JPH04123532U - Semiconductor substrate cleaning equipment - Google Patents

Semiconductor substrate cleaning equipment

Info

Publication number
JPH04123532U
JPH04123532U JP2916091U JP2916091U JPH04123532U JP H04123532 U JPH04123532 U JP H04123532U JP 2916091 U JP2916091 U JP 2916091U JP 2916091 U JP2916091 U JP 2916091U JP H04123532 U JPH04123532 U JP H04123532U
Authority
JP
Japan
Prior art keywords
cleaning
drying
semiconductor substrate
nozzle
substrate cleaning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2916091U
Other languages
Japanese (ja)
Inventor
博 斉藤
Original Assignee
日立電線株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日立電線株式会社 filed Critical 日立電線株式会社
Priority to JP2916091U priority Critical patent/JPH04123532U/en
Publication of JPH04123532U publication Critical patent/JPH04123532U/en
Pending legal-status Critical Current

Links

Abstract

(57)【要約】 【目的】半導体基板等の表面に付着した汚れを洗浄し、
乾燥するのに、洗浄処理から乾燥処理の間における移動
時間を少なくして、再酸化、乾燥むら等の生じないよう
な製品を得ることができる洗浄装置を提供する。 【構成】図2に示すように、半導体基板3等の表面付近
に洗浄用ノズル1に並設して新規に乾燥用ノズル2を設
置し、半導体基板3を収納した支持機構4を移動させ
て、洗浄と乾燥を同時的に行う。 【効果】本考案により、洗浄後の表面の再酸化などの表
面劣化を防ぎ、作業効率の向上をはかることができる。
(57) [Summary] [Purpose] Cleans dirt adhering to the surface of semiconductor substrates, etc.
To provide a cleaning device capable of obtaining a product free from re-oxidation, uneven drying, etc. by reducing the transfer time between cleaning treatment and drying treatment. [Structure] As shown in FIG. 2, a drying nozzle 2 is newly installed in parallel with the cleaning nozzle 1 near the surface of the semiconductor substrate 3, etc., and the support mechanism 4 containing the semiconductor substrate 3 is moved. , washing and drying at the same time. [Effect] The present invention can prevent surface deterioration such as re-oxidation of the surface after cleaning and improve work efficiency.

Description

【考案の詳細な説明】[Detailed explanation of the idea]

【0001】0001

【産業上の利用分野】[Industrial application field]

本考案は、半導体基板の洗浄装置に係り、特に洗浄と乾燥とを同時的に実施す ることができる洗浄装置に関する。 The present invention relates to a cleaning device for semiconductor substrates, and in particular, the present invention relates to a cleaning device for semiconductor substrates, and in particular, a device for cleaning and drying semiconductor substrates at the same time. The present invention relates to a cleaning device that can be used for cleaning.

【0002】0002

【従来の技術】[Conventional technology]

従来の半導体基板の洗浄装置では、まず、被洗浄物を保持機構に固定し、洗浄 用ノズルから洗浄液を供給して、洗浄物表面の汚れを洗浄した後乾燥室へ移し、 次の段階で、乾燥用装置を用いて乾燥するようになっていた。 In conventional semiconductor substrate cleaning equipment, the object to be cleaned is first fixed in a holding mechanism and then cleaned. After cleaning the dirt on the surface of the object by supplying cleaning liquid from the nozzle, the object is transferred to the drying room. The next step was to dry it using a drying device.

【0003】 そのため、洗浄段階から乾燥段階へ移行する際に、被洗浄物の表面が再び汚れ るおそれがあった。また、使用する洗浄液によっては洗浄により、表面が酸化す るなどのおそれがあった。さらに洗浄後、直ちに乾燥しないと、表面に洗浄液の 乾燥むらを発生することもあった。0003 Therefore, when moving from the cleaning stage to the drying stage, the surface of the object to be cleaned becomes contaminated again. There was a risk that Also, depending on the cleaning solution used, the surface may become oxidized due to cleaning. There was a risk that this could happen. Furthermore, if the surface is not dried immediately after cleaning, the cleaning solution may remain on the surface. Occasionally, uneven dryness occurred.

【0004】0004

【考案が解決しようとする課題】[Problem that the idea aims to solve]

前記のように、従来の装置では、洗浄処理を終了して乾燥処理に移行する間に 発生する汚れを防止するために移動用の設備が必要であった。 As mentioned above, in conventional equipment, between the end of the cleaning process and the transition to the drying process, Moving equipment was required to prevent the contamination that occurs.

【0005】 本考案の目的は、従来技術の欠点を解消するため、洗浄処理と乾燥処理を同時 に、容易に実施できるような洗浄装置を提供することである。[0005] The purpose of this invention is to simultaneously perform cleaning and drying processes in order to eliminate the drawbacks of conventional technology. Another object of the present invention is to provide a cleaning device that can be easily implemented.

【0006】[0006]

【課題を解決するための手段】[Means to solve the problem]

上記課題を解決するための本考案にかかる半導体基板の洗浄装置の構成は、被 洗浄物の表面に洗浄液を供給する洗浄用ノズルと被洗浄物の保持機構とこれを駆 動するための駆動装置とからなる半導体基板の洗浄装置において、前記洗浄用ノ ズルの後部側に、乾燥用ノズルを並列状に設けるようにしたことである。 The structure of the semiconductor substrate cleaning apparatus according to the present invention to solve the above problems is as follows: A cleaning nozzle that supplies cleaning liquid to the surface of the object to be cleaned, a holding mechanism for the object to be cleaned, and a drive mechanism for the cleaning nozzle. In a semiconductor substrate cleaning apparatus comprising a drive device for moving the cleaning nozzle, The drying nozzles are arranged in parallel on the rear side of the nozzle.

【0007】[0007]

【作用】[Effect]

本考案の要旨は、半導体基板の表面の汚れを洗浄する装置において、洗浄用ノ ズルから洗浄液を表面に供給すると同時に、並設された乾燥用ノズルから加圧さ れた気体を吹き付け、汚れを含んだ洗浄液を吹きとばし、表面に汚れが再付着す る余裕を与えずに、洗浄および乾燥を同時に行うことである。 The gist of this invention is to use a cleaning nozzle in an apparatus for cleaning dirt on the surface of a semiconductor substrate. At the same time, the cleaning liquid is supplied from the nozzle to the surface, and at the same time, the drying nozzle installed in parallel applies pressure. The cleaning solution containing dirt is blown away to prevent dirt from re-adhering to the surface. washing and drying at the same time.

【0008】[0008]

【実施例】【Example】

以下本考案の実施例を図1、図2を用いて説明する。 Embodiments of the present invention will be described below with reference to FIGS. 1 and 2.

【0009】 図1は本考案の半導体基板の洗浄装置の平面略示図、図2は本考案の半導体基 板の洗浄装置の断面略示図である。[0009] FIG. 1 is a schematic plan view of a semiconductor substrate cleaning apparatus according to the present invention, and FIG. 2 is a schematic plan view of a semiconductor substrate cleaning apparatus according to the present invention. FIG. 2 is a schematic cross-sectional view of a plate cleaning device.

【0010】 図1において、1は洗浄用ノズル、2は乾燥用ノズル、3は半導体基板(被洗 浄物)、4は保持機構、5は保持機構の駆動装置である。図2において、6はシ ャター、7はカバーであり、そのほかの符号は図1と同じである。0010 In Figure 1, 1 is a cleaning nozzle, 2 is a drying nozzle, and 3 is a semiconductor substrate (to be cleaned). 4 is a holding mechanism, and 5 is a drive device for the holding mechanism. In Figure 2, 6 is a 7 is a cover, and the other symbols are the same as in FIG.

【0011】 図1および図2を用いて、本装置の動作を説明する。[0011] The operation of this device will be explained using FIGS. 1 and 2.

【0012】 被洗浄物の半導体基板3は、保持機構4に収納され、カバー7つきの洗浄装置 内に収容される。予め準備された洗浄用ノズル1およびこれと並設された乾燥用 ノズル2は、半導体基板3の表面を洗浄、乾燥するのに最適な位置に設置する。 保持機構4は駆動装置5に積載され、通常矢印の方向(一方向)へ移動するよう になっている。0012 A semiconductor substrate 3 to be cleaned is housed in a holding mechanism 4, and a cleaning device with a cover 7 is installed. contained within. A cleaning nozzle 1 prepared in advance and a drying nozzle installed in parallel with the cleaning nozzle 1 The nozzle 2 is installed at an optimal position for cleaning and drying the surface of the semiconductor substrate 3. The holding mechanism 4 is loaded on the drive device 5 and is normally moved in the direction of the arrow (one direction). It has become.

【0013】 半導体基板3を矢印の方向に、一定の速度で移動させると同時に洗浄用ノズル 1から洗浄液を加圧供給して表面の汚れを除去洗浄し、その後部側に新規に設け た乾燥用ノズル2から加圧気体を吹き付けて、汚れを吹き飛ばし、再付着を防止 しながら乾燥を行う。[0013] While moving the semiconductor substrate 3 in the direction of the arrow at a constant speed, the cleaning nozzle Clean the surface by supplying cleaning liquid under pressure from 1, and then install a new one on the rear side. Pressurized gas is sprayed from drying nozzle 2 to blow away dirt and prevent re-adhesion. Dry while drying.

【0014】 本考案の実施例の装置においては、洗浄と乾燥とを同時的に行うことができる ので、洗浄後の表面の酸化等を防ぎ、また処理時間の短縮ができる。[0014] In the apparatus according to the embodiment of the present invention, cleaning and drying can be performed simultaneously. Therefore, oxidation of the surface after cleaning can be prevented and processing time can be shortened.

【0015】 半導体基板の固定方法、移動条件および洗浄液、乾燥気体の種類等については 予備試験によって選定し、最適なものを採用すればよい。[0015] Regarding the method of fixing the semiconductor substrate, moving conditions, cleaning liquid, type of drying gas, etc. It is sufficient to select through preliminary tests and adopt the most suitable one.

【0016】 洗浄処理は矢印方向へ移動する時にのみ行い、元の位置へ戻る時には、洗浄液 の供給は行はない。ただし、乾燥用気体の供給は、往復の両方向にて行ってもよ い。また、連続的に洗浄を行う場合は、必要数の保持機構を予め準備し、移動装 置を利用して、順次行うこともできる。[0016] The cleaning process is performed only when moving in the direction of the arrow, and when returning to the original position, use cleaning solution. There is no supply line. However, drying gas may be supplied in both directions. stomach. In addition, when performing continuous cleaning, prepare the required number of holding mechanisms in advance, and It can also be done sequentially using the location.

【0017】[0017]

【考案の効果】[Effect of the idea]

本考案により、(1)洗浄と乾燥を同時に行うために、酸化などの表面劣化を 防止できる(2)洗浄から乾燥への移動による汚れ、破損の防止ができる(3) 洗浄から乾燥への移動用装置を必要としない(4)同時に作業ができることおよ び移動時間がないことにより作業時間の短縮ができる等のことから、作業効率が 向上し、製品の精度は向上し、経済性の向上に貢献する。 With this invention, (1) surface deterioration such as oxidation is prevented in order to perform cleaning and drying at the same time. Can be prevented (2) Can prevent stains and damage caused by movement from washing to drying (3) No need for moving equipment from washing to drying (4) Able to work at the same time and Work efficiency is improved as work time can be shortened due to no travel time. This improves product accuracy and contributes to improved economic efficiency.

【図面の簡単な説明】[Brief explanation of drawings]

【図1】本考案の実施例の半導体基板の洗浄装置の平面
略示図である。
FIG. 1 is a schematic plan view of a semiconductor substrate cleaning apparatus according to an embodiment of the present invention.

【図2】本考案の実施例の半導体基板の洗浄装置の断面
略示図である。
FIG. 2 is a schematic cross-sectional view of a semiconductor substrate cleaning apparatus according to an embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 洗浄用ノズル 2 乾燥用ノズル 3 半導体基板 4 保持機構 5 保持機構の駆動装置 6 シャター 7 カバー 1 Cleaning nozzle 2 Drying nozzle 3 Semiconductor substrate 4 Holding mechanism 5 Drive device for holding mechanism 6 Shatter 7 Cover

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】被洗浄物の表面に洗浄液を供給する洗浄用
ノズルと被洗浄物の保持機構とこれを駆動するための駆
動装置とからなる半導体基板の洗浄装置において、前記
洗浄用ノズルの後部側に、乾燥用ノズルを並列状に設け
たことを特徴とする半導体基板の洗浄装置。
1. A semiconductor substrate cleaning device comprising a cleaning nozzle for supplying a cleaning liquid onto the surface of an object to be cleaned, a holding mechanism for the object to be cleaned, and a drive device for driving the same, wherein a rear portion of the cleaning nozzle is provided. A semiconductor substrate cleaning device characterized by having drying nozzles arranged in parallel on the side.
JP2916091U 1991-04-25 1991-04-25 Semiconductor substrate cleaning equipment Pending JPH04123532U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2916091U JPH04123532U (en) 1991-04-25 1991-04-25 Semiconductor substrate cleaning equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2916091U JPH04123532U (en) 1991-04-25 1991-04-25 Semiconductor substrate cleaning equipment

Publications (1)

Publication Number Publication Date
JPH04123532U true JPH04123532U (en) 1992-11-09

Family

ID=31913070

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2916091U Pending JPH04123532U (en) 1991-04-25 1991-04-25 Semiconductor substrate cleaning equipment

Country Status (1)

Country Link
JP (1) JPH04123532U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09120951A (en) * 1995-10-25 1997-05-06 Nec Corp Liquid drain system for substrate
JP2010505272A (en) * 2006-09-29 2010-02-18 ラム リサーチ コーポレーション Carrier for reducing entrance and / or exit marks left by a substrate processing meniscus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09120951A (en) * 1995-10-25 1997-05-06 Nec Corp Liquid drain system for substrate
JP2010505272A (en) * 2006-09-29 2010-02-18 ラム リサーチ コーポレーション Carrier for reducing entrance and / or exit marks left by a substrate processing meniscus

Similar Documents

Publication Publication Date Title
JP3030796B2 (en) Cleaning treatment method
TWI616239B (en) Scrubber
JP5048176B2 (en) Cleaning method for hydrophobic wafers
JP2001096245A (en) Cleaning method and cleaning equipment
JP2001054765A (en) Substrate cleaning device
JPH1131674A (en) Wafer-cleaning apparatus
JPH053184A (en) Cleaning method of wafer
JP3377414B2 (en) Processing equipment
JPH04123532U (en) Semiconductor substrate cleaning equipment
KR100292322B1 (en) Substrate treatment device and substrate transporting method
JPH1126547A (en) Wet treatment device
JP2004057862A (en) Cleaning apparatus and cleaning method
JPH07130637A (en) Semiconductor manufacturing equipment
KR20110064608A (en) Wafer cleaning apparatus with spin scrubber and cleaning method thereof
JPH05347287A (en) Cleaning device
JP2930580B1 (en) Cleaning equipment for semiconductor wafers
JP3537875B2 (en) Substrate cleaning device
JP2000150441A (en) Roller brush washing device
JPH09234664A (en) Top ring of polishing device and cleaning device of work to be polished
JP4213779B2 (en) Substrate processing apparatus and processing method
JPH0493046A (en) Wafer transfer apparatus
TW202337581A (en) Method for cleaning semiconductor wafers in a cleaning line
JP3335220B2 (en) Substrate processing equipment
KR200156133Y1 (en) Apparatus for cleaning wafer backside
JP2531393Y2 (en) Paint booth floor cleaning equipment