JPS61148233A - Photo-sensitive heat-resistant resin - Google Patents

Photo-sensitive heat-resistant resin

Info

Publication number
JPS61148233A
JPS61148233A JP27124384A JP27124384A JPS61148233A JP S61148233 A JPS61148233 A JP S61148233A JP 27124384 A JP27124384 A JP 27124384A JP 27124384 A JP27124384 A JP 27124384A JP S61148233 A JPS61148233 A JP S61148233A
Authority
JP
Japan
Prior art keywords
formula
formulas
tables
mathematical
group
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP27124384A
Other languages
Japanese (ja)
Other versions
JPH0641515B2 (en
Inventor
Satoshi Yanagiura
聡 柳浦
Shigeru Kubota
繁 久保田
Norimoto Moriwaki
森脇 紀元
Torahiko Ando
虎彦 安藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
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Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP27124384A priority Critical patent/JPH0641515B2/en
Publication of JPS61148233A publication Critical patent/JPS61148233A/en
Publication of JPH0641515B2 publication Critical patent/JPH0641515B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To provide the titled resin having excellent alkali-resistance, long potlife, and enabling a fine processing, by reacting a specific polybenzimidazole polymer with a specific acid halide compound, and using the reaction product as a component. CONSTITUTION:The objective resin can be produced by reacting (A) a polybenzimidazole polymer of formula III (R<1> is bivalent organic group; R<2> is 4-valent organic group; n is integer) synthesized by the polycondensation of a tetraamino compound having 4 amino groups (e.g. the compound of formula I) with a dicarboxylic acid phenyl ester (e.g. the compound of formula II) with (B) an acid halide compound of formula IV or V (R<3> and R<4> are group having double bond dimerizable or polymerizable with light or ionizing radiation, a group containing -N2-, or N3 group; X1 and X2 are halogen).

Description

【発明の詳細な説明】 (産業上の利用分野1 本発明は、新規な感光性耐熱樹脂に関する。[Detailed description of the invention] (Industrial application field 1 The present invention relates to a novel photosensitive heat-resistant resin.

[従来の技術1 半導体工業において、有情材料を固体素子の絶縁層やパ
ッシベーション層として用いると低応力および平滑性な
どの優れた性質かえられるため、一部の半導体素子に実
用化されている。固体素子の製造においては、グイボン
デング工程などのように加熱作業が多数含まれるため、
耐熱性の有情材料を使用する必要があり、そのため通常
耐熱性に優れたポリイミドが広く検討されている。
[Prior Art 1] In the semiconductor industry, the use of sentient materials as insulating layers and passivation layers of solid-state devices provides excellent properties such as low stress and smoothness, so they have been put to practical use in some semiconductor devices. Manufacturing solid-state devices involves a lot of heating work, such as the Guibonden process.
It is necessary to use a heat-resistant material, and therefore polyimide, which has excellent heat resistance, has been widely considered.

近年に至っては、ポリイミドにレジス)Iff能を加え
た感光性ポリイミドが実用化されたため、微細加工も可
能となり、工程も短縮されるようになった。
In recent years, photosensitive polyimide, which is a polyimide with resist) If function, has been put into practical use, making microfabrication possible and shortening the process.

[発明が解決しようとする問題点1 しかし従来の感光性ポリイミドは、パターニング後20
0〜400℃もの高温で処理しなくてはならず、そのさ
いの膜厚の減少が着しい、アルカリ、水などにより加水
分解を受けやすいため無電解メッキ浴に適用で外ない、
感光性ポリイミド前駆体溶液の安定性がわるい、ポリア
ミド酸と銅が複合体を作りやすいため鋼上でのパターニ
ングが難しいなど多くの欠点があった。
[Problem to be solved by the invention 1 However, conventional photosensitive polyimide is
It must be processed at high temperatures of 0 to 400°C, and the film thickness is significantly reduced during this process.It is easily hydrolyzed by alkali, water, etc., so it cannot be applied to electroless plating baths.
It had many drawbacks, including poor stability of the photosensitive polyimide precursor solution and difficulty in patterning on steel because polyamic acid and copper tend to form composites.

したがってパターニング後の熱処理が不用で、耐アルカ
リ性に優れ、ポットライフが艮く、鋼上でのバターニン
グが容易で、微細加工の可能な感光性耐熱材料が望まれ
ていた。
Therefore, there has been a desire for a photosensitive heat-resistant material that does not require heat treatment after patterning, has excellent alkali resistance, has a long pot life, is easy to butter on steel, and can be microfabricated.

E問題、αを解決するための手段1 本発明は前記従来の欠点を解消するためになされたもの
で、一般式(I): (式中、R1は2価の有機基、R2は4価の有機基、n
は整数を示す)で示されるポリベンゾイミダゾール系ポ
リマーに、一般式(■): Xl5O□−R3(II) または一般式(■): X2CO−R’              (I[I
 )(式中、R3、R4はいずれも光または放射線で2
量化あるいは重合可能な2重結合を有する基、−N2−
を含む基またはN3基のいずれかを示し、Xl、N2は
いずれもF、 C1,I、 Brのうちの1種を示す)
で示される酸ハロゲン化合物を反応させてえられたもの
を含有する感光性耐熱樹脂に関し、パターニング後の高
熱処理が不用で、耐アルカリ性が優れており、ポットラ
イフが長く、微細加工の可能な感光性耐熱樹脂を提供す
るものである。
Means 1 for Solving Problem E and α The present invention was made to solve the above-mentioned conventional drawbacks, and has the general formula (I): (wherein, R1 is a divalent organic group, R2 is a tetravalent organic group, organic group, n
represents an integer), the general formula (■): Xl5O□-R3(II) or the general formula (■): X2CO-R' (I[I
) (In the formula, both R3 and R4 are 2 with light or radiation.
A group having a quantifiable or polymerizable double bond, -N2-
or N3 group, and Xl and N2 each represent one of F, C1, I, Br)
Regarding the photosensitive heat-resistant resin containing the one obtained by reacting the acid halogen compound shown in , it does not require high heat treatment after patterning, has excellent alkali resistance, has a long pot life, and is photosensitive that can be microfabricated. The purpose of this invention is to provide a heat-resistant resin with high properties.

[実施例1 本発明のポリベンシイミグゾール系ポリマーは、一般式
(1)で示される構造を持っており、通常4つのアミ7
基を有するテトラアミノ化合物とジカルボン酸フェニル
エステルの縮重合により合成される。テトラアミノ化合
物の具体例としては、たな゛どがあげられ、これらのう
ちの少なくとも1種が用いられる。
[Example 1] The polybenziimiguzole polymer of the present invention has a structure represented by the general formula (1), and usually has four amino acids.
It is synthesized by condensation polymerization of a tetraamino compound having a group and a dicarboxylic acid phenyl ester. Specific examples of the tetraamino compound include the following, and at least one of these is used.

また、ジカルボン酸フェニルエステルの兵体例などがあ
げられ、これらのうち少なくとも1種が用いられる。こ
れらのテトラアミノ化合物およびジカルボン酸フェニル
エステルを用いて、■。
Further, there are examples of dicarboxylic acid phenyl esters, and at least one of these is used. ■ Using these tetraamino compounds and dicarboxylic acid phenyl esters.

Vogel、C,S Marvel(J、 Polym
、 Sci、、 50,511(1964))に記載さ
れている方法によって縮重合を行ない、ポリベンシイミ
グゾール系ポリマーをう、る。
Vogel, C.S. Marvel (J. Polym.
Polycondensation is carried out according to the method described in , Sci., 50, 511 (1964)) to form a polybenciimigsol polymer.

またそのほかに、前記テトラアミノ化合物の塩酸塩とジ
カルボン酸を、脱水剤としてポリリン酸を用い重縮合す
る方法、前記テトラアミノ化合物とジカルボン酸ハロゲ
ン化合物を重縮合する方法があり、いずれもよく知られ
ている。
In addition, there is a method of polycondensing the hydrochloride of the tetraamino compound and a dicarboxylic acid using polyphosphoric acid as a dehydrating agent, and a method of polycondensing the tetraamino compound and a dicarboxylic acid halogen compound, both of which are well known. ing.

つぎに本発明に係る一般式(II)および(III)で
示される酸ハロゲン化合物のR″およびR4としては、
たとえば (式中85は水素または7ヱニル基 R6は水素、アル
キル基またはアラ7基、R7はアルキル基または置換ア
ルキル基、×5はCL H3O,、C17,nC1□ま
たは(SO4)+ /2ZnSO<)などのうち少なく
とも1種が用いられる。
Next, R'' and R4 of the acid halogen compounds represented by general formulas (II) and (III) according to the present invention are as follows:
For example, (in the formula, 85 is hydrogen or a 7enyl group, R6 is hydrogen, an alkyl group or an ara7 group, R7 is an alkyl group or a substituted alkyl group, x5 is CL H3O, C17, nC1□ or (SO4)+ /2ZnSO< ), etc., are used.

これら酸ハロゲン化合物とポリベンシイミグゾール系ポ
リマーの反応は、脱ハロゲン剤としてたとえばプロピレ
ンオキシド、スチレンオキシドなどのエポキシ基を有す
る化合物を用いるか、または無触媒がよく、脱塩酸剤の
使用量は、酸ハロゲン化合物に対し1.0〜5.0当量
が好ましい。一般的な脱ハロゲン剤である三級アミンは
ポットライフ、誘電率にわるい影響をもたらすので好ま
しくない。
The reaction between these acid halogen compounds and polybenziimigusol polymers is preferably carried out using a compound having an epoxy group such as propylene oxide or styrene oxide as a dehalogenating agent, or without a catalyst, and the amount of the dehydrochlorinating agent used is , preferably 1.0 to 5.0 equivalents to the acid halogen compound. Tertiary amines, which are common dehalogenating agents, are not preferred because they have a negative effect on pot life and dielectric constant.

用いられるポリベンシイミグゾール系ポリマーの溶液の
粘度は500cps −4000cps、好ましくは1
000cps −2000cpsで、これ上り大%イと
均一な膜を作ることかで外ずまだ小さいとスピンナーを
用いたさいに充分な膜厚がえられず不都合である。
The viscosity of the polybenzimigsol polymer solution used is 500 cps to 4000 cps, preferably 1
000 cps - 2000 cps, it is difficult to form a uniform film with a large percentage of this, but if the film is still too small, a sufficient film thickness cannot be obtained when using a spinner, which is disadvantageous.

また、添加する酸ハロゲン化合物の量はポリベンシイミ
グゾール中の−i−に対して2.0〜0.4当量が適当
である。
Further, the amount of the acid halogen compound to be added is suitably 2.0 to 0.4 equivalents relative to -i- in the polybenciimigsol.

反応溶液および感光性耐熱樹脂の材料(以下、感光材料
という)として使用するときの溶媒は、ポリマーの溶解
性から主として極性溶媒が用いられ、たとえばジメチル
スルホキシド、ジメチルホルムアミド、ジメチルアセト
アミド、N−メチルピロリドン、ヘキサメチルホスホロ
アミドなどが好ましく、ポリベンゾイミダゾール系ポリ
マーに討し2〜10倍量用いられる。
The solvent used as the reaction solution and the photosensitive heat-resistant resin material (hereinafter referred to as photosensitive material) is mainly a polar solvent due to the solubility of the polymer, such as dimethyl sulfoxide, dimethylformamide, dimethylacetamide, N-methylpyrrolidone. , hexamethylphosphoramide, etc. are preferred, and are used in an amount of 2 to 10 times that of the polybenzimidazole polymer.

反応は、テトラアミ/化合物とジカルボン酸を当量まぜ
、これをチッ素雰囲気下で220℃に加熱し、融解した
ら250〜300℃に昇温し、30分間反応させる。つ
ぎに反応系を真空に切り換え(0,1ivh)、そのま
まの温度で20〜40分間反応を続け、さらに300〜
500’C,好ましくは350〜400“Cに昇温し、
1〜10時間好ましくは4〜9時間反応させる。
In the reaction, equivalent amounts of the tetraamide/compound and dicarboxylic acid are mixed, heated to 220°C in a nitrogen atmosphere, and once melted, the temperature is raised to 250-300°C and reacted for 30 minutes. Next, switch the reaction system to vacuum (0,1ivh), continue the reaction at the same temperature for 20-40 minutes, and then continue the reaction for 30-40 minutes.
Raise the temperature to 500'C, preferably 350-400"C,
The reaction is carried out for 1 to 10 hours, preferably 4 to 9 hours.

できた生成物は、不純物がほとんど除去された    
1ものであるが、メタノール、エタノール、水などで再
沈殿されればなお純度の高いものがえられる。
The resulting product has most of the impurities removed.
However, if it is reprecipitated with methanol, ethanol, water, etc., a highly pure product can be obtained.

えられた感光性ポリマーは赤外線吸収スペクトルにおい
て1675cz−’付近に−N−における■ C=0 ■ ll 引 I ペプチド結合の吸収がみられた。
In the infrared absorption spectrum of the obtained photosensitive polymer, absorption of the peptide bond in -N- was observed around 1675 cz-'.

上記の方法でえられる感光性ポリマーの1つの典型的な
例として、つぎのちのがあげられる。
One typical example of a photosensitive polymer obtained by the above method is as follows.

[以下余白1 このようにしてえられた感光性材料は、通常溶液の形で
実用に供せられる。この溶液には前記感光性ポリマーの
ほかに、光開始剤、増感剤、共重合モノマー、光架橋剤
、ポットライフ向上のための安定剤あるいは基板との接
着性改良剤などを含んでいてもよいが、これら添加物の
種類は、本発明の感光性ポリマーにグラフトされる感光
基に大きく依存する。」―記添加剤としてはジアジド、
ポリアジド、テトラゾニウム塩類、ポリノアゾニウム塩
類、フォール類、ポリオール類、シロキサン類、アント
ラキノン環を持つ化合物、ナフタリン環を持つ化合物、
ビリリウム塩類、チアピリリウム塩類、角田隆弘者[新
患光性樹脂](印刷学会出版部東京1981)65〜6
8ペーノに記載されている光開始剤、ベンゾキノン類、
チオール類、クロルアニル、エポキシ類などが用いられ
、使用量は、全溶質量の50%以下である。
[Margin 1 below] The photosensitive material thus obtained is usually put to practical use in the form of a solution. In addition to the photosensitive polymer, this solution may also contain a photoinitiator, a sensitizer, a copolymer monomer, a photocrosslinking agent, a stabilizer for improving pot life, or an adhesion improver with the substrate. However, the types of these additives are highly dependent on the photosensitive groups grafted onto the photosensitive polymers of the present invention. ” - The additives include diazide,
Polyazides, tetrazonium salts, polynoazonium salts, falls, polyols, siloxanes, compounds with anthraquinone rings, compounds with naphthalene rings,
Byrylium salts, Thiapyrylium salts, Takahiro Tsunoda [New photosensitive resin] (Printing Society Publishing Department Tokyo 1981) 65-6
Photoinitiators, benzoquinones, as described in 8 PENO,
Thiols, chloranil, epoxies, etc. are used, and the amount used is 50% or less of the total solute amount.

本発明の新規な感光材料は通常の7オトレジスト技術で
パターン加工で終る。基板としては、セラミック、〃ラ
スエポキシ、BTレジン、ガラスポリイミド、エポキシ
、紙7ニノール、金属、基板への塗布は、たとえば、ス
ピンナー、スクリーン印刷やバーコーターで、1〜30
μ屑の厚さ、好ましくは5〜15μ肩の厚さの膜が形成
されるように塗布する。この塗布膜を50〜80℃、好
ましくは60〜75°Cで15〜60分、好ましくは2
0〜40分乾燥する。
The novel photosensitive material of the present invention is patterned using conventional 7-photoresist technology. The substrate can be ceramic, lath epoxy, BT resin, glass polyimide, epoxy, paper 7-ninol, metal, etc. Coating to the substrate can be done using a spinner, screen printing or bar coater, for example, with a coating of 1 to 30%.
The coating is applied so as to form a film with a thickness of 5 to 15 microns, preferably 5 to 15 microns. This coating film is heated at 50 to 80°C, preferably 60 to 75°C for 15 to 60 minutes, preferably 2
Dry for 0-40 minutes.

つぎにこの塗布膜にマスクを置き、化学線を照射する。Next, a mask is placed on this coating film and actinic radiation is irradiated.

化学線は線源の種類やパワーによって大きく異なるため
、照射条件を特定することは困難であるが、化学線の種
類としてはX#!、電子線、紫外線、可視光線、レーザ
ー光線などがあげられ、紫外線がとくに望ましい。つい
で、現像剤で現像することにより、レリー7パターンを
うる。現像剤は通常ジメチルスルホキシド、ジメチルホ
ルムアミド、ツメチルアセトアミド、N−、/チルピロ
リドン、ヘキサメチレンホスホロアミドなど感光材料を
溶解する極性溶媒と、メタノール、エタノール、水、そ
の他の貧溶媒の混合系が好ましく用いられ、極性溶媒と
貧溶媒の割合は9:1〜3ニア、好ましくは7,5:2
.5〜6:4(重量比)である。
Actinic radiation varies greatly depending on the type and power of the radiation source, so it is difficult to specify the irradiation conditions, but as a type of actinic radiation, X#! , electron beams, ultraviolet rays, visible light, laser beams, etc., with ultraviolet rays being particularly desirable. Then, by developing with a developer, a relief 7 pattern is obtained. The developer is usually a mixture of a polar solvent that dissolves the photosensitive material, such as dimethyl sulfoxide, dimethylformamide, trimethylacetamide, N-, /thylpyrrolidone, or hexamethylene phosphoramide, and methanol, ethanol, water, or other poor solvent. Preferably used, the ratio of polar solvent to poor solvent is 9:1 to 3, preferably 7.5:2.
.. The ratio is 5 to 6:4 (weight ratio).

現像後、イソプロピルアルコールなどの貧溶媒でリンス
して従来上り用いられている加熱または空気の吹きつけ
でパターンをかわかす方法により、耐熱性に優れ、かつ
シャープな端面のパターンをうろことができる。
After development, by rinsing with a poor solvent such as isopropyl alcohol and evaporating the pattern by heating or blowing air, which is conventionally used, it is possible to create a pattern with excellent heat resistance and sharp edges.

このように本発明の感光材料を用いることにより、耐熱
性、耐薬品性、絶縁性、機械特性を有するパターンが、
従来のポリイミド系感光材料に必要な高温でのベイク工
程なしでうろことができる。
As described above, by using the photosensitive material of the present invention, patterns having heat resistance, chemical resistance, insulation properties, and mechanical properties can be created.
It can be processed without the high-temperature baking process required for conventional polyimide-based photosensitive materials.

つぎに本発明の感光性耐熱樹脂を、実施例にもとづ外説
明する。
Next, the photosensitive heat-resistant resin of the present invention will be explained based on Examples.

実施例I HoVogel、 C0S Marvel(J、 Po
lym、 Sci、、 50゜511(1964))に
記載されている方法を用いてえられたポリベンシイミグ
ゾール14gを86gのジメチルスルホキシドに溶解し
、さらにプロピオンオキシド2.6.を加えて混合し、
完全に溶解したらアイスバスで冷却しながらトルエン5
.0.に溶解したケイ皮酸クロライド3.83を添加し
、10〜15℃で3時間反応させた。この溶液にベンゾ
7エ7ン0.2g、ミヒラーケトン1.2fIを加え均
一に溶解し、濾過することにより試料溶液(1)をえた
。この試料溶1(1)をスピナーでセラミック板の上に
塗布した。
Example I HoVogel, COS Marvel (J, Po
lym, Sci., 50° 511 (1964)) was dissolved in 86 g of dimethyl sulfoxide, and 2.6 g of propion oxide was added. Add and mix;
Once completely dissolved, add 5 toluene while cooling in an ice bath.
.. 0. 3.83 ml of cinnamic acid chloride dissolved in was added, and the mixture was reacted at 10 to 15° C. for 3 hours. To this solution, 0.2 g of benzo7ene and 1.2 fI of Michler's ketone were added, uniformly dissolved, and filtered to obtain a sample solution (1). This sample solution 1(1) was applied onto a ceramic plate using a spinner.

つぎに65℃で30分乾燥したところ、塗膜の厚さは2
μであった。この上にネが型テストパターンが書かれた
マスクをffi着させ、23ci+の距離から500W
の高圧水銀灯で10分間照射したのち、ツメチルスルホ
キシド(7部)とメタノール(3部)の混合溶媒で超音
波をあてながら現像し、インプロパツールでリンスしで
、空気を吹外つけ、乾燥することにより、良好な耐熱性
を有したシャープな耐アルカリ性、耐ドライエツチング
性を有するネガパターンかえられ、現像や乾燥にともな
う膜ベリはなかった。また試料溶液(1)は銅の上のパ
ターニングも可能であり、4℃の冷暗所保存し、使用の
たびに室温に戻し開封したが、1日1回計8回の使用に
もかかわらず粘度低下などの劣化がみられなかった。
Next, when dried at 65℃ for 30 minutes, the thickness of the coating film was 2.
It was μ. On top of this, I put on a mask with a square-shaped test pattern written on it, and applied 500W from a distance of 23ci+.
After irradiating it with a high-pressure mercury lamp for 10 minutes, it was developed with a mixed solvent of trimethyl sulfoxide (7 parts) and methanol (3 parts) while applying ultrasonic waves, rinsed with an inproper tool, blown out with air, and dried. As a result, a negative pattern with good heat resistance, sharp alkali resistance, and dry etching resistance was obtained, and there was no film burr due to development or drying. In addition, sample solution (1) can be patterned on copper, and although it was stored in a cool, dark place at 4℃ and opened and returned to room temperature after each use, the viscosity decreased even though it was used once a day for a total of 8 times. No deterioration was observed.

実施例2 実施例1で用いられたポリベンゾイミダゾール14、を
861?のジメチルスルホキシドに溶解し、さらにプロ
ピオンオキシド2.61?を加えて混合し、完全に溶解
したらアイスパスで冷却しながら、ジメチルスルホキシ
ド5.O,、に溶解した1、2−す7トキノンー2−ジ
アジド−5スルフオン酸クロライド2gを添加し、10
〜15℃で3時間反応させた後、濾過することにより試
料溶液(2)をえ厄。この試料溶液(2)をスピナーで
セラミック板の上に塗布した。
Example 2 Polybenzimidazole 14 used in Example 1 was converted to 861? of dimethyl sulfoxide, and further propion oxide 2.61? Add dimethyl sulfoxide and mix, and when completely dissolved, add 5. dimethyl sulfoxide while cooling with an ice path. Add 2 g of 1,2-7toquinone-2-diazide-5 sulfonic acid chloride dissolved in O.
After reacting at ~15°C for 3 hours, remove the sample solution (2) by filtration. This sample solution (2) was applied onto a ceramic plate using a spinner.

つぎに65℃で30分乾燥したところ、塗膜の厚さは約
2μであった。この上にポジ型テストパターンが書かれ
たマスクを密着させ、23011のV[離から500W
高圧水銀灯で7分間照射し、ヘキサメチルホスホロアミ
ド(7部)と水酸化ナトリウム5%メタノール溶液(3
部)の混合溶媒で超音波をあてながら現像し、イソプロ
パツールでリンスして、空気を吹きつけ、乾燥すること
により良好な耐熱性を有したシャープな耐アルカリ性、
耐ドライエツチング性を有するポジパターンがえられ、
現像、乾燥にともなう膜べ9はほとんどなかった。また
試料溶[(2)は、銅の上のパターニングも可能であり
、4℃の冷暗所保存で実施例1と同様に8回使用したに
もかかわらず、粘度低下などの劣化がみられなかった。
Next, when it was dried at 65° C. for 30 minutes, the thickness of the coating film was about 2 μm. A mask with a positive test pattern written on it was placed on top of this, and a voltage of 23011 [500 W from a distance] was applied.
Irradiated with a high-pressure mercury lamp for 7 minutes, hexamethylphosphoramide (7 parts) and sodium hydroxide 5% methanol solution (3 parts)
Developed with ultrasonic waves in the mixed solvent of part), rinsed with isopropanol, blown with air, and dried, resulting in sharp alkali resistance with good heat resistance.
A positive pattern with dry etching resistance is obtained,
There was almost no film 9 due to development and drying. In addition, the sample solution [(2) was also capable of patterning on copper, and no deterioration such as a decrease in viscosity was observed even though it was stored in a cool, dark place at 4°C and used 8 times as in Example 1. .

実施例3 実施例1および2で用いられたポリベンシイミグゾール
14.を869のジメチルスルホキシドに溶解し、さら
にプロピオンオキシド2,6.を加えて混合し、完全に
溶解したらアイスバスで冷却しながら、ジメチルスルホ
キシド5.0gに溶解したバラ−アジドケイ皮酸クロラ
イド2gを添加し、10〜15℃で3時間反応させたあ
と、濾過することにより試料溶液(3)をえた。この溶
液をスピナーでセラミック板の上に塗布した。つぎに6
5℃で30分乾燥したところ、膜の厚さは2μであった
。この上にネガ型テストパターンが書かれたマスクを密
着させ、2BCIの即離から500Wの高圧水銀灯で7
分間照射し、ジメチルスルホキシド(7部)とメタノー
ル(3部)の混合溶媒で超音波をあてながら現像し、 
  )イソプロパツールでリンスして空気を吹きつけ、
乾燥することにより良好な耐熱性を有したシャーブな耐
アルカリ性、耐ドライエツチング性を有するネがパター
ンかえられ、現像、乾燥にともなう膜ベリはほとんどな
かった。また試料溶液(3)は銅の上のパターニングも
可能であり、4℃の冷暗所保存で実施例1および2と同
様に8回の使用にもかかわらず、粘度低下などの劣化が
みられなかった・ E比較例1] 特公昭54−116217号における実施例2にもとづ
き、感光性ポリイミド溶液を作り比較試料溶液(1)を
えた。この溶液を実施例1および3と同様にパターニン
グしたところ同程度のポリアミド酸のパターンができあ
がった。これをイミド化するため特公昭54−1162
17号にもとづき熱処理したところ、耐熱性ポリイミド
のパターンがえられた。しかし膜厚は熱処理により処理
前の60%に減少し、実施例1〜3にくらべて、アスペ
クト比がわるく、また銅の上でのパターニングができな
かった。で鰺あがったパターンはアルカリ水溶液中で加
水分解を起こし劣化するため、長時間無電解メッキ溶に
浸せきすることかで鰺ない。比較試料溶液(1)は空気
中の水分による加水分解を受けやすく、4℃の冷暗所に
保存しても3〜4回開封したものは粘度低下がお終だ。
Example 3 Polybenci imiguzol used in Examples 1 and 2 14. was dissolved in dimethyl sulfoxide of 869, and propion oxide 2,6. When completely dissolved, add 2 g of rose-azidocinnamic acid chloride dissolved in 5.0 g of dimethyl sulfoxide while cooling in an ice bath, react at 10 to 15°C for 3 hours, and then filter. A sample solution (3) was thus obtained. This solution was applied onto a ceramic plate using a spinner. Next 6
When dried at 5° C. for 30 minutes, the film thickness was 2 μm. A mask with a negative test pattern written on it was placed on top of the mask, and a 500W high-pressure mercury lamp was used to immediately remove the 2BCI.
irradiated for minutes, and developed while applying ultrasound with a mixed solvent of dimethyl sulfoxide (7 parts) and methanol (3 parts).
) Rinse with isoproper tool and blow air,
As a result of drying, the pattern was changed to a sharp one having good heat resistance, alkali resistance, and dry etching resistance, and there was almost no film burring due to development and drying. Sample solution (3) was also capable of patterning on copper, and no deterioration such as a decrease in viscosity was observed even though it was stored in a cool, dark place at 4°C and used 8 times as in Examples 1 and 2. - E Comparative Example 1] Based on Example 2 in Japanese Patent Publication No. 54-116217, a photosensitive polyimide solution was prepared to obtain a comparative sample solution (1). When this solution was patterned in the same manner as in Examples 1 and 3, a similar pattern of polyamic acid was completed. In order to imidize this
When heat-treated according to No. 17, a pattern of heat-resistant polyimide was obtained. However, the film thickness was reduced to 60% of the pre-treatment thickness by heat treatment, the aspect ratio was worse than in Examples 1 to 3, and patterning on copper was not possible. The pattern that has been raised in the process is hydrolyzed in an aqueous alkaline solution and deteriorates, so it is difficult to immerse the pattern in an electroless plating solution for a long period of time. Comparative sample solution (1) is easily hydrolyzed by moisture in the air, and even if it is stored in a cool, dark place at 4°C, the viscosity will only decrease after opening 3 to 4 times.

[発明の効果1 本発明の感光性耐熱樹脂によれば、ポリイミグゾール系
ポリマーの−NH一部分に酸ハロゲン化合物との反応を
利用して感光基をグラフトしたため、従来のように、パ
ターニング後に200〜400℃もの高温処理が不必要
となり、ポットライフも改良され、良好な耐熱性を有す
るシャープな耐アルカリ性、耐ドライエツチング性を有
するパターンかえられる。また本発明でえられる感光材
料は銅の上のパターニングが可能で、冷暗所保存による
粘度低下などの劣化がみちれない。
[Effect of the invention 1] According to the photosensitive heat-resistant resin of the present invention, a photosensitive group is grafted onto the -NH portion of the polyimiguzole-based polymer by utilizing a reaction with an acid halide compound. It eliminates the need for high-temperature treatment at temperatures as high as 0.9°C, improves pot life, and allows for a pattern change that has good heat resistance, sharp alkali resistance, and dry etching resistance. Further, the photosensitive material obtained by the present invention can be patterned on copper, and does not suffer from deterioration such as a decrease in viscosity due to storage in a cool and dark place.

Claims (3)

【特許請求の範囲】[Claims] (1)一般式( I ): ▲数式、化学式、表等があります▼( I ) (式中、R^1は2価の有機基、R^2は4価の有機基
、nは整数を示す)で示されるポリベンゾイミダゾール
系ポリマーに、一般式(II): X^1SO_2−R^3(II) または一般式(III): X^2CO−R^4(III) (式中、R^3、R^4はいずれも光または放射線で2
量化あるいは重合可能な2重結合を有する基、−N_2
−を含む基またはN_3基のいずれかを示し、X^1、
X^2はいずれもF、Cl、I、Brのうちの1種を示
す)で示される酸ハロゲン化合物を反応させてえられる
ものを含有する感光性耐熱樹脂。
(1) General formula (I): ▲There are mathematical formulas, chemical formulas, tables, etc.▼(I) (In the formula, R^1 is a divalent organic group, R^2 is a tetravalent organic group, and n is an integer. ), general formula (II): X^1SO_2-R^3(II) or general formula (III): X^2CO-R^4(III) (in the formula, R Both ^3 and R^4 are 2 with light or radiation.
Group having a quantifiable or polymerizable double bond, -N_2
Indicates either a group containing - or a N_3 group, X^1,
A photosensitive heat-resistant resin containing a compound obtained by reacting an acid halogen compound represented by X^2 (all of which represent one of F, Cl, I, and Br).
(2)R^1で示される2価の有機基が ▲数式、化学式、表等があります▼、▲数式、化学式、
表等があります▼、▲数式、化学式、表等があります▼
、▲数式、化学式、表等があります▼、 ▲数式、化学式、表等があります▼、▲数式、化学式、
表等があります▼、 ▲数式、化学式、表等があります▼、−(CH_2)_
4−、▲数式、化学式、表等があります▼ のうちの1種である特許請求の範囲第(1)項記載の感
光性耐熱樹脂。
(2) The divalent organic group represented by R^1 has ▲mathematical formula, chemical formula, table, etc.▼, ▲mathematical formula, chemical formula,
There are tables, etc. ▼, ▲ There are mathematical formulas, chemical formulas, tables, etc. ▼
, ▲ There are mathematical formulas, chemical formulas, tables, etc. ▼, ▲ There are mathematical formulas, chemical formulas, tables, etc. ▼, ▲ Mathematical formulas, chemical formulas,
There are tables, etc.▼, ▲There are mathematical formulas, chemical formulas, tables, etc.▼, -(CH_2)_
4- The photosensitive heat-resistant resin according to claim (1), which is one of the following: ▲There are mathematical formulas, chemical formulas, tables, etc.▼.
(3)R^2で示される4価の有機基が ▲数式、化学式、表等があります▼、▲数式、化学式、
表等があります▼、▲数式、化学式、表等があります▼ (式中、X^4はCH_2、O、S、SO_2、COお
よびNHCOのうちの1種を示す。)のうちの1種であ
る特許請求の範囲第(1)項記載の感光性耐熱樹脂。
(3) The tetravalent organic group represented by R^2 has ▲mathematical formula, chemical formula, table, etc.▼, ▲mathematical formula, chemical formula,
There are tables, etc.▼, ▲There are mathematical formulas, chemical formulas, tables, etc.▼ (In the formula, X^4 represents one of CH_2, O, S, SO_2, CO, and NHCO.) A photosensitive heat-resistant resin according to claim (1).
JP27124384A 1984-12-20 1984-12-20 Manufacturing method of photosensitive heat-resistant resin Expired - Lifetime JPH0641515B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP27124384A JPH0641515B2 (en) 1984-12-20 1984-12-20 Manufacturing method of photosensitive heat-resistant resin

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP27124384A JPH0641515B2 (en) 1984-12-20 1984-12-20 Manufacturing method of photosensitive heat-resistant resin

Publications (2)

Publication Number Publication Date
JPS61148233A true JPS61148233A (en) 1986-07-05
JPH0641515B2 JPH0641515B2 (en) 1994-06-01

Family

ID=17497350

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JPH0641515B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109336756A (en) * 2018-11-20 2019-02-15 河南大学 A kind of hydrogenation-dehalogenation method of halogenated aromatic

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109336756A (en) * 2018-11-20 2019-02-15 河南大学 A kind of hydrogenation-dehalogenation method of halogenated aromatic
CN109336756B (en) * 2018-11-20 2021-05-11 河南大学 Hydrogenation dehalogenation method of halogenated aromatic hydrocarbon

Also Published As

Publication number Publication date
JPH0641515B2 (en) 1994-06-01

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