOSE:To obtain the title polyamide gibing a polybenzoxazole excellent in heat resistance, water absorption properties, dielectric characteristics, etc., by subjecting specific raw materials to condensation by dehydration using dicycloexylcarbodiimide. CONSTITUTION:The title polyamide, having repeating units of formula I (wherein X is group of formula II, III or IV; Y is a group of formula V, VI, VII, VIII, or IX; a is 0.1-1; b is 0.9-0; and a+b is 1) and a reduced viscosity measured in N-methylpoyrrolidone at 25 deg.C of 0.05-0.5, is obtained by subjecting raw materials, such as a carboxylic acid and a diamine, to condensation by dehydration using dicyclohexylcarbodiimide. A varnish prepd. by dissolving the polyamide in a solvent is suitably used for forming a protective or insulating film for an electronic material like a semiconductor.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、新規なフッ素を含有する芳香族ポリアミド及
びその製造方法、並びにこれから誘導されたポリベンズ
オキサゾール、さらに該ポリアミドを用いたワニス及び
ポジ型感光性組成物ワニスに関する。
Detailed Description of the Invention [Field of Industrial Application] The present invention relates to a novel fluorine-containing aromatic polyamide, a method for producing the same, a polybenzoxazole derived therefrom, and a varnish and positive coating using the polyamide. The present invention relates to a type photosensitive composition varnish.

〔従来の技術〕[Conventional technology]

半導体等の電子材料に用いられる保護膜や絶縁膜に適し
たポリマーが、従来より盛んに研究されている。
Polymers suitable for protective films and insulating films used in electronic materials such as semiconductors have been actively researched.

優れた耐熱性と電気特性を有するポリベンズオキサゾー
ル系樹脂もその成果の1っであり、例えば近年特開昭6
3−96162号公報に開示されている高温ポジ型フォ
トレジスト組成物に用いられるポリベンズオキサゾール
の前駆物質としての新規なポリアミドが開発されている
。該ポリアミドは典型的にはへキサフルオロ−2,2−
ビス(3−アミノ−4−ヒドロキシフェニル)プロパン
を三塩基性酸クロリドと三塩基性酸クロリドの混合物と
縮合させたものであるが、以下に説明する本発明の含フ
ッ素芳香族ポリアミドに最も関係の深い物質ということ
ができる。
Polybenzoxazole resin, which has excellent heat resistance and electrical properties, is one of the results of these efforts.
Novel polyamides have been developed as precursors for polybenzoxazole used in high temperature positive photoresist compositions as disclosed in Publication No. 3-96162. The polyamide is typically hexafluoro-2,2-
It is a product obtained by condensing bis(3-amino-4-hydroxyphenyl)propane with a mixture of tribasic acid chloride and tribasic acid chloride, and is most related to the fluorine-containing aromatic polyamide of the present invention described below. It can be said to be a deep substance.

〔発明が解決しようとする課題〕 しかし、上記時開に開示されているポリアミドでは半導
体等のデバイスの層間絶縁膜、パッシベーション膜、バ
ッファコート膜、或いは、多層配線基板の絶縁膜等に利
用する際に強く要求されている耐熱性が充分でなく、改
良が望まれていた。
[Problems to be Solved by the Invention] However, the polyamide disclosed in the above-mentioned publication has problems when used for interlayer insulating films, passivation films, buffer coat films of devices such as semiconductors, or insulating films of multilayer wiring boards, etc. The heat resistance, which is strongly required for

本発明はその要望にこたえ、上記時開ポリアミドとは異
なった新規な構造を有し、本来の低誘電率、低吸水率を
維持、或いは向上させた上で、さらに問題の耐熱性を一
段と向上せしめた含フッ素芳香族ポリアミド及びそれか
ら誘導されたポリベンズオキサゾール並びにその用途を
提供することを課題とするものである。
The present invention meets this need and has a new structure different from the above-mentioned time-opening polyamide, maintains or improves the original low dielectric constant and low water absorption, and further improves the problematic heat resistance. It is an object of the present invention to provide a fluorine-containing aromatic polyamide with improved viscosity, a polybenzoxazole derived therefrom, and uses thereof.

〔課題を解決するための手段〕[Means to solve the problem]

本発明者らは上記課題を解決するため、フッ素を含む芳
香族ポリアミドを種々合成検討した結果、前記の一般式
Iの構造を有する新規なポリアミドによって該課題を解
決できることを見出し本発明を完成した。
In order to solve the above problem, the present inventors investigated the synthesis of various fluorine-containing aromatic polyamides, and as a result found that the problem could be solved by a novel polyamide having the structure of general formula I above, and completed the present invention. .

すなわち、本発明は一般式1で示される繰り返し単位を
有し、還元粘度(N−メチルピロリドン中、25℃)が
0,05〜0.5である含フッ素芳香族ポリアミド (式中、Xは OHOH Yは OH 1、b=0.9〜O,a+b−1である)、及びその製
造方法、並びにこれから誘導されたポリベンズオキサゾ
ール、さらに該ポリアミドを用いたワニス及びポジ型感
光性組成物ワニスを提供するものである。
That is, the present invention provides a fluorine-containing aromatic polyamide having a repeating unit represented by the general formula 1 and having a reduced viscosity (in N-methylpyrrolidone at 25°C) of 0.05 to 0.5 (wherein, X is OHOH Y is OH 1, b=0.9 to O, a+b-1), a method for producing the same, a polybenzoxazole derived therefrom, a varnish using the polyamide, and a positive photosensitive composition varnish It provides:

以下本発明の詳細な説明する。The present invention will be explained in detail below.

本発明の含フッ素芳香族ポリアミドは、下記−数式Iで
示される繰り返し単位からなる構造を有している。
The fluorine-containing aromatic polyamide of the present invention has a structure consisting of repeating units represented by Formula I below.

式中、Xは OHOHOHOH (以下余白) OHOH これらの中でも特に OHOH Yは、 OH これらのうちで、ポジ型感光性組成物ワニスに用いる場
合にポリマーとキノンジアジド化合物の相溶性向上に効
果のあるオルト位に置換位置を有する が特に好ましい。
In the formula, Particularly preferred are substitution positions.

aとbは夫々の繰り返し単位の比率(モル分率)を表わ
し、a= 0.1〜1.b= 0.9〜0.a十b=1
である。特に、吸湿率や誘電率の点がらaが0.2以上
であることが好ましい。
a and b represent the ratio (mole fraction) of the respective repeating units, and a = 0.1 to 1. b=0.9~0. a + b = 1
It is. In particular, it is preferable that a is 0.2 or more in terms of moisture absorption rate and dielectric constant.

又、本発明の含フッ素芳香族ポリアミドの還元粘度(η
 /C’)は、1%N−メチルピロリドンp 溶液にして、ウベローデ型粘度計で25℃にて測定した
ところ0.05〜0.5であった。
Furthermore, the reduced viscosity (η
/C') was 0.05 to 0.5 when measured at 25°C with an Ubbelohde viscometer in a 1% N-methylpyrrolidone p solution.

次に本発明の含フッ素芳香族ポリアミドの製造方法につ
いて説明する。
Next, the method for producing the fluorine-containing aromatic polyamide of the present invention will be explained.

該ポリアミドは一般的なポリアミドの製造方法に準じて
製造することができる。例えば、チオニルクロライド等
の試薬とカルボン酸より得られたカルボン酸クロライド
とジアミンを重縮合する酸クロライド法、或いはジシク
ロへキシルカルボジイミド(以下DCCと略記する)を
用いて、脱水縮合させるDCC法等がある。
The polyamide can be manufactured according to a general polyamide manufacturing method. For example, there is an acid chloride method in which diamine is polycondensed with a carboxylic acid chloride obtained from a reagent such as thionyl chloride and a carboxylic acid, or a DCC method in which dehydration condensation is performed using dicyclohexylcarbodiimide (hereinafter abbreviated as DCC). be.

しかし、これらのうち電子材料向けの用途では、塩素イ
オン等の不純物により金属配線の腐食や電気的エラー等
の問題が起こる可能性が有るので、合成途中で発生する
塩素イオンかポリマー中から除き難い酸クロライド法は
問題があり、本質的に低不純物濃度で製造しうるDCC
法の方が好ましい。
However, when these are used for electronic materials, impurities such as chlorine ions can cause problems such as corrosion of metal wiring and electrical errors, so it is difficult to remove chlorine ions generated during synthesis from the polymer. The acid chloride process is problematic and DCC can be produced with inherently low impurity concentrations.
The method is preferable.

このDCC法の詳細については、特開昭61−7202
2号公報の「ポリアミドの製造方法」に記載されている
For details of this DCC method, please refer to Japanese Patent Application Laid-Open No. 61-7202.
It is described in "Method for producing polyamide" in Publication No. 2.

本発明の含フッ素芳香族ポリアミドの使用方法について
説明する。
A method of using the fluorine-containing aromatic polyamide of the present invention will be explained.

まず該ポリアミドを、溶媒に溶解してワニス溶液として
使用する。この溶媒としては該ポリアミドに溶解性があ
り、非プロトン性極性溶媒が適しており、例えば、ジメ
チルアセトアミド、γ−ブチロラクトン、シクロペンタ
ノン、N−メチルピロリドン(以下NMPと略す)等の
中から選ぶことができる。
First, the polyamide is dissolved in a solvent and used as a varnish solution. As this solvent, an aprotic polar solvent that is soluble in the polyamide is suitable, and is selected from, for example, dimethylacetamide, γ-butyrolactone, cyclopentanone, N-methylpyrrolidone (hereinafter abbreviated as NMP), etc. be able to.

このワニスを、■C等の保護膜として用いる場合には該
ワニスをスピンコード等の方法でシリコンウェハー等の
基材に塗布し、オーブン又はホットプレート等を用いて
、50〜150℃の適当な温度で乾燥後、300〜50
0℃の温度で熱処理し、脱水閉環してポリベンズオキサ
ゾール化して保護膜とする。
When using this varnish as a protective film for ■C, etc., apply the varnish to a base material such as a silicon wafer using a method such as a spin code, and heat it at an appropriate temperature of 50 to 150°C using an oven or hot plate. After drying at a temperature of 300-50
Heat treatment is performed at a temperature of 0° C., followed by dehydration and ring closure to form a polybenzoxazole to form a protective film.

次に、塗膜にポンディングパッド等のパイヤホールパタ
ーンを形成する必要がある場合には、ポジ型フォトレジ
ストを用いて行なうことができる。すなわち、本発明の
含フッ素芳香族ポリアミドワニスを塗布乾燥後、その塗
膜上にポジ型フォトレジストをコーティングし、乾燥し
た後、パターン露光を行い、ついでポジ型フォトレジス
ト用アルカリ水溶液からなる現像液によって下地の本発
明含フッ素芳香族ポリアミドワニス塗膜まで一括して現
像することができる。さらに、上部のポジ型フォトレジ
ストを剥離液等により除いた後、300〜500℃の温
度で熱処理をすると、ポリベンズオキサゾールのパター
ンを形成することができる。
Next, if it is necessary to form a pie-hole pattern such as a bonding pad on the coating film, a positive photoresist can be used to form the pattern. That is, after applying and drying the fluorine-containing aromatic polyamide varnish of the present invention, a positive photoresist is coated on the coating film, and after drying, pattern exposure is performed, and then a developer consisting of an alkaline aqueous solution for positive photoresists is applied. By this, the underlying fluorine-containing aromatic polyamide varnish coating film of the present invention can be developed all at once. Further, after removing the upper positive type photoresist using a stripping solution or the like, heat treatment is performed at a temperature of 300 to 500° C., thereby forming a polybenzoxazole pattern.

又、高解像度のパターン形成が必要な場合には、本発明
の含フッ素芳香族ポリアミドを用いたポジ型感光性組成
物ワニスによりこれを行なうことができる。このポジ型
感光性組成物ワニスは、該ポリアミドと特定のキノンジ
アジド化合物を前記の溶媒に溶解して得ることができる
。ここで用いられるキノンジアジド化合物の例としては
、以下に示す構造のものをあげることができる。
Furthermore, when high-resolution pattern formation is required, this can be accomplished using a positive photosensitive composition varnish using the fluorine-containing aromatic polyamide of the present invention. This positive photosensitive composition varnish can be obtained by dissolving the polyamide and a specific quinonediazide compound in the above-mentioned solvent. Examples of the quinonediazide compound used here include those having the structures shown below.

RO0R ROOR OR H3 ■ このキノンジアジド化合物の詳細は、特公平1−468
62号公報に記載されている。
RO0R ROOR OR H3 ■ For details of this quinonediazide compound, see Japanese Patent Publication No. 1-468.
It is described in Publication No. 62.

本発明のポジ型感光性組成物ワニスは、シリコンウェハ
ー等の基材にスピンコード等の方法で塗布、乾燥した後
、パターン露光し、さらにアルカリ水溶液からなる現像
液により現像後、800〜500 ’Cの温度で熱処理
すると、前記のキノンジアジド化合物が揮散し、ポリマ
ーが脱水閉環されてポリベンズオキサゾールの微細パタ
ーンが形成される。ここで用いられる現像液用のアルカ
リとしては、金属イオンによるコンタミネーションを防
ぐため、有機アルカリが好ましく、例えば、コリンヒド
ロキサイド、テトラメチルアンモニウムヒドロキサイド
等が好ましい。又、この現像液の成分として、アルコー
ル、グリコールエーテルや、前記の非プロトン性極性溶
媒を少量加えると塗膜に対する濡れ性や溶解性を向上さ
せることができる。
The positive photosensitive composition varnish of the present invention is coated on a substrate such as a silicon wafer by a method such as a spin code, dried, exposed to light in a pattern, and further developed with a developer consisting of an alkaline aqueous solution. When heat-treated at a temperature of C, the quinonediazide compound evaporates, the polymer undergoes dehydration and ring closure, and a fine pattern of polybenzoxazole is formed. The alkali for the developing solution used here is preferably an organic alkali in order to prevent contamination by metal ions, and for example, choline hydroxide, tetramethylammonium hydroxide, etc. are preferable. Further, by adding a small amount of alcohol, glycol ether, or the above-mentioned aprotic polar solvent as a component of this developer, the wettability and solubility of the coating film can be improved.

〔実 施 例〕〔Example〕

以下、実施例により本発明を説明する。 The present invention will be explained below with reference to Examples.

実施例 1 フタル酸無水物59.3gにジメチルアセトアミド(以
下DMAeと略記する)  300m1を加え、かく拌
しながら、3,3′  −ジヒドロキシ〜4.4′  
−ジアミノビフェニル(以下HABと略記する) 43
.3gを添加した。これを室温(約25℃)下で12時
間かく拌した。次にこのものに2.2′  −ビス(4
−カルボキシフェニル)へキサフルオロプロパン(以下
BCPFと略記する) 78.5gとピリジン63Jf
を加え、かく拌しながら45℃下30分間加熱した。続
いてヒドロキシベンズトリアゾール(以下HOBTと略
記する)  182.2を加え、さらに45℃で30分
間加熱かく拌した。この反応液を一5℃まで冷却し、ジ
シクロへキシルカルボジイミド(以下DCCと略記する
)  167.1gをDMAc84mlに溶解した溶液
を滴下し、ジシクロへキシルウレア(以下D C,Uと
略記する)を析出させた。その後、これにHAB82.
2gを再び加え、その反応液を室温に戻した後、2時間
かく拌し、エタノール20m1を加えてDCUをろ過し
た。そのろ液をかく押下に4pのエタノール中に滴下し
て、もち状のポリマーを析出させた。このもち状ポリマ
ーを300 mlのテトラヒドロフランに溶解後、4g
のイオン交換水に滴下してポリマーを析出させた。次に
これを再びろ過した後、真空乾燥してポリマー粉末P−
1を得た。P−1の構造は下記の通りである。
Example 1 300 ml of dimethylacetamide (hereinafter abbreviated as DMAe) was added to 59.3 g of phthalic anhydride, and while stirring, 3,3'-dihydroxy to 4.4'
-Diaminobiphenyl (hereinafter abbreviated as HAB) 43
.. 3g was added. This was stirred at room temperature (approximately 25°C) for 12 hours. Next, add 2.2′-bis(4
-carboxyphenyl)hexafluoropropane (hereinafter abbreviated as BCPF) 78.5g and pyridine 63Jf
was added and heated at 45° C. for 30 minutes while stirring. Subsequently, hydroxybenztriazole (hereinafter abbreviated as HOBT) 182.2 was added, and the mixture was further heated and stirred at 45° C. for 30 minutes. This reaction solution was cooled to -5°C, and a solution of 167.1 g of dicyclohexylcarbodiimide (hereinafter abbreviated as DCC) dissolved in 84 ml of DMAc was added dropwise to precipitate dicyclohexylurea (hereinafter abbreviated as DC, U). I let it happen. After that, HAB82.
2 g was added again, and the reaction solution was returned to room temperature, stirred for 2 hours, 20 ml of ethanol was added, and the DCU was filtered. The filtrate was dropped into 4p ethanol to precipitate a sticky polymer. After dissolving this sticky polymer in 300 ml of tetrahydrofuran, 4 g
was added dropwise to ion-exchanged water to precipitate the polymer. Next, this was filtered again and then vacuum dried to form a polymer powder P-
I got 1. The structure of P-1 is as follows.

6711%                    
 33齢1%P−1の1%NMP溶液を調製し、ウベロ
ーデ型粘度計により還元粘度を求めたところ、η8./
C−0,17(25℃)であった。又、P−1のNMP
溶液をコート乾燥後400℃×2時間熱処理して得たフ
ィルムについてTMA (熱機械分析装置)によりガラ
ス転移温度を測定した所、340℃であり、DTG (
示差熱天秤)により熱分解開始温度を測定した所、45
0℃であった。又、上記フィルムの誘電率は、1 kH
zにおいて2.9であり、吸水率は85℃×85%I?
、H,下24時間後で、0.8vt%であった。
6711%
A 1% NMP solution of 33-year-old 1% P-1 was prepared and the reduced viscosity was determined using an Ubbelohde viscometer, and it was found to be η8. /
The temperature was C-0.17 (25°C). Also, NMP of P-1
The glass transition temperature of the film obtained by coating and drying the solution and heat-treating it at 400°C for 2 hours was measured using a thermomechanical analyzer (TMA) and found to be 340°C, which was similar to DTG (
When the thermal decomposition onset temperature was measured using a differential thermal balance, it was 45.
It was 0°C. Further, the dielectric constant of the above film is 1 kHz.
z is 2.9, and the water absorption rate is 85°C x 85% I?
, H, 24 hours later, it was 0.8 vt%.

実施例 2 イソフタル酸33.2g及びB CP F 78.5g
に、D M A e  300m1とピリジン83.3
gを加え、50℃まで加熱かく拌して溶解し、均一溶液
を得た。
Example 2 33.2 g of isophthalic acid and 78.5 g of B CP F
to 300 ml of DM A e and 83.3 ml of pyridine.
g was added and dissolved by heating and stirring to 50° C. to obtain a homogeneous solution.

この溶液を0℃まで冷却し、DCC187,1g−のD
MAc84ml溶液を滴下後、HA B 82.2gを
加えた。反応液を室温に戻した後、2時間かく拌し、つ
づいて実施例1と以下同様に処理してポリマー粉末P−
2を得た。
This solution was cooled to 0°C, and DCC187,1g-D
After dropping 84 ml of MAc solution, 82.2 g of HA B was added. After the reaction solution was returned to room temperature, it was stirred for 2 hours and then treated in the same manner as in Example 1 to obtain polymer powder P-
I got 2.

P−2の構造は次の通りである。The structure of P-2 is as follows.

50詩1%                    
50@o1%次に実施例1と同様にしてP−2の諸物性
を測定し、下記の結果を得た。
50 poems 1%
50@o1% Next, various physical properties of P-2 were measured in the same manner as in Example 1, and the following results were obtained.

rt Sp/ C−0,17、 ガラス転移温度−340℃、 熱分解開始温度−450℃、 誘電率−2,9(1kHz)、 吸水率−〇、8 vt%。rt Sp/ C-0,17, Glass transition temperature -340℃, Thermal decomposition start temperature -450℃, Dielectric constant -2.9 (1kHz), Water absorption rate - ○, 8 vt%.

実施例 3 BCPF 158.8gにD M A c  470m
1とピリジン83.3gを加え、かく拌して溶解した。
Example 3 BCPF 158.8g and DM Ac 470m
1 and 83.3 g of pyridine were added and stirred to dissolve.

さらにHoB T 162.2gを加えた後、−5℃ま
で冷却した。
After further adding 162.2 g of HoB T , the mixture was cooled to -5°C.

この溶液にDCC187,1gのD M A c 84
m1溶液を滴下後、HAB8B、5gを加えた。反応液
を室温に戻した後、2時間かく拌し、つづいて実施例1
と以下同様に処理してポリマー粉末P−3を得た。
Add 187 DCC, 1 g of DM Ac 84 to this solution.
After dropping the m1 solution, 5 g of HAB8B was added. After the reaction solution was returned to room temperature, it was stirred for 2 hours, and then Example 1
Polymer powder P-3 was obtained by processing in the same manner as above.

P−3の構造は次の通りである。The structure of P-3 is as follows.

次に実施例1と同様にしてP−3の諸物性を測定し、下
記の結果を得た。
Next, various physical properties of P-3 were measured in the same manner as in Example 1, and the following results were obtained.

ηSp/C−0,19、 ガラス転移温度−360℃、 熱分解開始温度−460℃、 誘電率−2,8(1kHz)、 吸水率−o、’y vt%。ηSp/C-0,19, Glass transition temperature -360℃, Thermal decomposition start temperature -460℃, Dielectric constant -2.8 (1kHz), Water absorption rate - o,'y vt%.

比較例 1 BCPF 15B、8gにD M A c  330m
1とビリジン83JIrを加え、かく拌して溶解した。
Comparative Example 1 BCPF 15B, 8g and DM Ac 330m
1 and pyridine 83JIr were added and stirred to dissolve.

この溶液を0℃まで冷却し、D CC1t37.1gの
DMAc84ml溶液を滴下後、2,2′  −ビス(
4,4’  −ジヒドロキシ−3,3’−ジアミノ)へ
キサフルオロプロパン139.2 gを加えた。反応液
を室温に戻した後、2時間かく拌し、つづいて実施例1
と以下同様に処理してポリマー粉末P−4を測定した。
This solution was cooled to 0°C, a solution of 37.1 g of DCC1t in 84 ml of DMAc was added dropwise, and 2,2'-bis(
139.2 g of 4,4'-dihydroxy-3,3'-diamino)hexafluoropropane were added. After the reaction solution was returned to room temperature, it was stirred for 2 hours, and then Example 1
Polymer powder P-4 was measured in the same manner as above.

P−4の構造は次の通りである。The structure of P-4 is as follows.

次に実施例1と同様にしてP−4の諸物性を測定し、下
記の結果を得た。
Next, various physical properties of P-4 were measured in the same manner as in Example 1, and the following results were obtained.

ηSp/C−0,16、 ガラス転移温度−280℃、 熱分解開始温度−400’C1 誘電率−2,8(lk)12)、 吸水率−0,7wt%。ηSp/C-0,16, Glass transition temperature -280℃, Thermal decomposition start temperature -400'C1 Dielectric constant -2,8(lk)12), Water absorption rate -0.7wt%.

以上の結果より、比較例のP−4は、ガラス転移温度及
び熱分解開始温度が実施例のものより低く耐熱性の点で
劣っていることがわかる。その原因は前記−数式IのX
がフッ素を含有した構造の基である点にあり、そのため
熱処理後のポリベンズオキサゾールの耐熱性が低下した
ものと推定される。
From the above results, it can be seen that Comparative Example P-4 has a glass transition temperature and a thermal decomposition start temperature lower than those of Examples, and is inferior in terms of heat resistance. The reason is the above-X of formula I
is a group with a fluorine-containing structure, and it is presumed that this is the reason why the heat resistance of polybenzoxazole after heat treatment is reduced.

実施例 4 実施例ユにより得られたポリマーP−1をIOg及び2
,2′  −ビス[4−(1,2−ナフトキノン−(2
)−ジアジド−5−スルホニル)フェニル〕プロパン2
gをNMP23.5.に溶解した。このワニス溶液をシ
リコンウェハー上にスピンコードした後、循環オーブン
中で80℃で20分間乾燥し、膜厚10μmの塗膜を得
た。この塗布ウェハーをフォトマスクを介して超高圧水
銀灯により、3GO+aJ/cJ(3B5nXOで測定
)のエネルギーで露光した後、テトラメチルアンモニウ
ムヒドロキシド1%、メタノール5%、ジエチレングリ
コールジメチルエーテル5%、ジメチルホルムアミド1
0%の水溶液からなる現像液により現像した。その結果
1Ournのライン/スペースか解像したシャープなポ
ジ型のパターンが得られた。このウェハーを窒素気流中
、400℃で2時間熱処理してポリベンズオキサゾール
に変換した。
Example 4 Polymer P-1 obtained in Example U was mixed with IOg and 2
,2'-bis[4-(1,2-naphthoquinone-(2
)-Diazido-5-sulfonyl)phenyl]propane 2
g to NMP23.5. dissolved in. This varnish solution was spin-coded onto a silicon wafer and then dried in a circulation oven at 80° C. for 20 minutes to obtain a coating film with a thickness of 10 μm. After exposing this coated wafer to an energy of 3GO+aJ/cJ (measured with 3B5nXO) using an ultra-high pressure mercury lamp through a photomask, 1% of tetramethylammonium hydroxide, 5% of methanol, 5% of diethylene glycol dimethyl ether, and 1% of dimethylformamide were used.
It was developed using a developer consisting of a 0% aqueous solution. As a result, a sharp positive pattern with one-own line/space resolution was obtained. This wafer was heat treated at 400° C. for 2 hours in a nitrogen stream to convert it into polybenzoxazole.

実施例 5 実施例2により得られたポリマーP−2の10gをNM
P23.5gに溶解した。この溶液をシリコンウェハー
上にスピンコードした後、ポットプレート上で150℃
で1層分間乾燥して、膜厚4μmの塗膜を得た。この塗
布ウェハー上に、さらに市販のポジ型フォトレジスト(
例えば東京応化製0FPR−800)をスピンコードし
、乾燥して2μm厚の塗膜を形成した。このウェハーを
超高圧水銀灯により、40mJ/ cd <385na
+で測定)のエネルギーで露光し、ポジレジストの専用
現像液(例えば、東京応化製NMD −3)により、2
層を同時に現像してパターンを形成した。次に上部に残
ったポジ型フォトレジストをアセトン中に浸漬して除い
た。
Example 5 10 g of polymer P-2 obtained in Example 2 was NM
Dissolved in 23.5g of P. After spin-coding this solution onto a silicon wafer, it was placed on a pot plate at 150°C.
After drying for one layer, a coating film with a thickness of 4 μm was obtained. A commercially available positive photoresist (
For example, 0FPR-800 manufactured by Tokyo Ohka Co., Ltd.) was spin-coded and dried to form a coating film with a thickness of 2 μm. This wafer was heated to 40 mJ/cd <385 na using an ultra-high pressure mercury lamp.
2.
The layers were developed simultaneously to form a pattern. Next, the positive photoresist remaining on the top was removed by immersing it in acetone.

このウェハーを窒素気流中、350”Cで1時間熱処理
してポリベンズオキサゾールのパターンを得た。
This wafer was heat treated at 350''C for 1 hour in a nitrogen stream to obtain a polybenzoxazole pattern.

〔発明の効果〕〔Effect of the invention〕

本発明の含フッ素芳香族ポリアミドは耐熱性が優れてい
るという特長を有するとともに吸水性、誘電特性の点で
も優れているポリベンズオキサゾールの前駆体であると
い−う効果を有している。
The fluorine-containing aromatic polyamide of the present invention has the advantage of being excellent in heat resistance, and also has the effect of being a precursor of polybenzoxazole, which is also excellent in water absorption and dielectric properties.

よってこれを用いたワニスは、そのもの自体で或いはポ
ジ型感光性組成物ワニスとして半導体等の電子材料の保
護膜もしくは絶縁膜として極めて有用なものであり、該
技術分野で多くの貢献をなすものといえる。
Therefore, a varnish using this material is extremely useful as a protective film or an insulating film for electronic materials such as semiconductors, either by itself or as a positive photosensitive composition varnish, and is expected to make many contributions in this technical field. I can say that.

特許出願人 旭化成工業株式会社Patent applicant: Asahi Kasei Industries, Ltd.

Claims (1)

【特許請求の範囲】 1、一般式 I で示される繰り返し単位を有し、還元粘
度(N−メチルピロリドン中、25℃)が0.05〜0
.5である含フッ素芳香族ポリアミド。 ▲数式、化学式、表等があります▼・・・・・・・・・
I (式中、Xは ▲数式、化学式、表等があります▼、▲数式、化学式、
表等があります▼、 ▲数式、化学式、表等があります▼のいずれかを表わし
、 Yは ▲数式、化学式、表等があります▼、▲数式、化学式、
表等があります▼、▲数式、化学式、表等があります▼
、 ▲数式、化学式、表等があります▼、 ▲数式、化学式、表等があります▼のいずれかを表わす
。a=0.1〜 1、b=0.9〜0、a+b=1である) 2、ジシクロヘキシルカルボジイミドを用いて脱水縮合
させることを特徴とする請求項1記載の含フッ素芳香族
ポリアミドの製造方法。 3、請求項1記載の含フッ素芳香族ポリアミドを加熱脱
水閉環して得たポリベンズオキサゾール。 4、請求項1記載の含フッ素芳香族ポリアミドと溶媒か
らなるワニス。 5、請求項1記載の含フッ素芳香族ポリアミドとキノン
ジアジド化合物と溶媒からなるポジ型感光性組成物ワニ
ス。
[Claims] 1. It has a repeating unit represented by the general formula I and has a reduced viscosity (in N-methylpyrrolidone at 25°C) of 0.05 to 0.
.. 5, a fluorine-containing aromatic polyamide. ▲There are mathematical formulas, chemical formulas, tables, etc.▼・・・・・・・・・
I (In the formula, X is a ▲ mathematical formula, chemical formula, table, etc.
There are tables, etc.▼, ▲There are mathematical formulas, chemical formulas, tables, etc.▼, and Y represents ▲There are mathematical formulas, chemical formulas, tables, etc.▼, ▲Mathematical formulas, chemical formulas, etc.
There are tables, etc. ▼, ▲ There are mathematical formulas, chemical formulas, tables, etc. ▼
Represents either , ▲There are mathematical formulas, chemical formulas, tables, etc.▼, ▲There are mathematical formulas, chemical formulas, tables, etc.▼. a=0.1-1, b=0.9-0, a+b=1) 2. The method for producing a fluorine-containing aromatic polyamide according to claim 1, characterized in that the dehydration condensation is carried out using dicyclohexylcarbodiimide. . 3. A polybenzoxazole obtained by thermally dehydrating and ring-closing the fluorine-containing aromatic polyamide according to claim 1. 4. A varnish comprising the fluorine-containing aromatic polyamide according to claim 1 and a solvent. 5. A positive photosensitive composition varnish comprising the fluorine-containing aromatic polyamide according to claim 1, a quinonediazide compound, and a solvent.
JP2295442A 1990-11-02 1990-11-02 Fluorinated aromatic polyamide, derivative thereof, production method thereof and use Expired - Lifetime JP3006870B2 (en)

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002034850A1 (en) * 2000-10-20 2002-05-02 Nippon Kayaku Kabushiki Kaisha Varnish containing polyamide resin and use thereof
WO2002079297A3 (en) * 2001-03-30 2003-01-30 Infineon Technologies Ag Coating material for electronic components
JP2009501286A (en) * 2005-07-13 2009-01-15 イー・アイ・デュポン・ドウ・ヌムール・アンド・カンパニー Method for producing polybenzobisoxazole-containing fiber
JP2015227403A (en) * 2014-05-30 2015-12-17 宇部興産株式会社 High heat-resistant film, precursor, and method of producing film
US9480154B2 (en) 2005-07-21 2016-10-25 Nippon Kayaku Kabushiki Kaisha Polyamide resin, epoxy resin compositions, and cured articles thereof

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002034850A1 (en) * 2000-10-20 2002-05-02 Nippon Kayaku Kabushiki Kaisha Varnish containing polyamide resin and use thereof
US6956100B2 (en) 2000-10-20 2005-10-18 Nippon Kayaku Kabushiki Kaisha Polyamide resin-containing varnish and its use
JP2008163330A (en) * 2000-10-20 2008-07-17 Nippon Kayaku Co Ltd Polyamide resin-containing varnish
WO2002079297A3 (en) * 2001-03-30 2003-01-30 Infineon Technologies Ag Coating material for electronic components
US7064176B2 (en) 2001-03-30 2006-06-20 Infineon Technologies Ag Coating material for electronic components
JP2009501286A (en) * 2005-07-13 2009-01-15 イー・アイ・デュポン・ドウ・ヌムール・アンド・カンパニー Method for producing polybenzobisoxazole-containing fiber
US9480154B2 (en) 2005-07-21 2016-10-25 Nippon Kayaku Kabushiki Kaisha Polyamide resin, epoxy resin compositions, and cured articles thereof
JP2015227403A (en) * 2014-05-30 2015-12-17 宇部興産株式会社 High heat-resistant film, precursor, and method of producing film

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