JPH0415924B2 - - Google Patents
Info
- Publication number
- JPH0415924B2 JPH0415924B2 JP58024202A JP2420283A JPH0415924B2 JP H0415924 B2 JPH0415924 B2 JP H0415924B2 JP 58024202 A JP58024202 A JP 58024202A JP 2420283 A JP2420283 A JP 2420283A JP H0415924 B2 JPH0415924 B2 JP H0415924B2
- Authority
- JP
- Japan
- Prior art keywords
- lens group
- positive lens
- reticle
- alignment
- light beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000003287 optical effect Effects 0.000 claims description 65
- 210000001747 pupil Anatomy 0.000 claims description 22
- 238000005286 illumination Methods 0.000 claims description 19
- 238000010586 diagram Methods 0.000 description 7
- 238000003384 imaging method Methods 0.000 description 4
- 241000276498 Pollachius virens Species 0.000 description 3
- 239000013307 optical fiber Substances 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Microscoopes, Condenser (AREA)
- Lenses (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58024202A JPS59149317A (ja) | 1983-02-16 | 1983-02-16 | 投影型露光装置のアライメント光学系 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58024202A JPS59149317A (ja) | 1983-02-16 | 1983-02-16 | 投影型露光装置のアライメント光学系 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59149317A JPS59149317A (ja) | 1984-08-27 |
JPH0415924B2 true JPH0415924B2 (de) | 1992-03-19 |
Family
ID=12131728
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58024202A Granted JPS59149317A (ja) | 1983-02-16 | 1983-02-16 | 投影型露光装置のアライメント光学系 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59149317A (de) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3165711B2 (ja) * | 1991-08-02 | 2001-05-14 | キヤノン株式会社 | 像投影方法及び該方法を用いた半導体デバイスの製造方法 |
JPH0536586A (ja) * | 1991-08-02 | 1993-02-12 | Canon Inc | 像投影方法及び該方法を用いた半導体デバイスの製造方法 |
-
1983
- 1983-02-16 JP JP58024202A patent/JPS59149317A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS59149317A (ja) | 1984-08-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7236254B2 (en) | Exposure apparatus with interferometer | |
US4592625A (en) | Double-conjugate maintaining optical system | |
US7177076B2 (en) | 8-mirror microlithography projection objective | |
US4402596A (en) | Projection type exposure device | |
US5751404A (en) | Exposure apparatus and method wherein alignment is carried out by comparing marks which are incident on both reticle stage and wafer stage reference plates | |
US4473293A (en) | Step-and-repeat projection alignment and exposure system | |
US4573791A (en) | Step-and-repeat projection alignment and exposure system | |
US20110109893A1 (en) | Microlithographic projection exposure apparatus | |
EP0017759A2 (de) | Verbessertes System der Ausrichtung und Belichtung durch schrittweise Projektion | |
US4888614A (en) | Observation system for a projection exposure apparatus | |
US6961132B2 (en) | Interference system and semiconductor exposure apparatus having the same | |
US6023321A (en) | Projection exposure apparatus and method | |
JPH0245324B2 (de) | ||
JPH08179202A (ja) | 紫外線結像光学システム | |
JPH0415924B2 (de) | ||
JP3611054B2 (ja) | 位置補正光学系、位置合わせ装置、並びに露光方法及び装置 | |
JP3327627B2 (ja) | 露光用原板及びそれを用いた投影露光装置 | |
JPS6265327A (ja) | 位置合わせ装置 | |
US4723846A (en) | Optical path length compensating optical system in an alignment apparatus | |
JPH113853A (ja) | 位置検出方法及び位置検出装置 | |
JPH0344242B2 (de) | ||
JP4337149B2 (ja) | 位置検出装置、露光装置及びデバイス製造方法 | |
JP4304550B2 (ja) | 走査型露光装置およびその製造方法、並びに走査型露光方法 | |
JPS63221616A (ja) | マスク・ウエハの位置合わせ方法 | |
KR100209369B1 (ko) | 애퍼처 정렬 정확도 측정방법 |