JPH0416749B2 - - Google Patents
Info
- Publication number
- JPH0416749B2 JPH0416749B2 JP57112447A JP11244782A JPH0416749B2 JP H0416749 B2 JPH0416749 B2 JP H0416749B2 JP 57112447 A JP57112447 A JP 57112447A JP 11244782 A JP11244782 A JP 11244782A JP H0416749 B2 JPH0416749 B2 JP H0416749B2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- display
- circuit
- resistor
- battery
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000012360 testing method Methods 0.000 claims description 126
- 239000003990 capacitor Substances 0.000 claims description 40
- 238000004146 energy storage Methods 0.000 claims description 21
- 230000008878 coupling Effects 0.000 claims description 12
- 238000010168 coupling process Methods 0.000 claims description 12
- 238000005859 coupling reaction Methods 0.000 claims description 12
- 230000003287 optical effect Effects 0.000 claims description 9
- 238000010438 heat treatment Methods 0.000 claims description 8
- 230000036541 health Effects 0.000 claims description 7
- 239000004020 conductor Substances 0.000 claims description 6
- 238000005259 measurement Methods 0.000 claims description 4
- 230000010355 oscillation Effects 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 6
- 230000008901 benefit Effects 0.000 description 5
- 238000007689 inspection Methods 0.000 description 5
- 230000005284 excitation Effects 0.000 description 4
- 238000009499 grossing Methods 0.000 description 4
- 230000000903 blocking effect Effects 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 3
- 230000003321 amplification Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 230000005674 electromagnetic induction Effects 0.000 description 2
- 210000003811 finger Anatomy 0.000 description 2
- 230000006698 induction Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 230000009849 deactivation Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005236 sound signal Effects 0.000 description 1
- 210000003813 thumb Anatomy 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16561—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in hand-held circuit testers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/14—Indicating direction of current; Indicating polarity of voltage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/145—Indicating the presence of current or voltage
- G01R19/155—Indicating the presence of voltage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Current Or Voltage (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE3125552.3 | 1981-06-29 | ||
| DE3125552A DE3125552C1 (de) | 1981-06-29 | 1981-06-29 | Prüfeinrichtung zum Anzeigen einer elektrischen Spannung, deren Polarität und zur Durchgangsprüfung |
| DE3213749.4 | 1982-04-14 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5828668A JPS5828668A (ja) | 1983-02-19 |
| JPH0416749B2 true JPH0416749B2 (enrdf_load_stackoverflow) | 1992-03-25 |
Family
ID=6135641
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57112447A Granted JPS5828668A (ja) | 1981-06-29 | 1982-06-29 | 電圧表示および導通試験用の試験装置 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPS5828668A (enrdf_load_stackoverflow) |
| DE (1) | DE3125552C1 (enrdf_load_stackoverflow) |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5564676A (en) * | 1978-11-06 | 1980-05-15 | Hitachi Ltd | Measuring method for tape run time |
| JPS5564674A (en) * | 1978-11-06 | 1980-05-15 | Hitachi Ltd | Measuring method for tape run time |
| DE2951816C2 (de) * | 1978-12-27 | 1989-06-29 | Staar S.A., Brüssel/Bruxelles | Verfahren zur automatischen Ermittlung des Types einer Kassette in Registrier- oder magnetischen Reproduktionsvorrichtungen |
| DE3505531A1 (de) * | 1985-02-18 | 1986-08-21 | Wolfgang Dipl.-Ing. 7500 Karlsruhe Schuster | Elektronisches mehrzweckanzeigegeraet |
| FR2648237B1 (fr) * | 1989-06-08 | 1991-12-13 | Annecy Electronique | Procede de controle de circuits electriques de vehicules par utilisation d'un shunt et dispositif de controle |
| DE4008298A1 (de) * | 1990-03-15 | 1991-09-19 | Veba Kraftwerke Ruhr | Oberschwingungsindikator |
| DE9108426U1 (de) * | 1991-07-08 | 1992-11-12 | Siemens AG, 8000 München | Stromwächter |
| US5345170A (en) | 1992-06-11 | 1994-09-06 | Cascade Microtech, Inc. | Wafer probe station having integrated guarding, Kelvin connection and shielding systems |
| US6380751B2 (en) | 1992-06-11 | 2002-04-30 | Cascade Microtech, Inc. | Wafer probe station having environment control enclosure |
| US5264788A (en) * | 1992-06-12 | 1993-11-23 | Cascade Microtech, Inc. | Adjustable strap implemented return line for a probe station |
| US5561377A (en) | 1995-04-14 | 1996-10-01 | Cascade Microtech, Inc. | System for evaluating probing networks |
| DE29706736U1 (de) * | 1997-04-15 | 1997-06-05 | Ponater, Helmut, Dipl.-Ing., 91301 Forchheim | Mobiles Vielfachmeßgerät |
| US6002263A (en) | 1997-06-06 | 1999-12-14 | Cascade Microtech, Inc. | Probe station having inner and outer shielding |
| US6445202B1 (en) | 1999-06-30 | 2002-09-03 | Cascade Microtech, Inc. | Probe station thermal chuck with shielding for capacitive current |
| US6914423B2 (en) | 2000-09-05 | 2005-07-05 | Cascade Microtech, Inc. | Probe station |
| US6965226B2 (en) | 2000-09-05 | 2005-11-15 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| EP1432546A4 (en) | 2001-08-31 | 2006-06-07 | Cascade Microtech Inc | OPTICAL TESTING APPARATUS |
| US6777964B2 (en) | 2002-01-25 | 2004-08-17 | Cascade Microtech, Inc. | Probe station |
| US6847219B1 (en) | 2002-11-08 | 2005-01-25 | Cascade Microtech, Inc. | Probe station with low noise characteristics |
| US7250779B2 (en) | 2002-11-25 | 2007-07-31 | Cascade Microtech, Inc. | Probe station with low inductance path |
| US6861856B2 (en) | 2002-12-13 | 2005-03-01 | Cascade Microtech, Inc. | Guarded tub enclosure |
| US7221172B2 (en) | 2003-05-06 | 2007-05-22 | Cascade Microtech, Inc. | Switched suspended conductor and connection |
| US7492172B2 (en) | 2003-05-23 | 2009-02-17 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7250626B2 (en) | 2003-10-22 | 2007-07-31 | Cascade Microtech, Inc. | Probe testing structure |
| US7187188B2 (en) | 2003-12-24 | 2007-03-06 | Cascade Microtech, Inc. | Chuck with integrated wafer support |
| DE202005021434U1 (de) | 2004-06-07 | 2008-03-20 | Cascade Microtech, Inc., Beaverton | Thermooptische Einspannvorrichtung |
| US7330041B2 (en) | 2004-06-14 | 2008-02-12 | Cascade Microtech, Inc. | Localizing a temperature of a device for testing |
| US7656172B2 (en) | 2005-01-31 | 2010-02-02 | Cascade Microtech, Inc. | System for testing semiconductors |
| US7535247B2 (en) | 2005-01-31 | 2009-05-19 | Cascade Microtech, Inc. | Interface for testing semiconductors |
| US8319503B2 (en) | 2008-11-24 | 2012-11-27 | Cascade Microtech, Inc. | Test apparatus for measuring a characteristic of a device under test |
| US9423417B2 (en) | 2011-10-12 | 2016-08-23 | Fluke Corporation | Voltage tester having alternatively attachable or separable probes |
| US9030220B2 (en) * | 2011-10-12 | 2015-05-12 | Fluke Corporation | Voltage tester having alternatively attachable or separable probes |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2756830C3 (de) * | 1977-04-21 | 1980-12-11 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Prüfeinrichtung zum Anzeigen einer elektrischen Spannung und/oder deren Polarität sowie des Stromdurchgangs durch einen elektrischen Leiter |
| DE2846675C3 (de) * | 1978-10-26 | 1981-08-13 | Siemens AG, 1000 Berlin und 8000 München | Prüfeinrichtung zum Anzeigen einer elektrischen Spannung und gegebenenfalls deren Polarität |
-
1981
- 1981-06-29 DE DE3125552A patent/DE3125552C1/de not_active Expired
-
1982
- 1982-06-29 JP JP57112447A patent/JPS5828668A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5828668A (ja) | 1983-02-19 |
| DE3125552C1 (de) | 1982-11-11 |
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