JPH04127650U - IC tester board connection mechanism - Google Patents

Abstract

(57) [Summary] [Purpose] The grounding conductor provided on the fixed board 1 prevents signal interference from the seat 6 of the DUT board 5 to the connection between the fixed board 1 and the socket 3, and connects the edge of the fixed board 1 and the DUT board. 5 maintains the stroke and pressure of the contact pin 4. [Structure] A DUT board that is attached to a fixed board 1 and has a pin unit 2 to which a socket 3 is attached, a contact pin 4 housed in the socket 3, a seat 6 that comes into contact with the contact pin 4, and a device 7 mounted thereon. 5, the pin units 2 are arranged on both sides of the fixed board 1, and the end 1A of the fixed board 1 is connected to the DUT.
A ground conductor 8 is placed in contact with the board 5 and on the inner layer of the fixed board 1.
will be established.

Description

[Detailed explanation of the idea]

0001

[Industrial application field]

The IC tester board includes the DUT board for device measurement and the signal from the tester. There is a fixed board that transmits the signal to the DUT board. This idea is connected to the DUT board. For IC testers that prevent signal interference between fixed boards and maintain contact pin stroke and pressure. This is about the board connection mechanism.

0002

[Conventional technology]

Next, the configuration of the connection mechanism of the IC tester board according to the prior art will be explained with reference to FIG. do. In Figure 3, 1 is a fixed board, 2 is a pin unit, 3 is a socket, and 4 is a contact pin , 5 is a DUT board, 6 is a seat, and 7 is a device. Fixed board 1 has a pin unit. Cut 2 is fixed. Figure 4 is an external perspective view with the DUT board 5 removed from Figure 3. be. A socket 3 is fixed to the pin unit 2 in FIG. 3, and a contact pin is attached to the socket 3. 4 is accommodated. The contact pin 4 has a built-in spring, and the pressure of the spring causes the contact pin to The pin 4 contacts the seat 6 of the DUT board 5. The lower part of the socket 3 is connected to the fixed board 1. connected to the circuit. Fixed board 1 connects contact pins to device 7 on DUT board 5. 4, receives the signal from device 7, and determines whether device 7 is good or bad. do.

0003 The contact pin 4 is fixed with the insulator of the pin unit 2 and is insulated from other contact pins. However, as the number of signals increases, the spacing between contact pins 4 becomes narrower, causing interference between signals. The correct signal will no longer be provided. Contact pin 4 is seated with appropriate pressure with a constant stroke. 6 and has the minimum contact resistance, but due to the fixing method of the DUT board 5, deflection, etc. The stroke of each contact pin 4 is no longer constant, the contact resistance increases, and the correct signal is not correct. supply becomes unavailable.

0004

[Problem that the idea aims to solve]

This idea extends from the seat 6 of the DUT board 5 to the connection between the fixed board 1 and the socket 3. The inner layer conductor provided inside the fixed board 1 prevents signal interference at the ends of the fixed board 1. Maintain the stroke and pressure of the contact pin 4 by contacting the DUT board 5 The purpose is to provide a connection mechanism for IC tester boards.

[0005]

[Means to solve the problem]

To achieve this objective, this invention uses a fixed board to which the test signals are supplied. 1, and a pin unit 2 attached to the fixed board 1 and to which the socket 3 is attached. A contact pin 4 accommodated in the socket 3 and a seat 6 that contacts the contact pin 4 are attached. It is an IC tester board comprising a DUT board 5 equipped with a device 7 and a DUT board 5 mounted thereon. Therefore, the pin units 2 are arranged on both sides of the fixed board 1, and the end portion 1A of the fixed board 1 is is extended to contact the DUT board 5, and a ground conductor 8 is provided on the inner layer of the fixed board 1. Ru.

[0006]

[Effect]

Next, we will explain the configuration diagram of the connection mechanism of the IC tester board based on this invention using Figure 1. I will clarify. In Fig. 1, the pin units 2 of Fig. 3 are arranged on both sides of the fixed board 1, and are in contact with each other. Pins 4 are also arranged on both sides of the fixed board 1. The end 1A of the fixed board 1 has a contact pin. The pressure of pin 4 is extended to the optimum stroke length, and the fixed board 1 is fixed to the DUT board. contact with door 5. As a result, the stroke of the contact pin 4 is constant, and the stroke of the contact pin 4 is constant. pressure and contact resistance can be obtained.

[0007] 8 in FIG. 1 is a ground conductor provided on the inner layer of the fixed board 1. electrically grounded. As a result, the contact pin 4 and socket 3 facing each other are transmitted. Signal interference can be prevented up to seat 6. Figure 2 shows the DUT board 5 removed from Figure 1. FIG.

[0008]

[Effect of the idea]

According to this invention, the contact pin portion between the DUT board pin units is connected to the fixed board. Since they are separated by a ground conductor on the inner layer, signal interference can be prevented. Also, the fixed button As the end of the board contacts the DUT board, maintain contact pin stroke and pressure. I can do that.

[Brief explanation of drawings]

FIG. 1 is a configuration diagram of an IC tester board according to this invention.

FIG. 2 is an external perspective view from FIG. 1 with the DUT board 5 removed.

FIG. 3 is a configuration diagram of an IC tester board according to the prior art.

4 is an external perspective view with the DUT board 5 removed from FIG. 3. FIG.

[Explanation of symbols]

1 Fixed board 1A end 2 pin unit 3 socket 4 Contact pin 5 DUT board 6 seats 7 devices 8 Ground conductor

Claims (1)

[Scope of utility model registration request] [Claim 1] A fixed board (1) to which a test signal is supplied.
, a pin unit (2) attached to the fixed board (1) and to which the socket (3) is attached, a contact pin (4) accommodated in the socket (3), and a seat (4) that contacts the contact pin (4). 6)
DUT board with attached device (7)
(5) A board for an IC tester, in which pin units (2) are arranged on both sides of the fixed board (1), and the fixed board
A connection mechanism for an IC tester board, characterized in that the end (1A) of (1) is extended to contact the DUT board (5), and a ground conductor (8) is provided on the inner layer of the fixed board (1).